Improved fixture for laser interferometer testing

By improving the fixture design and adopting a three-jaw and aligning reference column structure, the problems of sample deformation and long debugging time were solved, and efficient and accurate laser interferometer detection was achieved.

CN224527003UActive Publication Date: 2026-07-21ZHEJIANG MDK OPTICAL SEMICONDUCTOR CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
ZHEJIANG MDK OPTICAL SEMICONDUCTOR CO LTD
Filing Date
2025-08-28
Publication Date
2026-07-21

AI Technical Summary

Technical Problem

Existing laser interferometer fixtures cause sample deformation when holding and testing samples, and the lack of a reference leads to long debugging time, affecting measurement accuracy and efficiency.

Method used

An improved fixture was designed, which adopts a three-jaw structure. The jaws are equipped with a detection auxiliary fixture, which is equipped with an alignment reference post and a detachable sample placement stage. The sample is placed directly on the sample placement stage. The alignment reference post is used to quickly adjust the sample to be perpendicular to the light source, and the sample placement stage can be moved to adapt to different sample sizes.

Benefits of technology

This avoids sample deformation, improves measurement accuracy, shortens debugging time, reduces defect rate, and improves detection efficiency.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a kind of clamps for improved laser interferometer detection, including clamp, three clamping jaws are arranged on clamp, three clamping jaws are clamped with detection auxiliary jig, detection auxiliary jig includes jig main body, and there is even array distribution on the surface of jig main body with close-together reference column, and there is detachably installed with lofting platform between close-together reference column on jig main body.The detection auxiliary jig of the utility model designs lofting platform, product can be placed directly detection, avoids the deformation of sample due to external force, improves the accuracy of the PV value test of optical glass device;Through the design of sample close-together reference column, the surface of sample can be quickly perpendicular to detection light source, greatly shorten sample debugging time and detection difficulty, improve detection efficiency;Jig design selects Teflon material, in addition to avoid sample surface scratch bad, also eliminates the appearance of product around collapse and crack and other appearance bad, such as original factory iron clamp in the process of fastening sample, reduce the bad rate of product.
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Description

Technical Field

[0001] This utility model relates to the field of laser interferometer testing technology, and in particular to an improved fixture for laser interferometer testing. Background Technology

[0002] like Figure 1 As shown, the existing laser interferometer has a three-jaw clamp on the factory fixture 1, which uses a three-point knob fastening method to clamp the test sample 2. The test sample is directly subjected to force. When fixing the test sample, the clamping force causes the test sample to deform, which causes the PV value of the sample measured by the instrument to be distorted.

[0003] In addition, since the fixtures of existing laser interferometers are not aligned with the reference standard, a lot of time is required each time a sample is tested to adjust the perpendicularity between the sample plane and the light source. Utility Model Content

[0004] To solve the above-mentioned technical problems, this utility model designs an improved fixture for laser interferometer testing.

[0005] The present invention adopts the following technical solution: An improved laser interferometer inspection fixture includes a fixture with three grippers holding an auxiliary inspection jig. The auxiliary jig includes a main body with alignment reference pillars evenly arrayed on its surface. A detachable mounting stage is installed between the alignment reference pillars. The auxiliary inspection jig, composed of the mounting stage and alignment reference pillars, allows samples to be directly placed on the mounting stage for inspection, avoiding deformation caused by external forces and thus enabling accurate measurement of the PV value of thin optical glass devices. Furthermore, the mounting stage is detachable and movable, allowing the fixture to adjust the center position of the sample and the inspection light source according to the sample size for optimal inspection results. The alignment reference pillars ensure that the sample can be quickly and accurately aligned perpendicularly to the inspection light source, significantly reducing the time required for adjusting the sample surface to be perpendicular to the light source.

[0006] Preferably, the main body of the fixture and the surface of the alignment reference post are coated with a Teflon material layer. This effectively avoids scratches on the sample surface caused by the fixture during the testing process.

[0007] Preferably, the lofting stage is in the shape of a cuboid strip.

[0008] Preferably, the lofting platform is magnetically attached to the fixture body.

[0009] Preferably, the main body of the fixture is disc-shaped.

[0010] The beneficial effects of this utility model are: (1) The testing auxiliary fixture of this utility model is designed with a sample placement platform, and the product can be placed directly for testing, avoiding the deformation of the sample due to external force and improving the accuracy of PV value testing of optical glass devices; (2) By aligning the sample with the reference column, the sample surface can be quickly made perpendicular to the detection light source, which greatly shortens the sample debugging time and testing difficulty and improves the testing efficiency; (3) The fixture design uses Teflon material, which not only avoids the defects of scratches on the sample surface, but also eliminates the appearance defects such as chipping and cracking of the product around the original iron clamp during the process of fastening the sample, thus reducing the defect rate of the product. Attached Figure Description

[0011] Figure 1 This is a schematic diagram of a structure of an existing laser interferometer's factory-installed fixture; Figure 2 This is a schematic diagram of a detection auxiliary fixture in this utility model; Figure 3 This is a schematic diagram of the structure of this utility model; In the diagram: 1. Fixture, 2. Test sample, 3. Fixture body, 4. Alignment reference column, 5. Laying-out platform. Detailed Implementation

[0012] The technical solution of this utility model will be further described in detail below through specific embodiments and with reference to the accompanying drawings: Example: Figures 2-3 As shown, an improved laser interferometer testing fixture includes a fixture 1 with three grippers. The three grippers hold a testing auxiliary fixture, which includes a fixture body 3. Alignment reference pillars 4 are evenly arrayed on the surface of the fixture body. A sample placement stage 5 is detachably installed between the alignment reference pillars on the fixture body, and a test sample 2 is placed on the sample placement stage.

[0013] The testing auxiliary fixture consists of a lofting stage and an alignment reference post. Samples can be placed directly on the lofting stage for testing, avoiding deformation caused by external forces and thus ensuring accurate measurement of the PV value of thin optical glass devices. Furthermore, the lofting stage features a detachable and movable design, allowing the fixture to adjust the center position of the sample and the testing light source according to the sample size for optimal testing results. The alignment reference post ensures that the sample can be quickly and accurately aligned perpendicularly with the testing light source, significantly reducing the time required for adjusting the sample surface to be perpendicular to the light source, which typically takes more than 30 seconds for a single sample.

[0014] The fixture body and the surface of the alignment reference column are coated with a Teflon material layer. This effectively prevents scratches on the sample surface caused by the fixture during the testing process.

[0015] The lofting table is rectangular in shape. It is magnetically attached to the fixture body. The fixture body is disc-shaped.

[0016] The embodiments described above are merely preferred solutions of this utility model and are not intended to limit this utility model in any way. Other variations and modifications are possible without departing from the technical solutions described in the claims.

Claims

1. An improved fixture for laser interferometer testing, comprising a fixture with three grippers, characterized in that, The three grippers hold a detection auxiliary fixture, which includes a fixture body. Alignment reference columns are evenly distributed in an array on the surface of the fixture body, and a lofting stage is detachably installed between the alignment reference columns on the fixture body.

2. The improved laser interferometer testing fixture according to claim 1, characterized in that, The main body of the fixture and the surface of the alignment reference post are coated with a Teflon material layer.

3. The improved laser interferometer testing fixture according to claim 1, characterized in that, The lofting table is in the shape of a cuboid strip.

4. The improved laser interferometer testing fixture according to claim 1, characterized in that, The lofting platform is magnetically attached to the fixture body.

5. The improved laser interferometer testing fixture according to claim 1, characterized in that, The main body of the fixture is disc-shaped.