Dual light path dust concentration measuring instrument
By using a reference-side air chamber and a conductive film grid in the dual-path dust concentration meter, the problems of dust adhesion and temperature fluctuation on the lens were solved, achieving higher measurement accuracy and stability.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- HEFEI SHUOJIA ELECTRONIC TECH CO LTD
- Filing Date
- 2025-08-11
- Publication Date
- 2026-07-21
AI Technical Summary
During the measurement process, the measuring side lens of the dual-optical-path dust concentration meter is prone to dust adhesion due to static electricity, which affects the measurement accuracy; the two optical signals are easily affected by ambient temperature fluctuations, resulting in inaccurate measurement results.
A reference-side gas chamber is filled with clean gas to maintain a consistent lens temperature through heat exchange. A conductive film and conductive mesh are used to conduct static electricity, preventing dust adhesion and reducing environmental temperature interference.
This improved the accuracy and reliability of the measurement results, reduced the impact of dust adhesion and temperature fluctuations on the measurement, and ensured the stability and precision of the measurement.
Smart Images

Figure CN224535729U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of dust concentration measurement technology, specifically a dual-optical-path dust concentration measuring instrument. Background Technology
[0002] Dust concentration measurement is crucial in industrial production (such as mining, cement, and metallurgy), environmental monitoring (PM2.5 / PM10 monitoring), and occupational health (workplace dust exposure assessment). High-precision and stable measurements can ensure production safety, environmental pollution control, and personnel health.
[0003] Dual-beam dust concentration measuring instruments are commonly used to measure dust concentration. They eliminate environmental interference and achieve stable measurement through dual-beam differential compensation technology. However, during use, dust in the air being measured is easily adhered to the surface of the optical lenses due to static electricity. Although some measuring instruments have self-cleaning functions, the cleaning operation is delayed, and the dust accumulated during the cleaning interval has a substantial impact on the measurement accuracy. Furthermore, since the measuring side lens is in direct contact with the dusty air, it is significantly affected by ambient temperature fluctuations, while the reference side lens is usually in a sealed clean air chamber with a relatively stable temperature. This asymmetrical temperature distribution will cause systematic deviations in the two optical signals, thus affecting the accuracy of the final measurement result. Based on this, this application proposes a dual-beam dust concentration measuring instrument. Utility Model Content
[0004] This invention provides a dual-optical-path dust concentration measuring instrument, which solves the problems mentioned in the background art, such as dust easily adhering to the measuring side lens due to static electricity, affecting the measurement accuracy; and the two optical signals being easily affected by ambient temperature fluctuations, reducing reliability.
[0005] This utility model provides the following technical solution: a dual-path dust concentration measuring instrument, comprising a dual-path dust concentration measuring instrument body, wherein a measuring side lens and a reference side gas chamber are disposed on the top of the dual-path dust concentration measuring instrument body, the reference side gas chamber is filled with clean gas, the reference side gas chamber is detachably connected to the dual-path dust concentration measuring instrument body, and a reference side lens is disposed in the middle of the bottom of the reference side gas chamber; the measuring side lens and the reference side lens have the same structure, both comprising a lens body and a conductive film, the conductive film being disposed on the top of the lens body.
[0006] Preferably, the top of the dual-path dust concentration measuring instrument body is provided with a fixing groove, which is adapted to the reference side air chamber.
[0007] Preferably, the top of the reference-side air chamber is light-shielded, the bottom of the reference-side air chamber is provided with a sealing airbag, and the connection part between the reference-side air chamber and the reference-side lens is in contact with the top of the sealing airbag.
[0008] Preferably, the shell wall of the dual-path dust concentration measuring instrument is embedded with a conductive mesh, and the conductive film of the measuring side lens is in contact with the conductive mesh.
[0009] Preferably, the top of the conductive film is coated with a hydrophobic coating.
[0010] Preferably, the grid spacing of the conductive mesh is 3-5 mm.
[0011] Compared with the prior art, the present invention has the following beneficial effects:
[0012] 1. This dual-path dust concentration measuring instrument achieves temperature fluctuations of the clean air and the gas to be measured by exchanging heat between the clean air on the reference side and the gas to be measured. This ensures that the temperature fluctuations of the reference side lens and the measuring side lens are consistent, thereby reducing the systematic deviation of the two optical signals caused by the inconsistent temperature fluctuations of the two lenses and improving the accuracy of the final measurement results of this application.
[0013] 2. This dual-path dust concentration measuring instrument utilizes a conductive film and a conductive mesh to conduct static electricity accumulated on the measuring side lens to other parts of the instrument, preventing dust in the gas being measured from being electrostatically adsorbed onto the measuring lens and reducing the impact of dust adhesion on the dust concentration measurement. The top of the conductive film is coated with a hydrophobic coating, which further reduces dust adhesion using the lotus leaf effect. Furthermore, the conductive mesh protects the instrument body from electromagnetic interference and provides thermal conductivity, preventing localized overheating of the instrument housing and improving heat dissipation, thus facilitating its use. Attached Figure Description
[0014] Figure 1 This is a front view of the structure of this utility model;
[0015] Figure 2 This is an exploded view of the structure of this utility model;
[0016] Figure 3 This is a schematic cross-sectional view of the reference side air chamber of the present invention.
