A photoelectric coupler inspection device
By setting mounting slots and fixing components in the optocoupler detection device, a stable connection between the pins and the contact points is achieved, solving the problems of easy pin damage and low detection efficiency in the prior art, and improving the stability and convenience of detection.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- MEASUREMENT & TESTING TECH RES INST OF HUBEI AEROSPACE TECH RES INST
- Filing Date
- 2025-07-17
- Publication Date
- 2026-07-21
AI Technical Summary
Existing insulation testing methods for optocouplers are prone to damaging the pins and have low testing efficiency.
An optocoupler testing device was designed. By setting mounting slots and fixing components on the test socket, a stable connection between the pins and the contact points is achieved. The test interface is connected to the pins on one side of the optocoupler, which can simultaneously perform insulation tests on one side of the pins and perform separate tests when an abnormality is detected.
It effectively avoids damage to the pins, improves detection efficiency, simplifies the operation process, and enhances the stability and convenience of detection.
Smart Images
Figure CN224536119U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of optocouplers, and in particular to an optocoupler detection device. Background Technology
[0002] As an electro-optical conversion device that transmits electrical signals using light as a medium, the optocoupler occupies a pivotal position in the modern electronics field. Its basic structure consists of two parts: a light source and a light receiver. The two are encapsulated in the same sealed housing and isolated from each other by a transparent insulator. When an electrical signal is applied to the input terminal, the light source emits light, and the light receiver receives the light and generates a photocurrent, which flows out from the output terminal. This unique working method gives the optocoupler many significant advantages, such as small size, long life, no contacts, strong anti-interference ability, insulation between the output and input, and unidirectional signal transmission.
[0003] Before an optocoupler is put into use, it needs to be tested for insulation resistance to ensure that it can work properly. In the current technology, there is no dedicated fixture for testing the insulation of optocouplers, and the testing method usually uses test probes or clamps to perform single-channel testing.
[0004] Existing methods for testing optocouplers can damage the pins by directly contacting them with test pins or clips, causing deformation or scratches. Furthermore, when testing multi-pin optocouplers, the testing efficiency is low because each pin is tested individually. Utility Model Content
[0005] This utility model provides an optocoupler detection device that solves the problems of easy damage to pins and low detection efficiency in the prior art. The technical solution is as follows: An optocoupler testing device is used to test an optocoupler under test, wherein the optocoupler under test has multiple pins on both sides along its length, and includes: a test socket. The optocoupler under test is mounted on the test base, which has multiple mounting slots that match the pins. Contact points are provided in the mounting slots. Fixing components are provided at both ends of the optocoupler under test along its length. The fixing components include positioning clamps that abut against the top surface of the optocoupler under test. Test interfaces are provided on both sides of the test base, and each test interface is electrically connected to a contact point in one of the mounting slots.
[0006] Optionally, the fixing assembly further includes a support frame, a connecting rod, a first spring, and a fixing plate. The positioning clamp is located above the support frame. The support frame includes a top plate and a support rod. The top plate is disposed on the support rod and has a mounting hole. The connecting rod is slidably inserted into the mounting hole. The top end of the connecting rod is fixedly connected to the positioning clamp, and the bottom end of the connecting rod is fixedly connected to the fixing plate. The first spring is sleeved on the connecting rod, with one end connected to the fixing plate and the other end connected to the bottom of the top plate.
[0007] Optionally, the bottom of the positioning clamp is provided with a first inclined sleeve, and the top plate is provided with a second inclined sleeve that matches the first inclined sleeve. The first inclined sleeve and the second inclined sleeve are sleeved on the outside of the connecting rod.
[0008] Optionally, the bottom of the positioning clamp is provided with anti-slip texture, and the positioning clamp abuts against the top surface of the optocoupler under test through the anti-slip texture.
[0009] Optionally, the test stand is provided with a slide rail along the length of the optocoupler under test, and the fixing component is slidably mounted on the slide rail.
[0010] Optionally, the test stand has a countersunk hole, and the optocoupler under test and the fixing assembly are located in the countersunk hole.
[0011] Optionally, the test socket is provided with a plurality of switch buttons, one end of which is electrically connected to a contact point in the mounting slot, and the other end is electrically connected to the test interface.
