A chip testing fixture

Abstract

This invention provides a chip testing fixture, relating to the field of testing fixture technology, and solves the technical problem of low testing efficiency in existing chip testing devices. The chip testing fixture includes a fixture base mounted on a circuit board, with a chip placement slot on the fixture base; test pins mounted on the fixture base and electrically connected to the circuit board; the test pins are arranged around the chip placement slot and can elastically abut against the chip placement slot; and a driving structure for driving the test pins to move or swing, moving the test pins away from the chip placement slot. This invention provides a chip testing fixture with a simple and fast testing process, significantly improving testing efficiency.

Description

Technical Field

[0001] This utility model relates to the field of testing fixture technology, and in particular to a chip testing fixture. Background Technology

[0002] In the semiconductor industry, testing the quiescent current of chips is a crucial task. Quiescent current refers to the current consumed by a chip in standby mode, and its magnitude directly affects the chip's power consumption and battery life. With the increasing trend of domestically produced chips replacing imported ones, how to quickly and repeatedly test the quiescent current of chips has become an urgent problem to be solved.

[0003] Existing chip testing devices involve fixing the chip under test (DUT) in a test box, which contains chip pin interfaces. During use, the DUT is first placed on these interfaces, and then a specialized clamping mechanism presses the DUT firmly against the test box's lid. The test box then transmits signals to a dedicated testing instrument for testing. This type of chip testing device is not only structurally complex, but also inconvenient for installing and removing the DUT from the test box, thus affecting testing efficiency. Utility Model Content

[0004] The purpose of this invention is to provide a chip testing fixture to solve the technical problem of low testing efficiency in existing chip testing devices. The preferred technical solutions among the various technical solutions provided by this invention and their numerous technical effects are detailed below.

[0005] To achieve the above objectives, the present invention provides the following technical solution:

[0006] The chip testing fixture provided by this utility model includes:

[0007] A fixture base is mounted on a circuit board, and the fixture base is provided with a chip placement slot.

[0008] Test pins are disposed on the fixture base and are electrically connected to the circuit board; the test pins are arranged around the chip placement slot and can elastically abut against the chip placement slot.

[0009] A driving structure is used to drive the test pin to move or swing, so that the test pin is away from the chip placement slot.

[0010] As an optional implementation, the test pin includes a main body segment, an elastic segment, and a connecting segment. The connecting segment is connected to the tooling base, and the elastic segment is disposed between the main body segment and the connecting segment. The elastic segment is used to drive the main body segment to elastically abut against the chip placement slot.

[0011] As an optional implementation, a pressing section is further provided on the elastic section, and the driving structure is connected to the pressing section.

[0012] As an optional implementation, the drive structure includes a tooling cover frame connected to the tooling base, and the tooling cover frame is movable in a manner that moves closer to or further away from the tooling base. A clamping block is provided on the tooling cover frame, and the clamping block is correspondingly provided with the pressing section.

[0013] As an optional implementation, the clamping block is provided with a ramp surface, which drives the tooling cover frame to move closer to the tooling base, and the clamping block can drive the pressing section to swing outward from the chip placement slot.

[0014] As an optional implementation, the tooling cover frame is provided with a positioning post, and the tooling base is provided with a positioning groove, wherein the positioning post is adapted to the positioning groove.

[0015] As an optional implementation, an elastic element is also provided on the positioning post, the elastic force of which is used to drive the tooling cover frame and the tooling base to move away from each other.

[0016] As an optional implementation, the tooling base is further provided with a pin protection socket, which is located outside the test pin.

[0017] As an optional implementation, the tooling base is provided with a plug-in block, and the pin protection seat is provided with a plug-in slot, the plug-in slot cooperating with the plug-in block.

[0018] As an optional implementation, the tooling base is provided with a chip placement seat, the chip placement slot is disposed on the chip placement seat, and overlapping pins are provided around the chip placement slot, the overlapping pins being configured to correspond to the test pins.

