Iv test fixture for solar cells
By designing an IV test fixture with an elastic dielectric and insulating layer, the problem of low reliability of traditional fixtures in fine grid testing of gridless solar cells was solved, achieving stable current and voltage signal acquisition and reducing the risk of cell damage.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- TRINA SOLAR CO LTD
- Filing Date
- 2025-07-08
- Publication Date
- 2026-07-21
AI Technical Summary
Traditional main grid type IV test fixtures have difficulty accurately positioning the fine grids of gridless cells, resulting in large fluctuations in test data, low reliability, and a significant reduction in data reliability.
An IV test fixture was designed, which adopts an elastic medium and an elastic pressure plate structure. It achieves close contact with the fine grid through elastic deformation, and uses an insulating layer to isolate the elastic medium to prevent short circuit risk. It uses a line contact method to collect current and voltage signals.
It improves the reliability and stability of test data, reduces the risk of cell breakage, enhances the uniformity of contact area, and avoids damage caused by traditional point contact.
Smart Images
Figure CN224538159U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of photovoltaic cell testing technology, and in particular to IV test fixtures for solar cells. Background Technology
[0002] In recent years, with the development of the photovoltaic industry, busbarless cell technology has significantly reduced the amount of silver paste used and lowered production costs by eliminating the main grid design of the cell and retaining only a fine grid. At the same time, the busbarless design increases the effective light-receiving area of the cell, improving cell efficiency and module power. Furthermore, the use of more and finer solder ribbons increases the number of current-carrying contact points, resulting in more uniform stress distribution, reducing the risk of microcracks in the cell, and improving module yield. These three points demonstrate the significant advantages of busbarless crystalline silicon cell technology, making it a hot topic in the next round of technological competition in the photovoltaic industry.
[0003] However, because the number of fine grids far exceeds that of the main grid, while their width and spacing are much smaller, traditional main grid type IV test fixtures are used to detect the current and voltage of the main grid. Using traditional main grid type IV test fixtures makes it difficult to accurately locate each fine grid, resulting in large fluctuations in test data, low repeatability, and significantly reduced data reliability. Utility Model Content
[0004] Therefore, it is necessary to provide an IV test fixture for solar cells to address the problem of poor reliability when using a main grid type IV test fixture to test fine grids.
[0005] An IV test fixture for a solar cell, the IV test fixture comprising:
[0006] case;
[0007] Two elastic media spaced apart along a first direction, both of which are located within the housing;
[0008] An insulating layer is located between the two elastic media, wherein the projection area of the insulating layer along the first direction covers the projection area of the elastic media along the first direction, and the length of the insulating layer along the second direction is greater than or equal to the length of the elastic media along the second direction.
[0009] An elastic pressure plate is provided at the same end of the two elastic media along the second direction, and the elastic pressure plate extends out of the housing;
[0010] When the end of the elastic pressure plate away from the elastic medium abuts against the battery cell, the elastic medium can cause the elastic pressure plate to slide relative to the housing in a second direction through elastic deformation, and the first direction intersects with the second direction.
[0011] In one embodiment, each of the elastic pressure plates has at least one hole.
[0012] In one embodiment, the end of the elastic pressure plate away from the corresponding elastic medium is provided with a serrated structure.
[0013] In one embodiment, the elastic pressure plate includes a voltage elastic pressure plate and a current elastic pressure plate, and the two elastic media are a first elastic medium and a second elastic medium, respectively;
[0014] The first elastic medium includes a plurality of first conductive wires arranged sequentially along a third direction, and one end of each first conductive wire along a second direction is connected to the voltage elastic plate.
[0015] The second elastic medium includes a plurality of second conductive wires arranged sequentially along a third direction, and one end of each second conductive wire along a second direction is connected to the current elastic pressure plate.
[0016] In one embodiment, all the first conductive wires in the same first elastic medium are simultaneously connected to the voltage elastic plate;
[0017] All the second conductive wires in the same second elastic medium are simultaneously connected to the current elastic pressure plate.
[0018] In one embodiment, there are multiple voltage elastic pads, which are arranged sequentially along a third direction, and each voltage elastic pad is connected to at least one of the first conductive wires;
[0019] The number of current elastic pressure plates is multiple, and the multiple current elastic pressure plates are arranged sequentially along a third direction. Each current elastic pressure plate is connected to at least one of the second conductive wires.
