Hall element probe mapping device

Abstract

The application relates to a Hall element probe mapping device. The mapping device comprises a controller, a magnetic field measuring element, a magnetic field generating element, a data acquisition module and a display unit. The controller is used for adjusting the magnetic induction intensity of the magnetic field generated by the magnetic field generating element. The magnetic field measuring element is used for measuring the magnetic induction intensity and transmitting the magnetic induction intensity information to the controller. The data acquisition module is electrically connected with the controller and is used for being electrically connected with the Hall element probe to acquire the voltage value of the Hall element probe and transmit the voltage value information to the controller. The display unit is electrically connected with the controller. The controller is used for generating a mapping curve on the display unit according to the magnetic induction intensity information and the voltage value information. Through the setting of the Hall element probe mapping device, the output characteristic curve of the Hall element probe under different magnetic fields can be directly mapped, and temporary external circuits, fixing devices and the like are not needed, so that the convenience of mapping the output characteristic curve of the Hall element probe under different magnetic fields is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of power distribution maintenance, in particular to a Hall element probe mapping device. BACKGROUND

[0002] Generally, a Hall element probe is arranged on one side of a main magnet machine of a nuclear power plant to determine whether the main magnet machine is normally running. When the Hall element probe needs to be replaced during the overhaul of the main magnet machine of the nuclear power plant, the output characteristic curve of the Hall element probe under different magnetic fields needs to be mapped, so that the characteristic curve obtained when the original Hall element probe is monitored can be compared to select a Hall element probe spare part with similar functional characteristics. However, there is no special Hall element probe mapping device on the market, and the Hall element probe needs to be temporarily connected with a circuit, a fixing device and the like, so that the output curve mapping work of the Hall element probe is complicated. CONTENT OF THE UTILITY MODEL

[0003] Therefore, it is necessary to provide a Hall element probe mapping device to solve the technical problem that the Hall element probe needs to be temporarily connected with a circuit, a fixing device and the like, so that the output curve mapping work of the Hall element probe is complicated in the prior art.

[0004] A Hall element probe mapping device comprises:

[0005] A magnetic field generating part for generating a magnetic field;

[0006] A controller electrically connected with the magnetic field generating part, the controller being configured to adjust the magnetic induction intensity of the magnetic field generated by the magnetic field generating part;

[0007] A magnetic field measuring part electrically connected with the controller, the magnetic field measuring part being configured to measure the magnetic induction intensity of the magnetic field generated by the magnetic field generating part and transmit the magnetic induction intensity information to the controller;

[0008] A data acquisition module electrically connected with the controller and configured to be electrically connected with a Hall element probe, the data acquisition module being configured to acquire a voltage value generated by the Hall element probe under the magnetic induction intensity and transmit the voltage value information to the controller; and

[0009] A display unit electrically connected with the controller, the controller being configured to generate a mapping curve on the display unit according to the magnetic induction intensity information and the voltage value information.

[0010] In one of the embodiments, the Hall element probe mapping device further comprises a first power supply module configured to supply power to the Hall element probe.

[0011] In one embodiment, the Hall element probe mapping device includes a housing, which includes a frame and a cover plate. The frame has a mounting groove, and the controller, the magnetic field measuring device, the magnetic field generating device, and the data acquisition module are all installed in the mounting groove. One end of the cover plate is rotatably connected to the frame, and the other end is detachably connected to the frame. The cover plate is used to cover the opening of the mounting groove.

[0012] In one embodiment, the display unit is installed in the mounting slot; or the display unit is installed on the outer wall of the housing.

[0013] In one embodiment, the Hall element probe mapping device includes a first fixed bracket, which is housed in the mounting groove and connected to the groove wall of the mounting groove. The first fixed bracket is placed on one side of the magnetic field generator, and the magnetic field measuring element is mounted on the first fixed bracket.

[0014] In one embodiment, the first fixed bracket includes a support column and a support block connected to each other. The support column is connected to the wall of the mounting groove, and the support block is connected to the magnetic field measuring device. The support block is movable relative to the support column along the extension direction of the support column.

[0015] In one embodiment, the support block is provided with a mounting hole, the magnetic field measuring element passes through the mounting hole, and one end of the magnetic field measuring element is provided with a protrusion for abutting against the support block, and the other end of the magnetic field measuring element is provided with a detachably connected limiting ring, the limiting ring being used to abut against the side of the support block opposite to the protrusion.

