一种芯片测试夹具

By introducing a loading channel and a lifting drive device into the chip testing fixture, the problems of complex operation and dust entry caused by frequent cover flipping are solved, realizing automatic chip loading and stable positioning, and improving testing efficiency and accuracy.

CN224518771UActive Publication Date: 2026-07-17GUIZHOU U-TECH COMM TECH CO LTD
View PDF 0 Cites 0 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
GUIZHOU U-TECH COMM TECH CO LTD
Filing Date
2025-06-30
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

Existing chip test fixtures require frequent flipping of the cover plate during clamping, which is complicated and easily introduces dust, affecting the accuracy of test results.

Method used

The system employs a feeding channel and a lifting drive device. The feeding pusher plate places the chip on the chip placement platform, and the lifting drive device drives the lifting rod and lifting slider to achieve automatic chip feeding and positioning. Combined with the knob to drive the lifting nut to descend and tighten the chip, the system reduces the entry of dust.

Benefits of technology

It enables automatic chip loading and stable positioning, improves testing efficiency and accuracy, reduces the impact of dust on test results, and ensures the accuracy of test results.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN224518771U_ABST
    Figure CN224518771U_ABST
Patent Text Reader

Abstract

本实用新型公开一种芯片测试夹具，包括PCB测试板、设于PCB测试板上的芯片测试底座和设于芯片测试底座上的探针转接块，芯片测试底座一侧开设有贯通到探针转接块处的上料通道，上料通道内滑动连接有平行滑动伸出芯片测试底座的上料推板，上料推板上设有芯片放置台，芯片放置台与上料推板升降连接，芯片测试底座上还铰接有芯片压紧盖；实现通过上料推板将芯片沿通道推入放置台，驱动推杆带动齿轮驱动丝杆使放置台下降，使芯片接触探针转接块，随后旋转旋钮驱动压紧台下压固定芯片进行测试，其有益效果是采用滑入式送料和下压固定方式，避免了翻转盖板操作，使探针转接块始终处于封闭状态，有效防止灰尘进入，提高测试准确性。
Need to check novelty before this filing date? Find Prior Art

Claims

1. A chip testing fixture comprising a PCB testing board, a chip testing base provided on the PCB testing board, and a probe adapter block provided on the chip testing base, characterized in that, The chip test base has a feeding channel on one side that extends to the probe adapter block. A feeding pusher plate that slides parallel to the chip test base is slidably connected in the feeding channel. A chip placement platform is provided on the feeding pusher plate. The chip placement platform is liftably connected to the feeding pusher plate. A chip clamping cover is also hinged to the chip test base.

2. The chip test fixture of claim 1, wherein, The feeding push plate is rotatably equipped with a lifting rod, and the lifting rod is equipped with a lifting slider. The lifting slider is connected to the chip placement platform. The feeding push plate is also equipped with a lifting drive device for driving the lifting rod to rotate.

3. The chip test fixture of claim 2, wherein, The lifting drive device includes a drive channel on the feeding push plate, the drive channel being located below the lifting rod, a drive gear connected to the bottom of the lifting rod being provided in the drive channel, a drive push rod being connected to the feeding push plate, and a drive rack being provided on the drive push rod, the drive rack meshing with the drive gear.

4. The chip test fixture of claim 1, wherein, The chip clamping cover includes a cover plate hinged to the chip test base and a knob on the cover plate. A lifting nut extending through the top of the cover plate is connected to the top of the cover plate. The top of the lifting nut is embedded in the knob. The knob is fixed by screws. Rotating the knob lowers the lifting nut.

5. The chip test fixture of claim 4, wherein, The bottom of the lifting nut is equipped with a clamping platform for contacting the chip to be tested. The descending lifting nut pushes the clamping platform to clamp the chip.

6. The chip test fixture of claim 4, wherein, A locking plate is rotatably mounted on one side of the cover plate, and a hook is provided at the bottom of the locking plate. A carding platform is provided on one side of the chip test base, and the hook is hooked on the carding platform. The cover plate is fixed to the chip test base.

7. The chip test fixture of claim 1, wherein The probe adapter block has a placement channel on its side, and the chip placement stage supports the chip through an extended support plate. The placement channel is the same size as the support plate.

8. The chip test fixture of claim 1, wherein, The probe adapter block is equipped with a spring-loaded retractable pin, one end of which is connected to the PAD point on the bottom PCB board, and the other end is connected to the PAD point on the chip.