一种触摸驱动芯片老化测试加速设备

By designing a touch-driven chip aging test device with liquid and gas connection boxes, the device utilizes the atomization of water vapor and oxygen and air flow to accelerate chip aging, solving the problems of large equipment size and low testing efficiency, and achieving efficient and low-cost aging testing.

CN224518901UActive Publication Date: 2026-07-17SHENZHEN ANXINTAI TECH CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
SHENZHEN ANXINTAI TECH CO LTD
Filing Date
2025-06-30
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

Existing touch driver chip aging test equipment is bulky, inconvenient to move, has low testing efficiency, and slow oxidation reaction speed, resulting in low production efficiency and high cost, making it difficult to meet the testing needs of urgent projects.

Method used

A touch-driven chip aging test device was designed, which includes liquid and gas connection boxes. The liquid pump and gas pump control the atomization and injection of water vapor and oxygen respectively. Combined with the air flow driven by a small motor, the contact efficiency between the chip and oxygen and water vapor is improved. The heating element accelerates the temperature rise, forming a high oxygen, high humidity and high temperature environment to accelerate the aging process.

Benefits of technology

The device has been miniaturized, making it easy to carry and transport. At the same time, the testing time has been significantly shortened, the efficiency of aging tests has been improved, the cost has been reduced, and the urgent needs of the project have been met.

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Abstract

本实用新型公开了一种触摸驱动芯片老化测试加速设备,属于测试装置技术领域,其一种触摸驱动芯片老化测试加速设备,包括装置底座,所述装置底座上侧中部固定安装有电机固定座,所述电机固定座的上侧设置有驱动装置,所述装置底座的上端外侧固定安装有装置外壳体,通过设置有液体连接箱和气体连接箱的结构,可以在触摸驱动芯片通电运行时,提高装置外壳体内部的湿度,同时增加氧气含量,提高内部温度,使触摸驱动芯片处于高氧气,高湿度高温环境,加速触摸驱动芯片的老化速度,缩短检测时间,从而可以方便后续的检测,通过设置装置外壳体的结构,通过设置液体和气体的接口,从而使主体装置体积减小,方便装置携带运输。
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Claims

1. A touch driver chip burn-in test acceleration apparatus comprising a device base (5), characterized in that: A motor mounting base (23) is fixedly installed on the upper middle part of the device base (5). A driving device is provided on the upper side of the motor mounting base (23). A device housing (3) is fixedly installed on the upper outer side of the device base (5). A rotating mounting frame (19) is fixedly installed on the lower side of the inner cavity of the device housing (3). A rotating fan blade (20) is fixedly installed in the middle of the rotating mounting frame (19). A fixing frame (18) is fixedly installed in the middle of the inner cavity of the outer shell (3) of the device. A heating element (17) is fixedly installed in the middle of the fixing frame (18). A mounting base (16) is fixedly installed at the upper end of the heating element (17). A chip mounting plate (15) is fixedly installed at the upper end of the mounting base (16). A liquid connection box (2) is fixedly installed on the upper side of one side of the outer shell (3) of the device, and a gas connection box (6) is fixedly installed on the upper side of the other side of the outer shell (3). A liquid pump (9) is fixedly installed in the middle of the liquid connection box (2), and a gas pump (12) is fixedly installed in the middle of the inner cavity of the gas connection box (6). An atomizing head (10) is fixedly installed on the top of the inner cavity of the outer shell (3) near the liquid pump (9), and a one-way gas valve (14) is fixedly installed in the middle of the inner cavity of the outer shell (3) near the gas connection box (6).

2. The touch driver chip burn-in test acceleration apparatus of claim 1, wherein: The drive device includes a small motor (22) fixedly installed on the upper side of the motor mounting base (23). A connector (21) is fixedly installed on the upper end of the small motor (22), and the upper end of the connector (21) is fixedly connected to the lower side of the rotating fan blade (20).

3. The touch driver chip burn-in test acceleration apparatus of claim 1, wherein: An observation plate (4) is fixedly installed on the front middle of the device housing (3). A main control board (7) is fixedly installed on the side of the observation plate (4) of the device housing (3). The main control board (7) is electrically connected to the liquid pump (9), the air pump (12), the small motor (22), and the chip mounting plate (15).

4. The touch driver chip burn-in test acceleration apparatus of claim 1, wherein: The heating element (17) is a frustum-shaped component with several hexagonal through slots on its surface.

5. The touch driver chip burn-in test acceleration apparatus of claim 1, wherein: The liquid pump (9) is fixedly connected to the atomizing head (10) via a plastic hose, and the air inlet of the liquid pump (9) is provided with a hose.

6. The touch driver chip burn-in test acceleration apparatus of claim 1, wherein: A lithium battery (8) is fixedly installed on the side of the device base (5), and an upper cover (1) is threaded on the upper end of the device housing (3), and a sealing ring is provided at the connection position between the upper cover (1) and the device housing (3).

7. The touch driver chip burn-in test acceleration apparatus of claim 1, wherein: An installation head (11) is fixedly installed on the side of the gas connection box (6). The installation head (11) is connected to the air inlet of the air pump (12). A gas connection pipe (13) is fixedly installed at the air outlet of the air pump (12). The air pump (12) and the one-way valve (14) are fixedly connected through the gas connection pipe (13).