A test fixture for integrated circuit chips

Abstract

This utility model belongs to the field of integrated circuit chip testing, and specifically discloses a testing fixture for integrated circuit chips, including a base plate. A control panel is fixedly mounted on the upper surface of the base plate, a support assembly is provided above the base plate, and a testing assembly is provided above the base plate. This device allows the connecting plate to move up and down via a hydraulic rod and a mounting plate. Furthermore, through the cooperation of an electromagnet and a sliding plate, the electromagnet, when energized, generates magnetic force, pulling the sliding plates closer together. The sliding plates can drive the clamping plate to position the circuit board chip in the front-back direction. Moreover, through the cooperation of a servo motor, a forward and reverse threaded rod, and a perforated control block, the perforated control block can use the cross-shaped sliding plate to correct the left-right position of the integrated circuit board chip, while simultaneously clamping and limiting the integrated circuit board, effectively correcting the position of the integrated circuit board chip and preventing the probe from damaging the integrated circuit board chip.

Description

Technical Field

[0001] This utility model relates to the field of integrated circuit chip testing, and in particular to a testing fixture for integrated circuit chips. Background Technology

[0002] An integrated circuit chip is a tiny electronic device that integrates multiple electronic components (such as transistors, resistors, capacitors, etc.) onto a small semiconductor material (usually silicon). It is the foundation of modern electronic devices and is widely used in various fields such as computers, mobile phones, home appliances, automobiles, and medical equipment.

[0003] A search revealed Chinese Patent CN221707657U, which discloses a testing fixture for integrated circuit chips. The fixture includes four support pillars, each with its upper end fixedly connected to a common base. A connecting plate is fixedly connected to the surface of the base. An electric telescopic rod is mounted on one side of the connecting plate, and an auxiliary plate is mounted on the output end of the electric telescopic rod. A test plate is mounted on the lower surface of the auxiliary plate, and several test probes are mounted on the lower surface of the test plate. An adjustment structure, including a motor, is fixedly connected to the base. A connecting rod is fixedly connected to the output end of the motor, and the connecting rod is rotatably connected to the base. A gear is fixedly connected to the arc surface of the connecting rod. This invention provides a testing fixture for integrated circuit chips that facilitates clamping and fixing chips of different sizes, preventing displacement during testing.

[0004] While the above solution enables the disassembly and assembly of integrated circuit chips, it still has some shortcomings in actual use. For example, during integrated circuit chip testing, it is difficult to quickly limit the positioning of chips of different models and sizes, which can lead to misalignment during the testing process and damage to the chips.

[0005] To address these issues, we propose a testing fixture for integrated circuit chips. Utility Model Content

[0006] The purpose of this invention is to provide a testing fixture for integrated circuit chips to solve the problems mentioned in the background art.

[0007] To achieve the above objectives, this utility model provides the following technical solution:

[0008] A testing fixture for integrated circuit chips includes a base plate, a control panel fixedly mounted on the upper surface of the base plate, a support assembly above the base plate, a detection assembly above the base plate, a connection end of the detection assembly connected to the control end of the support assembly, a limiting assembly inside the base plate, and a calibration assembly above the base plate.

[0009] In a further embodiment, the detection component includes a mounting plate on which two sets of probes are fixedly mounted on the bottom surface.

[0010] In a further embodiment, the correction assembly includes two connecting strips mounted on the upper surface of the mounting plate. Each connecting strip has a groove on its front and back sides. An electromagnet is fixedly mounted on the inner wall of each groove. A sliding plate is slidably mounted on the inner wall of each groove. Clamping plates are fixedly mounted on the opposite sides of the two sets of sliding plates. Two perforated sliders are fixedly mounted on the upper surface of each connecting strip. A sliding rod is slidably mounted on the inner wall of each perforated slider. A spring is sleeved on the outer surface of each sliding rod. A standing block is fixedly mounted on the opposite ends of the two sets of sliding rods. The bottom surface of each standing block is fixedly mounted to the upper surfaces of the two sets of clamping plates.

[0011] In a further embodiment, the limiting component includes a support plate mounted on the bottom surface of the base plate. A servo motor is fixedly mounted on the left side of the support plate, and a positive and negative threaded rod is fixedly mounted on the output end of the servo motor. Two cross slides are formed on the upper surface of the base plate. A cross slide plate is slidably mounted on the inner wall of each cross slide. A control block with a hole is fixedly mounted on the bottom surface of each of the two cross slide plates. The two control blocks with holes are threadedly connected to the outer surface of the positive and negative threaded rod. A limiting block is fixedly mounted on the upper surface of each cross slide plate.