[0020] In one embodiment, the thickness of the voltage elastic plate is 0.1mm-0.2mm, and the thickness of the current elastic plate is 0.4mm-0.5mm.
[0021] In one embodiment, at least one of the first conductive wire and the second conductive wire includes a first arc-shaped wire segment and a second arc-shaped wire segment spaced apart, the two ends of the first arc-shaped wire segment and the second arc-shaped wire segment are connected to each other along a second direction, the center of the first arc-shaped wire segment is located on the side closer to the second arc-shaped wire segment, and the center of the second arc-shaped wire segment is located on the side closer to the first arc-shaped wire segment.
[0022] The first arc-shaped wire segment and the second arc-shaped wire segment are spaced apart along the first direction or along the third direction.
[0023] In one embodiment, at least one of the first conductive wire and the second conductive wire includes a straight segment and a curved segment connected end to end, and the elastic pressure plate is connected to the end of the corresponding curved segment away from the straight segment.
[0024] In one embodiment, at least one of the first conductive wire and the second conductive wire has an S-shaped structure.
[0025] The aforementioned IV test fixture for solar cells has two elastic media connected to elastic plates at the same end along the second direction. One elastic plate is used to test the voltage of the grid lines, and the other is used to detect the current of the grid lines. During use, the IV test fixture is pressed down on the solar cell to ensure close contact between the elastic plates and the grid lines, thereby obtaining stable voltage and current signals and improving the reliability of the test data. Simultaneously, since both the elastic plates and the elastic media can undergo elastic deformation, when the elastic plates are squeezed, the contraction of the elastic media can cause the elastic plates to slide relative to the housing, allowing part of the elastic plates to retract into the housing, thus preventing damage to the solar cell surface due to excessive pressure. Furthermore, the projection area of the insulating layer along the first direction covers the projection area of the elastic media along the first direction, meaning the insulating layer completely isolates the two elastic media, preventing contact between the first and second elastic media during elastic deformation and thus avoiding the risk of short circuits. In addition, this application uses contact between the elastic plates and the grid lines on the surface of the solar cell, transforming the traditional point contact acquisition of current and voltage signals into line contact acquisition of current and voltage signals. The increased contact area between the elastic clamp and the surface of the battery cell reduces the force on each contact point and makes the force more uniform, thus reducing damage caused by uneven force on the battery cell. Attached Figure Description
[0026] Figure 1 This is a three-dimensional structural diagram of the IV test fixture in one embodiment.
[0027] Figure 2 This is a schematic diagram of the IV test fixture after part of the housing has been removed in one embodiment.
[0028] Figure 3 This is a schematic diagram of the cross-sectional structure of the IV test fixture along a third direction in one embodiment.
[0029] Figure 4 This is a schematic diagram of the cross-sectional structure of the IV test fixture along a third direction in another embodiment.
[0030] Figure 5 This is a schematic diagram of the cross-sectional structure of the IV test fixture along a third direction in another embodiment.
[0031] Figure 6This is a schematic diagram of the connection structure between the elastic medium and the elastic pressure plate in another embodiment.
[0032] Reference numerals: 100, shell; 200, elastic medium; 210, first elastic medium; 211, first conductive wire; 220, second elastic medium; 221, second conductive wire; 231, first arc-shaped wire segment; 232, second arc-shaped wire segment; 241, straight segment; 242, curved segment; 300, elastic pressure plate; 310, voltage elastic pressure plate; 320, current elastic pressure plate; 330, hole; 340, serrated structure; 400, insulating layer. Detailed Implementation
[0033] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.
[0034] In the description of this application, it should be understood that if terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" appear, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.
[0035] Furthermore, where the terms "first" and "second" appear, these terms are for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, where the term "multiple" appears, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0036] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.
[0037] In this application, unless otherwise expressly specified and limited, the use of descriptions such as "above" or "below" the second feature indicates that the first and second features are in direct contact or indirect contact via an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. Similarly, "below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.
[0038] It should be noted that if an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. If an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. If so, the terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application are for illustrative purposes only and do not represent the only possible implementation.