[0012] Optionally, it also includes a connector that is plugged into the test interface. A locking component is provided on one side of the connector. The locking component includes a first slide rod, a second spring, and a locking block. A first sliding hole is provided on the locking block. One end of the first slide rod is vertically fixed to the side of the connector, and the other end is slidably disposed in the first sliding hole. The second spring is disposed between the locking block and the side wall of the connector. The second spring is sleeved on the first slide rod. The side of the locking block away from the second spring abuts against the inner wall of the test interface.
[0013] Optionally, a sliding plate is provided between the inner wall of the test interface and the side wall of the connector, and a sliding block is fixedly provided on the sliding plate. A sliding groove is provided on the side wall of the test interface, and the sliding block is slidably disposed in the sliding groove. A chamfer is provided on the side of the sliding plate near the locking component, and the chamfer abuts against the side of the locking block away from the second spring. A protrusion is provided on the locking block, and the protrusion abuts against the inner wall of the test interface.
[0014] Optionally, a fixing block is provided on the outer wall of the test interface, the fixing block and the sliding block are arranged at intervals, a second sliding hole is provided on the fixing block, a second sliding rod is fixedly provided on the sliding block, the other end of the second sliding rod is slidably provided in the second sliding hole, a third spring is provided between the fixing block and the sliding block, and the third spring is sleeved on the second sliding rod.
[0015] The beneficial effects of the technical solution provided by this utility model embodiment include at least the following: This utility model provides an optocoupler testing device. By setting a mounting slot on the test base, the pins of the optocoupler under test are placed in the mounting slot for positioning, thus achieving connection between the pins and the contact point. Furthermore, the positioning clamp of the fixing component presses the optocoupler under test firmly onto the test base, making the connection between the pins and the contact point more stable. With this design, during insulation testing, it is unnecessary to repeatedly connect the test probes or clamps to the pins, effectively solving the problem of potential pin damage in existing technologies. Moreover, since the test interface is connected to one side of the optocoupler's pins, insulation testing of one side's pins can be performed simultaneously. When a short circuit is detected on one side's pins causing abnormal data, that pin is then tested individually, thereby improving testing efficiency and effectively solving the problem of low testing efficiency in existing technologies. Attached Figure Description
[0016] To more clearly illustrate the technical solutions in the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0017] Figure 1 This is a schematic diagram of the overall structure provided in an embodiment of the present utility model; Figure 2 This is another overall structural schematic diagram provided by an embodiment of the present utility model; Figure 3 This is a top view of the overall structure provided in an embodiment of the present utility model; Figure 4 This is a schematic diagram of the fixing component structure provided in an embodiment of the present utility model; Figure 5 This is a schematic diagram of the test interface and connector provided in this embodiment of the utility model; Figure 6 This is a schematic diagram of the test interface structure provided in an embodiment of this utility model; Figure 7This is a schematic diagram of the locking component and connector mating provided in an embodiment of the present utility model; Figure 8 This is a schematic diagram of the locking component structure provided in an embodiment of the present utility model; Figure 9 This is a schematic diagram of the fit between the connector and the sliding plate provided in an embodiment of this utility model.
[0018] In the diagram: 101-Optical coupler under test; 102-Pin; 1-Test base; 11-Mounting slot; 12-Slide rail; 13-Counterhead; 14-Switch button; 2-Fixing assembly; 21-Positioning clamp; 211-Anti-slip texture; 22-Support frame; 221-Top plate; 222-Support rod; 223-Mounting hole; 23-Connecting rod; 24-First spring; 25-Fixing plate; 26-First oblique sleeve; 27-Second oblique sleeve; 3-Test interface; 31-Sliding groove; 32-Fixing block; 321-Second sliding hole; 4-Connector; 5-Locking assembly; 51-First slide rod; 52-Second spring; 53-Clamping block; 531-First sliding hole; 532-Protrusion; 6-Sliding plate; 61-Sliding block; 62-Chamfer; 63-Second slide rod; 64-Third spring. Detailed Implementation
[0019] To make the objectives, technical solutions, and advantages of this utility model clearer, the embodiments of this utility model will be described in further detail below with reference to the accompanying drawings.
