Nand flash memory chip testing fixture
By designing an automated NAND Flash test fixture, automatic chip alignment and locking were achieved, solving the problem of low efficiency in traditional manual operation and improving testing efficiency and product stability.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHENZHEN JIADE SEMICONDUCTOR TECHNOLOGY CO LTD
- Filing Date
- 2025-11-05
- Publication Date
- 2026-07-21
AI Technical Summary
Traditional NAND Flash chip testing fixtures rely on manual operation, resulting in low efficiency, long testing time per batch, and problems such as poor contact or damage to chip pins, making them difficult to meet the efficiency requirements of large-scale production.
An automated test fixture was designed, comprising a test stand, an alignment mechanism, a locking mechanism, and a feeding mechanism. The fixture achieves automatic chip loading by driving a push plate with a cylinder, precise alignment without manual calibration is achieved by the alignment mechanism, fast locking and unlocking is achieved by the locking mechanism, and convenient material unloading is achieved by the feeding mechanism. The multiple mechanisms work together.
The process of chip testing has been automated, which has improved testing efficiency, reduced manual operation time, ensured chip stability and testing accuracy, and met the needs of large-scale production.
Smart Images

Figure CN224536707U_ABST