一种导通检测治具

Abstract

本实用新型公开了一种导通检测治具，涉及导通检测治具技术领域。本实用新型包括治具，所述治具作为整个检测装置的基础承载结构，提供产品放置区域，并承载其他部件，所述治具的顶部安装有产品，所述产品是被检测的对象，其内部的线路和天线等结构是导通检测的目标。本实用新型通过在治具上设置探针一与探针二，它们能在检测时分别与产品上不同的检测部位接触，改变了以往一次只能检测一个位置的局限，实现了同时对产品内线路及天线等结构的多部位检测，大大提升了检测效率。

Claims

1. A conduction detection fixture, characterized by: Includes a fixture (1), which serves as the basic support structure for the entire testing device, provides a placement area for the product (6), and supports other components; The product (6) is mounted on the top of the fixture (1). The product (6) is the object to be tested, and its internal circuitry and antenna structure are the targets of continuity testing. The fixture (1) is equipped with a probe (2), which contacts the corresponding detection part on the product (6) during detection. The fixture (1) is equipped with a probe (3), which contacts another detection part on the product (6) during detection.

2. The turn-on detection fixture of claim 1, wherein The probe one (2) and probe two (3) come into contact with different detection parts on the product (6) during detection, completing the transmission of signals between the fixture (1) and the product (6) to achieve multi-part detection.

3. The turn-on detection fixture of claim 2, wherein The fixture (1) is equipped with a conductive spring (4), which is fixed to the fixture (1) by a snap-fit ​​structure.

4. The turn-on detection fixture of claim 3, wherein The conductive spring (4) makes elastic contact with the probe (3) to distribute the signal to the probe (3).

5. The turn-on detection fixture of claim 4, wherein The fixture (1) is equipped with an electronic component (5), which is connected to probe one (2) and probe two (3) by a line, so as to receive the detection signal transmitted back from probe one (2) and probe two (3).

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