A dual-station detection light source and surface defect detection device

By designing a dual-station inspection light source and utilizing a combination of a beam splitter and a linear laser, the inspection of two types of workpieces and pin defects was achieved, solving the problem of limited applicability in existing technologies and improving the flexibility and accuracy of inspection.

CN224580160UActive Publication Date: 2026-07-31OPT VISION TECH (SUZHOU) CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
OPT VISION TECH (SUZHOU) CO LTD
Filing Date
2025-07-22
Publication Date
2026-07-31

AI Technical Summary

Technical Problem

Existing coaxial light sources can only be used to inspect workpieces of a specific size and cannot detect whether there are defects in the pins on the workpiece, thus limiting their applicability.

Method used

Design a dual-station inspection light source, comprising a housing, a lamp board, a beam splitter prism, and a linear laser. The light is split by the beam splitter and emitted from two light-emitting holes to illuminate different workpieces, and the linear laser illuminates the pins of the workpieces for inspection.

Benefits of technology

It enables the inspection of two different types of workpieces, expanding its applicability and effectively detecting pin defects on workpieces, thus improving the accuracy and applicability of the inspection.

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Abstract

This utility model relates to the field of light source structures and discloses a dual-station inspection light source and surface defect detection device, including a housing, a lamp board, a beam splitter, and a linear laser fixedly connected to the housing. The lamp board and the beam splitter are both installed in the housing. The housing has a first light-emitting hole and a second light-emitting hole. The light emitted from the lamp board is split by the beam splitter and then emitted from the first light-emitting hole and the second light-emitting hole respectively. The light emitted from the linear laser is perpendicular to the center line of the second light-emitting hole. This utility model's dual-station inspection light source and surface defect detection device can be used to inspect two different workpieces, and is particularly suitable for inspecting workpieces with pins.
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Description

Technical Field

[0001] This utility model relates to the field of light source structure, and in particular to a dual-station detection light source and surface defect detection device. Background Technology

[0002] With the development of the times, the market has increasingly stringent requirements for workpiece quality, which has led to the widespread application of machine vision inspection technology in various industries. Among them, the inspection light source is a key component of the machine vision inspection system, and its quality directly affects the actual inspection results.

[0003] Existing coaxial light sources include a housing, a diffuser, a beam splitter, and a PCB board. The beam splitter, diffuser, and PCB board are sequentially arranged within the housing. An LED is mounted on the PCB board, emitting light that passes through the diffuser and beam splitter before reaching the workpiece for inspection. However, this type of coaxial light source can only inspect workpieces of a specific size. Because it only has one light-emitting aperture, its applicability is limited, and it cannot detect defects such as pins on the workpiece.

[0004] In view of this, it is necessary to design a dual-station detection light source and surface defect detection device to at least partially solve the above problems.

[0005] The above information is provided as background information only to aid in understanding this disclosure and does not constitute an assertion or admission that any of the above content can be used as prior art relative to this disclosure. Utility Model Content

[0006] This invention provides a dual-station detection light source and surface defect detection device, which can be used to detect two different workpieces and can also be used to detect workpieces with pins.

[0007] To achieve the above objectives, this utility model provides the following technical solution:

[0008] A dual-station detection light source includes a housing, a lamp board, a beam splitter, and a linear laser fixedly connected to the housing. The lamp board and the beam splitter are both installed in the housing.

[0009] The housing has a first light-emitting hole and a second light-emitting hole. The light emitted from the lamp panel is split by the beam splitter and then emitted from the first light-emitting hole and the second light-emitting hole respectively. The light emitted from the linear laser is perpendicular to the center line of the second light-emitting hole.

[0010] Optionally, the first light-emitting aperture is a tapered aperture;

[0011] The diameter of the first light-emitting hole increases as it moves further away from the lamp plate, and a ring-shaped lighting component is installed on the inner wall of the first light-emitting hole.

[0012] Optionally, the housing is further provided with a detection hole, which is disposed opposite to the second light-emitting hole, and the center line of the detection hole and the center line of the second light-emitting hole coincide with each other.

[0013] Optionally, a diffuser plate is also installed in the housing, and the diffuser plate is installed between the lamp plate and the beam splitter prism;

[0014] The diffuser plate is parallel to the lamp plate, and the light emitted from the lamp plate passes through the diffuser plate and is directed towards the beam splitter.

