Test device and test apparatus
By designing a test device that includes a housing, probe, adjustment section and drive assembly, the problems of false testing and damage risk of existing power ripple testing methods are solved, and convenient and accurate power ripple testing is realized.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHENZHEN JINGZHIDA SEMICONDUCTOR TECHNOLOGY CO LTD
- Filing Date
- 2025-06-18
- Publication Date
- 2026-07-21
AI Technical Summary
Existing power supply ripple testing methods are prone to mistesting, time-consuming, and pose a risk of damaging components, making it difficult to achieve convenient, accurate, and safe testing.
A testing device was designed, including a housing, a first probe, a second probe, an adjustment unit, a drive assembly, a coaxial cable, and a capacitor. The distance between the first probe and the second probe is adjusted by the adjustment unit and the drive assembly so that they accurately abut against two test points of the device under test. Power supply ripple testing is then performed in conjunction with an oscilloscope.
It improves the reliability and ease of operation of power supply ripple testing, reduces the risk of false testing, and avoids damage to components.
Smart Images
Figure CN224536089U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of electronic technology, and in particular to a testing device and testing equipment. Background Technology
[0002] Power supply ripple refers to the voltage fluctuations generated when a power module transmits energy to the chip pins through a power distribution network in a real-world operating environment. Due to the existence of the power supply network, in addition to its own ripple, the power output terminal can also couple noise interference from other circuits, affecting system stability.
[0003] Currently, there are two main methods for testing power supply ripple: Oscilloscope probe with grounding loop test method: This method involves connecting a grounding loop to the negative terminal of the oscilloscope probe, and then connecting the positive terminal of the probe to the device under test through the grounding loop. This method is prone to mismeasurement due to poor contact, and the measurement results are not very reliable.
[0004] Coaxial cable soldering test method: The coaxial cable needs to be soldered to the test point. The product must be powered off before testing, and powered on again after soldering. This method is time-consuming, and the soldering process may damage components, introducing additional risks.
[0005] Therefore, how to provide a convenient, accurate and safe power supply ripple testing device is a problem that urgently needs to be solved by those skilled in the art. Utility Model Content
[0006] In view of the problems existing in the background art, the purpose of this application is to provide a testing device and testing equipment that overcomes or at least partially solves the above problems.
[0007] According to a first aspect of this application, a testing apparatus is provided, comprising a housing, a first probe, a second probe, an adjustment unit, a drive assembly, a coaxial line, and a capacitor. The first probe and the second probe are spaced apart at one end of the housing, and are used to abut against the two ends of a component to be tested, respectively. The adjustment unit is disposed in the housing. The adjustment unit is connected to the drive assembly, and is used to drive the drive assembly to adjust the distance between the first probe and the second probe. The inner conductor of the first end of the coaxial line is connected to the first probe, the shielding layer of the first end of the coaxial line is connected to the second probe, and the second end of the coaxial line is used to connect to an oscilloscope. The capacitor is disposed between the inner conductor of the first end of the coaxial line and the first probe, and is used to isolate direct current.
[0008] In one or more of the above optional embodiments, the adjustment part is a knob, and the driving assembly includes a rotating shaft, a gear, and a first rack. The knob is connected to a first end of the rotating shaft, and the gear is connected to a second end of the rotating shaft. The rotation axis of the gear coincides with the rotation axis of the rotating shaft. The first rack is movably mounted on the housing, and the gear meshes with the first rack. The first probe is fixed to the first rack. The knob is used to drive the rotating shaft to rotate, thereby driving the first rack to move through the gear, and thus moving the first probe closer to or away from the second probe. Alternatively, the second probe is fixed to the first rack, and the knob is used to drive the rotating shaft to rotate, thereby driving the first rack to move through the gear, and thus moving the second probe closer to or away from the first probe.
[0009] In one or more of the above optional embodiments, the adjustment part is a knob, and the driving assembly includes a rotating shaft, a gear, a first rack, and a second rack. The knob is connected to the first end of the rotating shaft, and the gear is connected to the second end of the rotating shaft. The rotation axis of the gear coincides with the rotation axis of the rotating shaft. The first rack and the second rack are movably disposed in the housing and are arranged opposite to each other. The gear is disposed between the first rack and the second rack, and the opposite sides of the gear mesh with the first rack and the second rack, respectively. The first probe is fixed to the first rack, and the second probe is fixed to the second rack. The knob is used to drive the rotating shaft to rotate, thereby driving the first rack and the second rack to move in opposite directions simultaneously through the gear, thereby causing the first probe and the second probe to move closer to each other or further away from each other.
