可快速拆卸的二极管测试封装座
By designing a detachable diode test package holder, and adopting a T-block and slot matching and telescopic cylinder structure, the problem of poor fixture adaptability is solved, realizing flexible adaptation and stable clamping of diodes of different sizes, improving testing efficiency and equipment adaptability.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- DONGGUAN HUIHENG ELECTRONIC TECH CO LTD
- Filing Date
- 2025-07-28
- Publication Date
- 2026-07-17
AI Technical Summary
Existing quick-release diode test package mounts have fixed clamp dimensions, making it difficult to adapt to diodes of different sizes, resulting in clamping difficulties, reduced testing efficiency, and reduced equipment adaptability.
A diode test package holder comprising a base, a fixing mechanism, and a clamping mechanism was designed. It adopts a T-block and T-slot for precise matching, a telescopic cylinder and spring structure, and is equipped with a variety of arc plates to accommodate diodes of different sizes. An anti-slip layer and anti-slip texture are set on the bottom of the base, and alloy steel is used to improve stability and strength.
It enables flexible adaptation to diodes of different sizes, is easy to operate, has stable clamping, improves testing efficiency, extends equipment life, and meets diverse testing needs.
Smart Images
Figure CN224518781U_ABST
Abstract
Claims
1. A quick-detachable diode test package holder, comprising a base (1), a body (2), a fixing mechanism (3), and a clamping mechanism, characterized in that: The main body (2) is connected to the base (1) via the fixing mechanism (3). The fixing mechanism (3) includes a frame (4), a telescopic cylinder (5), a connecting plate (6), a spring (7), a fixing block (8), a cylinder (9), a T-slot (10), a T-block (11), a square block (12), an arc plate (13), and a limiting rod (14). One end of the telescopic cylinder (5) is connected to the top of the base (1), and the other end of the telescopic cylinder (5) is connected to one end of the connecting plate (6). The other end of the connecting plate (6) is connected to the frame (4). One end of the spring (7) is connected to the frame (4), and the other end of the spring (7) is connected to the fixing block (8). One end of the cylinder (9) is connected to the top of the fixing block (8), and the other end of the cylinder (9) passes through the frame (4). 4) The cylinder (9) is located inside the spring (7), the T-slot (10) is opened on the fixing block (8), one end of the T-block (11) extends into the T-slot (10), the other end of the T-block (11) is connected to one end of the block (12), the other end of the block (12) is connected to the arc plate (13), the arc plate (13) abuts against the outer wall of the body (2), the bottom of the body (2) contacts the top of the base (1), one end of the limiting rod (14) is connected to the block (12), the other end of the limiting rod (14) passes through the frame (4), the clamping mechanism includes a sliding component (15) and a clamping piece (16), the clamping piece (16) is connected to the base (1) through the sliding component (15), and there are two clamping mechanisms.
2. The quick detachable diode test socket of claim 1, wherein: The base (1) has an anti-slip layer at the bottom, and the anti-slip layer is fixedly connected to the bottom of the base (1).
3. The quick detachable diode test socket of claim 2, wherein: The bottom of the anti-slip layer is provided with anti-slip texture, and the anti-slip texture has several lines.
4. The quick detachable diode test socket of claim 3, wherein: The T-block (11) matches the T-slot (10).
5. The quick disconnect diode test socket of claim 4, wherein: The two clamping mechanisms are arranged symmetrically.
6. The quick disconnect diode test socket of claim 5, wherein: The base (1) is made of alloy steel.