一种Micro-OLED缺陷检测设备

Abstract

本实用新型公开了一种Micro‑OLED缺陷检测设备,属于光学检测设备技术领域，包括底座、立柱、相机和治具，立柱的下端固定在底座上，立柱上设有第一升降调节机构，相机通过第一支撑座支撑于第一升降调节机构上，相机的镜头朝向下方，治具可滑动的设置于底座上且位于相机镜头的正下方。其结构简单，使用方便，检测时，工作人员只需要将待测OLED装配在治具上，然后通过相机分别拍摄点亮和熄灭时的画面，并传输至PC端进行自动分析判断是否存在缺陷，大大降低了劳动强度，提高了检测效果和检测的准确性，还不易出现漏检；另外，治具不仅保证了工件放置的一致性，而且可以对待测OLED快速点亮，并且不会对OLED软排线的金手指造成损坏，保证了产品的合格率。

Claims

1. A Micro-OLED defect detection apparatus, characterized by: The device includes a base, a column, a camera, and a fixture. The lower end of the column is fixed to the base, and the column is provided with a first lifting adjustment mechanism. The camera is supported on the first lifting adjustment mechanism via a first support base, and the camera lens faces downward. The fixture is slidably disposed on the base and located directly below the camera lens. The first lifting adjustment mechanism includes a first slide block, a first rack, a first gear, and a first handle. The first slide block is slidably engaged with the column. The first rack is vertically mounted on the column. The first gear is supported on the first slide block by a first rotating shaft. The first gear meshes with the first rack. The first handle is located at one end of the first rotating shaft. Alternatively, the first lifting adjustment mechanism includes a first slide block, a first lead screw, a first nut, and a first motor. The first slide block is slidably engaged with the column. The two ends of the first lead screw are rotatably supported on the column and correspond to the first slide block. The first nut is sleeved on the first lead screw and threadedly engaged. The first nut is also fixedly connected to the first slide block. The first motor is mounted on the column and located at one end of the first lead screw. The output shaft of the first motor is drively connected to one end of the first lead screw.

2. The Micro-OLED defect detection apparatus of claim 1, wherein: The column is also provided with a second lifting adjustment mechanism, which is located below the first lifting adjustment mechanism. The second lifting adjustment mechanism is provided with a second support base, which is located below the camera. The second support base is provided with a through hole, the axis of which coincides with the axis of the camera lens. A light source is provided on the lower side of the second support base.

3. The Micro-OLED defect detection apparatus of claim 2, wherein: The light source is a ring-shaped light source and surrounds the through hole.

4. The Micro-OLED defect detection apparatus of claim 2, wherein: The second lifting adjustment mechanism includes a second slide block, a second rack, a second gear, and a second handle. The second slide block is slidably engaged with the column and located below the first slide block. The second rack is vertically mounted on the column. The second gear is supported on the second slide block by a second rotating shaft. The second gear meshes with the second rack. The second handle is located at one end of the second rotating shaft.

5. The Micro-OLED defect detection apparatus of claim 2, wherein: The second lifting adjustment mechanism includes a second slide block, a second lead screw, a second nut, and a second motor. The second slide block is slidably engaged with the column. The two ends of the second lead screw are rotatably supported on the column and correspond to the second slide block. The second nut is sleeved on the second lead screw and threadedly engaged. The second nut is also fixedly connected to the second slide block. The second motor is mounted on the column and located at one end of the second lead screw. The output shaft of the second motor is drively connected to one end of the second lead screw.

6. The Micro-OLED defect detection apparatus of claim 1, wherein: The fixture is pressed onto the base by multiple pressure blocks.

7. The Micro-OLED defect detection apparatus of claim 6, wherein: The fixture includes a vacuum seat, an insulating seat, and a cover plate. The vacuum seat has a recessed groove at its upper end, and the insulating seat is disposed within the recessed groove. A groove is provided at one edge of the insulating seat, and an OLED flexible flat cable carrier is disposed within the groove. The OLED flexible flat cable carrier has an OLED flexible flat cable positioning groove. One end of the cover plate is hinged to one end of the insulating seat, and the other end of the cover plate is snapped into the other end of the insulating seat. The cover plate has a mounting hole corresponding to the OLED flexible flat cable carrier, and a probe holder fixing plate is disposed within the mounting hole. A probe holder is disposed on the side of the probe holder fixing plate facing the OLED flexible flat cable carrier. A control circuit board is disposed on the top of the cover plate, and the control circuit board is electrically connected to the probes on the probe holders. The vacuum seat has an OLED main body positioning groove corresponding to the OLED flexible flat cable carrier, and a vacuum adsorption hole is disposed within the OLED main body positioning groove.

8. The Micro-OLED defect detection apparatus of claim 7, wherein: A probe guide plate is provided on the side of the probe holder away from the probe holder fixing plate. The probe guide plate has a probe guide hole. The probe on the probe holder is inserted into the probe guide hole. The probe guide plate and the probe holder fixing plate are connected by a spring.

Images