多工位电子元器件老化测试设备
By designing clamping and protection devices for multi-station electronic component aging test equipment, the problems of inaccurate testing and low operating efficiency caused by component shaking during aging testing are solved. Stable clamping and display protection are achieved, improving the practicality and convenience of the equipment.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SUZHOU ERDONG ELECTRONIC TECH CO LTD
- Filing Date
- 2025-07-09
- Publication Date
- 2026-07-17
AI Technical Summary
In existing technologies, electronic components are prone to shaking during aging tests, leading to inaccurate test data and difficulty in flexibly clamping and adjusting multiple stations, thus reducing operational efficiency.
A multi-station electronic component aging test device was designed, including a clamping device and a protective device. The clamping device realizes multi-station adjustable clamping through components such as limit rods, push rods and rotating rings, and the protective device protects the data display screen through components such as support plates and protective plates.
This achieves stable clamping of components, preventing shaking from affecting the accuracy of test data, improving operational efficiency, protecting the data display screen, and enhancing the practicality and convenience of the equipment.
Smart Images
Figure CN224518862U_ABST
Abstract
Claims
1. Multi-station electronic component burn-in test equipment, characterized in that, The device includes an aging test machine body (1), on which a data display screen (2) is mounted. A clamping device (3) is provided on the surface of the aging test machine body (1). The clamping device (3) includes a long plate (301), which is fixedly connected to the surface of the aging test machine body (1). Two push rods (302) are slidably inserted in the long plate (301). One end of each of the two push rods (302) is fixedly connected to a clamping plate (303). Short rods (304) are fixedly connected to the surface of the long plate (301). A strip plate (306) is slidably connected to the arc surface of each of the two short rods (304). A limiting rod (307) is slidably inserted in the strip plate (306). One end of the limiting rod (307) is fixedly connected to a circular plate (309). Several limiting holes are opened on the arc surface of the push rod (302).
2. The multi-site electronic component burn-in test apparatus of claim 1, wherein: The arc surface of the limiting rod (307) is fitted with a spring (308), and the two ends of the spring (308) are fixedly connected to the circular plate (309) and the strip plate (306) respectively.
3. The multi-site electronic component burn-in test apparatus of claim 1, wherein: The short rod (304) has a rotating ring (305) rotatably connected to its arc surface. The surface of the rotating ring (305) is fixedly connected to the strip plate (306). The surface of the long plate (301) has two recycling grooves.
4. The multi-site electronic component burn-in test apparatus of claim 1, wherein: Two positioning plates (310) are fixedly connected to the surface of the long plate (301), and the size of the limiting rod (307) is adapted to the size of the limiting hole on the arc surface of the push rod (302).
5. The multi-site electronic component burn-in test apparatus of claim 1, wherein: The surface of the aging test machine body (1) is provided with a protective device (4). The protective device (4) includes two support plates (41). The two support plates (41) are fixedly connected to the surface of the aging test machine body (1). A rotating rod (42) is fixedly connected to one side of the two support plates (41) that are close to each other. A protective plate (44) is rotatably connected to the arc surface of the rotating rod (42). A connecting frame (45) is fixedly connected to one side of the support plate (41). A fixing rod (46) is slidably inserted in the connecting frame (45). A fixing hole is opened on the surface of the protective plate (44).
6. The multi-site electronic component burn-in test apparatus of claim 5, wherein: The arc surface of the fixing rod (46) is fixedly connected to the baffle (47), and the size of the fixing rod (46) is adapted to the size of the fixing hole on the surface of the protective plate (44).
7. The multi-site electronic component burn-in test apparatus of claim 5, wherein: The rotating rod (42) has two torsion springs (43) on its arc surface. The two ends of the torsion springs (43) are fixedly connected to the support plate (41) and the protective plate (44) respectively.