[0015] Optionally, a single-line laser is provided on each of the two opposite sides of the second light-emitting aperture, and the light emitted by the two single-line lasers is located on the same vertical plane.

[0016] Optionally, the two linear lasers emit light of different colors.

[0017] Optionally, the linear laser can be detachably mounted on the housing.

[0018] Optionally, the inner wall of the housing is provided with a light-absorbing coating.

[0019] Optionally, a cooling cavity is formed on the back side of the lamp panel away from the beam splitter.

[0020] A surface defect detection device includes a dual-station detection light source as described in any of the preceding claims.

[0021] Compared with the prior art, the present invention has the following beneficial effects:

[0022] The dual-station inspection light source and surface defect detection device provided by this utility model have their light emitted from the lamp board split by a beam splitter and directed towards a first light-emitting hole and a second light-emitting hole, respectively. This illuminates a first workpiece facing the first light-emitting hole and a second workpiece facing the second light-emitting hole. Furthermore, the light emitted from the linear laser is projected onto the pins of the second workpiece facing the second light-emitting hole. In summary, the dual-station inspection light source can inspect two different types of workpieces, expanding its applicability and making it better suited for inspecting workpieces with pins.

[0023] This invention has other features and advantages that will be apparent from or will be set forth in detail in the accompanying drawings and the following detailed description, which together serve to explain the particular principles of this invention. Attached Figure Description

[0024] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0025] Figure 1 This is a top view schematic diagram of the dual-station detection light source provided in this embodiment of the utility model;

[0026] Figure 2 This is a cross-sectional structural diagram of the dual-station detection light source provided in this embodiment of the utility model.

[0027] Reference numerals: 1. Housing; 101. Cooling cavity; 11. First light-emitting hole; 12. Second light-emitting hole; 13. Detection hole; 2. Lamp board; 3. Beam splitter prism; 4. Linear laser; 5. Ring illumination assembly; 6. Diffuser plate. Detailed Implementation

[0028] To illustrate the possible application scenarios, technical principles, implementable specific solutions, and achievable objectives and effects of this application in detail, the following description, in conjunction with the listed specific embodiments and accompanying drawings, provides a detailed explanation. The embodiments described herein are merely illustrative of the technical solutions of this application and are therefore intended to limit the scope of protection of this application.

[0029] In this document, the term "embodiment" means that a specific feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The term "embodiment" appearing in various places throughout the specification does not necessarily refer to the same embodiment, nor does it specifically limit its independence or connection with other embodiments. In principle, in this application, as long as there are no technical contradictions or conflicts, the technical features mentioned in each embodiment can be combined in any way to form corresponding implementable technical solutions.

[0030] Unless otherwise defined, the technical terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the use of related terms herein is merely for the purpose of describing particular embodiments and is not intended to limit this application.

[0031] In the description of this application, the term "and / or" is used to describe the logical relationship between objects, indicating that three relationships can exist. For example, A and / or B means: A exists, B exists, and A and B exist simultaneously. Additionally, the character " / " in this document generally indicates that the preceding and following objects have an "or" logical relationship.

[0032] In this application, terms such as “first” and “second” are used only to distinguish one entity or operation from another, and do not necessarily require or imply any actual quantity, hierarchy or order relationship between these entities or operations.

[0033] Unless otherwise specified, the use of terms such as “comprising,” “including,” “having,” or other similar expressions in this application is intended to cover non-exclusive inclusion, which does not exclude the presence of additional elements in a process, method, or product that includes the stated elements, such that a process, method, or product that includes a list of elements may include not only those defined elements but also other elements not expressly listed, or elements inherent to such a process, method, or product.

[0034] Similar to the understanding in the Examination Guidelines, in this application, expressions such as "greater than," "less than," and "exceeding" are understood to exclude the stated number; expressions such as "above," "below," and "within" are understood to include the stated number. Furthermore, in the description of the embodiments in this application, "multiple" means two or more (including two), and similar expressions related to "multiple" are also understood in this way, such as "multiple groups" and "multiple times," unless otherwise explicitly specified.