[0020] Figure 1 This is a schematic diagram of the overall structure provided in an embodiment of the present utility model; Figure 2 This is another overall structural schematic diagram provided by an embodiment of the present utility model; Figure 3 This is a top view of the overall structure provided in an embodiment of the present utility model; Figure 4 This is a schematic diagram of the fixing component structure provided in an embodiment of the present utility model; Figure 5 This is a schematic diagram of the test interface and connector provided in this embodiment of the utility model; Figure 6 This is a schematic diagram of the test interface structure provided in an embodiment of this utility model; Figure 7 This is a schematic diagram of the locking component and connector mating provided in an embodiment of the present utility model; Figure 8 This is a schematic diagram of the locking component structure provided in an embodiment of the present utility model; Figure 9 This is a schematic diagram of the fit between the connector and the sliding plate provided in an embodiment of this utility model. Figures 1 to 9The device shown is an optocoupler testing device for testing an optocoupler 101 under test. The optocoupler 101 under test has multiple pins 102 on both sides along its length. The device includes a test base 1, on which the optocoupler 101 under test is mounted. The test base 1 has multiple mounting slots 11 that match the pins 102. Contact points are provided in the mounting slots 11. Fixing components 2 are provided at both ends of the optocoupler 101 under test along its length. The fixing components 2 include positioning clamps 21 that abut against the top surface of the optocoupler 101 under test. Test interfaces 3 are provided on both sides of the test base 1. Each test interface 3 is electrically connected to a contact point in the mounting slot 11 on one side.
[0021] For example, in this embodiment of the present invention, the optocoupler under test 101 is provided with 16 pins 102, with 8 pins 102 on one side. The test base 1 is also provided with 16 mounting slots 11, each corresponding to one of the 16 pins 102. At the start of the test, the optocoupler under test 101 is placed on the test base 1, and each pin 102 is aligned with a mounting slot 11. This allows the wall of the mounting slot 11 to limit the pins 102, preventing the optocoupler under test 101 from shaking during the test. Furthermore, since the mounting slot 11 has contact points that communicate with the test interface 3, the pins 102 are connected to the test interface 3. The optocoupler under test 101 has two rows of pins 102 on each side. Each test interface 3 is connected to one row of pins 102. This allows for insulation testing by simply connecting the positive terminal of the test system to the top shell of the optocoupler under test and the negative terminal to the test interface 3. Insulation tests can then be performed on both rows of pins 102. If the values of both rows of pins 102 are normal, the optocoupler under test 101 is considered a qualified product. If an abnormal value is found in one row of pins 102, that row of pins 102 is tested individually to identify the abnormal pin. This structure enables circuit connection simply by installing the pins 102, eliminating the need for repeated connection with test probes or clips. This effectively solves the problem of potential damage to pins in existing technologies. Furthermore, it allows for rapid insulation testing of a row of pins 102. Compared to testing each pin individually in traditional technologies, this embodiment significantly reduces testing time, thereby improving testing efficiency. In this embodiment, a fixing component 2 is also provided to press the optocoupler 101 under test onto the test base 1, thereby maintaining the stability of the circuit connection. In this embodiment, a positioning clamp 21 is used to press the optocoupler 101 under test onto the test base 1 from top to bottom. The bottom of the positioning clamp 21 abuts against the top of the optocoupler 101 under test, so that the pin 102 can be stably connected to the contact point in the mounting groove 11, thereby improving the stability of the device.
[0022] This utility model provides an optocoupler testing device. By setting a mounting groove 11 on the test base 1, the pin 102 of the optocoupler 101 under test is placed in the mounting groove 11 for positioning, thus achieving communication between the pin 102 and the contact point. Furthermore, the positioning clamp 21 of the fixing component 2 presses the optocoupler 101 under test onto the test base 1, making the connection between the pin 102 and the contact point more stable. With this setting, during insulation testing, it is unnecessary to repeatedly connect the test probe or clamp to the pin 102, thus effectively solving the problem of easily damaging the pin 102 in the prior art. Moreover, since the test interface 3 is connected to the pin 102 on one side of the optocoupler 101, insulation testing of one side of the pin 102 can be performed simultaneously. When a short circuit is detected on one side of the pin 102 causing abnormal data, the pin 102 is then tested individually, thereby improving testing efficiency and effectively solving the problem of low testing efficiency in the prior art.
[0023] Optionally, the fixing assembly 2 further includes a support frame 22, a connecting rod 23, a first spring 24, and a fixing plate 25. The positioning clamp 21 is located above the support frame 22. The support frame 22 includes a top plate 221 and a support rod 222. The top plate 221 is disposed on the support rod 222 and has a mounting hole 223. The connecting rod 23 is slidably inserted into the mounting hole 223. The top end of the connecting rod 23 is fixedly connected to the positioning clamp 21, and the bottom end of the connecting rod 23 is fixedly connected to the fixing plate 25. The first spring 24 is sleeved on the connecting rod. One end of the first spring 24 is connected to the fixing plate 25, and the other end is connected to the bottom of the top plate 221.