[0016] In one embodiment, the Hall element probe mapping device includes a second fixing bracket located in the mounting groove and connected to the groove wall, and the second fixing bracket is placed on one side of the magnetic field generator, and the second fixing bracket is used to connect to the Hall element probe.

[0017] In one embodiment, the second fixing bracket includes a base and a support platform. The base is connected to the wall of the mounting groove, and the support platform is used to connect to the Hall element probe. The support platform is slidably connected to the base so that the support platform can move closer to or further away from the magnetic field generator.

[0018] In one embodiment, the second fixing bracket further includes a limiting rod connected to the side of the support platform away from the magnetic field generator, and partially protruding relative to the support platform to abut against the wall of the mounting groove. The limiting rod is movable relative to the support platform along its own extension direction to change the length of the protrusion of the limiting rod relative to the support platform.

[0019] Beneficial effects:

[0020] The Hall element probe mapping device provided in this application includes a controller, a magnetic field measuring device, a magnetic field generating device, a data acquisition module, and a display unit. The magnetic field generating device generates a magnetic field. The controller is electrically connected to the magnetic field generating device and is used to adjust the magnetic induction intensity of the magnetic field generated by the magnetic field generating device. The magnetic field measuring device is electrically connected to the controller and is used to measure the magnetic induction intensity of the magnetic field generated by the magnetic field generating device and transmit the magnetic induction intensity information to the controller. The data acquisition module is electrically connected to the controller and is used to connect to the Hall element probe. The data acquisition module is used to acquire the voltage value generated by the Hall element probe under the magnetic induction intensity and transmit the voltage value information to the controller. The display unit is electrically connected to the controller and is used to generate a mapping curve on the display unit based on the magnetic induction intensity information and the voltage value information.

[0021] In this application, the magnetic field strength generated by the magnetic field generator is adjusted by a controller, and the magnetic field strength is measured by a magnetic field measuring device. This allows the data acquisition module to collect the output voltage of the Hall element probe under different magnetic field strengths. Based on the magnetic field strength and voltage information, the controller controls the display unit to generate a plotted curve, facilitating comparison with the characteristic curve obtained during the original Hall element probe monitoring. This allows for functional mapping and judgment of the Hall element probe, enabling accurate selection of Hall element probe spares with similar functional characteristics. In other words, this application, through the Hall element probe mapping device, can directly plot the output characteristic curves of the Hall element probe under different magnetic fields without the need for temporary external circuits or fixing devices. This improves the stability of the Hall element probe's input voltage and the convenience of plotting the output characteristic curves of the Hall element probe under different magnetic fields. Attached Figure Description

[0022] Figure 1 A partial schematic diagram of a Hall element probe mapping device provided in an embodiment of this application. Figure 1 .

[0023] Figure 2 A partial schematic diagram of a Hall element probe mapping device provided in an embodiment of this application. Figure 2 .

[0024] Figure 3This is a schematic diagram of the housing of the Hall element probe mapping device provided in one embodiment of this application when the housing is open.

[0025] Figure 4 This is a schematic diagram of the Hall element probe mapping device provided in one embodiment of this application when the housing is closed.

[0026] Figure 5 This is a schematic diagram of the second mounting bracket in a Hall element probe mapping device provided in an embodiment of this application.

[0027] Icon labels:

[0028] 100 - Magnetic field generator; 110 - Base; 120 - Coil; 130 - Second power supply module; 200 - Controller; 300 - Magnetic field measuring component; 310 - Gaussmeter probe; 320 - Gaussmeter mainboard; 400 - Hall element probe; 510 - Main unit panel; 520 - Output voltage measurement interface; 530 - Input voltage measurement interface; 540 - Adjustment knob; 550 - First switch; 560 - Main power switch; 570 - Gaussmeter display panel; 580 - Controllable power supply panel; 600 - Housing; 610 - Frame ; 611-Mounting slot; 612-Slot bottom wall; 613-Quick interface; 620-Cover plate; 630-Lock; 640-Locking ring; 650-First fixed bracket; 651-Support column; 652-Support block; 653-First fastener; 654-Limit ring; 660-Second fixed bracket; 661-Base; 662-Support platform; 663-Limit rod; 664-Guide rail; 665-Slider; 670-Mounting frame; 700-First power supply module; 800-Third power supply module; 900-Data acquisition module. Detailed Implementation

[0029] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0030] In the description of this application, it should be understood that if terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" appear, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0031] Furthermore, where the terms "first" and "second" appear, these terms are for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, where the term "multiple" appears, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0032] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0033] In this application, unless otherwise expressly specified and limited, the use of descriptions such as "above" or "below" the second feature indicates that the first and second features are in direct contact or indirect contact via an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. Similarly, "below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0034] It should be noted that if an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. If an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. If so, the terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application are for illustrative purposes only and do not represent the only possible implementation.

