Mechanical keyboard chip detection mechanism

Abstract

The utility model relates to mechanical keyboard manufacturing technical field, especially mechanical keyboard chip detection mechanism, including detection platform, be equipped with detection track and detection mechanism on the detection platform, the detection track is equipped with detection mechanism, the detection track is equipped with detection seat, detection seat is equipped with a plurality of detection sites towards detection mechanism array, the one side of detection seat is connected with the compacting mechanism, the compacting mechanism is opposite detection site array and is equipped with a plurality of compacting parts, and the detection site is opposite compacting part and is equipped with the department of giving way, and the compacting part is connected in detection site, the one side of detection mechanism is connected with NG mechanism, the utility model aims at improving the detection efficiency to make detection mechanism have the universality.

Description

Technical Field

[0001] This utility model relates to the field of mechanical keyboard manufacturing technology, and in particular to a mechanical keyboard chip testing mechanism. Background Technology

[0002] The mechanical keyboard chip is a core component of the keyboard, and its manufacturing quality directly affects the keyboard's tactile feedback, response speed, and lifespan. Currently, the testing of mechanical keyboard chips mainly relies on manual visual inspection or traditional optical testing equipment. Manual inspection methods suffer from low efficiency, high labor intensity, and inconsistent testing standards, easily leading to missed or false positives. Existing automated testing equipment mostly only detects external defects in the chip, making it difficult to effectively test critical functional parameters such as keycap contact conductivity and solder joint defects.

[0003] Furthermore, the structural design of existing testing equipment is usually relatively fixed, making it difficult to adapt to the rapid replacement requirements of chips with different specifications, resulting in insufficient testing flexibility. At the same time, the sensor layout and data processing algorithms of traditional testing devices have not been optimized, making them susceptible to environmental interference and affecting the accuracy of testing results. Utility Model Content

[0004] The main purpose of this invention is to provide a mechanical keyboard chip testing mechanism, which aims to improve testing efficiency and make the testing mechanism universal.

[0005] To achieve the above objectives, this utility model proposes a mechanical keyboard chip testing mechanism, including a testing platform, a testing track and a testing mechanism on the testing platform, the testing track passing through the testing mechanism, a testing seat on the testing track, a plurality of testing positions arranged on the testing seat facing the array of testing mechanisms, a pressing mechanism connected to one side of the testing seat, a plurality of pressing parts protruding from the pressing mechanism relative to the array of testing positions, a clearance part being provided for each testing position relative to the pressing parts, and the pressing parts being connected to the testing positions.

[0006] The detection mechanism is connected to an NG mechanism on one side.

[0007] In one embodiment of this application, the clamping mechanism is connected to a driving unit, which is connected to the side of the detection seat away from the clamping mechanism. The driving unit passes through the detection seat and has a driving rod facing the clamping mechanism.

[0008] In one embodiment of this application, the detection platform is provided with a clearance groove relative to the detection track, the clearance groove is connected to one side of the detection track, the detection platform is provided with a balance track on the other side of the clearance groove, one end of the detection seat is connected to the balance track, and the other end is connected to the detection track.

[0009] A drive mechanism is provided on the other side of the detection track, and the detection seat is driven to the drive mechanism.

[0010] In one embodiment of this application, the detection seat is provided with a drive seat relative to the drive mechanism, and the drive seat is slidably connected to the detection track;

[0011] The drive seat is provided with a lifting structure at one end away from the detection position, and the lifting structure passes through the clearance groove.

[0012] In one embodiment of this application, the detection mechanism is provided with a clamping structure relative to each detection position, each clamping structure is connected to a solenoid valve, and the NG mechanism is connected to the clamping structure.

[0013] In one embodiment of this application, the NG mechanism includes a retrieval track and a receiving track, wherein the retrieval track is connected to the detection table and is inclined along the direction away from the clearance groove;

[0014] A movable structure connects the receiving track and the detection mechanism. The receiving track has a receiving part relative to multiple clamping structures. The receiving track has a recovery part relative to the receiving part. The width of the recovery part gradually decreases along the direction away from the receiving part. The end of the recovery part away from the receiving part has a splash-proof structure relative to the recovery track.