[0017] Figure 4 This is a schematic diagram of the explosion of the measuring side lens of the present invention.
[0018] Figure 5 This is a schematic cross-sectional view of the back of the dual-optical-path dust concentration measuring instrument of this utility model.
[0019] In the figure: 1. Dual-optical-path dust concentration measuring instrument body; 2. Measuring side lens; 3. Reference side air chamber; 4. Fixing groove; 5. Reference side lens; 6. Sealing airbag; 7. Lens body; 8. Conductive film; 9. Conductive grid. Detailed Implementation
[0020] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0021] This utility model provides an embodiment: see reference Figures 1 to 5 A dual-beam dust concentration measuring instrument includes a dual-beam dust concentration measuring instrument body 1. The dual-beam dust concentration measuring instrument body 1 is existing technology. Its core principle is based on the interaction between laser and dust particles. It adopts an open design so that the laser emitted from the measuring side directly irradiates the dust particles of the gas to be measured. Environmental interference is eliminated through dual-beam differential technology to improve measurement accuracy. Specific models can be selected according to requirements, which will not be elaborated here.
[0022] The dual-path dust concentration measuring instrument body 1 has a measuring side mirror 2 on its top, through which the measuring side beam directly illuminates the dust particles of the gas to be measured. A reference side gas chamber 3 is also located on the top of the instrument body 1, along with a fixing groove 4. The fixing groove 4 is adapted to the reference side gas chamber 3, and the reference side gas chamber 3 is detachably connected to the fixing groove 4. This allows for quick assembly and disassembly of the reference side gas chamber 3, facilitating its replacement. Preferably, when the reference side gas chamber 3 is connected to the fixing groove 4, the top of the reference side gas chamber 3 and the top of the dual-path dust concentration measuring instrument body 1 are flush. By observing the position of the reference side gas chamber 3, the operator can determine whether it is properly installed, improving the assembly convenience of this application.
[0023] A reference side mirror 5 is provided in the middle of the bottom of the reference side gas chamber 3. The reference side gas chamber 3 is made of a material with high thermal conductivity. The specific material can be selected according to the requirements and is not limited here. By utilizing the thermal conductivity of the reference side gas chamber 3, the temperature difference between the inside and outside of the reference side gas chamber 3 can be reduced, so that the temperature of the clean gas filled in the reference side gas chamber 3 changes with the change of the external temperature. This allows the temperature fluctuation of the reference side mirror 5 to be consistent with the temperature fluctuation of the measurement side mirror 2, thereby reducing the systematic deviation of the two optical signals caused by the inconsistent temperature fluctuation of the two mirrors and improving the accuracy of the final measurement results of this application.
[0024] The top of the reference side air chamber 3 is light-shielded. After the top of the reference side air chamber 3 is light-shielded, external light is prevented from shining into the reference side air chamber 3, eliminating the interference of external light on the reference side beam and further improving the accuracy of this application. The operation of light-shielding the reference side air chamber 3 is the prior art. It is sufficient to ensure that external light is prevented from shining into the reference side air chamber 3 and that heat exchange between the inside and outside of the reference side air chamber 3 is not affected.
[0025] In addition, a sealing airbag 6 is provided at the bottom of the reference side air chamber 3. The connection between the reference side air chamber 3 and the reference side lens 5 is in contact with the top of the sealing airbag 6. When the reference side air chamber 3 is installed in place, the sealing airbag 6 is compressed. Under the action of the compression force, the sealing airbag 6 is tightly fitted with the connection between the reference side air chamber 3 and the reference side lens 5, thereby improving the sealing performance of the connection between the reference side air chamber 3 and the reference side lens 5.
[0026] As described above, when this application is used, by exchanging heat between the clean air on the reference side and the gas to be measured, the temperature fluctuation of the clean air is kept consistent with the temperature fluctuation of the gas to be measured. This ensures that the temperature fluctuation of the reference side lens 5 is consistent with the temperature fluctuation of the measurement side lens 2, reducing the systematic deviation of the two optical signals caused by the inconsistent temperature fluctuations of the two lenses, and improving the accuracy of the final measurement result of this application.
[0027] The measuring side lens 2 and the reference side lens 5 have the same structure, which allows the temperature fluctuations of the measuring side lens 2 and the reference side lens 5 to be consistent, reducing error interference. Both the measuring side lens 2 and the reference side lens 5 include a lens body 7 and a conductive film 8. The conductive film 8 is located on the top of the lens body 7. The material of the conductive film 8 can be selected according to requirements and is not limited here, as long as it meets the requirements of wear resistance, conductivity, high light transmittance, and does not affect laser propagation and thermal conductivity.
[0028] By using the conductive film 8, heat can be transferred to the reference-side mirror 5 during use, increasing the rate of temperature change. When the measuring-side mirror 2 is in use, the conductive film 8 can quickly conduct away accumulated static electricity, preventing dust in the air from adhering to it due to static electricity. This reduces the impact of dust adhesion on the dust concentration measurement. Furthermore, the top of the conductive film 8 is coated with a hydrophobic coating, which utilizes the lotus leaf effect to reduce dust adhesion. The material of this coating can be selected according to requirements and is not limited here.
