一种阵列式屏蔽栅场效应晶体管与电子设备
By combining an array-type shielded gate structure with a dielectric filling layer in the shielded gate field-effect transistor, the problems of poor electric field modulation effect and uneven potential distribution in the shielded gate MOS structure are solved, resulting in lower switching losses and stronger avalanche capability, thus preventing device failure.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- 捷捷微电(南通)科技有限公司
- Filing Date
- 2025-09-09
- Publication Date
- 2026-07-17
AI Technical Summary
Existing shielded gate MOS structures suffer from poor electric field modulation, uneven potential distribution, high switching losses, and are prone to device failure.
An array-type shielded gate field-effect transistor is used. By setting an array of shielded gate structures around the device region and using a dielectric filling layer to isolate the gate and the shielded gate structure, a three-dimensional charge depletion effect is provided. Furthermore, the shielded gate structure and the gate are led out independently to avoid affecting the gate.
It achieves better electric field modulation effect, uniform potential distribution, reduced switching loss, improved avalanche capability, and prevents device failure.
Smart Images

Figure CN224521483U_ABST