[0010] In one or more of the above optional embodiments, the adjustment part is a knob, and the driving component includes a first rack. The outer peripheral wall of the knob is provided with protruding teeth, which mesh with the first rack. The first probe is fixed to the first rack, and the knob is used to drive the first rack to move through the protruding teeth, thereby driving the first probe closer to or away from the second probe. Alternatively, the second probe is fixed to the first rack, and the knob is used to drive the first rack to move through the protruding teeth, thereby driving the second probe closer to or away from the first probe.
[0011] In one or more of the above optional embodiments, the housing is provided with a receiving cavity, the adjustment part and the drive assembly are disposed in the receiving cavity, and the side wall of the housing is provided with a communicating window that communicates with the receiving cavity and the window is used to expose at least part of the adjustment part.
[0012] In one or more of the above optional embodiments, the connecting window includes a first window and a second window disposed opposite to each other on both sides of the housing along a direction perpendicular to the rotation axis of the knob, with the opposite ends of the knob exposed through the first window and the second window respectively.
[0013] In one or more of the above alternative embodiments, a connector is included, which is connected to a second end of a coaxial cable, and the connector is used for connection to an oscilloscope.
[0014] In one or more of the above optional embodiments, the connector is a bayonet nut connector, which is used to connect to the probe of an oscilloscope.
[0015] In one or more of the above optional embodiments, a circuit board, a first wire, and a second wire are included. The circuit board is disposed inside the housing, a capacitor is disposed on the circuit board, a first end of the coaxial line is connected to the circuit board, one end of the first wire is connected to the circuit board, the other end of the first wire is connected to the first probe, one end of the second wire is connected to the circuit board, the other end of the second wire is connected to the second probe, the inner conductor of the first end of the coaxial line is electrically connected to one end of the capacitor through the circuit board, the other end of the capacitor is electrically connected to the first wire through the circuit board, and the shielding layer of the first end of the coaxial line is electrically connected to the second wire through the circuit board.
[0016] According to a second aspect of this application, a test apparatus is provided, including an oscilloscope and the aforementioned test apparatus.
[0017] The beneficial effects of the embodiments of this application are as follows: The testing device provided in the embodiments of this application, by setting a first probe and a second probe to hold the device under test, and by adjusting the distance between the first probe and the second probe through the adjusting part and the driving component so that the first probe and the second probe hold the two test points respectively, when applied to the test of power supply ripple, compared with the traditional oscilloscope probe plus grounding ring test method and coaxial cable soldering test method, is simple to operate, and the adjusting part and the driving component can adjust the distance between the first probe and the second probe so that the first probe and the second probe can hold the two test points more accurately respectively, and the test reliability is high. Attached Figure Description
[0018] To more clearly illustrate the technical solutions in the specific embodiments of this application or the prior art, the accompanying drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. In all the drawings, similar elements or parts are generally identified by similar reference numerals. In the drawings, the elements or parts are not necessarily drawn to scale.
[0019] Figure 1 A schematic diagram of a testing device provided in an embodiment of this application; Figure 2 This application provides a view of a test device with a partially concealed housing structure as shown in an embodiment of the present application. Figure 3 This is a partial schematic diagram of a testing device provided in an embodiment of this application; Figure 4 This is a partial schematic diagram of a testing device provided in an embodiment of this application; Figure 5 This is a partial schematic diagram of a testing device provided in an embodiment of this application. Detailed Implementation
[0020] To facilitate understanding of this application, a more detailed description is provided below with reference to the accompanying drawings and specific embodiments. It should be noted that when an element is described as being "fixed to" another element, it can be directly on the other element, or one or more intermediate elements may exist between them. When an element is described as being "connected" to another element, it can be directly connected to the other element, or one or more intermediate elements may exist between them. The terms "vertical," "horizontal," "left," "right," "inner," "outer," and similar expressions used in this specification are for illustrative purposes only.
[0021] Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the scope of the application. The term "and / or" as used in this specification includes any and all combinations of one or more of the associated listed items.
[0022] In the description of this specification, unless otherwise expressly specified and limited, the terms "connected," "linked," and "fixed" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.