[0039] See Figures 1-3 , Figure 1An IV test fixture for a solar cell according to an embodiment of this application is shown. The IV test fixture includes a housing 100, an elastic medium 200, an insulating layer 400, and an elastic pressure plate 300. Two elastic media 200 are spaced apart along a first direction OX, and both elastic media 200 are located inside the housing 100. The insulating layer 400 is located between the two elastic media 200, and the projection area of the insulating layer 400 along the first direction OX covers the projection area of the elastic media 200 along the first direction OX. The length of the insulating layer 400 along the second direction OZ is greater than or equal to the length of the elastic media 200 along the second direction OZ. An elastic pressure plate 300 is respectively provided at the same end of the two elastic media 200 along the second direction OZ, and the elastic pressure plate 300 extends outside the housing 100. When the end of the elastic pressure plate 300 away from the elastic medium 200 abuts against the solar cell, the elastic medium 200 causes the elastic pressure plate 300 to slide relative to the housing 100 along the second direction OZ through elastic deformation, and the first direction OX and the second direction OZ intersect.
[0040] In this embodiment, two elastic media 200 are respectively connected to elastic pressure plates 300 at the same end along the second direction OZ. One elastic pressure plate 300 is used to test the voltage of the grid lines, and the other elastic pressure plate 300 is used to detect the current of the grid lines. In use, the IV test fixture is pressed down on the battery cell to ensure that the elastic pressure plate 300 is in close contact with the grid lines on the battery cell, so as to obtain stable voltage and current signals and improve the reliability of test data. At the same time, since the elastic media 200 can undergo elastic deformation, when the end of the elastic pressure plate 300 away from the elastic media 200 abuts against the battery cell, the contraction of the elastic media 200 can drive the elastic pressure plate 300 to slide relative to the housing 100, so that part of the elastic pressure plate 300 retracts into the housing 100, thereby avoiding damage to the surface of the battery cell when the pressure is too high. Meanwhile, the projection area of the insulating layer 400 along the first direction OX covers the projection area of the elastic medium 200 along the first direction OX, and the length of the insulating layer 400 along the second direction OZ is greater than or equal to the length of the elastic medium 200 along the second direction OZ. That is, the insulating layer 400 can completely isolate the two elastic media 200, preventing the two elastic media 200 from contacting each other when they deform elastically, thus preventing the risk of short circuit.
[0041] Furthermore, this application employs an elastic pressure plate 300 to contact the grid lines on the surface of the solar cell, transforming the traditional point contact acquisition of current and voltage signals into line contact acquisition. The increased contact area between the elastic pressure plate 300 and the solar cell surface reduces the force on each contact point, resulting in more uniform force distribution and minimizing damage caused by uneven force distribution.
[0042] Combination Figure 1 In some embodiments, each elastic pressure plate 300 has at least one hole 330.
[0043] In this embodiment, each elastic plate 300 has at least one hole 330. The opening of the hole 330 enables the elastic plate 300 to produce more significant elastic bending when subjected to force. When the elastic plate 300 contacts the fine grid, the edge of the elastic plate 300 can absorb local overload stress through slight deformation, avoiding damage to the surface of the battery cell.
[0044] In some embodiments, the end of the elastic pressure plate 300 away from the corresponding elastic medium 200 is provided with a serrated structure 340.
[0045] In this embodiment, the tips of the serrated structure 340 can penetrate deep into the texturing surface of the gridless solar cell, increasing the tightness of contact between the elastic pressure plate 300 and the surface of the solar cell, and ensuring stable acquisition of electrical signals.
[0046] Combination Figures 1-4 In some embodiments, the elastic pressure plate 300 includes a voltage elastic pressure plate 310 and a current elastic pressure plate 320, and the two elastic media 200 are a first elastic medium 210 and a second elastic medium 220, respectively; the first elastic medium 210 includes a plurality of first conductive wires 211 arranged sequentially along the third direction OY, and one end of each first conductive wire 211 along the second direction OZ is connected to the voltage elastic pressure plate 310; the second elastic medium 220 includes a plurality of second conductive wires 221 arranged sequentially along the third direction OY, and one end of each second conductive wire 221 along the second direction OZ is connected to the current elastic pressure plate 320.