[0024] Exemplary, in embodiments of this utility model, such as Figure 4As shown, the positioning clamp 21 can be in the form of a strip handle for easy pulling. In the initial state, due to the elastic force of the first spring 24, the supporting force of the fixing plate 25 and the top plate 221, and the guiding force of the connecting rod 23 and the mounting hole 223, the positioning clamp 21 is subjected to a downward pulling force. When it is necessary to place the optocoupler 101 under test on the test base 1, the positioning clamp 21 is pulled upward, which further compresses the first spring 24. At this time, the positioning clamp 21 will not interfere with the placement of the optocoupler 101 under test. The positioning clamp 21 can also be rotated at a certain angle, which makes it easier to place the optocoupler 101 under test. After the optocoupler 101 under test is placed in place, the pulling force on the positioning clamp 21 is released. Under the elastic force of the first spring 24, the positioning clamp 21 is driven to move downward, so that the bottom surface of the positioning clamp 21 abuts against the top surface of the optocoupler 101 under test, pressing the optocoupler 101 under test onto the test base 1. By setting this structure, the structure is simple and easy to operate. Only by lifting or loosening the positioning clamp 21 can the optocoupler 101 under test be fixed, thereby improving the ease of operation of this device.
[0025] Optionally, a first inclined sleeve 26 is provided at the bottom of the positioning clamp 21, and a second inclined sleeve 27 matching the first inclined sleeve 26 is provided on the top plate 221. The first inclined sleeve 26 and the second inclined sleeve 27 are sleeved on the outside of the connecting rod 23.
[0026] Exemplary, in embodiments of this utility model, such as Figure 4 As shown, when the first inclined sleeve 26 and the second inclined sleeve 27 are matched, they form a complete cylindrical structure. When the first inclined sleeve 26 and the second inclined sleeve 27 rotate relative to each other at a certain angle, the bottom of the first inclined sleeve 26 rests on the top of the second inclined sleeve 27, thus preventing the positioning clamp 21 from descending further. By setting this structure, when placing the optocoupler 101 under test, the engagement of the first inclined sleeve 26 and the second inclined sleeve 27 restricts the descent of the positioning clamp 21, eliminating the need to continuously pull the positioning clamp 21. This facilitates two-handed operation for placing the optocoupler 101 under test and also provides clearance for placing the optocoupler 101 under test on the test base 1, thereby further improving the ease of operation of this device.
[0027] Optionally, the bottom of the positioning clamp 21 is provided with anti-slip texture 211, and the positioning clamp 21 abuts against the top surface of the optocoupler 101 under test through the anti-slip texture 211.
[0028] Exemplary, in embodiments of this utility model, such as Figure 4As shown, by setting anti-slip texture 211, the friction between the positioning clamp 21 and the contact surface of the optocoupler 101 under test can be increased, thereby making the positioning clamp 21 more stable in clamping and fixing the optocoupler 101 under test, thus improving the stability of the device.
[0029] Optionally, the test stand 1 is provided with a slide rail 12 along the length of the optocoupler 101 under test, and the fixing component 2 is slidably disposed on the slide rail 12.
[0030] Exemplary, in embodiments of this utility model, such as Figure 2 and Figure 3 As shown, by setting the slide rail 12, the position of the fixing component 2 can be adjusted, thereby facilitating the clamping and fixing of different types of optocouplers 101 under test. In this embodiment, it can accommodate optocouplers 101 under test with up to 16 pins 102. When measuring optocouplers 101 under test with smaller length or fewer pins 102, the fixing component 2 can be operated to slide on the slide rail 12, thereby fixing optocouplers 101 under test of different sizes, thus improving the compatibility of this device.
[0031] Optionally, the test stand 1 has a countersunk hole 13, in which the optocoupler 101 under test and the fixing component 2 are located.
[0032] Exemplary, in embodiments of this utility model, such as Figure 1 and Figure 2 As shown, by opening a countersunk hole 13 on the test seat 1, both the optocoupler 101 under test and the fixing component 2 are located in the countersunk hole 13, thereby reducing the overall height of the device and saving space occupied by the device.
[0033] Optionally, the test socket 1 is provided with a plurality of switch buttons 14, one end of which is electrically connected to the contact point in the mounting groove 11, and the other end is electrically connected to the test interface 3.
