探针组件和PCB检测设备
By employing a first circuit board and a second circuit board design in the probe assembly, the angular position of the probe is kept stable, solving the problem of skewness in traditional probe assemblies and improving the accuracy and efficiency of PCB inspection.
CN224518808UActive Publication Date: 2026-07-17SUZHOU IND PARK HIDEA MECHATRONICS TECH
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SUZHOU IND PARK HIDEA MECHATRONICS TECH
- Filing Date
- 2025-08-07
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
Traditional probe assemblies are prone to probe misalignment in PCB inspection, which affects inspection accuracy and efficiency.
Method used
A probe assembly was designed, including a first circuit board and a second circuit board. The probe is fixed between the two and connected to the electrical signal output terminal through an electrical signal output connector to keep the angular position of the probe stable and avoid skewing.
Benefits of technology
It effectively suppresses probe misalignment, improves detection accuracy and efficiency, ensures alignment between the probe and the test point, and enhances the quality of PCB inspection.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN224518808U_ABST
Abstract
本申请涉及PCB检测技术领域，尤其是涉及一种探针组件和PCB检测设备。探针组件包括：第一电路板；第二电路板，沿第三方向与所述第一电路板隔开，且固定到所述第一电路板；多个探针，沿所述第三方向延伸，每个所述探针均固定到所述第一电路板和所述第二电路板，与所述第一电路板和所述第二电路板中的至少一者电性连接，具有从所述第二电路板的与所述第一电路板的相反侧伸出的探测端；电信号输出连接器，配置在所述第一电路板和所述第二电路板之间，并包括多个电信号输出端子，每个所述电信号输出端子与所述第一电路板和所述第二电路板中的至少一者电性连接。
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