[0047] In this embodiment, the first elastic medium 210 includes a plurality of first conductive wires 211. A voltage elastic plate 310 is connected to a corresponding first conductive wire 211. The diameter of the first conductive wire 211 is small. During voltage testing, when the IV test fixture is pressed down, the first conductive wire 211 can undergo elastic deformation, thereby causing the corresponding voltage elastic plate 310 to slide relative to the housing 100 along the second direction OZ, so as to avoid damaging the battery. Similarly, the second elastic medium 220 includes a plurality of second conductive wires 221. A current elastic plate 320 is connected to a corresponding second conductive wire 221. The diameter of the second conductive wire 221 is small. During current testing, when the IV test fixture is pressed down, the second conductive wire 221 can undergo elastic deformation, thereby causing the corresponding current elastic plate 320 to slide relative to the housing 100 along the second direction OZ, so as to avoid damaging the battery.
[0048] In some embodiments, all the first conductive wires 211 in the same first elastic medium 210 are simultaneously connected to the voltage elastic platen 310; and all the second conductive wires 221 in the same second elastic medium 220 are simultaneously connected to the current elastic platen 320.
[0049] In this embodiment, both the voltage elastic platen 310 and the current elastic platen 320 are elongated strip structures, which increases the contact area between the voltage elastic platen 310 and the current elastic platen 320 and the surface of the battery cell, thereby reducing the compression on the surface of the battery cell. Simultaneously, the voltage elastic platen 310 and the current elastic platen 320 are each provided with multiple holes 330 to increase the elastic deformation of the voltage elastic platen 310 and the current elastic platen 320 themselves, thereby facilitating stable contact between the voltage elastic platen 310 and the current elastic platen 320 and the fine grid, improving test stability.
[0050] Combination Figure 2 In some embodiments, there are multiple voltage elastic plates 310, which are arranged sequentially along the third direction OY, and each voltage elastic plate 310 is connected to at least one first conductive wire 211; there are multiple current elastic plates 320, which are arranged sequentially along the third direction OY, and each current elastic plate 320 is connected to at least one second conductive wire 221.
[0051] Specifically, each voltage elastic plate 310 is connected to one first conductive wire 211, or each voltage elastic plate 310 is connected to two or more first conductive wires 211. Similarly, each current elastic plate 320 is connected to one second conductive wire 221, or each current elastic plate 320 is connected to two or more second conductive wires 221.
[0052] In this embodiment, there are multiple voltage elastic plates 310, and each voltage elastic plate 310 is connected to at least one first conductive wire 211. There is no connection between adjacent voltage elastic plates 310, so that the surface of the voltage elastic plate 310 can adaptively contact the surface of the battery cell, increasing the stability and reliability of voltage testing. Similarly, there are multiple current elastic plates 320, and each current elastic plate 320 is connected to at least one second conductive wire 221. There is no connection between adjacent current elastic plates 320, so that the surface of the current elastic plate 320 can adaptively contact the surface of the battery cell, increasing the stability and reliability of current testing. Specifically, each voltage elastic plate 310 and current elastic plate 320 has the same dimensions: 1.05 mm in length and 0.7 mm in width.
[0053] In actual use, each elastic pressure plate 300 is connected to the elastic medium 200 so that each elastic pressure plate 300 has an individual elastic function. The elastic range of the foil is 1mm (±0.5mm), and the contact stress of a pair of current and voltage elastic metal foils is 0.16N. Pressing a test fixture on the M12 battery cell involves approximately 200 elastic metal foils, totaling about 32N. This stress is very small and can avoid damaging the battery cell.
[0054] Specifically, the thickness of the voltage elastic pressure plate 310 is 0.1mm-0.2mm, and the thickness of the current elastic pressure plate 320 is 0.4mm-0.5mm.
[0055] In this embodiment, compared with traditional probes (probe diameter of 0.6mm-1mm), the voltage elastic plate 310 and current elastic plate 320 of this application are both relatively thin, which can achieve elastic line contact with the gridless cell, thereby reducing the stress on the gridless cell and distributing it evenly, improving the problems of poor fine grid contact, large and uneven force in the gridless cell IV test fixture.
