Test fixture
By designing a test fixture for mesh-layered structures, and utilizing sliding and mating components to form bidirectional limits on the test plane, the problem of inaccurate shear force measurement in existing devices is solved, achieving uniform transmission of shear load and accuracy of test data.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHENZHEN BIOREGENERATION TECHNOLOGY CO LTD
- Filing Date
- 2025-08-12
- Publication Date
- 2026-07-17
AI Technical Summary
Existing shear testing devices cannot accurately measure the shear force of elastic specimens with mesh-layered structures because they lack in-plane limiting constraints on the test plane. This causes the specimen to easily undergo torsional displacement around the normal direction during loading, and the shear load cannot be uniformly transferred to the target layered interface.
A test fixture is designed, including first and second holding members. A sliding component and a mating component form a bidirectional limiting mechanism on the test plane, ensuring that the shear load is uniformly transmitted along a preset direction. The fixture consists of a first fixed frame and a second fixed frame. The sliding component and the mating component move relative to each other on the test plane, forming a connected fixed cavity. A fixing pin passes through a through hole to fix the elastic specimen, preventing torsional displacement.
It effectively suppressed the torsional displacement of the elastic specimen in the test plane, ensured that the shear load was accurately transferred to the target delamination interface, avoided the distortion of test data, and improved the accuracy of shear force measurement.
Smart Images
Figure CN224518338U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of materials testing technology, and in particular to a test fixture. Background Technology
[0002] In the field of materials mechanical property testing, existing shear testing methods typically fix the specimen to a shear testing fixture via axial clamping and apply a tangential load parallel to the test plane to the outer surface of the specimen. For traditional homogeneous material specimens with high elastic modulus and strong resistance to deformation, the testing accuracy of such fixtures can meet engineering testing requirements. However, for elastic specimens with mesh-like layered structures that have been widely used in recent years, the limitations of existing testing devices become apparent when it is necessary to accurately measure the shear force on the plane where the layer interfaces are located due to the weak interlayer bonding force and strong overall elastic deformation capacity of these specimens. Because of the lack of in-plane constraint structures for the test plane, the specimen is prone to torsional displacement around the normal direction on the test plane during load application, resulting in the shear load not being uniformly transmitted to the target layer interface, causing a significant deviation between the measured shear force data and the actual interlayer stress state. This problem is particularly prominent in the research and development and quality control of lightweight high-strength mesh materials. There is an urgent need to design a shear test fixture with a test plane limiting function to solve the problem of accurate measurement of shear force in elastic specimens with mesh layers. Utility Model Content
[0003] This application provides a test fixture to solve the problem of inaccurate measurement of shear force in elastic specimens with mesh delamination.
[0004] To address the aforementioned technical problems, this application provides a test fixture for performing shear force tests on a target layer of an elastic specimen with a mesh-layered structure, wherein the plane containing the target layer is the test plane, comprising:
[0005] The first holding member includes a first fixing frame, the first fixing frame includes a first annular bottom surface, the inner boundary of the first annular bottom surface is a first inner ring, the outer surface of the first fixing frame is symmetrically provided with sliding components in the radial direction of the first inner ring, the direction of the sliding components is a first direction, and the first fixing frame is provided with a plurality of symmetrical through holes, the plane of any symmetrical through hole is parallel to the test plane.
[0006] The second holding member includes a second fixing frame, which includes a second annular bottom surface. The second annular bottom surface and the first annular bottom surface are attached to each other on the test plane. The inner boundary of the second annular bottom surface is a second inner ring. The second inner ring and the first inner ring are the same in size and shape. The outer surface of the second fixing frame is provided with a mating component that matches the sliding component. The second holding member and the first holding member slide relative to each other on the test plane along the first direction. The second fixing frame has a plurality of symmetrical through holes, and the plane where any symmetrical through hole is located is parallel to the test plane.
[0007] When the first inner ring and the second inner ring completely coincide with the edge contour line of the target layer, the first fixing frame and the second fixing frame form a connected fixing cavity, and the elastic specimen is fixed in the fixing cavity by a fixing pin passing through the symmetrical through hole.
[0008] The sliding component and the mating component move relative to each other on the test plane.
[0009] When the first inner ring coincides with the second inner ring, the inner wall of the fixed cavity is in contact with the outer contour surface of the elastic specimen.