[0012] In a further embodiment, the support assembly includes a bracket mounted on the upper surface of the base plate, a hydraulic rod fixedly mounted on the upper surface of the bracket, the telescopic end of the hydraulic rod being fixedly mounted to the upper surface of the mounting plate, and a fixing seat fixedly mounted on the back of the bracket, the bottom surface of the fixing seat being fixedly mounted to the upper surface of the base plate.

[0013] In a further embodiment, each of the connecting bars is provided with two circular blocks above it, and the two sets of circular blocks are fixedly installed on opposite sides that are far apart from each other, and on opposite sides that are close to each other, respectively.

[0014] In a further embodiment, two sets of rubber pads are provided below the base plate, and the two sets of rubber pads are fixedly installed on opposite sides that are far apart from each other and on opposite sides that are close to each other.

[0015] In a further embodiment, an insulating plate is fixedly installed on the upper surface of the base plate, and two sets of support legs are fixedly installed on the bottom surface of the base plate.

[0016] Compared with the prior art, the beneficial effects of this utility model are:

[0017] This device uses a hydraulic rod and mounting plate to move the connecting plate up and down. Through the cooperation of an electromagnet and a sliding plate, the electromagnet, when energized, generates magnetic force that pulls the sliding plates closer together. The sliding plates then move the clamping plate to position the circuit board chip in the front-back direction. Furthermore, through the cooperation of a servo motor, forward and reverse threaded rods, and a perforated control block, the perforated control block can use the cross-shaped sliding plate to correct the lateral position of the integrated circuit board chip. Simultaneously, it can clamp and limit the integrated circuit board, effectively correcting the position of the chip and preventing damage to the chip by the probe, thus ensuring safety during integrated circuit chip testing.

[0018] This device, through the cooperation of a spring, a sliding rod, and a perforated slider, allows the sliding rod to move under the elastic force of the spring. This enables the clamping plate to be controlled and reset after the electromagnet loses its magnetic force. This allows the clamping plate to be reset in time after the integrated circuit chip has been corrected, facilitating the testing of the next integrated circuit chip. Attached Figure Description

[0019] Figure 1 This is a three-dimensional structural diagram of a test fixture used for integrated circuit chips.

[0020] Figure 2 This is a three-dimensional structural schematic diagram of a test fixture used for integrated circuit chips, viewed from the side.

[0021] Figure 3 This is a three-dimensional structural schematic diagram of a test fixture used for integrated circuit chips, shown in a cross-sectional view.

[0022] Figure 4 This is a schematic diagram of the disassembled structure of a test fixture used for integrated circuit chips.

[0023] Figure 5 This is a three-dimensional structural diagram of a test fixture limiting component used for integrated circuit chips.

[0024] In the diagram: 1. Base plate; 101. Control panel; 102. Insulation plate; 103. Support leg; 2. Limiting assembly; 201. Support plate; 202. Servo motor; 203. Positive and negative threaded rod; 204. Cross slide groove; 205. Cross slide plate; 206. Control block with hole; 207. Limiting block; 3. Supporting assembly; 301. Bracket; 302. Hydraulic rod; 303. Fixing seat; 4. Detection assembly; 401. Mounting plate; 402. Probe; 5. Calibration assembly; 501. Connecting strip; 502. Groove; 503. Electromagnet; 504. Slider with hole; 505. Slide plate; 506. Clamping plate; 507. Stand block; 508. Slide rod; 509. Round block; 510. Spring; 6. Rubber pad. Detailed Implementation

[0025] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0026] Please see Figure 1-4 In this utility model, a testing fixture for integrated circuit chips includes a base plate 1, a control panel 101 fixedly installed on the upper surface of the base plate 1, a support component 3 above the base plate 1, a detection component 4 above the base plate 1, the connection end of the detection component 4 being connected to the control end of the support component 3, a limiting component 2 inside the base plate 1, and a calibration component 5 above the base plate 1.

[0027] like Figure 3 As shown, the detection component 4 includes a mounting plate 401, on the bottom surface of which two sets of probes 402 are fixedly mounted. The probes 402 can contact the integrated circuit chip to detect the integrated circuit chip.