[0015] By adopting the above technical solution, this utility model has the following advantages:

[0016] 1. From a structural and functional perspective, the chip testing mechanism can be divided into a testing platform for installing and stabilizing the entire mechanism and improving the overall strength; a testing mechanism for efficiently testing the chips to be tested; a testing seat for loading multiple chips so that they can be quickly and stably tested at the testing mechanism; and a testing track inside the testing mechanism for transporting the testing seat into the testing mechanism. The testing seat can be equipped with multiple testing positions to simultaneously accept and assist chip testing. The testing seat or testing mechanism can be configured with a lifting function so that after the testing seat is in place, the testing positions can be connected to the testing mechanism, which can effectively improve the testing efficiency.

[0017] 2. The detection base is connected to a clamping mechanism. The detection position has a clearance part relative to the clamping mechanism, and the clamping mechanism has a clamping part relative to the clearance part. After chips of different specifications enter the detection position, the clamping mechanism will be activated and the chips will be gradually clamped by the clamping part. This allows the chip detection mechanism to be used to detect chips of various models, which can effectively improve the user experience.

[0018] 3. The testing station is equipped with an NG (Not From) mechanism relative to the testing mechanism. When the testing mechanism detects a problem with a chip, the NG mechanism can quickly remove the problematic chip, which can effectively improve product quality. Through the above structure, the testing efficiency can be effectively improved and the quality of the products removed after testing can be guaranteed. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0020] Figure 1 This is a schematic diagram of the mechanical keyboard chip detection mechanism of this utility model;

[0021] Figure 2 This is a front view of the mechanical keyboard chip testing mechanism of this utility model;

[0022] Figure 3 This is a rear view of the mechanical keyboard chip testing mechanism of this utility model.

[0023] Explanation of icon numbers:

[0024] 1. Inspection table; 11. Clearance groove; 12. Inspection track; 13. Balance track; 2. Inspection seat; 21. Inspection position; 22. Drive seat; 23. Lifting structure; 3. Clamping mechanism; 31. Clamping part; 32. Drive part; 4. Inspection mechanism; 41. Clamping structure; 5. NG mechanism; 51. Recycling track; 52. Receiving track; 53. Receiving part; 54. Recycling part; 6. Moving structure.

[0025] The realization of the purpose, functional features and advantages of this utility model will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0026] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0027] Reference Figures 1 to 3 To achieve the above objectives, this utility model proposes a mechanical keyboard chip testing mechanism 4, which includes a testing platform 1, a testing track 12 and a testing mechanism 4 on the testing platform 1, the testing track 12 passing through the testing mechanism 4, a testing seat 2 on the testing track 12, a plurality of testing positions 21 arrayed facing the testing mechanism 4, a pressing mechanism 3 connected to one side of the testing seat 2, a plurality of pressing parts 31 protruding from the pressing parts 21 array relative to the testing positions 21, a clearance part being provided for the testing positions 21 relative to the pressing parts 31, and the pressing parts 31 being connected to the testing positions 21;

[0028] The NG mechanism 5 is connected to one side of the testing mechanism 4.

[0029] From a structural and functional perspective, the chip testing mechanism 4 can be divided into a testing platform 1 for installing and stabilizing the entire mechanism and improving the overall strength; a testing mechanism 4 for efficiently testing the chips to be tested; a testing seat 2 for loading multiple chips so that they can be quickly and stably tested at the testing mechanism 4; and a testing track 12 that passes through the inside of the testing mechanism 4 to transport the testing seat 2 into the testing mechanism 4. The testing seat 2 can be equipped with multiple testing positions 21 to simultaneously receive and assist in chip testing. The testing seat 2 or the testing mechanism 4 can be configured with a lifting function so that after the testing seat 2 is in place, the testing positions 21 can be connected to the testing mechanism 4, which can effectively improve the testing efficiency.

[0030] The detection base 2 is connected to the clamping mechanism 3. The detection position 21 is provided with a clearance part relative to the clamping mechanism 3. The clamping mechanism 3 is provided with a clamping part 31 relative to the clearance part. After chips of different specifications enter the detection position 21, the clamping mechanism 3 will be activated and the chips will be gradually clamped by the clamping part 31. This allows the chip detection mechanism 4 to be used to detect chips of various models, which can effectively improve the user experience.