[0010] Wherein, the symmetrical through holes on the first holding member are first symmetrical through holes, the symmetrical through holes on the second holding member are second symmetrical through holes, a plurality of the first symmetrical through holes are distributed on a first plane, and a plurality of the second symmetrical through holes are distributed on a second plane, and both the first plane and the second plane are parallel to the test plane.
[0011] In this configuration, any symmetrical through-hole is perpendicular to the first direction.
[0012] Among them, a plurality of first symmetrical through holes are uniformly distributed on the first plane, and a plurality of second symmetrical through holes are uniformly distributed on the second plane.
[0013] Among them, a plurality of first symmetrical through holes are closely distributed on the first plane according to the mesh of the elastic specimen, and a plurality of second symmetrical through holes are closely distributed on the second plane according to the mesh of the elastic specimen.
[0014] The elastic specimen consists of several interconnected mesh layers, with the first plane separated from the test plane by one mesh layer, and the second plane separated from the test plane by one mesh layer.
[0015] The sliding component includes a slider and / or a slide rail, and the mating component includes a slide rail that matches the sliding component and / or a slider that matches the slide rail.
[0016] The track distance of the slide rail is 0.1 to 1 times the diameter of the first inner ring.
[0017] Wherein, the first fixing frame has a limiting hole arranged radially symmetrically away from the first annular bottom surface, or the second fixing frame has a limiting hole arranged radially symmetrically away from the second annular bottom surface, and the limiting plate passes through the limiting hole to limit the elastic specimen.
[0018] The beneficial effects of this application's embodiments, which differ from existing technologies, are as follows: This application provides a test fixture for performing shear force tests on the target layer of an elastic specimen with a mesh layered structure. The plane containing the target layer is the test plane. The test fixture includes a first holding member and a second holding member. The first holding member includes a first fixing frame, which includes a first annular bottom surface. The inner boundary of the first annular bottom surface is a first inner ring. The outer surface of the first fixing frame is symmetrically provided with sliding components in the radial direction of the first inner ring. The direction of the sliding components is a first direction. The first fixing frame has several symmetrical through holes, and the plane containing any symmetrical through hole is parallel to the test plane. The second holding member includes a second fixing frame, which includes a first... The second annular bottom surface is attached to the first annular bottom surface on the test plane. The inner boundary of the second annular bottom surface is the second inner ring, which is the same size and shape as the first inner ring. The outer surface of the second fixed frame is provided with a mating component that matches the sliding component. The second holding component and the first holding component slide relative to each other on the test plane along a first direction. The second fixed frame has several symmetrical through holes, and the plane where any symmetrical through hole is located is parallel to the test plane. When the first inner ring and the second inner ring completely coincide with the edge contour line of the target layer, the first fixed frame and the second fixed frame form a connected fixed cavity. The elastic specimen is fixed in the fixed cavity by a fixing pin passing through the symmetrical through hole. By attaching the first and second annular bottom surfaces to the test plane and forming a fixed cavity when the first and second inner rings overlap, the elastic specimen is bidirectionally confined in the test plane by utilizing the characteristics of the mesh layered structure. This application can significantly suppress the torsional displacement of the elastic specimen around the normal direction in the test plane, ensuring that the shear load is uniformly transmitted to the target layered interface along the preset direction, and fundamentally avoiding test data distortion caused by displacement deviation. Attached Figure Description
[0019] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are merely some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort, wherein:
[0020] Figure 1A three-dimensional structural diagram of an elastic specimen provided for this application;
[0021] Figure 2 This application provides a schematic diagram of the structure of a shear force testing machine.
[0022] Figure 3 A three-dimensional structural schematic diagram of a test fixture with a built-in elastic specimen provided for this application;
[0023] Figure 4 for Figure 3 The diagram shown is a top-down view of the structure.
[0024] Figure 5 for Figure 4 A schematic diagram of the cross-sectional structure along the AA direction;
[0025] Figure 6 for Figure 3 A schematic diagram of the disassembled structure of the test fixture shown;
[0026] Figure 7 for Figure 3 A schematic diagram of the three-dimensional structure of the test fixture shown;
[0027] Figure 8 for Figure 7 The diagram shows the front view of the structure.