[0019] As an optional implementation, the sidewall of the chip placement slot is an inclined surface, so that the opening area of ​​the chip placement slot gradually increases from the inside to the outside along the depth direction of the chip placement slot.

[0020] As an optional implementation, a pin slot is provided on the side wall of the chip placement slot, and the pin slot is plugged into the test pin.

[0021] The beneficial effects of this utility model are as follows: The chip testing fixture provided by this utility model includes a fixture base, test pins, and a driving structure. The fixture base is disposed on a circuit board, and the test pins are disposed on the fixture base and electrically connected to the circuit board. The fixture base is also provided with a chip placement slot, in which the chip to be tested can be placed. The test pins surround the chip placement slot and can elastically abut against the chip placement slot. The driving structure is used to drive the test pins to move or swing, so that the test pins move away from the chip placement slot. Thus, when the test pins are driven away from the chip placement slot by the driving structure, the chip can be placed into the chip placement slot. Then, the driving structure resets, and the test pins can elastically abut against the chip to complete the chip test. The testing process is simple and fast, and can greatly improve the testing efficiency. Attached Figure Description

[0022] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0023] Figure 1 This is a diagram showing the usage status of the chip testing fixture provided by this utility model;

[0024] Figure 2 This is a perspective view of the chip testing fixture provided by this utility model;

[0025] Figure 3 This is an exploded view of the chip testing fixture provided by this utility model;

[0026] Figure 4 This is a cross-sectional view (a) of the chip testing fixture provided by this utility model.

[0027] Figure 5 This is a cross-sectional view (II) of the chip testing fixture provided by this utility model.

[0028] Figure 6 This is a partial structural schematic diagram of the chip testing fixture provided by this utility model.

[0029] In the picture:

[0030] 100. Fixture base; 200. Chip placement socket; 300. Test pins; 400. Fixture cover frame; 500. Circuit board;

[0031] 110. Positioning slot; 120. Connector block; 130. Pin protection socket; 140. Connector slot;

[0032] 210, Chip placement slot; 220, Pin slot; 230, Overlapping pin;

[0033] 310. Main body section; 320. Elastic section; 330. Connecting section; 340. Pressing section;

[0034] 410. Positioning pin; 420. Positioning bolt; 430. Positioning nut; 440. Clamping block; 450. Sloping surface; 460. Elastic element. Detailed Implementation

[0035] Please refer to the attached diagram below. Figures 1-6 This document explains the content of this utility model and its differences from existing technologies. The technical solutions (including preferred solutions) of this utility model are further described in detail below through accompanying drawings and examples of optional embodiments. It should be noted that any technical feature or solution in this embodiment is one or more of a variety of optional technical features or solutions. For the sake of brevity, this document cannot exhaustively list all alternative technical features and solutions of this utility model, nor is it convenient to emphasize that each implementation of a technical feature is one of multiple optional implementations. Therefore, those skilled in the art should understand that any technical means provided by this utility model can be replaced, or any two or more technical means or features provided by this utility model can be combined to obtain a new technical solution. No technical feature or solution in this embodiment limits the scope of protection of this utility model. The scope of protection of this utility model should include any alternative technical solutions that can be conceived by those skilled in the art without creative effort, as well as new technical solutions obtained by combining any two or more technical means or features provided by this utility model.

[0036] In the description of this invention, it should be noted that, unless otherwise stated, "a plurality of" means two or more; the terms "upper," "lower," "left," "right," "inner," "outer," "front end," "rear end," "head," "tail," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this invention. Furthermore, the terms "first," "second," "third," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0037] In the description of this invention, it should also be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to mechanical connections or electrical connections; they can refer to direct connections or indirect connections through an intermediate medium. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0038] This invention provides a chip testing fixture that simplifies and speeds up the testing process and significantly improves testing efficiency.

