一种电性检测探针

By designing the tilt angle and material selection of the detection and mating parts, the problems of false signals and dust interference in LED bracket testing by electrical testing probes were solved, achieving high accuracy and sensitivity in electrical testing.

CN224518804UActive Publication Date: 2026-07-17吉安市木林森电子有限公司

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
吉安市木林森电子有限公司
Filing Date
2025-04-17
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

In the testing of LED semi-finished product brackets, the existing electrical testing probes are prone to bridging adjacent pins or conductive layers due to their wide contact surface, resulting in false conduction signals. Furthermore, dust interferes with the identification of weak electrical differences, affecting the accuracy of the test.

Method used

Design an electrical detection probe with a detection section width smaller than the mating section and an inclination angle of 60° to 80°. The mating section has an inclination angle of 20° to 40°. The probe is made of a material with excellent compressive strength and conductivity to avoid dust accumulation. It is combined with an ion air knife to remove static electricity and dust.

Benefits of technology

It improves the accuracy and sensitivity of electrical detection, avoids dust interference, and ensures the stability and reliability of the detection function.

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Abstract

本实用新型公开一种电性检测探针,包括探针柄端以及与所述探针柄端相接的探针检测端,所述探针检测端上设有用于接触产品以检测电性的检测部以及与所述检测部相邻倾斜设置的配合部,所述检测部的宽度比所述配合部的宽度小。所述检测部能够接触产品以检测电性,其宽度设置比所述配合部的宽度小,能够在保障实现检测功能的同时避免环境因素如粉尘对电性检测的影响。
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Claims

1. An electrical detection probe, characterized in that, It includes a probe handle end (1) and a probe detection end (2) connected to the probe handle end (1). The probe detection end (2) is provided with a detection part (21) for contacting the product to detect electrical properties and a mating part (22) that is inclined adjacent to the detection part (21). The width of the detection part (21) is smaller than the width of the mating part (22).

2. The electrical detection probe of claim 1, wherein, The width of the detection part (21) is a, and the length of a is set to 0.1 to 0.3 mm.

3. The electrical detection probe of claim 2, wherein, The width a of the detection section (21) is 0.2 mm.

4. The electrical detection probe of claim 1, wherein, The angle of inclination of the surface where the detection part (21) is located relative to the axis of the probe handle (1) is α, and the angle of α is set between 60° and 80°.

5. The electrical detection probe of claim 4, wherein, The angle α of the plane where the detection part (21) is located relative to the axis of the probe handle (1) is 72°.

6. The electrical detection probe according to claim 1, characterized in that, The angle of inclination of the mating part (22) relative to the axis of the probe handle (1) is β, and the angle of β is set between 20° and 40°.

7. The electrical detection probe of claim 6, wherein, The angle β of the plane where the mating part (22) is located relative to the axis of the probe handle end (1) is 30°.

8. The electrical detection probe of claim 1, wherein, The probe handle end (1) is provided with a wire hole (11) for connecting wires on the side away from the probe detection end (2), and a locking protrusion (12) for positioning and installing the electrical detection probe is provided on the side of the probe handle end (1) close to the probe detection end (2).

9. The electrical detection probe of claim 1, wherein, The detection unit (21) is made of tungsten steel.

10. The electrical detection probe of claim 1, wherein, Two mating parts (22) are provided, and the mating parts (22) are symmetrically arranged on both sides of the detection part (21).