[0056] In some embodiments, the housing 100 is a metal guide frame with multiple mounting holes 330 for fixing the IV test fixture. The elastic pressure plate 300 is made of a highly conductive metal, such as copper or foil, and a layer of gold is deposited on its surface to increase its conductivity. The IV test fixture has a thickness of 1.2 mm, while the traditional probe array has a thickness of 1.3 mm. The thinner thickness used in this application reduces the obstruction of the light source by the IV test fixture, which is beneficial for more accurate testing of the efficiency of gridless solar cells. The insulating layer 400 has a thickness of 0.2 mm, which can block surface leakage current between the two elastic media 200. The insulating layer 400 is made of insulating materials such as epoxy resin (EP) or polyarylether resin (PAE).
[0057] Combination Figure 2 and Figure 4 In some embodiments, at least one of the first conductive wire 211 and the second conductive wire 221 includes a first arc-shaped wire segment 231 and a second arc-shaped wire segment 232 spaced apart. The two ends of the first arc-shaped wire segment 231 and the second arc-shaped wire segment 232 are connected to each other along the second direction OZ. The center of the first arc-shaped wire segment 231 is located on the side closer to the second arc-shaped wire segment 232, and the center of the second arc-shaped wire segment 232 is located on the side closer to the first arc-shaped wire segment 231. The first arc-shaped wire segment 231 and the second arc-shaped wire segment 232 are spaced apart along the first direction OX or along the third direction OY.
[0058] In this embodiment, taking the example that both the first conductive wire 211 and the second conductive wire 221 include a first arc-shaped wire segment 231 and a second arc-shaped wire segment 232 spaced apart, the two ends of the first arc-shaped wire segment 231 and the second arc-shaped wire segment 232 are connected to each other along the second direction OZ. The center of the first arc-shaped wire segment 231 is located on the side closer to the second arc-shaped wire segment 232, and the center of the second arc-shaped wire segment 232 is located on the side closer to the first arc-shaped wire segment 231. That is, the first arc-shaped wire segment 231 and the second arc-shaped wire segment 232 form a structure similar to an ellipse. When the elastic pressure plate 300 connected to the conductive wire (including the first conductive wire 211 and the second conductive wire 221) is subjected to pressure, the first arc-shaped wire segment 231 and the second arc-shaped wire segment 232 can bend at the same time, so that the elastic pressure plate 300 partially retracts.
[0059] The first direction OX is the thickness direction of the IV test fixture, the second direction OZ is the height direction of the IV test fixture, and the third direction OY is the length direction of the IV test fixture.
[0060] Combination Figure 2 In one embodiment, the first arc-shaped wire segment 231 and the second arc-shaped wire segment 232 are spaced apart along the third direction OY, which helps to reduce the thickness of the IV test fixture, reduce the obstruction of light, and avoid affecting the photoelectric conversion efficiency of the battery.
[0061] Combination Figure 4 In another embodiment, the first arc-shaped wire segment 231 and the second arc-shaped wire segment 232 may also be arranged at intervals along the first direction OX.
[0062] Combination Figure 5 In some embodiments, at least one of the first conductive wire 211 and the second conductive wire 221 has an S-shaped structure.
[0063] In this embodiment, the first conductive wire 211 has an S-shaped structure, the second conductive wire 221 has an S-shaped structure, or at least one of the first conductive wire 211 and the second conductive wire 221 has an S-shaped structure. Specifically, the first conductive wire 211 and the second conductive wire 221 are bent in a first plane, or the first conductive wire 211 and the second conductive wire 221 are bent along a second plane. The first plane is perpendicular to the first direction OX; the second plane is perpendicular to the third direction OY. When the elastic pressure plate 300 connected to the conductive wire is subjected to compressive force, the S-shaped structure can be bent, so that the elastic pressure plate 300 partially retracts.
[0064] Combination Figure 6In some embodiments, at least one of the first conductive wire 211 and the second conductive wire 221 includes a straight segment 241 and a curved segment 242 connected end to end, and the elastic pressure plate 300 is connected to the end of the corresponding curved segment 242 away from the straight segment 241.