[0039] The following is combined Figures 1-6 The technical solution provided by this utility model will be described in more detail.

[0040] This utility model provides a chip testing fixture, including:

[0041] A tooling base 100 is mounted on a circuit board 500, and a chip placement slot 210 is provided on the tooling base 100.

[0042] Test pin 300 is disposed on the tooling base 100 and is electrically connected to the circuit board 500; and the test pin 300 is disposed around the chip placement slot 210 and can elastically abut against the chip placement slot 210.

[0043] A driving structure is provided to drive the test pin 300 to move or swing away from the chip placement slot 210.

[0044] The chip testing fixture provided by this utility model includes a fixture base 100, test pins 300, and a driving structure. The fixture base 100 is disposed on a circuit board 500, and the test pins 300 are disposed on the fixture base 100 and electrically connected to the circuit board 500. The fixture base 100 is also provided with a chip placement slot 210, in which the chip to be tested can be placed. The test pins 300 surround the chip placement slot 210 and can elastically abut against the chip placement slot 210. The driving structure is used to drive the test pins 300 to move or swing away from the chip placement slot 210. Thus, when the test pins 300 are driven away from the chip placement slot 210 by the driving structure, the chip can be placed into the chip placement slot 210. Then, the driving structure resets, and the test pins 300 can elastically abut against the chip to complete the chip test. The testing process is simple and fast, and can greatly improve the testing efficiency.

[0045] It should be noted that the test pin 300 can be elastically abutted against the chip placement slot 210. The elastic abutment can be achieved by the structure of the test pin 300 itself, or by other elastic structures, so as to ensure that the test pin 300 can switch between the elastic abutment state and the away state.

[0046] In some embodiments of this utility model, the test pin 300 includes a main body segment 310, an elastic segment 320, and a connecting segment 330. The connecting segment 330 is connected to the tooling base 100. The elastic segment 320 is disposed between the main body segment 310 and the connecting segment 330. The elastic segment 320 is used to drive the main body segment 310 to elastically abut against the chip placement slot 210.

[0047] In some embodiments of the present invention described above, the test pin 300 includes a main body segment 310, an elastic segment 320, and a connecting segment 330. The connecting segment 330 is connected to the tooling base 100 and electrically connected to the circuit board 500. The elastic segment 320 is disposed between the main body segment 310 and the connecting segment 330. The elastic segment 320 is used to drive the main body segment 310 to elastically abut against the chip placement slot 210. The driving structure can drive the elastic segment 320 to elastically deform, thereby moving the main body segment 310 away from the chip placement slot 210.

[0048] It is understood that when the elastic segment 320 deforms, the main body segment 310 moves away from the chip placement slot 210, and the chip can be placed into the chip placement slot 210; when the drive structure is reset, the elastic force of the elastic segment 320 can drive the main body segment 310 to elastically abut against the chip in the chip placement slot 210, thereby completing the chip test. The test process is simple and fast, and can greatly improve the test efficiency.

[0049] In some specific embodiments of this utility model, the elastic segment 320 has a U-shaped structure.

[0050] In some embodiments of this utility model, a pressing section 340 is further provided on the elastic section 320, and the driving structure is connected to the pressing section 340.

[0051] In some of the embodiments of this utility model described above, by setting a pressing section 340 on the elastic section 320, the driving structure drives the pressing section 340 to move, thereby driving the main body section 310 away from the chip placement slot 210, so as to place the chip into the chip placement slot 210 and complete the chip testing.

[0052] In some embodiments of this utility model, the driving structure includes a tooling cover frame 400, which is connected to the tooling base 100 and can move closer to or further away from the tooling base 100. A clamping block 440 is provided on the tooling cover frame 400, and the clamping block 440 is correspondingly provided with the pressing section 340.