[0035] See Figure 1 and Figure 2 , Figure 1 A partial schematic diagram of a Hall element probe mapping device provided in an embodiment of this application. Figure 1 . Figure 2 A partial schematic diagram of a Hall element probe mapping device provided in an embodiment of this application. Figure 2 An embodiment of this application provides a Hall element probe mapping device, including a controller 200, a magnetic field measuring device 300, a magnetic field generating device 100, a data acquisition module 900, and a display unit. The magnetic field generating device 100 is used to generate a magnetic field. The controller 200 is electrically connected to the magnetic field generating device 100 and is used to adjust the magnetic induction intensity of the magnetic field generated by the magnetic field generating device 100. The magnetic field measuring device 300 is electrically connected to the controller 200 and is used to measure the magnetic induction intensity of the magnetic field generated by the magnetic field generating device 100 and transmit the magnetic induction intensity information to the controller 200. The data acquisition module 900 is electrically connected to the controller 200 and is used to be electrically connected to the Hall element probe 400. The data acquisition module 900 is used to acquire the voltage value generated by the Hall element probe 400 under the magnetic induction intensity and transmit the voltage value information to the controller 200. The display unit is electrically connected to the controller 200 and the controller 200 is used to generate a mapping curve on the display unit based on the magnetic induction intensity information and the voltage value information.

[0036] Specifically, in this application, the controller 200 adjusts the magnetic induction intensity of the magnetic field generated by the magnetic field generator 100, and the magnetic field measuring device 300 measures the magnetic induction intensity of the magnetic field generated by the magnetic field generator 100. This allows the data acquisition module 900 to collect the output voltage of the Hall element probe 400 under different magnetic field intensities. Based on the magnetic induction intensity and voltage value information, the controller 200 controls the display unit to generate a plotted curve, facilitating comparison with the characteristic curve obtained during monitoring of the original Hall element probe 400. This allows for functional mapping and judgment of the Hall element probe 400, enabling accurate selection of a Hall element probe 400 spare with similar functional characteristics. In other words, this application, through the setting of the Hall element probe mapping device, can directly plot the output characteristic curve of the Hall element probe 400 under different magnetic fields without the need for temporary external circuits or fixing devices. This improves the stability of the input voltage of the Hall element probe 400 and the convenience of plotting the output characteristic curve of the Hall element probe 400 under different magnetic fields.

[0037] It should be noted that this application includes a Hall element characteristic curve mapping platform software, which enables the controller 200 to generate a mapping curve on the display unit based on magnetic induction intensity information and voltage value information.

[0038] See Figure 1 and Figure 2 In one embodiment, the Hall element probe mapping device further includes a first power supply module 700, which is used to supply power to the Hall element probe 400. Thus, when mapping and determining the function of the Hall element probe 400, no temporary external circuit is required, ensuring the stability of the power supply and reducing the risk of damage to the Hall element probe 400.

[0039] The core technology of this device lies in the high integration of the magnetic field generator 100, the magnetic field measuring device 300, the data acquisition module 900, and the first power supply module 700. By precisely controlling the magnetic field generator 100 to generate a magnetic field, the Hall element probe 400 is detected to acquire corresponding data and plot curves, thereby realizing the functional mapping and judgment of the Hall element probe 400.

[0040] See Figure 1 and Figure 2 In one embodiment, the magnetic field generator 100 includes a coil 120 and a second power supply module 130. The second power supply module 130 is electrically connected to the coil 120 and a controller 200. The second power supply module 130 supplies power to the coil 120, and the controller 200 controls the output current of the second power supply module 130 to change the magnetic induction intensity of the magnetic field generated by the coil 120. Preferably, the magnetic field generator 100 is a magnetic field generator.

