一种高频同轴测试插座

By designing the fixed post, movable frame, and limiting component structure of the high-frequency coaxial test socket, the problem of chip offset and shaking during the testing process was solved, improving the accuracy and efficiency of the test.

CN224518795UActive Publication Date: 2026-07-17SUZHOU HSTEED TECH CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
SUZHOU HSTEED TECH CO LTD
Filing Date
2025-08-11
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

Existing high-frequency coaxial test sockets suffer from problems such as easy chip displacement, insufficient positioning, inaccurate guidance, unstable fixing and support, and low testing efficiency in the chip fixing and testing process.

Method used

A high-frequency coaxial test socket is designed, which adopts a fixed post and movable frame structure, combined with limiting components, guide rods and telescopic posts, to achieve stable fixation and precise guidance of the chip. The design of the fixed post and movable frame, through the combination of the fixed post and movable frame, ensures that the chip remains stable during the test. Combined with the design of springs and fixing rings, it prevents the movable frame from shifting and shaking, thus realizing the fixation of the chip and the connection of the test slot.

Benefits of technology

It achieves efficient chip fixation and testing, improving the accuracy and efficiency of testing.

✦ Generated by Eureka AI based on patent content.

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Abstract

本实用新型公开了同轴测试插座技术领域的一种高频同轴测试插座,包括测试插座的检测座,所述检测座顶部且位于四个拐角分别固定连接有固定柱,所述固定柱贯穿安装有活动框,所述活动框中心处开设有放置孔,所述检测座顶部且位于放置孔正下方开设有检测槽,所述检测槽底部固定连接有矩形排列的多个伸缩柱,保护垫能够对芯片待测件进行保护,防止芯片发生偏移或受到干扰,利用固定柱对活动框进行导向和限位,防止活动框发生偏移或晃动,即待测芯片件插入活动框内侧的放置孔内,可使待测芯片与检测槽内的伸缩柱连接,使检测座与芯片电性连接,并外接测试设备来实现测试。
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Claims

1. A high frequency coaxial test socket comprising a test socket detection seat (1), characterized in that: The top of the test base (1) and at its four corners are fixedly connected to fixed posts (2), and a movable frame (3) is installed through the fixed posts (2). A placement hole (4) is opened at the center of the movable frame (3). A test groove (5) is opened at the top of the test base (1) and directly below the placement hole (4). A plurality of telescopic posts (6) arranged in a rectangle are fixedly connected to the bottom of the test groove (5). The test groove (5) corresponds to the placement hole (4). Limiting members for fixing the chip under test are installed on the inner side of the movable frame (3) and on both sides of the placement hole (4). The telescopic posts (6) are conductive.

2. A high frequency coaxial test socket according to claim 1, characterized in that: The four corners of the detection seat (1) and the four corners of the movable frame (3) are respectively provided with grooves (7). A spring (8) is fitted on the outside of the fixed column (2). The bottom of the spring (8) is fixedly connected to the detection seat (1). The spring (8) is located in the groove (7) and fits and supports the movable frame (3). A fixing ring (9) is fitted and screwed on the top of the fixed column (2).

3. A high frequency coaxial test socket according to claim 2, characterized in that: The limiting component includes fixing grooves (10) respectively opened on both sides of the placement hole (4). A guide rod (11) is fixedly connected to the inside of the fixing groove (10) and near the bottom. A tension spring (12) is fitted on the outside of the guide rod (11). A limiting strip (13) is fixedly connected to one end of the tension spring (12). The guide rod (11) passes through the limiting strip (13) and is slidably connected to it.

4. A high frequency coaxial test socket according to claim 3, wherein: The outer side of the detection seat (1) is fixedly connected with three sets of positioning rods (14), each set of positioning rods (14) includes three rods, and the positioning rods (14) pass through the movable frame (3) and are movably connected to it.

5. A high frequency coaxial test socket according to claim 3, wherein: The bottom of the movable frame (3) and the edge of the placement hole (4) are covered with a protective pad (15).

6. A high frequency coaxial test socket according to claim 5, wherein: An elastic strip (16) is fixedly connected to the inside of the fixing groove (10) and at the top, and the inside of the elastic strip (16) is a hollow cavity.

7. A high frequency coaxial test socket according to claim 4, wherein: A pull block (17) is fixedly connected to the top of the limiting strip (13).