[0023] Furthermore, the technical features involved in the different embodiments of this application described below can be combined with each other as long as they do not conflict with each other.
[0024] Please see Figure 1 and Figure 2 The testing device 1000 includes a housing 1, a first probe 2, a second probe 3, an adjustment unit 4, a drive assembly 5, a coaxial cable 6, and a capacitor 7. The first probe 2 and the second probe 3 are spaced apart at one end of the housing 1, and are used to contact the two ends of the component to be tested, respectively. The adjustment unit 4 is located in the housing 1 and connected to the drive assembly 5. The adjustment unit 4 drives the drive assembly 5 to adjust the distance between the first probe 2 and the second probe 3. The inner conductor of the first end of the coaxial cable 6 is connected to the first probe 2, the shielding layer of the first end of the coaxial cable 6 is connected to the second probe 3, and the second end of the coaxial cable 6 is used to connect to an oscilloscope. The capacitor 7 is located between the inner conductor of the first end of the coaxial cable 6 and the first probe 2, and is used to isolate direct current.
[0025] During testing, the second end of the coaxial cable 6 is connected to the oscilloscope. The user holds the housing 1 and places the first probe 2 and the second probe 3 against the two ends of the device under test, respectively. The user operates the adjustment part 4 of the housing 1 with their fingers. The adjustment part 4 drives the drive component 5 to work, thereby adjusting the distance between the first probe 2 and the second probe 3 so that the first probe 2 and the second probe 3 respectively contact the two test points located at the two ends of the device under test.
[0026] The testing device 1000 provided in this application embodiment uses a first probe 2 and a second probe 3 to support the device under test. The distance between the first probe 2 and the second probe 3 is adjusted by the adjustment unit 4 and the driving component 5 so that the first probe 2 and the second probe 3 support two test points respectively. When applied to power supply ripple testing, compared with the traditional oscilloscope probe plus grounding ring test method and coaxial cable soldering test method, it is simple to operate. At the same time, the adjustment unit 4 and the driving component 5 can adjust the distance between the first probe 2 and the second probe 3 so that the first probe 2 and the second probe 3 can support the two test points more accurately, and the test reliability is high.
[0027] Please see Figure 1-3 In some embodiments, the adjustment part 4 is a knob, and the drive assembly 5 includes a rotating shaft 51, a gear 52, and a first rack 53. The knob is connected to the first end of the rotating shaft 51, and the gear 52 is connected to the second end of the rotating shaft 51. The rotation axis of the gear 52 coincides with the rotation axis of the rotating shaft 51. The first rack 53 is movably mounted on the housing 1, and the gear 52 meshes with the first rack 53. The first probe 2 is fixed to the first rack 53. The knob is used to drive the rotating shaft 51 to rotate, thereby driving the first rack 53 to move through the gear 52, thereby causing the first probe 2 to move closer to or away from the second probe 3. Alternatively, the second probe 3 is fixed to the first rack 53, and the knob is used to drive the rotating shaft 51 to rotate, thereby driving the first rack 53 to move through the gear 52, thereby causing the second probe 3 to move closer to or away from the first probe 2.
[0028] In some embodiments, the housing 1 is generally in the shape of a long rod extending along a first direction X. Along the first direction X, the first probe 2 and the second probe 3 protrude from one end of the housing 1, and the second end of the coaxial line 6 passes through the other end of the housing 1.
[0029] In some embodiments, the rotation axis of the knob is parallel to the first direction X, the first rack 53 extends along the second direction Y, and the first rack 53 is slidably disposed on the housing 1 along the second direction Y, wherein the first direction X is perpendicular to the second direction Y.
[0030] In some embodiments, the outer surface of the knob is provided with a first anti-slip texture, which provides friction when the knob is rotated.
[0031] In some embodiments, along the first direction X, the outer surface of the housing 1 near the first probe 2 is provided with a second anti-slip texture, which is used to provide friction when the user holds the housing 1.
[0032] In some embodiments, the capacitance of capacitor 7 is 10 μF.
