Nand flash memory chip testing fixture

By designing an automated NAND Flash test fixture, automatic chip alignment and locking were achieved, solving the problem of low efficiency in traditional manual operation and improving testing efficiency and product stability.

CN224536707UActive Publication Date: 2026-07-21SHENZHEN JIADE SEMICONDUCTOR TECHNOLOGY CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
SHENZHEN JIADE SEMICONDUCTOR TECHNOLOGY CO LTD
Filing Date
2025-11-05
Publication Date
2026-07-21

AI Technical Summary

Technical Problem

Traditional NAND Flash chip testing fixtures rely on manual operation, resulting in low efficiency, long testing time per batch, and problems such as poor contact or damage to chip pins, making them difficult to meet the efficiency requirements of large-scale production.

Method used

An automated test fixture was designed, comprising a test stand, an alignment mechanism, a locking mechanism, and a feeding mechanism. The fixture achieves automatic chip loading by driving a push plate with a cylinder, precise alignment without manual calibration is achieved by the alignment mechanism, fast locking and unlocking is achieved by the locking mechanism, and convenient material unloading is achieved by the feeding mechanism. The multiple mechanisms work together.

Benefits of technology

The process of chip testing has been automated, which has improved testing efficiency, reduced manual operation time, ensured chip stability and testing accuracy, and met the needs of large-scale production.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a kind of Nand Flash storage chip test fixture, including test seat, the test groove is set in the center of test seat upper surface, the connecting terminal is fixedly installed in the test groove bottom, the connecting rod is fixedly installed in test seat upper surface four corners, the spring is arranged in the outer wall of connecting rod, two symmetrically arranged installation grooves are opened in the left and right sides of test seat, the outer wall of multiple connecting rods is slidably connected with pressing plate, the spring is located between test seat and pressing plate;Alignment mechanism, the alignment mechanism is fixedly installed in the top of pressing plate, realizes the automatic continuous conveying of multiple chips by blanking mechanism, the chip rack of base installation platform can be stacked and placed multiple chips to be tested, cylinder drives push plate and quickly pushes the lowermost chip into alignment mechanism.
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