[0053] In some embodiments of the present invention described above, the driving structure includes a tooling cover frame 400, which is connected to the tooling base 100 and is movable to move closer to or further away from the tooling base 100. A clamping block 440 is provided on the tooling cover frame 400, corresponding to the lower pressing section 340. When the tooling cover frame 400 is driven to move closer to the tooling base 100, the clamping block 440... When the pressing section 340 moves, the pressing block moves and drives the elastic section 320 to deform elastically, thereby driving the main body section 310 away from the chip placement slot 210. At this time, the chip can be placed in the chip placement slot 210. When the tooling cover frame 400 is driven away from the tooling base 100, the clamping block 440 separates from the pressing section 340, and the elastic section 320 resets, thereby driving the main body section 310 to elastically abut against the chip in the chip placement slot 210.

[0054] In some embodiments of this utility model, the clamping block 440 is provided with a ramp surface 450, which drives the tooling cover frame 400 to move closer to the tooling base 100, and the clamping block 440 can drive the pressing section 340 to swing outward from the chip placement slot 210.

[0055] In some embodiments of the present invention described above, the clamping block 440 is provided with a ramp surface 450, which drives the tooling cover frame 400 to move closer to the tooling base 100. The pressing section 340 moves along the ramp, thereby causing the pressing section 340 to swing outward from the chip placement slot 210, which in turn drives the elastic section 320 to swing outward, causing the main body section 310 to swing outward from the chip placement slot 210, thereby disengaging from the chip placement slot 210. At this time, the chip can be placed in the chip placement slot 210. When the tooling cover moves away from the tooling base 100, the clamping block 440 moves away from the pressing section 340. Under the elastic force of the elastic section 320, the pressing section 340 moves along the ramp to reset, and the main body section 310 resets to elastically abut against the chip in the chip placement slot 210.

[0056] In some embodiments of this utility model, the tooling cover frame 400 is provided with a positioning post 410, and the tooling base 100 is provided with a positioning groove 110, wherein the positioning post 410 is adapted to the positioning groove 110.

[0057] In some of the embodiments of this utility model described above, by providing positioning posts 410 and positioning grooves 110 on the tooling cover frame 400 and the tooling base 100, the positioning posts 410 and positioning grooves 110 cooperate to ensure that the tooling cover frame 400 and the tooling base 100 move along the direction of the positioning grooves 110, ensuring the moving accuracy, thereby ensuring that the adjustment can be achieved more precisely.

[0058] It should be noted that a positioning bolt 420 and a positioning nut 430 are provided between the tooling cover frame 400 and the tooling base 100. The travel between the tooling cover frame 400 and the tooling base 100 is determined by the positioning bolt 420 and the positioning nut 430 to ensure positioning accuracy.

[0059] In some embodiments of this utility model, an elastic element 460 is also provided on the positioning post 410, and the elastic force of the elastic element 460 is used to drive the tooling cover frame 400 and the tooling base 100 to move away from each other.

[0060] In some embodiments of this utility model described above, an elastic element 460 is provided on the positioning post 410. The elastic force of the elastic element 460 can drive the fixture cover frame 400 and the fixture base 100 to move away from each other. When it is necessary to place a chip, press the fixture cover frame 400 to move it closer to the fixture base 100 to compress the elastic element 460, thereby completing the chip placement. After the chip is placed, release the fixture cover frame 400, and the fixture cover frame 400 can automatically reset under the elastic force of the elastic element 460, making testing more convenient and faster, and greatly improving testing efficiency.

[0061] In some embodiments of this utility model, the tooling base 100 is further provided with a pin protection seat 130, which is disposed outside the test pin 300.

[0062] In some of the embodiments of this utility model described above, by setting a pin protection seat 130, which is located outside the test pin 300, the pin protection seat 130 can reduce dust ingress, effectively protect the pin, and prevent the test pin 300 from deforming.

[0063] In some embodiments of this utility model, the tooling base 100 is provided with a plug-in block 120, and the pin protection base 130 is provided with a plug-in groove 140, which cooperates with the plug-in block 120.