[0065] In this embodiment, taking as an example that both the first conductive wire 211 and the second conductive wire 221 include a straight segment 241 and a curved segment 242 connected end to end, and the elastic pressure plate 300 is connected to the end of the corresponding curved segment 242 away from the straight segment 241, the structure of the first conductive wire 211 and the second conductive wire 221 is considered to be approximately a hook-shaped structure. Specifically, the curved segment 242 is bent in a first plane, or the curved segment 242 is bent in a second plane. The first plane is perpendicular to the first direction OX of the IV test fixture; the second plane is perpendicular to the third direction OY of the IV test fixture. When the elastic pressure plate 300 connected to the conductive wire is subjected to compressive force, the curved segment 242 can be bent, so that the elastic pressure plate 300 partially retracts.
[0066] Of course, in some other embodiments, the first conductive wire may be a hook-shaped structure and the second conductive wire 221 may be an S-shaped structure; or the first conductive wire may be an elliptical structure and the second conductive wire 221 may be an S-shaped structure; or the first conductive wire may be a hook-shaped structure and the second conductive wire 221 may be an elliptical structure, etc.
[0067] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0068] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.
Claims
1. An IV test fixture for solar cells, characterized in that, The IV test fixture includes: case; Two elastic media spaced apart along a first direction, both of which are located within the housing; An insulating layer is located between the two elastic media, wherein the projection area of the insulating layer along the first direction covers the projection area of the elastic media along the first direction, and the length of the insulating layer along the second direction is greater than or equal to the length of the elastic media along the second direction. An elastic pressure plate is provided at the same end of the two elastic media along the second direction, and the elastic pressure plate extends out of the housing; When the end of the elastic pressure plate away from the elastic medium abuts against the battery cell, the elastic medium can cause the elastic pressure plate to slide relative to the housing in a second direction through elastic deformation, and the first direction intersects with the second direction.
2. The IV test fixture for solar cells according to claim 1, characterized in that, Each of the elastic pressure plates has at least one hole.
3. The IV test fixture for solar cells according to claim 1, characterized in that, The end of the elastic pressure plate away from the corresponding elastic medium is provided with a serrated structure.
4. The IV test fixture for solar cells according to claim 1, characterized in that, The elastic pressure plate includes a voltage elastic pressure plate and a current elastic pressure plate, and the two elastic media are a first elastic medium and a second elastic medium, respectively. The first elastic medium includes a plurality of first conductive wires arranged sequentially along a third direction, and one end of each first conductive wire along a second direction is connected to the voltage elastic plate. The second elastic medium includes a plurality of second conductive wires arranged sequentially along a third direction, and one end of each second conductive wire along a second direction is connected to the current elastic pressure plate.
5. The IV test fixture for solar cells according to claim 4, characterized in that, All the first conductive wires in the same first elastic medium are simultaneously connected to the voltage elastic plate; All the second conductive wires in the same second elastic medium are simultaneously connected to the current elastic pressure plate.
6. The IV test fixture for solar cells according to claim 4, characterized in that, The number of voltage elastic plates is multiple, and the multiple voltage elastic plates are arranged sequentially along a third direction. Each voltage elastic plate is connected to at least one of the first conductive wires. The number of current elastic pressure plates is multiple, and the multiple current elastic pressure plates are arranged sequentially along a third direction. Each current elastic pressure plate is connected to at least one of the second conductive wires.
7. The IV test fixture for solar cells according to claim 6, characterized in that, The thickness of the voltage elastic plate is 0.1mm-0.2mm, and the thickness of the current elastic plate is 0.4mm-0.5mm.
8. The IV test fixture for solar cells according to claim 4, characterized in that, At least one of the first conductive wire and the second conductive wire includes a first arc-shaped wire segment and a second arc-shaped wire segment arranged at intervals. The two ends of the first arc-shaped wire segment and the second arc-shaped wire segment are connected to each other along a second direction. The center of the first arc-shaped wire segment is located on the side closer to the second arc-shaped wire segment, and the center of the second arc-shaped wire segment is located on the side closer to the first arc-shaped wire segment. The first arc-shaped wire segment and the second arc-shaped wire segment are spaced apart along the first direction or along the third direction.
9. The IV test fixture for solar cells according to claim 4, characterized in that, At least one of the first conductive wire and the second conductive wire includes a straight segment and a curved segment connected end to end, and the elastic pressure plate is connected to the end of the corresponding curved segment away from the straight segment.
10. The IV test fixture for solar cells according to claim 4, characterized in that, At least one of the first conductive wire and the second conductive wire has an S-shaped structure.