[0028] Figure 9 for Figure 7 A three-dimensional structural diagram of the first holding member of the test fixture shown. Detailed Implementation
[0029] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. It is understood that the specific embodiments described herein are only for explaining this application and not for limiting it. Furthermore, it should be noted that, for ease of description, only the parts related to this application are shown in the accompanying drawings, not all structures. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.
[0030] In the description of this application, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," and "counterclockwise," etc., indicating orientation or positional relationships based on the orientation or positional relationships shown in the accompanying drawings, are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include one or more of the stated features. In the description of this application, "a plurality of" means two or more, unless otherwise explicitly specified.
[0031] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection, an electrical connection, or a connection that allows communication between them; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication between two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.
[0032] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.
[0033] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a mutually exclusive, independent, or alternative embodiment. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.
[0034] In the field of materials mechanical property testing, existing shear testing methods typically fix the specimen to a shear testing fixture via axial clamping and apply a tangential load parallel to the test plane to the outer surface of the specimen. For traditional homogeneous material specimens with high elastic modulus and strong resistance to deformation, the testing accuracy of such fixtures can meet engineering testing requirements. However, for elastic specimens with mesh-like layered structures that have been widely used in recent years, the limitations of existing testing devices become apparent when it is necessary to accurately measure the shear force on the plane where the layer interfaces are located due to the weak interlayer bonding force and strong overall elastic deformation capacity of these specimens. Because of the lack of in-plane constraint structures for the test plane, the specimen is prone to torsional displacement around the normal direction on the test plane during load application, resulting in the shear load not being uniformly transmitted to the target layer interface, causing a significant deviation between the measured shear force data and the actual interlayer stress state. This problem is particularly prominent in the research and development and quality control of lightweight high-strength mesh materials. There is an urgent need to design a shear test fixture with a test plane limiting function to solve the problem of accurate measurement of shear force in elastic specimens with mesh layers.
[0035] In view of the above problems, this application provides a test fixture for solving the problem of accurate measurement of shear force in elastic specimens with mesh layers. Figures 2 to 9 Specific implementation of the test fixture provided in this application.
[0036] like Figures 2 to 9 As shown, this application provides a test fixture 10 for performing shear force tests on an elastic specimen 20 with a mesh layered structure, wherein the plane containing the target layer is the test plane 30a. Figure 2 As shown, this is a specific embodiment of the test fixture 10 being installed in the shear force testing device 1. In this embodiment, the shear force is tested by applying opposing vertical tension forces to the test fixture 10. Figure 1 As shown, the virtual contour surface formed by the outer periphery of the elastic specimen 20 is the outer contour surface 201. In this embodiment, the elastic specimen 20 is a specimen with a cylindrical outer contour and a mesh-like layered structure, so the cross-section of its target layer is circular. The shape of the outer contour of the elastic specimen can be changed according to the shape of the breast implantation area, and can be frustum, square, or circular, etc. The shape of the test fixture 10 is determined according to the shape of the outer contour. Figures 3 to 9The test fixture 10 provided in this application includes a first holding member 100 and a second holding member 200. The first holding member 100 includes a first fixing frame 110, which includes a first annular bottom surface 111. The second holding member 200 includes a second fixing frame 210, which includes a second annular bottom surface 211. The second annular bottom surface 211 and the first annular bottom surface 111 are attached to each other, and the plane where they are attached is the test plane 30a. The inner boundary of the first annular bottom surface 111 is a first inner ring 1111, and the inner boundary of the second annular bottom surface 211 is a second inner ring 2111. The first inner ring 1111 and the second inner ring 2111 are the same in size and shape. When the first inner ring 1111 and the second inner ring 2111 completely coincide with the edge contour line of the target layer, the first fixing frame 110 and the second fixing frame 210 form a connected fixing cavity 400. At this time, if the elastic specimen 20 is placed into the fixing cavity 400, the first fixing frame 110 and the second fixing frame 210 achieve the wrapping of the edge contour of the target layer of the elastic specimen 20 on the test plane 30a.
[0037] like Figure 8 As shown, the outer surface of the first fixing frame 110 is symmetrically provided with sliding components 120 in the radial direction of the first inner ring 1111, and the direction of the sliding components 120 is the first direction X. The first fixing frame 110 also has several symmetrical through holes, and the plane of any symmetrical through hole is parallel to the test plane. The outer surface of the second fixing frame 210 is provided with a mating component 220 that matches the sliding component 120 on the first fixing frame 110. The sliding component 120 and the mating component 220 are used to make the first holding member 100 and the second holding member 200 slide relative to each other on the test plane 30a along the first direction X. The second fixing frame 210 also has several symmetrical through holes, and the plane of any symmetrical through hole is parallel to the test plane. The test fixture 10 also includes a fixing pin 500, which is a cylinder that mates with the through hole, and the fixing pin 500 can pass through any symmetrical through hole.