[0041] Furthermore, the second power supply module 130 is electrically connected to the data acquisition module, thereby enabling the data acquisition module to measure the power supply supplied by the second power supply module 130 to the coil 120, that is, to measure the input current value and input current value of the coil 120, so as to ensure that the input current value and input current value are normal, thereby improving the reliability of the Hall element probe mapping device.

[0042] Furthermore, the Hall element probe mapping device also includes a third power supply module 800, which is electrically connected to the data acquisition module 900 and supplies power to the data acquisition module 900. The data acquisition module 900 also acquires the input voltage of the Hall element probe 400 to ensure a normal power supply voltage.

[0043] See Figure 1 and Figure 2 In one embodiment, the magnetic field measuring device 300 is a gaussmeter, which includes a gaussmeter probe 310 and a gaussmeter mainboard 320. The gaussmeter mainboard 320 is electrically connected to the gaussmeter probe 310 and the controller 200. The gaussmeter probe 310 directly contacts the magnetic field being measured, converting the magnetic field strength into an electrical signal. The gaussmeter mainboard 320 receives the electrical signal transmitted by the gaussmeter probe 310, and after amplification, filtering, analog-to-digital conversion, etc., obtains the magnetic field strength value, and transmits the magnetic induction intensity value to the controller 200. In other embodiments, the magnetic field measuring device 300 can be anything else, as long as it can measure the magnetic field induction intensity.

[0044] See Figure 1 , Figure 2 , Figure 3 and Figure 4 , Figure 3 This is a schematic diagram of the housing of the Hall element probe mapping device provided in one embodiment of this application when the housing is opened. Figure 4 This is a schematic diagram of the Hall element probe mapping device provided in one embodiment of this application when the housing is closed. In one embodiment, the Hall element probe mapping device includes a housing 600, which includes a frame 610 and a cover plate 620. The frame 610 has a mounting groove 611. The controller 200, the magnetic field measuring device 300, the magnetic field generating device 100, and the data acquisition module 900 are all installed in the mounting groove 611. One end of the cover plate 620 is rotatably connected to the frame 610, and the other end is detachably connected to the frame 610. The cover plate 620 is used to cover the opening of the mounting groove 611.

[0045] Specifically, the enclosure 600 integrates all components, facilitating convenient, safe, and reliable operation of the Hall element probe mapping device during the overall testing process. Furthermore, the enclosure 600 is a non-standard, custom-designed unit, making it easy to carry and move to different locations for testing. The cover 620 is rotatably connected to the frame 610 at one end and detachably connected to the frame 610 at the other end, allowing easy opening of the enclosure 600 to facilitate the installation of the Hall element probe 400 into the mounting slot 611 and its electrical connection to the components within the slot. The first power supply module 700 is installed inside the enclosure 600, and the outer wall of the frame 610 has a rotary quick-connect interface 613 for convenient quick connection to an external power source.

[0046] See Figure 1 and Figure 2 In one embodiment, the Hall element probe mapping device further includes a mounting frame 670, which is installed within a mounting slot 611 and located on one side of the magnetic field generator 100. A first power supply module 700, a second power supply module 130, a third power supply module 800, a data acquisition module 900, a gaussmeter mainboard 320, and a controller 200 are all mounted within the mounting frame 670, integrated into a detection host. The detection host has a reserved interface for an external multimeter plug, allowing for additional measurement of the input and output voltages of the Hall element probe. This integrated setup of the detection host simplifies the overall structure of the Hall element probe mapping device, making it convenient to use and maintain.

[0047] See Figure 1 , Figure 2 , Figure 3 and Figure 4 In one embodiment, the display unit is mounted within the mounting slot 611, which protects the display unit and facilitates the carrying of the Hall element probe mapping device. In other embodiments, the display unit can also be mounted on the outer wall of the housing 600, thereby reducing the size of the housing 600 and miniaturizing it. Preferably, the display unit is a display panel.

[0048] In this embodiment, the controller 200 is electrically connected to a computer, the display unit is a display panel on the computer, and the Hall element characteristic curve mapping platform software is installed on the computer. In other embodiments, the display unit may be other components.

[0049] Furthermore, the Hall element probe mapping device also includes a main panel 510, which is mounted on the mounting frame 670. The main panel 510 is provided with a gaussmeter display panel 570 and a controllable power supply panel 580. The gaussmeter display panel 570 is used to display the magnetic induction intensity value measured by the gaussmeter, and the controllable power supply panel 580 is used to display the input voltage and input of the magnetic field generator 100.