[0034] Exemplary, in embodiments of this utility model, such as Figure 2 As shown, a switch button 14 is provided between each pin 102 and the test interface 3, so that the switch button 14 can control whether a single pin 102 can be connected to the circuit. With this setting, the test of a single pin 102 can be realized. When the test shows that the data of a certain row of pins 102 is abnormal, each pin 102 can be connected by controlling each switch button 14, so as to find the abnormal pin 102 and process it.
[0035] Optionally, it also includes a connector 4, which is plugged into the test interface 3. A locking component 5 is provided on one side of the connector 4. The locking component 5 includes a first slide rod 51, a second spring 52, and a locking block 53. A first sliding hole 531 is provided on the locking block 53. One end of the first slide rod 51 is vertically fixed on the side of the connector 4, and the other end is slidably disposed in the first sliding hole 531. The second spring 52 is disposed between the locking block 53 and the side wall of the connector 4. The second spring 52 is sleeved on the first slide rod 51. The side of the locking block 53 away from the second spring 52 abuts against the inner wall of the test interface 3.
[0036] For example, in this embodiment of the present invention, one end of the connector 4 is plugged into the test interface 3, and the other end is fitted with a test cable for testing. The structure of the other end of the connector 4 is not limited in this embodiment, as long as it can be connected to the test cable. Figure 7 and Figure 8 As shown, by setting a first sliding hole 531, a first sliding rod 51, and a second spring 52, the locking block 53 moves along the direction of the first sliding rod 51 under the action of the second spring 52. When the connector 4 is inserted into the test interface 3, the second spring 52 is compressed, and the inner wall of the test interface 3 abuts against the locking block 53. When installed in place, the connector 4 is fixed to the test interface 3 by the elastic force of the second spring 52. By setting this structure, the test cable can be connected to the connector 4, and then the connector 4 can be inserted into the test interface 3. By setting the locking component 5, the connection stability between the test interface 3 and the connector 4 can be ensured, and the ease of operation of this device can be further improved.
[0037] Optionally, a sliding plate 6 is provided between the inner wall of the test interface 3 and the side wall of the connector 4. A sliding block 61 is fixedly provided on the sliding plate 6. A sliding groove 31 is provided on the side wall of the test interface 3. The sliding block 61 is slidably disposed in the sliding groove 31. A chamfer 62 is provided on the side of the sliding plate 6 near the locking component 5. The chamfer 62 abuts against the side of the locking block 53 away from the second spring 52. A protrusion 532 is provided on the locking block 53. The protrusion 532 abuts against the inner wall of the test interface 3.
[0038] Exemplary, in embodiments of this utility model, such as Figure 9As shown, the locking block 53 abuts against the inner wall of the test interface 3 through the protrusion 532 to form a limiting structure. The thickness of the protrusion 532 protruding from the locking block 53 is greater than the thickness of the sliding plate 6. When it is necessary to remove the connector 4 from the test interface 3, the sliding block 61 can be slid in the sliding groove 31, thereby causing the sliding plate 6 to move towards the locking component 5. By abutting against the locking block 53 through the chamfer 62 on the sliding plate 6, the second spring 52 is further compressed inward, thereby creating a gap between the protrusion 532 and the inner wall of the test interface 3, releasing the abutment between the protrusion 532 and the test interface 3, allowing the connector 4 to slide out of the test interface 3 without resistance. By setting this structure, the connector 4 and the test interface 3 can be quickly separated, further improving the ease of operation of this device.
[0039] Optionally, a fixing block 32 is provided on the outer wall of the test interface 3. The fixing block 32 and the sliding block 61 are arranged at intervals. A second sliding hole 321 is provided on the fixing block 32. A second sliding rod 63 is fixedly provided on the sliding block 61. The other end of the second sliding rod 63 is slidably provided in the second sliding hole 321. A third spring 64 is provided between the fixing block 32 and the sliding block 61. The third spring 64 is sleeved on the second sliding rod 63.
[0040] Exemplary, in embodiments of this utility model, such as Figure 5 and Figure 6 As shown, when the sliding block 61 is moved to separate the protrusion 532 and the inner wall of the test interface 3, the second sliding rod 63 slides in the second sliding hole 321, the sliding block 61 moves closer to the fixed block 32, the third spring 64 is compressed, and elastic potential energy is accumulated. When the connector 4 is removed, the external force applied to the sliding block 61 is released, the elastic potential energy accumulated by the third spring 64 is released, so that the sliding block 61 can quickly return to its original position, further improving the ease of operation of this device.