[0038] Because the elastic specimen 20 has a mesh-layered structure, when the first inner ring 1111 and the second inner ring 2111 completely coincide with the edge contour line of the target layer, the elastic specimen 20 passes through the mesh of the elastic specimen 20 through a through hole opened on one side of the first fixing frame 110 or the second fixing frame 210, and finally extends out from the symmetrical through hole on the other side. Therefore, the elastic specimen 20 is fixed in the fixing cavity 400 by the fixing pins 500. This fixing method, through the cooperation of the fixing pins 500 and the through holes, makes the first fixing frame 110 and the second fixing frame 210 form symmetrical limiting constraints on both sides of the test plane 30a, and the limiting of the fixing pins 500 is parallel to the test plane 30a, ensuring that the target layer will not undergo torsional displacement when subjected to force. Simultaneously, because the target layer is tightly fitted to the inner side of the first annular bottom surface 111 and the inner side of the second annular bottom surface 211, when the sliding component 120 and the mating component 220 move relative to each other, the first fixed frame 110 and the second fixed frame 210 slide relative to each other along the first direction X on the test plane 30a. At this time, when the target layer is subjected to the relative load applied by the first fixed frame 110 and the second fixed frame 210 in the first direction X, the elastic specimen 20 will not be torsional or offset around the normal direction of the test plane 30a due to the limiting constraint, ensuring that the shear load can be accurately transmitted to the target layer interface and avoiding deviation between the measured shear force data and the actual interlayer stress state. Figure 2 As shown, in this embodiment, one end of the shear force testing device 1 is connected to the second holding member 200, and the other end is connected to the first holding member 100, so that the test plane 30a is perpendicular to the horizontal plane. The first direction X is also perpendicular to the horizontal plane. When the test starts, the end of the shear force testing device 1 connected to the second holding member 200 drives the second holding member 200 to move upward in the first direction X, and the end of the shear force testing device 1 connected to the first holding member 100 drives the first holding member 100 to move downward in the first direction X. Therefore, the target layer is subjected to the relative load applied by the first fixed frame 110 and the second fixed frame 210 in the first direction X. Due to the limiting constraint of the test fixture 10, the elastic specimen 20 will not be torsional or offset around the horizontal plane, ensuring that the shear load can be accurately transmitted to the target layer interface, so that the measured shear force data is consistent with the actual interlayer force. In actual operation, if there is an angle between the sliding direction and the test plane 30a, it may cause the sliding component 120 and the mating component 220 to introduce bending moment or torque due to the deviation of the movement direction from the plane. Therefore, in some embodiments, such as Figure 8As shown, the sliding component 120 and the mating component 220 of the test fixture 10 move relative to each other on the test plane 30a. When the sliding component 120 and the mating component 220 move relative to each other on the test plane 30a, the applied load direction is strictly parallel to the test plane 30a, ensuring that the load vector acts completely on the target interface and eliminating the interference of additional torque. At the same time, combined with the relative loads applied by the first fixed frame 110 and the second fixed frame 210 to the target layer in the first direction X, the sliding component 120 and the mating component 220 form symmetrical reaction forces on both sides of the test plane 30a. This symmetrical loading mechanism allows the target layer interface to bear uniform shear stress, avoids local stress concentration, and ensures that the load is uniformly transmitted along the test plane 30a.
[0039] In some implementations, such as Figure 5 As shown, when the first inner ring 1111 coincides with the second inner ring 2111, the inner wall of the fixing cavity 400 fits against the outer contour surface 201 of the elastic specimen, forming a geometric conjugate constraint between the inner wall of the fixing cavity 400 and the elastic specimen 20. This ensures that the position of the elastic specimen 20 within the test plane 30a is precisely defined, preventing eccentricity or tilting of the elastic specimen 20 due to installation deviations, thereby ensuring that the direction of the shear load is strictly limited to the test plane 30a. Furthermore, there are no gaps between the tightly fitted inner wall of the fixing cavity 400 and the elastic specimen 20, which effectively suppresses out-of-plane warping or in-plane sliding of the elastic specimen 20 due to load during the test.