[0050] Furthermore, the main control panel 510 is equipped with an output voltage measurement interface 520 and an input voltage measurement interface 530. These interfaces are used to connect an external multimeter to measure the output and input voltage values ​​of the Hall element probe 400. The main control panel 510 also includes a first switch 550 for controlling the first power supply module 700 and an adjustment knob 540 for adjusting the output voltage of the first power supply module 700, thereby meeting the needs of different Hall element probes 400 and improving the adaptability of the Hall element probe mapping device. Additionally, the main control panel 510 includes a main power switch 560 for the Hall element probe mapping device, facilitating convenient control of the device's on / off operation.

[0051] See Figure 1 , Figure 2 , Figure 3 and Figure 4 In one embodiment, one of the cover plate 620 and the frame 610 is provided with a latch 630, and the other is provided with a locking ring 640. The latch 630 is used to cooperate with the locking ring 640 to lock the cover plate 620 and the frame 610, ensuring the reliability of the housing 600. The latch 630 is provided on the frame 610.

[0052] See Figure 1 and Figure 2 In one embodiment, the Hall element probe mapping device includes a first fixed bracket 650, which is housed in a mounting groove 611 and connected to the groove wall of the mounting groove 611. The first fixed bracket 650 is placed on one side of the magnetic field generator 100, and the magnetic field measuring element 300 is mounted on the first fixed bracket 650.

[0053] Specifically, the magnetic field generator 100 is connected to the wall of the mounting groove 611. By placing the first fixed bracket 650 on one side of the magnetic field generator 100 and mounting the gaussmeter probe 310 on the first fixed bracket 650, the position of the gaussmeter probe 310 relative to the magnetic field generator 100 is fixed. This allows for accurate measurement of the magnetic field induction intensity when plotting the output characteristic curves of the Hall element probe 400 under different magnetic fields, improving the functional measurement accuracy of the Hall element probe 400 and enhancing the reliability of the Hall element probe plotting device. In other words, in this application, the gaussmeter probe 310 is fixed to the designated detection position using a specially designed bracket to ensure detection accuracy.

[0054] See Figure 1 and Figure 2In one embodiment, the first fixed bracket 650 includes a support column 651 and a support block 652 connected to each other. The support column 651 is connected to the wall of the mounting groove 611, and the support block 652 is connected to the magnetic field measuring component 300. The support block 652 can move relative to the support column 651 along the extension direction of the support column 651 to adjust the height position of the gaussmeter probe 310 relative to the magnetic field generator 100. This can improve the assembly error of the gaussmeter probe 310, so that the gaussmeter probe 310 is installed at the target position, thereby accurately improving the accuracy of the magnetic field measuring component 300 in measuring the magnetic field induction intensity.

[0055] Furthermore, the support column 651 is connected to the bottom wall 612 of the mounting groove 611 and extends vertically. The support block 652 is sleeved on the support column 651. The first fixed bracket 650 also includes a first fastener 653, which passes through the support block 652 and is threadedly connected to it. The first fastener 653 is used to abut against the support column 651 to limit the height of the support block 652 relative to the support column 651 in the vertical direction. Preferably, the first fastener 653 is a bolt.

[0056] See Figure 1 and Figure 2 In one embodiment, the support block 652 is provided with a mounting hole, the magnetic field measuring element 300 passes through the mounting hole, and one end of the magnetic field measuring element 300 is provided with a protrusion for abutting against the support block 652, and the other end of the magnetic field measuring element 300 is provided with a detachably connected limiting ring 654, which abuts against the side of the support block 652 away from the protrusion.

[0057] Specifically, the gaussmeter probe 310 is inserted through the mounting hole, and the protrusion and the limiting ring 654 are both provided on the gaussmeter probe 310. The protrusion and the limiting ring 654 abut against the support block 652 to stably limit the sliding of the gaussmeter probe 310 relative to the support block 652, so as to ensure that the position of the gaussmeter probe 310 relative to the support block 652 is fixed and improve the accuracy of the magnetic field measuring component 300 in measuring the magnetic field induction intensity.

[0058] When installing the gaussmeter probe 310, the limiting ring 654 can be removed from the gaussmeter probe 310 first. Then, the side of the gaussmeter probe 310 away from the protrusion can be inserted into the mounting hole. After the gaussmeter probe 310 is installed in place, the limiting ring 654 can be installed on the gaussmeter probe 310 so that the limiting ring 654 abuts against the support block 652 to ensure the consistency of the position of the gaussmeter probe 310 during repeated installation.

