双备份充放电测试系统以及双备份充放电测试设备
By introducing a fault detection module and an intelligent switching control module into the electric vehicle testing system, real-time monitoring and switching of functional units were achieved, solving the problem of test interruption caused by equipment failure and improving the reliability and stability of the testing system.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- XIAN LINGCHONG DIGITAL ENERGY TECH CO LTD
- Filing Date
- 2025-06-27
- Publication Date
- 2026-07-17
AI Technical Summary
In existing electric vehicle testing systems, the dual backup bus communication module and dual backup conference system unit cannot avoid test termination due to equipment failure, resulting in poor test continuity and reliability.
The dual-backup charge-discharge test system consists of a fault detection module, an intelligent switching control module, and a backup test module. The fault detection module monitors the status of the functional units in real time, and the intelligent switching control module switches to the backup functional unit for testing, ensuring the continuity and accuracy of the test.
This improves the reliability and stability of the electric vehicle testing system, ensuring the continuity and accuracy of charge and discharge testing.
Smart Images
Figure CN224518858U_ABST
Abstract
Claims
1. A dual backup charge and discharge test system, characterized by, The dual-backup charge-discharge test system includes: a fault detection module, an intelligent switching control module, a main test module, and a backup test module. The multiple functional units deployed in the main test module correspond one-to-one with the multiple functional units deployed in the backup test module. The input terminal of the fault detection module is connected to the main test module and the backup test module, the output terminal of the fault detection module is connected to the input terminal of the intelligent switching control module, and the output terminal of the intelligent switching control module is connected to the enable terminal of each of the functional units. The fault detection module is used to detect the working status of each functional unit and send a fault detection signal to the intelligent switching control module. Under the action of the fault detection signal, the intelligent switching control module switches the test path of the faulty functional unit to the test path of the corresponding normal functional unit.
2. The dual backup charge and discharge test system of claim 1, wherein, The intelligent switching control module includes: multiple intelligent switching circuits, with one intelligent switching circuit corresponding to two functional units of a set of functions; The normally closed contact of each of the intelligent switching circuits is connected to the enable terminal of a functional unit in the main test module, and the normally open contact of each of the intelligent switching circuits is connected to a functional unit in the backup test module.
3. The dual backup charge and discharge test system of claim 2, wherein, The multiple intelligent switching circuits each include: optocouplers, transistors, and relays; The first input terminal of the optocoupler is connected to the output terminal of the fault detection module. The second input terminal of the optocoupler and the input terminal of the relay are both used to connect to a DC power supply. The first output terminal of the optocoupler and the emitter of the transistor are both grounded. The second output terminal of the optocoupler is connected to the base of the transistor, the collector of the transistor is connected to the control terminal of the relay, the normally closed contact of the relay is connected to the enable terminal of a functional component in the main test module, and the normally open contact of the relay is connected to the enable terminal of a functional component in the backup test module.
4. The dual backup charge and discharge test system of claim 3, wherein, The optocoupler includes: a light-emitting diode and a phototransistor; The positive terminal of the light-emitting diode is connected to the output terminal of the fault detection module, the negative terminal of the light-emitting diode is grounded, and the light-emitting diode is connected to the base of the phototransistor via photocoupler. The collector of the phototransistor is connected to a DC power supply, and the emitter of the phototransistor is connected to the base of the phototransistor.
5. The dual backup charge and discharge test system of claim 4, wherein, Each of the multiple intelligent switching circuits further includes: a first resistor, a second resistor, and a third resistor; The fault detection module is connected to the positive terminal of the light-emitting diode in the optocoupler via the first resistor; The emitter of the phototransistor is connected to one end of the second resistor, and the other end of the second resistor is connected to the base of the phototransistor. One end of the third resistor is connected to the other end of the second resistor and the base of the transistor, while the other end of the third resistor and the emitter of the transistor are both grounded.
6. The dual backup charge and discharge test system of claim 3, wherein, The relay includes: an electromagnetic coil; One end of the electromagnetic coil is connected to a DC power supply, and the other end of the electromagnetic coil is connected to the collector of the transistor.
7. The dual backup charge and discharge test system of claim 1, wherein, The multiple functional units are: a data acquisition unit, a charge / discharge control unit, a data processing server, and a test report generation unit; The sampling terminals of the data acquisition unit, the charging and discharging control unit, the data processing server, and the test report generation unit are all connected to the input terminal of the fault detection module. The enable terminals of the data acquisition unit, the charging and discharging control unit, the data processing server, and the test report generation unit are all connected to the output terminal of the intelligent switching control module. The data acquisition unit is used to collect test data in real time during the charging and discharging test of the external device. The charging and discharging control unit is used to control the charging and discharging test of the dual backup charging and discharging test system. The data processing server is used to parse the test data and send the parsing results to the test report generation unit. The test report generation unit generates a test report for the external device based on the parsing results.
8. The dual backup charge and discharge test system of claim 6, wherein, Each of the multiple intelligent switching circuits also includes: a diode; The input terminal of the diode is connected to the other end of the electromagnetic coil and the collector of the transistor, respectively, and the output terminal of the diode is connected to one end of the electromagnetic coil.
9. The dual backup charge and discharge test system of claim 1, wherein, The fault detection module includes at least one fault detection circuit.
10. A dual backup charge and discharge test apparatus, characterized by, The dual-backup charge-discharge test equipment is equipped with the dual-backup charge-discharge test system as described in any one of claims 1-9.