[0033] Please see Figure 2 , Figure 3 and Figure 4 In other embodiments, the adjustment part 4 is a knob, and the drive assembly 5 includes a rotating shaft 51, a gear 52, a first rack 53, and a second rack 54. The knob is connected to the first end of the rotating shaft 51, and the gear 52 is connected to the second end of the rotating shaft 51. The rotation axis of the gear 52 coincides with the rotation axis of the rotating shaft 51. The first rack 53 and the second rack 54 are movably disposed in the housing 1 and are arranged opposite to each other. The gear 52 is disposed between the first rack 53 and the second rack 54, and the opposite sides of the gear 52 mesh with the first rack 53 and the second rack 54, respectively. The first probe 2 is fixed to the first rack 53, and the second probe 3 is fixed to the second rack 54. The knob is used to drive the rotating shaft 51 to rotate, thereby driving the first rack 53 and the second rack 54 to move in opposite directions simultaneously through the gear 52, thereby causing the first probe 2 and the second probe 3 to move closer to each other or further away from each other.
[0034] In some embodiments, the first rack 53 and the second rack 54 are arranged opposite each other along a third direction Z, wherein the first direction X, the second direction Y and the third direction Z are perpendicular to each other.
[0035] Please see Figure 2 and Figure 5 In other embodiments, the adjustment part 4 is a knob, and the drive assembly 5 includes a first rack 53. The outer peripheral wall of the knob is provided with protruding teeth 41, which mesh with the first rack 53. The first probe 2 is fixed to the first rack 53. The knob is used to drive the first rack 53 to move through the protruding teeth 41, thereby driving the first probe 2 to move closer to or away from the second probe 3. Alternatively, the second probe 3 is fixed to the first rack 53, and the knob is used to drive the first rack 53 to move through the protruding teeth 41, thereby driving the second probe 3 to move closer to or away from the first probe 2.
[0036] It is understood that the adjustment part 4 and the drive assembly 5 are not limited to the above-mentioned gear 52 and rack and pinion cooperation method. For example, in some other embodiments, the drive assembly 5 includes a slider, which is slidably disposed on the housing 1 and connected to the first probe 2 or the second probe 3. One end of the adjustment part 4 is connected to the slider, and the other end of the adjustment part 4 protrudes from the housing 1. By moving the adjustment part 4, the first probe 2 or the second probe 3 can be moved, thereby adjusting the distance between the first probe 2 and the second probe 3.
[0037] Please see Figure 1 and Figure 2 In some embodiments, the housing 1 is provided with a receiving cavity a, the adjustment part 4 and the drive assembly 5 are provided in the receiving cavity a, and the side wall of the housing 1 is provided with a communicating window b, which communicates with the receiving cavity a. The window is used to expose at least part of the adjustment part 4 for user operation.
[0038] In some embodiments, the adjustment part 4 protrudes at least partially from the outer surface of the housing 1 via the communicating window b.
[0039] In some embodiments, the adjustment part 4 is a knob, and the connecting window b includes a first window and a second window disposed opposite to each other on both sides of the housing 1 along a direction perpendicular to the rotation axis of the knob, with the opposite ends of the knob exposed through the first window and the second window respectively.
[0040] In some embodiments, the test apparatus 1000 includes a connector 8 connected to the second end of a coaxial line 6, and the connector 8 is used to connect to an oscilloscope.
[0041] In some embodiments, connector 8 is a bayonet nut connector, which is used to connect to the probe of an oscilloscope.
[0042] In some embodiments, the testing device 1000 includes a circuit board 9, a first wire 10, and a second wire 11. The circuit board 9 is disposed inside the housing 1, and a capacitor 7 is disposed on the circuit board 9. The first end of the coaxial line 6 is connected to the circuit board 9, one end of the first wire 10 is connected to the circuit board 9, and the other end of the first wire 10 is connected to the first probe 2. One end of the second wire 11 is connected to the circuit board 9, and the other end of the second wire 11 is connected to the second probe 3. The inner conductor of the first end of the coaxial line 6 is electrically connected to one end of the capacitor 7 through the circuit board 9, and the other end of the capacitor 7 is electrically connected to the first wire 10 through the circuit board 9. The shielding layer of the first end of the coaxial line 6 is electrically connected to the second wire 11 through the circuit board 9.
[0043] Based on the same inventive concept, this application also provides a testing device, including an oscilloscope and the testing apparatus 1000 in any of the above embodiments.
[0044] The above description is merely an embodiment of this application and does not limit the patent scope of this application. Any equivalent structural or procedural transformations made using the content of this application's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this application.