[0059] Furthermore, the limiting ring 654 is provided with a fastening hole, and the first fixed bracket 650 also includes a second fastener, which passes through the fastening hole and is threaded to the hole wall of the fastening hole, and abuts against the gaussmeter probe 310 to limit the relative movement of the limiting ring 654 and the gaussmeter probe 310.

[0060] See Figure 1 and Figure 2 In one embodiment, the Hall element probe mapping device includes a second fixed bracket 660, which is located in the mounting groove 611 and connected to the groove wall of the mounting groove 611. The second fixed bracket 660 is placed on one side of the magnetic field generator 100 and is used to connect to the Hall element probe 400.

[0061] Specifically, the magnetic field generator 100 is connected to the wall of the mounting groove 611. By placing the second fixed bracket 660 on one side of the magnetic field generator 100 and mounting the Hall element probe 400 on the second fixed bracket 660, the position of the Hall element probe 400 relative to the magnetic field generator 100 is fixed. This ensures the accuracy of the output voltage of the Hall element probe 400 under the current magnetic field induction intensity when plotting the output characteristic curves of the Hall element probe 400 under different magnetic fields, improving the measurement accuracy of the Hall element probe 400 function and the reliability of the Hall element probe plotting device. In other words, in this application, the Hall element probe 400 is fixed to the designated detection position by a specially designed bracket, ensuring detection accuracy.

[0062] Furthermore, the second fixed bracket 660 is positioned on the side of the magnetic field generator 100 away from the gaussmeter probe 310, thereby reducing interference with the gaussmeter probe 310. The mounting position of the Hall element probe 400 corresponds to the mounting position of the gaussmeter probe 310, ensuring the accuracy of the output voltage of the Hall element probe 400 under the current magnetic field induction intensity measured by the magnetic field measuring device 300, improving the functional measurement accuracy of the Hall element probe 400, and enhancing the reliability of the Hall element probe mapping device.

[0063] See Figure 1 , Figure 2 and Figure 5 , Figure 5This is a schematic diagram of the second mounting bracket in a Hall element probe mapping device provided in one embodiment of this application. In one embodiment, the second mounting bracket 660 includes a base 661 and a support platform 662. The base 661 is connected to the wall of the mounting groove 611, and the support platform 662 is used to connect to the Hall element probe 400. The support platform 662 is slidably connected to the base 661 so that the support platform 662 can move closer to or further away from the magnetic field generator 100, thereby facilitating the adjustment of the position of the Hall element probe 400 relative to the magnetic field generator 100. During the measurement process, the Hall element probe 400 moves to the target position to accurately measure the output voltage value under the current magnetic field induction intensity. After the measurement is completed, the support platform 662 can move the Hall element probe 400 away from the magnetic field generator 100 to facilitate the disassembly and installation of the Hall element probe 400.

[0064] Furthermore, the base 661 is installed on the bottom wall 612 of the mounting groove 611, and the base 661 is provided with a guide rail 664 extending along the arrangement direction of the gaussmeter probe 310 and the magnetic field generator 100. The support platform 662 is provided with a slider 665, which is in concave-convex fit with the guide rail 664 and can slide relative to the guide rail 664 along the arrangement direction of the gaussmeter probe 310 and the magnetic field generator 100, thereby playing a guiding role.

[0065] See Figure 1 , Figure 2 and Figure 5 In one embodiment, the second fixed bracket 660 further includes a limiting rod 663, which is connected to the side of the support platform 662 away from the magnetic field generator 100 and partially protrudes relative to the support platform 662 to abut against the groove wall of the mounting groove 611. The limiting rod 663 can move relative to the support platform 662 along its own extension direction to change the length of the protrusion of the limiting rod 663 relative to the support platform 662.

[0066] Specifically, during the measurement process, when the support platform 662 drives the Hall element probe 400 to slide relative to the base 661 to a preset position, the limiting rod 663 can be controlled to move relative to the support platform 662 along its own extension direction. This changes the length of the protrusion of the limiting rod 663 relative to the support platform 662, allowing the limiting rod 663 to abut against the wall of the mounting groove 611. This restricts the support platform 662 from moving away from the magnetic field generator 100, improving the reliability of the positional stability of the Hall element probe 400 relative to the magnetic field generator 100. Specifically, the side of the Hall element probe 400 closest to the magnetic field generator 100 abuts against the magnetic field generator 100, thus stably limiting the reliability of the positional stability of the Hall element probe 400 relative to the magnetic field generator 100.

