A circuit board rapid inspection test fixture

Abstract

The utility model relates to circuit board fixture technical field, and disclose a kind of circuit board rapid inspection test fixture, including device base and adjusting mechanism, the top two sides of device base are movably connected with adjusting mechanism, the adjusting mechanism includes support rod, the bottom of support rod movably connects device base, the top of support rod is fixedly connected with adjusting knob, the outside of support rod is movably connected with threaded sleeve close to top position, the outside of threaded sleeve is fixedly connected with driving bevel gear, the back of driving bevel gear bottom is movably connected with driven bevel gear, the inside of driven bevel gear is fixedly connected with connecting rod;The utility model is rotated adjusting knob, so that support rod rotates, drives threaded sleeve to move, simultaneously by bevel gear make the other end of connecting rod threaded sleeve synchronous movement, it is favorable to by the number of thread circle of threaded sleeve movement to fine control the force of probe pressing down.

Description

Technical Field

[0001] This utility model relates to the field of circuit board fixture technology, and more specifically to a rapid inspection and testing fixture for circuit boards. Background Technology

[0002] A circuit board, or printed circuit board (PCB) for short, is a support structure for electronic components. It is responsible for connecting electronic components to form a complete circuit. It uses printing technology to transfer the circuit design onto an insulating substrate, realizing the fixation and electrical connection of electronic components. A circuit board is mainly composed of pads, vias, mounting holes, wires, components, connectors, fillers, and electrical boundaries. Structurally, it is divided into single-sided boards, double-sided boards, and multilayer boards. A single-sided board has wiring on only one side, a double-sided board has wiring on both sides and is connected by holes, and a multilayer board is composed of multiple layers of conductive and insulating layers stacked alternately to realize complex circuit designs. Circuit board test fixtures are key equipment in the electronics manufacturing industry used to test the function, performance, and soldering quality of circuit boards. They are usually placed at the end of the production line and test the components and circuit networks on the circuit board through physical contact or electrical connection.

[0003] Existing circuit board test fixtures typically use pneumatic methods to drive the probes downwards during testing, or require manual operation of the probes. However, manual operation requires precise control of the downward pressure to avoid damage, which is difficult and inconvenient. Furthermore, manual operation also results in slower testing speeds and lower efficiency. Utility Model Content

[0004] In order to overcome the above-mentioned defects of the prior art, the present invention provides a circuit board rapid inspection and testing fixture to solve the problems existing in the background art.

[0005] This utility model provides the following technical solution: a rapid inspection and testing fixture for circuit boards, comprising a device base and an adjustment mechanism. The adjustment mechanism is movably connected to both sides of the top of the device base, and a device top plate is movably connected to the top of the adjustment mechanism. A platform is fixedly connected to the top of the device base near the center, and a detection component is fixedly connected to one side of the top of the platform. The adjustment mechanism includes a support rod, the bottom of which is movably connected to the device base, and an adjustment knob is fixedly connected to the top of the support rod. A threaded sleeve is movably connected to the outer side of the support rod near the top, and a drive bevel gear is fixedly connected to the outer side of the threaded sleeve. A driven bevel gear is movably connected to the bottom back of the drive bevel gear, and a connecting rod is fixedly connected inside the driven bevel gear.

[0006] Furthermore, the outer top of the support rod is threaded, the inside of the threaded sleeve is threaded, the thread of the support rod and the thread of the threaded sleeve are mutually compatible, and the two ends of the connecting rod are mirror symmetrical structures.

[0007] Furthermore, the device top plate includes a top plate body, and heat dissipation grooves are provided on the top and bottom sides of the top plate body. The heat dissipation grooves have a concave structure and are in a through state at the center. A heat dissipation perforated plate is fixedly connected inside the heat dissipation grooves, and a fixing member is fixedly connected to the top four corners of the heat dissipation perforated plate.

[0008] Furthermore, a handle is fixedly connected to the middle of one side of the top plate body, and the top plate and the base of the device have the same structure.

[0009] Furthermore, the stage includes a carrying frame, a vacuum suction cup is fixedly connected to the top of the inner side of the carrying frame, a connecting pipe is fixedly connected to one side of the carrying frame, a vacuum pump is fixedly connected to one side of the connecting pipe, and a housing is fixedly connected to the outer side of the vacuum pump.

[0010] Furthermore, the detection component includes a base frame, the base frame having a transparent structure, a mounting plate fixedly connected to the bottom of the base frame, uniformly distributed test probes fixedly connected to the top of the mounting plate, and a probe substrate fixedly connected to the top of the test probes.