[0035] In the description of the embodiments of this application, the space-related expressions used, such as "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "vertical," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential," indicate the orientation or positional relationship based on the orientation or positional relationship shown in the specific embodiments or drawings. They are only for the purpose of describing the specific embodiments of this application or for the reader's understanding, and do not indicate or imply that the device or component referred to must have a specific position, a specific orientation, or be constructed or operated in a specific orientation. Therefore, they should not be construed as limitations on the embodiments of this application.

[0036] Unless otherwise expressly specified or limited, the terms "installation," "connection," "linking," "fixing," and "setting," as used in the description of the embodiments of this application, should be interpreted broadly. For example, "connection" can be a fixed connection, a detachable connection, or an integral setting; it can be a mechanical connection, an electrical connection, or a communication connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be the internal connection of two components or the interaction between two components. For those skilled in the art to which this application pertains, the specific meaning of the above terms in the embodiments of this application can be understood according to the specific circumstances.

[0037] Example 1

[0038] In view of the aforementioned deficiencies in existing dual-station detection light sources, the applicant, based on years of extensive practical experience and professional knowledge in the design and manufacture of such products, and in conjunction with the application of theoretical principles, actively conducted research and innovation in order to create a solution to the deficiencies in the existing technology and make the dual-station detection light source more practical. After continuous research, design, and repeated prototype production and improvements, this utility model with real practical value was finally created.

[0039] Please refer to Figures 1 to 2 This utility model embodiment provides a dual-station detection light source, including a housing 1, a lamp board 2, a beam splitter 3, and a single-line laser 4 fixedly connected to the housing 1. The lamp board 2 and the beam splitter 3 are both installed in the housing 1. The beam splitter 3 is installed on the light-emitting side of the lamp board 2, and the light emitted from the lamp board 2 is directed towards the beam splitter 3.

[0040] The housing 1 has a first light-emitting hole 11 and a second light-emitting hole 12. The light emitted from the lamp plate 2 is split by the beam splitter 3 and then emitted from the first light-emitting hole 11 and the second light-emitting hole 12 respectively. The light emitted from the linear laser 4 is perpendicular to the center line of the second light-emitting hole 12.

[0041] like Figure 2 As shown, in the dual-station detection light source, the light emitted from the lamp plate 2 is split by the beam splitter prism 3 and directed towards the first light-emitting aperture 11 and the second light-emitting aperture 12, thereby illuminating the first workpiece 100 facing the first light-emitting aperture 11 and the second workpiece 200 facing the second light-emitting aperture 12. Furthermore, the light emitted from the linear laser 4 is projected onto the pins of the second workpiece 200 facing the second light-emitting aperture 12, illuminating the pin ends to facilitate detection by the camera 300. In summary, the dual-station detection light source in this embodiment can be used to detect both the first workpiece 100 and the second workpiece 200, thus enabling the detection of two different workpieces and expanding its applicability.

[0042] It should also be noted that, Figure 2 The camera 300 is only used to detect either the first workpiece 100 or the second workpiece 200, and cannot detect both workpieces simultaneously. If it is necessary to detect both workpieces simultaneously, it is recommended to set up two cameras 300, one for detecting the first workpiece 100 and the other for detecting the second workpiece.

[0043] Optionally, the first light-emitting aperture 11 is a tapered aperture; the aperture of the first light-emitting aperture 11 increases in diameter as it moves further away from the lamp plate 2, and an annular illumination component 5 is installed on the inner wall of the first light-emitting aperture 11. The annular illumination component 5 can emit light at an angle, thereby better illuminating the surface of the first workpiece 100 and improving the accuracy of the inspection. The annular illumination component 5 can also be called an annular light source.

[0044] Optionally, the housing 1 is further provided with a detection hole 13, which is disposed opposite to the second light-emitting hole 12, and the center line of the detection hole 13 coincides with the center line of the second light-emitting hole 12. The lens of the camera 300 is positioned directly opposite the detection hole 13 for taking pictures and detecting the first workpiece 100 or the second workpiece 200.

[0045] Optionally, a diffuser plate 6 is also installed in the housing 1, and the diffuser plate 6 is installed between the lamp plate 2 and the beam splitter 3; the diffuser plate 6 is parallel to the lamp plate 2, and the light emitted from the lamp plate 2 passes through the diffuser plate 6 and is directed to the beam splitter 3. The arrangement of the diffuser plate 6 can homogenize the light, making the light directed to the beam splitter 3 more uniform, thereby improving the uniformity of the light illuminating the first workpiece 100 and the second workpiece 200.

