一种电子元件高功率老化测试装置
By designing a high-power aging test device suitable for electronic components, the problems of inconvenient operation, poor soldering reliability, and inaccurate temperature monitoring in the existing technology have been solved, achieving efficient and accurate test results and wide applicability.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- QUANZHOU HUOJU ELECTRONIC CO LTD
- Filing Date
- 2025-07-31
- Publication Date
- 2026-07-17
AI Technical Summary
Existing high-power aging test methods suffer from problems such as inconvenient operation, poor welding reliability, insufficient test stability and safety, inability to accurately monitor temperature, and low versatility.
A high-power aging test device for electronic components was designed, comprising a ceramic substrate, a pressurizing mechanism, and a temperature measuring mechanism. The pressurizing probe is stably connected to the solder strip, and the temperature measuring probe is set to detect the temperature in real time, adapting to ceramic substrates and resistors of different specifications.
It improves the accuracy and reliability of testing, simplifies the operation process, reduces costs and workload, adapts to the testing needs of resistors of different specifications, and ensures the accuracy and stability of test data.
Smart Images
Figure CN224518805U_ABST