[0064] In some embodiments of this utility model described above, the pin protection base 130 and the tooling base 100 are detachably connected by a connector block 120 and a connector slot 140, facilitating the repair, cleaning, and maintenance of the test pin 300.

[0065] In some embodiments of this utility model, a chip placement seat 200 is provided on the tooling base 100, and a chip placement slot 210 is provided on the chip placement seat 200. Overlapping pins 230 are provided around the chip placement slot 210, and the overlapping pins 230 are correspondingly provided with the test pins 300.

[0066] In some embodiments of the present invention described above, a chip placement seat 200 is provided on the tooling base 100, and a chip placement slot 210 is provided on the chip placement seat 200. The chip placement seat 200 is easy to replace and more convenient to use. Overlapping pins 230 are provided around the chip placement slot 210, and the overlapping pins 230 and the test pins 300 are correspondingly arranged to ensure that the test pins 300 can better complete the test and ensure the test accuracy.

[0067] In some embodiments of this utility model, a pin slot 220 is provided on the side wall of the chip placement slot 210, and the pin slot 220 is plugged into the test pin 300.

[0068] In some of the embodiments of this utility model described above, by providing a pin slot 220 on the side wall of the chip placement slot 210, the pin slot 220 is plugged into the test pin 300. During the swinging or moving process, the test pin 300 moves along the pin slot 220, which effectively ensures the moving accuracy and positioning accuracy of the test pin 300, improves the test effect, and avoids the problem of misalignment of the test pin 300.

[0069] In some embodiments of this utility model, the sidewall of the chip placement slot 210 is an inclined surface, so that the opening area of ​​the chip placement slot 210 gradually increases from the inside to the outside along the depth direction of the chip placement slot 210.

[0070] In some of the embodiments of this utility model described above, the sidewall of the chip placement slot 210 is an inclined surface, which facilitates the rapid placement of the chip into the chip placement slot 210, thereby improving chip testing efficiency.

[0071] Example 1:

[0072] The chip testing fixture provided by this utility model includes a fixture base 100, which is disposed on a circuit board 500. A chip placement seat 200 is disposed on the fixture base 100, and a chip placement slot 210 is disposed on the chip placement seat 200. Overlapping pins 230 are disposed around the chip placement slot 210.

[0073] Test pin 300 is disposed on the tooling base 100 and is electrically connected to the circuit board 500; and the test pin 300 is disposed around the chip placement slot 210 and can elastically abut against the overlapping pin 230 in the chip placement slot 210.

[0074] Specifically, the test pin 300 includes a main body segment 310, an elastic segment 320, a connecting segment 330, and a pressing segment 340. The connecting segment 330 is connected to the tooling base 100. The elastic segment 320 is disposed between the main body segment 310 and the connecting segment 330. The elastic segment 320 is used to drive the main body segment 310 to elastically abut against the chip placement slot 210. The pressing segment 340 is disposed on the elastic segment 320.

[0075] A tooling cover frame 400 is connected to the tooling base 100. A positioning post 410 is provided on the tooling cover frame 400, and a positioning groove 110 is provided on the tooling base 100. The positioning post 410 is adapted to the positioning groove 110 so that the tooling cover frame 400 and the tooling base 100 can move closer to or further away from the tooling base 100. A positioning bolt 420 passes through the positioning post 410 and is connected to a positioning nut 430 provided below the tooling base 100. An elastic element 460 is also provided on the positioning post 410. The elastic force of the elastic element 460 is used to drive the tooling cover frame 400 and the tooling base 100 to move away from each other.

[0076] Furthermore, a clamping block 440 is provided on the tooling cover frame 400, and the clamping block 440 is correspondingly provided with the pressing section 340. The clamping block 440 is provided with a ramp surface 450, which drives the tooling cover frame 400 to move closer to the tooling base 100. The clamping block 440 can drive the pressing section 340 to swing outward from the chip placement slot 210, thereby driving the elastic member 460 to swing, so as to drive the main body section 310 to disengage from the chip placement slot 210.