[0046] Optionally, such as Figure 2 A linear laser 4 is disposed on each side of the second light-emitting aperture 12, and the light emitted by the two linear lasers 4 is located on the same vertical plane. Specifically, the two linear lasers 4 shine light from both sides toward the pin end, illuminating both ends of the pin end. If there is a defect such as misalignment at the pin end, the imaging result of that pin will be significantly different from the normal imaging effect, thus facilitating the detection of defective pins. The pin can be a PIN. The second workpiece 200 is generally...

[0047] Optionally, the two linear lasers 4 emit light of different colors, so that the direction of the pin deviation can be determined based on the image color, making it convenient to count the pin tilt direction.

[0048] Optionally, the linear laser 4 can be detachably mounted on the housing 1.

[0049] Optionally, a light-absorbing coating is provided on the inner wall of the housing 1, which can effectively reduce the impact of reflected stray light on imaging.

[0050] Optionally, a cooling cavity 101 is formed on the back side of the lamp board 2 away from the beam splitter 3. For example, a gas cooling device can output cooling airflow to the cooling cavity 101, thereby better cooling the lamp board 2. It should also be noted that the lamp board 2 generally includes a circuit board and LEDs mounted on the circuit board. There may be a certain number of small holes on the circuit board, through which the cooling airflow passes, thereby improving the cooling effect on the circuit board.

[0051] Example 2

[0052] This embodiment discloses a surface defect detection device, including a dual-station detection light source as described in any of the preceding embodiments.

[0053] Finally, it should be noted that although the above embodiments have been described in the text and drawings of this application, this should not limit the scope of patent protection of this application. Any technical solutions that are based on the essential concept of this application and utilize the content described in the text and drawings of this application, resulting in equivalent structural or procedural substitutions or modifications, as well as the direct or indirect application of the technical solutions of the above embodiments to other related technical fields, are all included within the scope of patent protection of this application.

Claims

1. A dual station detection light source, characterized by, It includes a housing (1), a lamp board (2), a beam splitter (3), and a single-line laser (4) fixedly connected to the housing (1). The lamp board (2) and the beam splitter (3) are both installed in the housing (1). The housing (1) has a first light-emitting hole (11) and a second light-emitting hole (12). The light emitted from the lamp plate (2) is split by the beam splitter (3) and then emitted from the first light-emitting hole (11) and the second light-emitting hole (12) respectively. The light emitted from the linear laser (4) is perpendicular to the center line of the second light-emitting hole (12).

2. The dual position detection light source of claim 1, wherein, The first light-emitting aperture (11) is a tapered aperture; The diameter of the first light-emitting hole (11) is larger the further away from the lamp plate (2), and an annular lighting component (5) is installed on the inner wall of the first light-emitting hole (11).

3. The dual-station detection light source according to claim 1, characterized in that, The housing (1) is also provided with a detection hole (13), which is disposed opposite to the second light-emitting hole (12), and the center line of the detection hole (13) and the center line of the second light-emitting hole (12) coincide with each other.

4. The dual-station detection light source according to claim 1, characterized in that, A diffuser plate (6) is also installed in the housing (1), and the diffuser plate (6) is installed between the lamp plate (2) and the beam splitter (3); The diffuser plate (6) is parallel to the lamp plate (2), and the light emitted from the lamp plate (2) passes through the diffuser plate (6) and is directed towards the beam splitter (3).

5. The dual-station detection light source according to claim 1, characterized in that, Each of the two opposite sides of the second light-emitting aperture (12) is provided with a line laser (4), and the light emitted by the two line lasers (4) is located on the same vertical plane.

6. The dual position detection light source of claim 5, wherein, The two line lasers (4) emit light of different colors.

7. The dual position detection light source of claim 1, wherein, The single-line laser (4) is detachably mounted on the housing (1).

8. The dual position detection light source of claim 1, wherein, The inner wall of the housing (1) is provided with a light-absorbing coating.

9. The dual position detection light source of claim 1, wherein, The back of the lamp panel (2) away from the beam splitter (3) forms a cooling cavity (101).

10. A surface defect detection apparatus characterized by comprising: It includes a dual-station detection light source as described in any one of claims 1 to 9.