[0031] The testing station 1 is equipped with an NG mechanism 5 relative to the testing mechanism 4. When the testing mechanism 4 detects a problem with the chip, the NG mechanism 5 can quickly remove the problematic chip, which can effectively improve the quality of the product. Through the above structure, the testing efficiency can be effectively improved and the quality of the product removed after testing can be guaranteed.

[0032] See also Figure 1 In one embodiment of this application, the clamping mechanism 3 is connected to a driving part 32, which is connected to the side of the detection seat 2 away from the clamping mechanism 3. The driving part 32 passes through the detection seat 2 and has a driving rod facing the clamping mechanism 3.

[0033] The driving part 32 of the clamping structure is connected to the side of the detection seat 2 away from the clamping mechanism 3, so that one end of the detection seat 2 is connected to the clamping mechanism 3 and the other end is connected to the driving part 32. This can stabilize the entire clamping mechanism 3 structure, ensure the clamping effect, and prevent the chip from being damaged during the clamping process.

[0034] See also Figures 1 to 3 In one embodiment of this application, the detection platform 1 is provided with a clearance groove 11 relative to the detection track 12. The clearance groove 11 is connected to one side of the detection track 12. The other side of the detection platform 1 relative to the clearance groove 11 is provided with a balance track 13. One end of the detection seat 2 is connected to the balance track 13 and the other end is connected to the detection track 12.

[0035] A drive mechanism is provided on the other side of the detection track 12, and the detection seat 2 is driven to the drive mechanism.

[0036] The testing table 1 has a clearance groove 11. On both sides of the clearance groove 11, there are testing tracks 12 and balance tracks 13 respectively. On the side of the testing track 12 away from the clearance groove 11, there is a drive mechanism opposite to the testing seat 2. The design of the testing track 12 and the balance track 13 can make the movement of the testing seat 2 more stable. The design of the clearance groove 11 can better plan the layout of the testing table 1 and improve the overall strength of the testing table 1, which can effectively improve the service life of the testing mechanism 4.

[0037] See also Figures 1 to 3 In one embodiment of this application, the detection seat 2 is provided with a drive seat 22 relative to the drive mechanism, and the drive seat 22 is slidably connected to the detection track 12;

[0038] The drive seat 22 is provided with a lifting structure 23 at one end away from the detection position 21, and the lifting structure 23 passes through the clearance groove 11.

[0039] The bottom of the detection seat 2 is connected to the drive seat 22, which can more conveniently connect to the drive mechanism. At the same time, a lifting structure 23 can be set at the bottom of the drive seat 22 relative to the detection position 21. The clearance groove 11 can be used to place the lifting structure 23, which can effectively lower the center of gravity of the detection seat 2 and ensure the stability of the detection process.

[0040] See also Figures 1 to 2 In one embodiment of this application, the detection mechanism 4 is provided with a clamping structure 41 relative to each detection position 21, and each clamping structure 41 is connected to a solenoid valve. The NG mechanism 5 is connected to the clamping structure 41.

[0041] In addition to a detection structure for each detection position 21, the detection mechanism 4 can also have a clamping structure 41 for each detection position 21. The clamping structure 41 can be a pneumatic gripper or a mechanical gripper. A solenoid valve can control each clamping structure 41 independently. After the chip is detected on the detection mechanism 4, the unqualified chip detected by the electrical test will be fed back to the clamping structure 41. The corresponding clamping structure 41 can clamp the chip that needs to be rejected. When the detection seat 2 returns with qualified chips, the rejection mechanism 5 will connect to the clamping structure 41 to quickly recover the rejection chip. Through the above structure, the entire detection process can be highly integrated, which can effectively improve the detection efficiency. Moreover, the rejection of the chip will not disturb the chip testing process, which can ensure the efficiency of the entire detection.

[0042] See also Figures 2 to 3 In one embodiment of this application, the NG mechanism 5 includes a retrieval track 51 and a receiving track 52. The retrieval track 51 is connected to the detection table 1 and is inclined along the direction away from the relief groove 11.