[0029] In addition, a conductive mesh 9 is embedded in the shell wall of the dual-path dust concentration measuring instrument body 1. The conductive film 8 of the measuring side lens 2 is in contact with the conductive mesh 9. Through the setting of the conductive mesh 9, the static electricity accumulated on the conductive film 8 can be quickly conducted to other parts of the dual-path dust concentration measuring instrument body 1, preventing the dust in the air to be measured from adhering to the conductive film 8 due to static electricity. The conductive mesh 9 can protect the dual-path dust concentration measuring instrument body 1, preventing electromagnetic interference from affecting the dual-path dust concentration measuring instrument. Moreover, the conductive mesh 9 has a heat conduction function, preventing local overheating of the dual-path dust concentration measuring instrument shell, improving the heat dissipation speed of the dual-path dust concentration measuring instrument, and facilitating the use of this application. The mesh spacing of the conductive mesh 9 is 3-5mm, and its material can be selected according to requirements, without limitation.
[0030] As can be seen from the above description, this application reduces dust adhesion by decreasing the accumulation of dust on the measuring side mirror and utilizing the lotus leaf effect, thereby reducing the impact of dust on this application and ensuring the accuracy of its use.
[0031] In summary: When this dual-path dust concentration measuring instrument is in use, the laser beam emitted by the light source passes through a beam splitter and enters the measuring side and the reference side. The laser on the measuring side directly irradiates the dust particles in the gas to be measured through the measuring side lens 2. The dust particles undergo Mie scattering or Rayleigh scattering under laser irradiation, and a high-sensitivity laser detector receives the scattered light signal. After amplification and filtering, the signal is converted into an electrical signal. The laser on the reference side irradiates clean air through the reference side lens 5, and a laser point detector on the reference side receives the scattered light signal. After amplification and filtering, the signal is converted into an electrical signal, and the microprocessor calculates the dust mass concentration. During this process, the... The conductive mesh 9 is used to quickly conduct away the static electricity accumulated on the measuring side lens 2, preventing dust in the gas to be measured from adhering to the measuring side lens 2 due to static electricity. This reduces the impact of dust adhesion on the laser transmission on the measuring side. Furthermore, the reference side air chamber 3 is used to exchange heat between the clean air on the reference side and the gas to be measured, ensuring that the temperature fluctuations of the clean air and the gas to be measured are consistent. This, in turn, ensures that the temperature fluctuations of the reference side lens 5 and the measuring side lens 2 are consistent, reducing the systematic deviation of the two optical signals caused by the inconsistent temperature fluctuations of the two lenses and improving the accuracy of the final measurement results of this application.
[0032] All standard parts used in this utility model can be purchased from the market, and irregular parts can be customized according to the description and drawings. The specific connection methods of each structure adopt conventional technical means such as bolt connection that are mature in the prior art. The machinery, parts and equipment adopt conventional models in the prior art. The materials of each component can be selected according to the requirements and are not limited here. The contents not described in detail in this specification belong to the prior art known to those skilled in the art. Although the embodiments of this utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principles and spirit of this utility model. The scope of this utility model is defined by the appended claims and their equivalents.
Claims
1. A dual-path dust concentration measuring instrument, comprising a dual-path dust concentration measuring instrument body (1), characterized in that: The top of the dual-path dust concentration measuring instrument body (1) is provided with a measuring side lens (2) and a reference side air chamber (3). The reference side air chamber (3) is filled with clean gas. The reference side air chamber (3) is detachably connected to the dual-path dust concentration measuring instrument body (1). The middle of the bottom of the reference side air chamber (3) is provided with a reference side lens (5). The measuring side lens (2) and the reference side lens (5) have the same structure, both including a lens body (7) and a conductive film (8). The conductive film (8) is provided on the top of the lens body (7).
2. The dual-optical-path dust concentration measuring instrument according to claim 1, characterized in that: The top of the dual-path dust concentration measuring instrument body (1) is provided with a fixing groove (4), which is adapted to the reference side air chamber (3).
3. The dual-optical-path dust concentration measuring instrument according to claim 1, characterized in that: The top of the reference side air chamber (3) is light-shielded, and a sealing airbag (6) is provided at the bottom of the reference side air chamber (3). The connection between the reference side air chamber (3) and the reference side lens (5) is in contact with the top of the sealing airbag (6).
4. The dual-optical-path dust concentration measuring instrument according to claim 1, characterized in that: The body (1) of the dual-path dust concentration measuring instrument has an embedded conductive mesh (9) in its shell wall, and the conductive film (8) of the measuring side lens (2) is in contact with the conductive mesh (9).
5. A dual-optical-path dust concentration measuring instrument according to claim 1, characterized in that: The top of the conductive film (8) is coated with a hydrophobic coating.
6. A dual-optical-path dust concentration measuring instrument according to claim 4, characterized in that: The spacing of the conductive mesh (9) is 3-5 mm.