Claims
1. A testing device, characterized in that, include: case; A first probe and a second probe are disposed at one end of the housing at a distance from each other, and the first probe and the second probe are used to abut against the two ends of the component to be tested, respectively. An adjustment section is provided in the housing; A driving assembly, wherein the adjusting part is connected to the driving assembly, the adjusting part is used to drive the driving assembly to move, and the driving assembly is used to adjust the distance between the first probe and the second probe; A coaxial cable, wherein the inner conductor at the first end of the coaxial cable is connected to the first probe, the shielding layer at the first end of the coaxial cable is connected to the second probe, and the second end of the coaxial cable is used to connect to an oscilloscope; A capacitor is disposed between the inner conductor at the first end of the coaxial line and the first probe, and the capacitor is used to isolate direct current.
2. The testing apparatus according to claim 1, characterized in that, The adjustment part is a knob, and the drive assembly includes a rotating shaft, a gear and a first rack. The knob is connected to the first end of the rotating shaft, the gear is connected to the second end of the rotating shaft, the rotation axis of the gear coincides with the rotation axis of the rotating shaft, and the first rack is movably disposed in the housing. The gear meshes with the first rack. The first probe is fixed to the first rack, and the knob is used to drive the rotating shaft to rotate, thereby driving the first rack to move through the gear, thereby moving the first probe closer to or away from the second probe. Alternatively, the second probe is fixed to the first rack, and the knob is used to drive the rotating shaft to rotate, thereby driving the first rack to move through the gear, thereby moving the second probe closer to or away from the first probe.
3. The testing apparatus according to claim 1, characterized in that, The adjustment part is a knob, and the drive assembly includes a rotating shaft, a gear, a first rack, and a second rack. The knob is connected to the first end of the rotating shaft, and the gear is connected to the second end of the rotating shaft. The rotation axis of the gear coincides with the rotation axis of the rotating shaft. The first rack and the second rack are movably disposed in the housing and are arranged opposite to each other. The gear is disposed between the first rack and the second rack, and the opposite sides of the gear mesh with the first rack and the second rack, respectively. The first probe is fixed to the first rack, and the second probe is fixed to the second rack. The knob is used to drive the rotating shaft to rotate, and then drive the first rack and the second rack to move in opposite directions simultaneously through the gear, thereby causing the first probe and the second probe to move closer to each other or further away from each other.
4. The testing apparatus according to claim 1, characterized in that, The adjustment part is a knob, and the drive assembly includes a first rack. The outer peripheral wall of the knob is provided with protruding teeth, which mesh with the first rack. The first probe is fixed to the first rack, and the knob is used to drive the first rack to move through the convex teeth, thereby driving the first probe closer to or away from the second probe. Alternatively, the second probe is fixed to the first rack, and the knob is used to drive the first rack to move through the convex teeth, thereby driving the second probe closer to or away from the first probe.
5. The testing apparatus according to any one of claims 2-4, characterized in that, The housing has a receiving cavity, the adjustment part and the drive assembly are disposed in the receiving cavity, and the side wall of the housing has a communicating window that communicates with the receiving cavity. The window is used to expose at least part of the adjustment part.
6. The testing apparatus according to claim 5, characterized in that, The connecting window includes a first window and a second window disposed opposite to each other on both sides of the housing along a direction perpendicular to the rotation axis of the knob, with the opposite ends of the knob exposed through the first window and the second window, respectively.
7. The testing apparatus according to claim 1, characterized in that, Includes a connector that connects to the second end of the coaxial line and is used for connection to the oscilloscope.
8. The testing apparatus according to claim 7, characterized in that, The connector is a bayonet nut connector, which is used to connect to the probe of the oscilloscope.
9. The testing apparatus according to claim 1, characterized in that, The device includes a circuit board, a first wire, and a second wire. The circuit board is disposed within the housing. The capacitor is disposed on the circuit board. A first end of the coaxial cable is connected to the circuit board. One end of the first wire is connected to the circuit board, and the other end of the first wire is connected to the first probe. One end of the second wire is connected to the circuit board, and the other end of the second wire is connected to the second probe. The inner conductor of the first end of the coaxial cable is electrically connected to one end of the capacitor through the circuit board. The other end of the capacitor is electrically connected to the first wire through the circuit board. The shielding layer of the first end of the coaxial cable is electrically connected to the second wire through the circuit board.
10. A testing device, characterized in that it comprises: Oscilloscope; The testing apparatus according to any one of claims 1-9, wherein the second end of the coaxial line is connected to the oscilloscope.