[0040] In some implementations, such as Figure 8 As shown, the symmetrical through holes on the first holding member 100 are first symmetrical through holes 112, and the symmetrical through holes on the second holding member 200 are second symmetrical through holes 212. A plurality of first symmetrical through holes 112 are distributed on the first plane 40a, and a plurality of second symmetrical through holes 212 are distributed on the second plane 50a. Both the first plane 40a and the second plane 50a are parallel to the test plane 30a. This design allows the mesh layer 202 parallel to the test plane 30a to be limited by the fixing pins 500. Therefore, when the target layer is subjected to a relative load applied by the first fixing frame 110 and the second fixing frame 210 in the first direction X, the limitation on both sides of the target layer of the elastic specimen 20 is more stable, further reducing the probability of torsional displacement in the normal direction of the test plane 30a and improving the accuracy of shear load transfer to the target layer interface.
[0041] In some implementations, any symmetrical through-hole is perpendicular to the first direction X. If the symmetrical through-hole is in a direction other than perpendicular to the first direction, it may spatially interfere with the sliding structure or weaken the strength of the fixed frame. Figure 4As shown, when any symmetrical through hole is perpendicular to the first direction X, its distribution direction is orthogonal to the movement direction of the sliding component 120, which can avoid spatial conflict between the through hole and the sliding structure. This design can ensure that the clamping force applied by the fixing pin 500 is orthogonal to the first direction X, forming a lateral constraint on the elastic specimen 20. This design allows the shear force to act only along the first direction X on the target layer, avoiding additional torque or eccentric load during shear force testing. At the same time, it facilitates the sliding alignment of the first fixing frame 110 and the second fixing frame 210 along the first direction X, improving the assembly accuracy and force stability of the test fixture 10. On the other hand, when the first fixing frame 110 and the second fixing frame 210 slide to a fitted state along the first direction X, the symmetrical through holes perpendicular to the first direction X can be aligned by simple linear sliding (without three-dimensional angle adjustment) because their orientation is fixed, reducing the assembly difficulty.
[0042] like Figure 1 As shown, if the mesh structure is uniform but the fixing pins are non-uniformly distributed on the plane, stress concentration may occur in local areas due to the dense or sparse distribution of the fixing pins. This can easily cause deformation of the specimen, which is not the target being tested, when subjected to shear force, affecting the accurate assessment of the target's shear performance. Therefore, in some implementations, such as... Figure 8 As shown, a number of first symmetrical through holes 112 are evenly distributed on the first plane 40a, and a number of second symmetrical through holes 212 are evenly distributed on the second plane 50a. That is to say, the distance between the axis of any through hole and the axis of its adjacent through hole is the same. When the fixing pin 500 passes through the through hole to fix the elastic specimen 20, this design can ensure that the constraint force at each point on the edge of the specimen is consistent, and the shear force can be evenly transmitted along the test plane 30a, avoiding the introduction of additional bending moment or torque due to fixing deviation, and improving the accuracy of the test results.
[0043] If the mesh structure is non-uniform, with dense mesh distribution or localized reinforcement, the fixing pins can increase their density in dense areas and decrease their density in sparse areas, achieving on-demand constraint and avoiding traditional uniform distribution. Therefore, in some embodiments, a plurality of first symmetrical through holes are densely distributed on a first plane according to the mesh of the elastic specimen, and a plurality of second symmetrical through holes are densely distributed on a second plane according to the mesh of the elastic specimen. The fixing pins are densely distributed according to the mesh, avoiding load concentration on a few mesh nodes due to sparse fixing points, or specimen damage due to redundant fixing points in dense areas.
[0044] If the elastic specimen 20 is a plurality of interconnected mesh layers 202, in some embodiments, such as Figure 5As shown, the first plane 40a containing the first symmetrical through-hole 112 and the second plane 50a containing the second symmetrical through-hole 212 are both separated from the test plane 30a by a mesh layer 202. Compared to setting the first and second symmetrical through-holes with multiple mesh layers in between, separating them by one mesh layer allows the area of the elastic specimen with the fixed pin limit to be closer to the target layer. When the target layer is subjected to shear force, the applied load will be fully applied to the test plane, ensuring that the load vector is fully applied to the target interface and eliminating the interference of additional torque.