[0028] like Figure 4 As shown, the calibration assembly 5 includes two connecting strips 501 mounted on the upper surface of the mounting plate 401. Each connecting strip 501 has a groove 502 on both its front and back sides. An electromagnet 503 is fixedly mounted on the inner wall of each groove 502. A sliding plate 505 is slidably mounted on the inner wall of each groove 502. A clamping plate 506 is fixedly mounted on the side of each pair of sliding plates 505 that are far apart from each other. Two perforated sliders 504 are fixedly mounted on the upper surface of each connecting strip 501. The inner wall of 04 is slidably mounted with slide rods 508. Each slide rod 508 has a spring 510 sleeved on its outer surface. Each of the two sets of slide rods 508 has a block 507 fixedly mounted at the opposite end. The bottom surface of each block 507 is fixedly mounted to the upper surface of the two sets of clamping plates 506. The slide plate 505 can be attracted by the electromagnet 503, so that the slide plate 505 can drive the clamping plate 506 to move, so that the clamping plate 506 can correct the position of the chip. The spring 510 can push the clamping plate 506 to reset.

[0029] like Figure 5As shown, the limiting component 2 includes a support plate 201 mounted on the bottom surface of the base plate 1. A servo motor 202 is fixedly mounted on the left side of the support plate 201. A positive and negative threaded rod 203 is fixedly mounted on the output end of the servo motor 202. Two cross slides 204 are opened on the upper surface of the base plate 1. A cross slide plate 205 is slidably mounted on the inner wall of each cross slide 204. A perforated control block 206 is fixedly mounted on the bottom surface of each of the two cross slide plates 205. The two perforated control blocks 206 are threadedly connected to the outer surface of the positive and negative threaded rod 203. A limiting block 207 is fixedly mounted on the upper surface of each cross slide plate 205. The servo motor 202 can drive the positive and negative threaded rod 203 to rotate. As the positive and negative threaded rod 203 rotates, it can drive the limiting block 207 to move through the perforated control block 206 and the cross slide plate 205, thereby limiting the integrated circuit board.

[0030] like Figure 2 As shown, the support assembly 3 includes a bracket 301 mounted on the upper surface of the base plate 1. A hydraulic rod 302 is fixedly mounted on the upper surface of the bracket 301. The telescopic end of the hydraulic rod 302 is fixedly mounted on the upper surface of the mounting plate 401. A fixing seat 303 is fixedly mounted on the back of the bracket 301. The bottom surface of the fixing seat 303 is fixedly mounted on the upper surface of the base plate 1. The mounting plate 401 can be pushed up and down by the hydraulic rod 302, so that the mounting plate 401 can push the probe 402 down, so that the probe 402 can detect the integrated circuit chip.

[0031] like Figure 4 As shown, each connecting bar 501 has two round blocks 509 above it. The two sets of round blocks 509 are fixedly installed on opposite sides and close to opposite ends of the two sliding rods 508. The round blocks 509 can limit the sliding rods 508, so that the sliding rods 508 can be easily reset.

[0032] like Figure 4 As shown, two sets of rubber pads 6 are provided below the base plate 1. The two sets of rubber pads 6 are fixedly installed on opposite sides and opposite sides of the two sets of clamping plates 506. The rubber pads 6 can protect the integrated circuit chip and prevent damage to the integrated circuit board chip.

[0033] like Figure 1 As shown, an insulating plate 102 is fixedly installed on the upper surface of the base plate 1, and two sets of support legs 103 are fixedly installed on the bottom surface of the base plate 1. The integrated circuit chip can be supported by the insulating plate 102 to prevent the integrated circuit chip from being damaged by static electricity.

[0034] The working principle of this utility model is as follows:

[0035] In use, the integrated circuit board chip is first placed on the insulating plate 102. Then, the hydraulic rod 302 is activated, causing the mounting plate 401 to move downwards. The mounting plate 401 moves the connecting strip 501 downwards, causing the clamping plate 506 to move downwards until it is flush with the circuit chip. Then, the electromagnet 503 is activated, causing it to attract the sliding plate 505. The sliding plate 505 then moves the clamping plate 506, bringing it into contact with the chip for positional correction. Afterwards, the electromagnet 503 is de-energized, allowing the clamping plate to return to its original position. 506 uses the spring force of spring 510 to push clamp 506 to reset, then starts servo motor 202, which drives the positive and negative threaded rod 203 to rotate. The positive and negative threaded rod 203 is threadedly connected to the control block 206 with holes, driving the cross slide plate 205 to slide inside the cross slide groove 204. The cross slide plate 205 drives the limit block 207 to clamp and position the chip, so that the chip can be in the set position. Then, the hydraulic rod 302 is started, which pushes the probe 402 downward, so that the probe 402 can contact the chip and test the chip.