[0043] A movable structure 6 is connected between the receiving track 52 and the detection mechanism 4. The receiving track 52 is provided with a receiving part 53 relative to multiple clamping structures 41. The receiving track 52 is provided with a recovery part 54 relative to the receiving part 53. The width of the recovery part 54 gradually decreases along the direction away from the receiving part 53. The end of the recovery part 54 away from the receiving part 53 is provided with an anti-splash structure relative to the recovery track 51.

[0044] The NG mechanism 5 includes a retrieval track 51 connecting to the NG bin and a receiving track 52 for connecting to the clamping structure 41 and receiving chips that need to be NG. The NG bin is connected to one side of the detection station 1. The receiving track 52 needs to connect to multiple clamping structures 41 at the same time to ensure that chips that need to be NG can be stably received no matter where they are located. The receiving track 52 has a wide receiving section 53 and a retrieval section 54 that gradually narrows from the receiving section 53 to the retrieval track 51. The above structure can stably receive chips. A moving structure 6 is provided between the receiving track and the detection mechanism 4. In this application, the moving mechanism is an electric telescopic rod. Depending on the function, the moving mechanism can be a cylinder with a push rod, a motor with a lead screw, or many other feasible structures. It is used to drive the connecting track to connect to the retrieval track 51 when the detection seat 2 leaves the detection mechanism 4, so as to facilitate the retrieval of chips.

[0045] The anti-splash structure is sealed at the end of the recycling section 54 and connected to the recycling track 51. It can be used to prevent the chip from rushing out of the NG mechanism 5, which can ensure recycling efficiency and improve the user experience.

[0046] In the accompanying drawings of this embodiment, the same or similar reference numerals correspond to the same or similar components. In the description of this application, it should be understood that if terms such as "upper," "lower," "left," and "right" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, they are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, the terms used to describe positional relationships in the accompanying drawings are only for illustrative purposes and should not be construed as limiting this patent. For those skilled in the art, the specific meaning of the above terms can be understood according to the specific circumstances.

[0047] The above are merely preferred embodiments of this application and are not intended to limit this application. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A mechanical keyboard chip testing mechanism, comprising a testing platform, characterized in that, The testing platform is provided with a testing track and a testing mechanism. The testing track passes through the testing mechanism and a testing seat is provided on the testing track. The testing seat has multiple testing positions facing the array of the testing mechanism. A clamping mechanism is connected to one side of the testing seat. The clamping mechanism has multiple clamping parts protruding relative to the array of testing positions. The testing positions have clearance parts relative to the clamping parts. The clamping parts are connected to the testing positions. The detection mechanism is connected to an NG mechanism on one side.

2. The mechanical keyboard chip testing mechanism according to claim 1, characterized in that, The clamping mechanism is connected to a drive unit, which is connected to the side of the detection seat away from the clamping mechanism. The drive unit passes through the detection seat and has a drive rod facing the clamping mechanism.

3. The mechanical keyboard chip testing mechanism according to claim 1, characterized in that, The testing platform is provided with a clearance groove relative to the testing track. The clearance groove is connected to one side of the testing track. The testing platform is provided with a balance track on the other side of the clearance groove. One end of the testing seat is connected to the balance track and the other end is connected to the testing track. A drive mechanism is provided on the other side of the detection track, and the detection seat is driven to the drive mechanism.

4. The mechanical keyboard chip detection mechanism according to claim 3, characterized in that, The detection seat is provided with a drive seat relative to the drive mechanism, and the drive seat is slidably connected to the detection track; The drive seat is provided with a lifting structure at one end away from the detection position, and the lifting structure passes through the clearance groove.

5. The mechanical keyboard chip detection mechanism according to claim 1, characterized in that, The detection mechanism is provided with a clamping structure for each detection position, and each clamping structure is connected to a solenoid valve. The NG mechanism is connected to the clamping structure.

6. The mechanical keyboard chip detection mechanism according to claim 5, characterized in that, The NG mechanism includes a retrieval track and a receiving track. The retrieval track is connected to the detection table and is inclined along the direction away from the clearance groove. A movable structure connects the receiving track and the detection mechanism. The receiving track has a receiving part relative to multiple clamping structures. The receiving track has a recovery part relative to the receiving part. The width of the recovery part gradually decreases along the direction away from the receiving part. The end of the recovery part away from the receiving part has a splash-proof structure relative to the recovery track.

Images