[0045] In some embodiments, the sliding assembly includes a slider and / or a slide rail, and the mating assembly includes a slide rail that mates with the sliding assembly and / or a slider that mates with the slide rail. For example... Figures 3 to 8 As shown, in a specific embodiment of this application, the outer surface of the first fixed frame 110 is provided with a first slide rail 121 and a first sliding member 122 in the radial direction of the first inner ring 1111, and the outer surface of the second fixed frame 210 is provided with a second sliding member 221 matching the first slide rail 121 and a second slide rail 222 matching the first sliding member 122 in the radial direction of the second inner ring 2111. This design forms a bidirectional constrained linear guide mechanism. This symmetrical matching structure of the slide rail and the sliding member can ensure that the first fixed frame 110 and the second fixed frame 210 slide in a high-precision straight line relative to each other along the first direction X, avoiding the skew or jamming that may occur from unilateral sliding, and ensuring the parallelism and positional accuracy of the first fixed frame 110 and the second fixed frame 210 when they are attached to the test plane 30a.
[0046] In some implementations, such as Figure 5 As shown in the figure, the track distance L of the slide rail is 0.1 to 1 times the diameter R of the first inner ring. The track distance L of the slide rail determines the magnitude of the load applied by the shear force. Therefore, in actual operation, the track distance of the slide rail is set by the elastic strength of the elastic specimen and the size of the target layer of the elastic specimen, and the track distance is greater than or equal to 0.1 times the diameter of the first inner ring and does not exceed the diameter of the first inner ring.
[0047] In some embodiments, the first fixing frame has radially symmetrically arranged limiting holes away from the first annular bottom surface, or the second fixing frame has radially symmetrically arranged limiting holes away from the second annular bottom surface, and the limiting plate passes through the limiting holes to limit the elastic specimen. In this embodiment, such as Figures 3 to 9As shown, the other end face of the second fixing frame 210 away from the second annular bottom surface 211 is the second annular top surface 213, and the other end face of the first fixing frame 110 away from the first annular bottom surface 11 is the first annular top surface 113. The second fixing frame 210 is provided with radially symmetrically arranged limiting holes 214 at the position away from the second annular bottom surface 211. When the first fixing frame 110 and the second fixing frame 210 are in contact and the first inner ring 1111 and the second inner ring 2111 are completely overlapped, the elastic specimen 20 enters the fixed cavity 400 through the first annular top surface 113. Before the elastic specimen 20 is fixed with the fixing pin 400, the limiting plate 600 supports the elastic specimen 20. On the one hand, it can prevent the elastic specimen 20 from falling off the second annular top surface 213 and prevent damage to the elastic specimen due to operational errors. On the other hand, after the limiting plate 600 supports the elastic specimen 20, it is convenient for the operator to fix the elastic specimen 20 with the fixing pin 500.
[0048] This application provides a test fixture 10 for performing shear force tests on the target layer of an elastic specimen 20 with a mesh layered structure. The plane containing the target layer is the test plane 30a. The test fixture 10 includes a first holding member 100 and a second holding member 200. The first holding member 100 includes a first fixing frame 110, which includes a first annular bottom surface 111. The inner boundary of the first annular bottom surface 111 is a first inner ring 1111. The outer surface of the first fixing frame 110 is symmetrically provided with sliding components 120 in the radial direction of the first inner ring 1111. The direction of the sliding components 120 is the first direction X. The first fixing frame 110 has a plurality of symmetrical through holes, and the plane containing any symmetrical through hole is parallel to the test plane 30a. The second holding member 200 includes a second fixing frame 210, which includes a second annular bottom surface 211. The first annular bottom surface 111 is attached to the test plane 30a. The inner boundary of the second annular bottom surface 211 is the second inner ring 2111. The second inner ring 2111 and the first inner ring 1111 are the same in size and shape. The outer surface of the second fixing frame 210 is provided with a mating component 220 that matches the sliding component 120. The second holding member 200 and the first holding member 100 slide relative to each other along the first direction X on the test plane 30a. The second fixing frame 210 has a plurality of symmetrical through holes. The plane where any symmetrical through hole is located is parallel to the test plane 30a. When the first inner ring 1111 and the second inner ring 2111 completely coincide with the edge contour line of the target layer, the first fixing frame 110 and the second fixing frame 210 form a connected fixing cavity 400. The elastic specimen 20 is fixed in the fixing cavity 400 by a fixing pin 500 passing through the symmetrical through hole. By attaching the first annular bottom surface 111 and the second annular bottom surface 211 to the test plane 30a, and forming a fixed cavity 400 when the first inner ring 1111 and the second inner ring 2111 overlap, the elastic specimen 20 is bidirectionally limited in the test plane 30a by utilizing the characteristics of the mesh layered structure. This application can significantly suppress the torsional displacement of the elastic specimen around the normal direction in the test plane, ensuring that the shear load is uniformly transmitted to the target layered interface along the preset direction, and fundamentally avoiding test data distortion caused by displacement deviation.
