一种多并网点同步的一次调频性能测试的测试装置
The integrated testing device combines a voltage and frequency source with a data analysis system. It employs a dual-core processor and modular acquisition units, which solves the problem of synchronizing multiple grid-connected points in the primary frequency regulation performance test of new energy power plants, and achieves efficient and accurate testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- ELECTRIC POWER RES INST OF EAST INNER MONGOLIA ELECTRIC POWER
- Filing Date
- 2025-07-31
- Publication Date
- 2026-07-17
AI Technical Summary
The current testing of primary frequency regulation performance of new energy power plants requires multiple testers, resulting in low testing efficiency, and existing tools are insufficient to meet the testing needs of multiple grid-connected points.
The integrated testing device combines the voltage and frequency source with the test data analysis system into one device. It is equipped with a dual-core processor and modular acquisition unit, supports synchronous testing at multiple grid points, and can be completed by a single person with a single device.
It improves testing efficiency and accuracy, reduces the difficulty for testers, enables synchronous testing of multiple grid connection points, and meets the testing requirements of primary frequency regulation.
Smart Images
Figure CN224518869U_ABST
Abstract
Claims
1. A test device for multi-point-of-grid synchronization primary frequency modulation performance test, characterized in that, include: The system includes a main control unit and an acquisition unit, which communicate with each other via an optical fiber receiving module. The main control unit integrates a first processor and a second processor, which communicate with each other via an on-chip bus. The first processor communicates with the acquisition unit, the current and voltage output module, and the voltage and frequency retrieval module. The acquisition unit is a pluggable voltage secondary conversion module and / or a pluggable current secondary conversion module. The voltage secondary conversion module uses a transformer-type voltage secondary converter and an active Chebyshev filter. The current secondary conversion module uses a non-contact current clamp to convert the current signal into a milliampere-level microcurrent signal, and then connects a sampling resistor in series to convert the microcurrent signal into a small voltage signal before connecting it to the active Chebyshev filter. The second processor communicates with a host computer.
2. The test device for testing the performance of a P-F of multiple grid points synchronization according to claim 1, wherein, The first processor is an FPGA, and the second processor is an ARM.
3. The test device for testing the performance of a P-P synchronous primary frequency modulation according to claim 1, wherein, The current and voltage output module includes a DA conversion module and a power amplifier; the first processor communicates with the DA conversion module via an SPI bus.
4. The test device for testing the performance of a P-V curve of a plurality of grid points according to claim 3, wherein, The power amplifier is equipped with multiple current output interfaces and multiple voltage output interfaces.
5. The test apparatus for primary frequency modulation performance testing of multi-grid point synchronization as described in claim 1, characterized in that, The voltage and frequency sampling module includes an AD conversion module and a secondary PT converter; the first processor communicates with the AD conversion module via an SPI bus.
6. The test device for testing the performance of a P-V curve synchronization primary frequency modulation according to claim 1, wherein, The acquisition unit is connected to the first processor via an AD conversion module.
7. The test device for testing the performance of a P-V curve of a plurality of grid points according to claim 1, wherein, The second processor is connected to the SDRAM and FLASH of the host computer via the AXI bus.
8. The test device for testing the performance of a P-V curve of a plurality of grid points according to claim 1, wherein, Both the first processor and the second processor are equipped with an MII interface to connect and communicate with Ethernet devices.
9. The test device for testing the performance of a P-V curve synchronization primary frequency modulation according to claim 8, wherein, The Ethernet device also communicates with the RJ45 debugging interface.
10. The test device for testing the performance of a P-V curve of a plurality of grid points according to claim 1, wherein, It also includes a high-temperature constant-temperature crystal oscillator and a rechargeable battery.