[0011] The technical effects and advantages of this utility model are as follows:

[0012] 1. This utility model has an adjustment mechanism. By rotating the adjustment knob, the support rod rotates within the device base, thereby driving the threaded sleeve to move up and down along the support rod. At the same time, the threaded sleeve drives the active bevel gear to rotate, which in turn drives the driven bevel gear to rotate, thereby driving the connecting rod to rotate. Consequently, the threaded sleeve at the other end of the connecting rod moves synchronously, causing the top plate of the device to move up and down. This allows for precise control of the probe's downward pressure force by controlling the number of thread turns of the moving threaded sleeve.

[0013] 2. This utility model has an adjustment mechanism. By rotating the adjustment knob, the top plate of the device is moved, which in turn moves the detection component to quickly approach the stage. This allows the probe substrate of the detection component to detect the circuit board fixed on the stage, which is beneficial for quickly inspecting and testing the circuit board and improving efficiency. Attached Figure Description

[0014] Figure 1 This is a schematic diagram of the overall structure of this utility model.

[0015] Figure 2 This is a schematic diagram of the adjustment mechanism of this utility model.

[0016] Figure 3 This is a schematic diagram of the structure of the stage of this utility model.

[0017] Figure 4This is a schematic diagram of the detection component of this utility model.

[0018] The attached figures are labeled as follows: 1. Device base; 2. Adjustment mechanism; 201. Support rod; 202. Adjustment knob; 203. Threaded sleeve; 204. Driving bevel gear; 205. Driven bevel gear; 206. Connecting rod; 3. Device top plate; 301. Top plate body; 302. Heat dissipation plate; 303. Fixture; 304. Handle; 4. Stage; 401. Carrying frame; 402. Vacuum suction cup; 403. Connecting pipe; 404. Box; 5. Detection assembly; 501. Base frame; 502. Mounting plate; 503. Test probe; 504. Probe substrate. Detailed Implementation

[0019] The technical solution of this utility model will be clearly and completely described below with reference to the accompanying drawings. In addition, the forms of the various structures described in the following embodiments are merely illustrative. The circuit board rapid inspection and testing fixture involved in this utility model is not limited to the structures described in the following embodiments. All other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.

[0020] Reference Figures 1-4 This utility model provides a rapid inspection and testing fixture for circuit boards, including a device base 1 and an adjustment mechanism 2. The adjustment mechanism 2 is movably connected to both sides of the top of the device base 1, and a device top plate 3 is movably connected to the top of the adjustment mechanism 2. A platform 4 is fixedly connected to the top of the device base 1 near the center, and a detection component 5 is fixedly connected to one side of the top of the platform 4. The adjustment mechanism 2 includes a support rod 201, with the bottom of the support rod 201 movably connected to the device base 1. An adjustment knob 202 is fixedly connected to the top of the support rod 201, and a threaded sleeve 203 is movably connected to the outer side of the support rod 201 near the top. A drive bevel gear 204 is fixedly connected to the outer side of the threaded sleeve 203. A driven bevel gear 205 is movably connected to the bottom back of the bevel gear 204. A connecting rod 206 is fixedly connected inside the driven bevel gear 205. By rotating the adjustment knob 202, the support rod 201 rotates within the device base 1, thereby driving the threaded sleeve 203 to move up and down along the support rod 201. At the same time, the threaded sleeve 203 drives the driving bevel gear 204 to rotate. The rotation of the driving bevel gear 204 drives the driven bevel gear 205 to rotate, thereby driving the connecting rod 206 to rotate. Consequently, the threaded sleeve 203 at the other end of the connecting rod 206 moves synchronously, causing the top plate 3 of the device to move up and down. This allows for precise control of the probe's downward pressure by the number of thread turns of the threaded sleeve 203.

[0021] In a preferred embodiment, the outer top of the support rod 201 is threaded, and the inside of the threaded sleeve 203 is threaded. The threads of the support rod 201 and the threads of the threaded sleeve 203 are compatible with each other. The two ends of the connecting rod 206 are mirror symmetrical. By rotating the adjustment knob 202, the top plate 3 of the device is moved, which in turn drives the detection component 5 to quickly approach the stage 4. This allows the probe substrate 504 of the detection component 5 to detect the circuit board fixed on the stage 4, which is beneficial for quickly inspecting and testing the circuit board and improving efficiency.

[0022] In a preferred embodiment, the device top plate 3 includes a top plate body 301. The top and bottom sides of the top plate body 301 are provided with heat dissipation grooves. The heat dissipation grooves have a concave structure and are in a through state at the center. A heat dissipation perforated plate 302 is fixedly connected inside the heat dissipation grooves. Fixing members 303 are fixedly connected to the four corners of the top of the heat dissipation perforated plate 302.