[0049] The above description is merely an embodiment of this application and does not limit the patent scope of this application. Any equivalent structural or procedural transformations made using the content of this application's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this application.
Claims
1. A test fixture for performing shear force testing on a target layer of an elastic specimen with a mesh-layered structure, wherein the plane containing the target layer is the test plane, characterized in that, include: The first holding member includes a first fixing frame, the first fixing frame includes a first annular bottom surface, the inner boundary of the first annular bottom surface is a first inner ring, the outer surface of the first fixing frame is symmetrically provided with sliding components in the radial direction of the first inner ring, the direction of the sliding components is a first direction, and the first fixing frame is provided with a plurality of symmetrical through holes, the plane of any symmetrical through hole is parallel to the test plane. The second holding member includes a second fixing frame, which includes a second annular bottom surface. The second annular bottom surface and the first annular bottom surface are attached to each other on the test plane. The inner boundary of the second annular bottom surface is a second inner ring. The second inner ring and the first inner ring are the same in size and shape. The outer surface of the second fixing frame is provided with a mating component that matches the sliding component. The second holding member and the first holding member slide relative to each other on the test plane along the first direction. The second fixing frame has a plurality of symmetrical through holes, and the plane where any symmetrical through hole is located is parallel to the test plane. When the first inner ring and the second inner ring completely coincide with the edge contour line of the target layer, the first fixing frame and the second fixing frame form a connected fixing cavity, and the elastic specimen is fixed in the fixing cavity by a fixing pin passing through the symmetrical through hole.
2. The test fixture of claim 1, wherein, The sliding component and the mating component move relative to each other on the test plane.
3. The test fixture of claim 2, wherein, When the first inner ring coincides with the second inner ring, the inner wall of the fixed cavity fits against the outer contour surface of the elastic specimen.
4. The test fixture of claim 3, wherein, The symmetrical through holes on the first holding member are first symmetrical through holes, and the symmetrical through holes on the second holding member are second symmetrical through holes. A plurality of the first symmetrical through holes are distributed on a first plane, and a plurality of the second symmetrical through holes are distributed on a second plane. Both the first plane and the second plane are parallel to the test plane.
5. The test fixture of claim 4, wherein, Any symmetrical through hole is perpendicular to the first direction.
6. The test fixture of claim 5, wherein, A plurality of first symmetrical through holes are uniformly distributed on the first plane, and a plurality of second symmetrical through holes are uniformly distributed on the second plane.
7. The test fixture of claim 6, wherein, A plurality of first symmetrical through holes are closely distributed on the first plane according to the mesh of the elastic specimen, and a plurality of second symmetrical through holes are closely distributed on the second plane according to the mesh of the elastic specimen.
8. The test fixture of claim 6 or 7, wherein, The elastic specimen consists of several interconnected mesh layers, with the first plane separated from the test plane by one mesh layer, and the second plane separated from the test plane by one mesh layer.
9. The test fixture of claim 8, wherein, The sliding assembly includes a slider and / or a slide rail, and the mating assembly includes a slide rail that matches the sliding assembly and / or a slider that matches the slide rail.
10. The test fixture as described in claim 9, characterized in that, The track distance of the slide rail is 0.1 to 1 times the diameter of the first inner ring.
11. The test fixture of claim 10, wherein, The first fixing frame has radially symmetrically arranged limiting holes away from the first annular bottom surface, or the second fixing frame has radially symmetrically arranged limiting holes away from the second annular bottom surface, and the limiting plate passes through the limiting holes to limit the elastic specimen.