Memory strip etching line speed dynamic adjustment mechanism
By combining an eddy current sensor and a high-speed CMOS camera with a microcomputer-based dynamic etching line speed adjustment mechanism, the problem of line width deviation caused by fixed etching line speed is solved, improving the electrical performance and production efficiency of memory modules, and simplifying the maintenance process of the testing device.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- QUZHOU SUNLORD CIRCUIT BOARD CO LTD
- Filing Date
- 2025-06-30
- Publication Date
- 2026-07-21
AI Technical Summary
Existing memory module etching equipment cannot dynamically adjust the etching line speed, resulting in excessive line width deviations due to copper thickness fluctuations and material differences. This affects the electrical performance and signal transmission quality of the memory module. At the same time, the testing equipment is complex to maintain, increasing production costs and downtime.
By combining an eddy current sensor and a high-speed CMOS camera with a microcomputer, the speed of the conveyor motor is dynamically adjusted through a PID control algorithm to achieve precise regulation of the etching line speed. The detector is designed to be detachable for easy maintenance and installation.
It enables dynamic and precise adjustment of etching line speed, avoids line width deviation, improves production efficiency and product quality, reduces maintenance costs and manpower input, and extends equipment life.
Smart Images

Figure CN224529801U_ABST