[0023] In a preferred embodiment, a handle 304 is fixedly connected to the middle of one side of the top plate body 301, and the top plate 3 and the base 1 of the device have the same structure.

[0024] In a preferred embodiment, the stage 4 includes a carrying frame 401, a vacuum suction cup 402 is fixedly connected to the top of the inner side of the carrying frame 401, a connecting pipe 403 is fixedly connected to one side of the carrying frame 401, a vacuum pump is fixedly connected to one side of the connecting pipe 403, and a housing 404 is fixedly connected to the outer side of the vacuum pump.

[0025] In a preferred embodiment, the detection component 5 includes a base frame 501, which is a transparent structure. A mounting plate 502 is fixedly connected to the bottom of the base frame 501, and test probes 503 are uniformly distributed and fixedly connected to the top of the mounting plate 502. A probe substrate 504 is fixedly connected to the top of the test probes 503.

[0026] The working principle of this utility model:

[0027] In use, the circuit board is placed on the stage 4, and a vacuum is drawn using a vacuum pump and connecting pipe 403, causing the vacuum suction cup 402 to fix the circuit board. By rotating the adjustment knob 202, the support rod 201 rotates within the device base 1, thereby causing the threaded sleeve 203 to move up and down along the support rod 201. Simultaneously, the threaded sleeve 203 drives the active bevel gear 204 to rotate, which in turn drives the driven bevel gear 205 to rotate, thereby causing the connecting rod 206 to rotate. Consequently, the threaded sleeve 203 at the other end of the connecting rod 206 moves synchronously, causing the device top plate 3 to move up and down. This allows for precise control of the probe's downward pressure by controlling the number of thread turns of the threaded sleeve 203. By rotating the adjustment knob 202, the device top plate 3 moves, which in turn causes the detection component 5 to quickly approach the stage 4, allowing the probe substrate 504 of the detection component 5 to detect the circuit board fixed on the stage 4. This facilitates rapid inspection and testing of the circuit board, improving efficiency.

[0028] Finally: The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A rapid inspection and testing fixture for circuit boards, comprising a device base (1) and an adjustment mechanism (2), characterized in that: The top two sides of the device base (1) are movably connected to the adjustment mechanism (2), the top of the adjustment mechanism (2) is movably connected to the device top plate (3), the top of the device base (1) is fixedly connected to the platform (4) near the middle, the top side of the platform (4) is fixedly connected to the detection component (5), the adjustment mechanism (2) includes a support rod (201), the bottom of the support rod (201) is movably connected to the device base (1), the top of the support rod (201) is fixedly connected to the adjustment knob (202), the outer side of the support rod (201) is movably connected to the threaded sleeve (203) near the top, the outer side of the threaded sleeve (203) is fixedly connected to the active bevel gear (204), the bottom back of the active bevel gear (204) is movably connected to the driven bevel gear (205), and the inside of the driven bevel gear (205) is fixedly connected to the connecting rod (206).

2. The circuit board rapid inspection and testing fixture according to claim 1, characterized in that: The support rod (201) has a thread on its outer top, and the threaded sleeve (203) has a thread inside. The thread of the support rod (201) and the thread of the threaded sleeve (203) are compatible with each other. The two ends of the connecting rod (206) are mirror symmetrical structures.

3. The circuit board rapid inspection and testing fixture according to claim 1, characterized in that: The device top plate (3) includes a top plate body (301). The top and bottom sides of the top plate body (301) are provided with heat dissipation grooves. The heat dissipation grooves have a concave structure and are in a through state at the center. A heat dissipation perforated plate (302) is fixedly connected inside the heat dissipation groove. Fixing members (303) are fixedly connected to the four corners of the top of the heat dissipation perforated plate (302).

4. The circuit board rapid inspection and testing fixture according to claim 3, characterized in that: A handle (304) is fixedly connected to the middle of one side of the top plate body (301), and the top plate (3) and the base (1) of the device have the same structure.

5. A circuit board rapid inspection and testing fixture according to claim 1, characterized in that: The stage (4) includes a carrying frame (401), a vacuum suction cup (402) is fixedly connected to the top inside the carrying frame (401), a connecting pipe (403) is fixedly connected to one side of the carrying frame (401), a vacuum pump is fixedly connected to one side of the connecting pipe (403), and a housing (404) is fixedly connected to the outside of the vacuum pump.

6. The circuit board rapid inspection and testing fixture according to claim 1, characterized in that: The detection component (5) includes a base frame (501), which is a transparent structure. A mounting plate (502) is fixedly connected to the bottom of the base frame (501), and a uniformly distributed test probe (503) is fixedly connected to the top of the mounting plate (502). A probe substrate (504) is fixedly connected to the top of the test probe (503).

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