[0067] Furthermore, the limiting rod 663 is threadedly connected to the support platform 662. Preferably, the limiting rod 663 is a bolt.

[0068] See Figure 1 and Figure 2 In one embodiment, the magnetic field generator 100 further includes a base 110 connected to the wall of the mounting groove 611 and positioned between the gaussmeter probe 310 and the Hall element probe 400, with the coil 120 mounted on the base 110.

[0069] The detection host is located on one side of the arrangement direction of the gaussmeter probe 310 and the Hall element probe 400, and is located on the side away from the latch 630.

[0070] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0071] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A Hall element probe mapping device, characterized in that, The Hall element probe mapping device includes: A magnetic field generator, wherein the magnetic field generator is used to generate a magnetic field; A controller, electrically connected to the magnetic field generator, is used to adjust the magnetic induction intensity of the magnetic field generated by the magnetic field generator; A magnetic field measuring device is electrically connected to the controller. The magnetic field measuring device is used to measure the magnetic induction intensity of the magnetic field generated by the magnetic field generator and transmit the magnetic induction intensity information to the controller. A data acquisition module, electrically connected to the controller and also electrically connected to a Hall element probe, is used to acquire the voltage value generated by the Hall element probe under the magnetic induction intensity and transmit the voltage value information to the controller; and... The display unit is electrically connected to the controller, and the controller is used to generate a plotted curve on the display unit based on the magnetic induction intensity information and the voltage value information.

2. The Hall element probe mapping device according to claim 1, characterized in that, The Hall element probe mapping device further includes a first power supply module, which is used to supply power to the Hall element probe.

3. The Hall element probe mapping device according to claim 1, characterized in that, The Hall element probe mapping device includes a housing, which includes a frame and a cover plate. The frame has a mounting groove, and the controller, the magnetic field measuring element, the magnetic field generating element and the data acquisition module are all installed in the mounting groove. One end of the cover plate is rotatably connected to the frame, and the other end is detachably connected to the frame. The cover plate is used to cover the opening of the mounting groove.

4. The Hall element probe mapping device according to claim 3, characterized in that, The display unit is installed in the mounting slot; or the display unit is installed on the outer wall of the housing.

5. The Hall element probe mapping device according to claim 3, characterized in that, The Hall element probe mapping device includes a first fixed bracket, which is housed in the mounting groove and connected to the groove wall. The first fixed bracket is placed on one side of the magnetic field generator, and the magnetic field measuring element is mounted on the first fixed bracket.

6. The Hall element probe mapping device according to claim 5, characterized in that, The first fixed bracket includes a support column and a support block connected to each other. The support column is connected to the wall of the mounting groove, and the support block is connected to the magnetic field measuring device. The support block is movable relative to the support column along the extension direction of the support column.

7. The Hall element probe mapping device according to claim 6, characterized in that, The support block is provided with mounting holes, the magnetic field measuring element passes through the mounting holes, and one end of the magnetic field measuring element is provided with a protrusion for abutting against the support block. The other end of the magnetic field measuring element is provided with a detachable limiting ring, which abuts against the side of the support block away from the protrusion.

8. The Hall element probe mapping device according to any one of claims 3-7, characterized in that, The Hall element probe mapping device includes a second fixed bracket, which is located in the mounting groove and connected to the groove wall. The second fixed bracket is placed on one side of the magnetic field generator and is used to connect to the Hall element probe.

9. The Hall element probe mapping device according to claim 8, characterized in that, The second fixed bracket includes a base and a support platform. The base is connected to the wall of the mounting groove, and the support platform is used to connect to the Hall element probe. The support platform is slidably connected to the base so that the support platform can move closer to or further away from the magnetic field generator.

10. The Hall element probe mapping device according to claim 9, characterized in that, The second fixed bracket also includes a limiting rod, which is connected to the side of the support platform away from the magnetic field generator and partially protrudes relative to the support platform to abut against the wall of the mounting groove. The limiting rod can move relative to the support platform along its own extension direction to change the length of the protrusion of the limiting rod relative to the support platform.

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