Claims
1. An optocoupler testing device for testing an optocoupler (101) under test, wherein the optocoupler (101) under test has multiple pins (102) on both sides along its length, characterized in that, include: Test stand (1) The optocoupler under test (101) is mounted on the test base (1). The test base (1) has multiple mounting slots (11) that match the pins (102). Contact points are provided in the mounting slots (11). Fixing components (2) are provided at both ends of the optocoupler under test (101) along the length direction. The fixing components (2) include positioning clamps (21). The positioning clamps (21) abut against the top surface of the optocoupler under test (101). Test interfaces (3) are provided on both sides of the test base (1). Each test interface (3) is electrically connected to a contact point in the mounting slot (11) on one side.
2. The optocoupler detection device according to claim 1, characterized in that, The fixing component (2) further includes a support frame (22), a connecting rod (23), a first spring (24), and a fixing plate (25). The positioning clamp (21) is located above the support frame (22). The support frame (22) includes a top plate (221) and a support rod (222). The top plate (221) is disposed on the support rod (222). The top plate (221) has an installation hole (223). The connecting rod (23) is slidably inserted into the installation hole (223). The top end of the connecting rod (23) is fixedly connected to the positioning clamp (21), and the bottom end of the connecting rod (23) is fixedly connected to the fixing plate (25). The first spring (24) is sleeved on the connecting rod. One end of the first spring (24) is connected to the fixing plate (25), and the other end is connected to the bottom of the top plate (221).
3. The optocoupler detection device according to claim 2, characterized in that, The bottom of the positioning clamp (21) is provided with a first inclined sleeve (26), and the top plate (221) is provided with a second inclined sleeve (27) that matches the first inclined sleeve (26). The first inclined sleeve (26) and the second inclined sleeve (27) are sleeved on the outside of the connecting rod (23).
4. The optocoupler detection device according to claim 1, characterized in that, The bottom of the positioning clamp (21) is provided with anti-slip texture (211), and the positioning clamp (21) abuts against the top surface of the optocoupler (101) under test through the anti-slip texture (211).
5. The optocoupler detection device according to claim 1, characterized in that, The test stand (1) is provided with a slide rail (12) along the length of the optocoupler (101) under test, and the fixing component (2) is slidably disposed on the slide rail (12).
6. The optocoupler detection device according to claim 1, characterized in that, The test stand (1) has a countersunk hole (13), and the optocoupler under test (101) and the fixing component (2) are located in the countersunk hole (13).
7. The optocoupler detection device according to claim 1, characterized in that, The test base (1) is provided with a plurality of switch buttons (14). One end of the switch button (14) is electrically connected to the contact point in the mounting groove (11), and the other end is electrically connected to the test interface (3).
8. The optocoupler detection device according to claim 1, characterized in that, It also includes a connector (4), which is plugged into the test interface (3). A locking component (5) is provided on one side of the connector (4). The locking component (5) includes a first slide rod (51), a second spring (52), and a locking block (53). A first sliding hole (531) is provided on the locking block (53). One end of the first slide rod (51) is vertically fixed on the side of the connector (4), and the other end is slidably disposed in the first sliding hole (531). The second spring (52) is disposed between the locking block (53) and the side wall of the connector (4). The second spring (52) is sleeved on the first slide rod (51). The side of the locking block (53) away from the second spring (52) abuts against the inner wall of the test interface (3).
9. The optocoupler detection device according to claim 8, characterized in that, A sliding plate (6) is provided between the inner wall of the test interface (3) and the side wall of the connector (4). A sliding block (61) is fixedly provided on the sliding plate (6). A sliding groove (31) is provided on the side wall of the test interface (3). The sliding block (61) is slidably disposed in the sliding groove (31). A chamfer (62) is provided on the side of the sliding plate (6) near the locking component (5). The chamfer (62) abuts against the side of the locking block (53) away from the second spring (52). A protrusion (532) is provided on the locking block (53). The protrusion (532) abuts against the inner wall of the test interface (3).
10. The optocoupler detection device according to claim 9, characterized in that, A fixing block (32) is provided on the outer wall of the test interface (3). The fixing block (32) and the sliding block (61) are arranged at intervals. A second sliding hole (321) is provided on the fixing block (32). A second sliding rod (63) is fixedly provided on the sliding block (61). The other end of the second sliding rod (63) is slidably provided in the second sliding hole (321). A third spring (64) is provided between the fixing block (32) and the sliding block (61). The third spring (64) is sleeved on the second sliding rod (63).