[0036] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. A test fixture for integrated circuit chips, characterized by: Includes a base plate (1), on the upper surface of which a control panel (101) is fixedly installed, a support component (3) is provided above the base plate (1), a detection component (4) is provided above the base plate (1), the connecting end of the detection component (4) is connected to the control end of the support component (3), a limiting component (2) is provided inside the base plate (1), and a correction component (5) is provided above the base plate (1). The correction component (5) includes two connecting strips (501) mounted on the upper surface of the mounting plate (401). Each connecting strip (501) has a groove (502) on its front and back sides. An electromagnet (503) is fixedly mounted on the inner wall of each groove (502). A sliding plate (505) is slidably mounted on the inner wall of each groove (502). A clamping plate (506) is fixedly mounted on the side of each set of sliding plates (505) that is far apart from each other. Two perforated sliders (504) are fixedly mounted on the upper surface of each connecting strip (501). A sliding rod (508) is slidably mounted on the inner wall of each perforated slider (504). A spring (510) is sleeved on the outer surface of each sliding rod (508). A standing block (507) is fixedly mounted on the end of each set of sliding rods (508) that is far apart from each other. The bottom surface of each standing block (507) is fixedly mounted to the upper surface of the two sets of clamping plates (506).

2. The test handler for integrated circuit chips of claim 1 wherein: The detection component (4) includes a mounting plate (401), on the bottom surface of which two sets of probes (402) are fixedly mounted.

3. The testing fixture for integrated circuit chips according to claim 1, characterized in that: The limiting component (2) includes a support plate (201) installed on the bottom surface of the base plate (1). A servo motor (202) is fixedly installed on the left side of the support plate (201). A positive and negative threaded rod (203) is fixedly installed at the output end of the servo motor (202). Two cross slides (204) are opened on the upper surface of the base plate (1). A cross slide plate (205) is slidably installed on the inner wall of each cross slide (204). A perforated control block (206) is fixedly installed on the bottom surface of each of the two cross slide plates (205). The two perforated control blocks (206) are threadedly connected to the outer surface of the positive and negative threaded rod (203). A limiting block (207) is fixedly installed on the upper surface of each cross slide plate (205).

4. The testing fixture for integrated circuit chips according to claim 2, characterized in that: The support assembly (3) includes a bracket (301) installed on the upper surface of the base plate (1). A hydraulic rod (302) is fixedly installed on the upper surface of the bracket (301). The telescopic end of the hydraulic rod (302) is fixedly installed on the upper surface of the mounting plate (401). A fixing seat (303) is fixedly installed on the back of the bracket (301). The bottom surface of the fixing seat (303) is fixedly installed on the upper surface of the base plate (1).

5. The test handler for integrated circuit chips of claim 1 wherein: the plurality of test sockets are arranged in a plurality of rows and columns; and the plurality of test sockets are arranged in a plurality of rows and columns such that each test socket in a column is aligned with a test socket in a row. Two circular blocks (509) are provided above each of the connecting bars (501), and the two sets of circular blocks (509) are fixedly installed on opposite sides that are far apart from each other and on opposite sides that are close to each other of the two sliding rods (508). ​ 6. The test handler for integrated circuit chips of claim 1 wherein: the plurality of test sockets are arranged in a plurality of rows and columns; and the plurality of test sockets are arranged in a plurality of rows and columns such that each test socket in a column is aligned with a test socket in a row. Two sets of rubber pads (6) are provided below the base plate (1). The two sets of rubber pads (6) are fixedly installed on opposite sides and opposite sides of the two sets of clamps (506).

7. A testing fixture for integrated circuit chips according to claim 1, characterized in that: The base plate (1) has an insulating plate (102) fixedly installed on its upper surface, and two sets of support legs (103) are fixedly installed on the bottom surface of the base plate (1).

Images