[0077] Preferably, the tooling base 100 is further provided with a pin protection seat 130, which is located outside the test pin 300.

[0078] Specifically, the tooling base 100 is provided with a plug block 120, and the pin protection seat 130 is provided with a plug groove 140. The plug groove 140 cooperates with the plug block 120 so that the pin protection seat 130 is detachably connected to the tooling base 100.

[0079] Optionally, the sidewall of the chip placement slot 210 is an inclined surface, so that the opening area of ​​the chip placement slot 210 gradually increases from the inside to the outside along the depth direction of the chip placement slot 210.

[0080] A pin slot 220 is provided on the side wall of the chip placement slot 210, and the pin slot 220 is plugged into the test pin 300.

[0081] In the description of this specification, references to terms such as "example," "embodiment," or "some embodiments" indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the invention. In this specification, illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0082] Of course, the present invention is not limited to the above-described embodiments. Those skilled in the art can make equivalent modifications or substitutions without departing from the spirit of the present invention. All such equivalent modifications or substitutions are included within the scope defined by the claims of this application.

Claims

1. A chip testing tool, characterized by, include: A fixture base is mounted on a circuit board, and the fixture base is provided with a chip placement slot. Test pins are disposed on the fixture base and are electrically connected to the circuit board; the test pins are arranged around the chip placement slot and can elastically abut against the chip placement slot. A driving structure is used to drive the test pin to move or swing, so that the test pin is away from the chip placement slot.

2. The chip testing tool of claim 1, wherein The test pin includes a main body segment, an elastic segment, and a connecting segment. The connecting segment is connected to the tooling base. The elastic segment is disposed between the main body segment and the connecting segment. The elastic segment is used to drive the main body segment to elastically abut against the chip placement slot.

3. The chip testing tool of claim 2, wherein, A pressing section is also provided on the elastic section, and the driving structure is connected to the pressing section.

4. The chip testing tooling of claim 3, wherein, The driving structure includes a tooling cover frame, which is connected to the tooling base and can move closer to or further away from the tooling base. A clamping block is provided on the tooling cover frame, and the clamping block is correspondingly provided with the pressing section.

5. The chip testing tooling of claim 4, wherein, The clamping block is provided with a ramp surface, which drives the tooling cover frame to move closer to the tooling base. The clamping block can drive the lower pressing section to swing outward from the chip placement slot.

6. The chip testing tooling of claim 4, wherein, The tooling cover frame is provided with a positioning post, and the tooling base is provided with a positioning groove, wherein the positioning post is adapted to the positioning groove.

7. The chip testing tooling of claim 6, wherein, An elastic element is also provided on the positioning post, and the elastic force of the elastic element is used to drive the tooling cover frame and the tooling base to move away from each other.

8. The chip testing tooling of any one of claims 1-7, wherein, The tooling base is also provided with a pin protection socket, which is located on the outside of the test pin.

9. The chip testing tooling of claim 8, wherein, The tooling base is provided with a plug block, and the pin protection base is provided with a plug slot, which cooperates with the plug block.

10. The chip testing tooling of any one of claims 1-7, wherein, The tooling base is provided with a chip placement seat, the chip placement slot is provided on the chip placement seat, and overlapping pins are provided around the chip placement slot, the overlapping pins being provided in correspondence with the test pins.

11. The chip testing tooling of any one of claims 1-7, wherein, The sidewall of the chip placement slot is an inclined surface, so that the opening area of ​​the chip placement slot gradually increases from the inside to the outside along the depth direction of the chip placement slot.

12. The chip testing tooling of any one of claims 1-7, wherein, The chip placement slot has a pin slot on its side wall, and the pin slot is plugged into the test pin.

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