Pressure detection circuit and electronic equipment

Abstract

This application discloses a pressure detection circuit and electronic device. The pressure detection circuit includes: a power supply, a first resistor, a second resistor, and a ground terminal connected in series. The power supply provides a working voltage to the pressure detection circuit. The first resistor is a fixed resistor, and the second resistor is a strain gauge resistor. When the second resistor is placed on the surface of the component under test, its resistance changes with the vibration of the component under test, causing the connection point of the first and second resistors to form a detection voltage. This detection voltage changes with the resistance of the second resistor, thereby reflecting the pressure change of the component under test caused by vibration. The pressure detection circuit described in this application can accurately detect the vibration of the component under test.

Description

Technical Field

[0001] This application generally relates to the field of detection technology. More specifically, this application relates to a pressure detection circuit and electronic device. Background Technology

[0002] Electronic devices with audio functions, such as mobile phones, tablets, and computers, often exhibit board vibration noise during operation. The root cause of this phenomenon lies in the capacitors inside the device: when the voltage across the capacitor fluctuates significantly within a short period, it triggers frequent charging and discharging. The physical vibrations generated by the capacitor during this process are transmitted to the device's casing, creating board vibration noise. The presence of board vibration noise directly interferes with the device's audio performance; therefore, testing for board vibration noise is a necessary step in ensuring audio quality.

[0003] Currently, the testing of plate vibration performance in equipment typically involves either manual listening or equipment testing. Manual listening relies on the tester's auditory judgment to determine if the intensity of the plate vibration meets standards; equipment testing uses instruments to detect the vibration. However, because the volume of plate vibration is inherently weak, and because the capacitors are encapsulated inside the equipment casing, vibration must be transmitted through the casing, and accessories such as the equipment back cover further obstruct the sound, making it difficult to clearly capture the vibration. Therefore, neither manual listening nor equipment testing can accurately obtain the true data on plate vibration and effectively evaluate its performance.

[0004] In view of this, there is an urgent need to provide a pressure detection circuit and electronic device in order to accurately test the board vibration effect of related devices. Utility Model Content

[0005] In order to at least solve one or more of the technical problems mentioned above, this application proposes a pressure detection circuit and electronic device in several aspects.

[0006] In a first aspect, this application provides a pressure detection circuit, comprising: a power supply, a first resistor, a second resistor, and a ground terminal connected in series; wherein the power supply is used to provide a working voltage for the pressure detection circuit, the first resistor is a fixed resistor, and the second resistor is a strain gauge resistor;

[0007] When the second resistor is placed on the surface of the component under test, its resistance changes with the pressure of the component under test, so that the connection node of the first resistor and the second resistor forms a detection voltage. This detection voltage changes with the resistance of the second resistor, thereby reflecting the pressure change of the component under test caused by vibration.

[0008] In some embodiments, an amplifier circuit is further included, the input of which is connected to the connection node between the first resistor and the second resistor, for amplifying the detected voltage.

[0009] In some embodiments, the amplification circuit includes: an amplifier, a third resistor, and a fourth resistor; wherein the non-inverting input terminal of the amplifier is connected to the connection node between the first resistor and the second resistor; one end of the third resistor is connected to the inverting input terminal of the amplifier, and the other end is connected to the ground terminal; one end of the fourth resistor is connected to the inverting input terminal of the amplifier, and the other end is connected to the output terminal of the amplifier, wherein the output voltage of the amplifier is the amplified detection voltage; wherein the third resistor and the fourth resistor constitute a feedback network to adjust the amplification factor of the amplifier by the resistance ratio of the third resistor and the fourth resistor, thereby amplifying the detection voltage according to the amplification factor.

[0010] In some embodiments, the amplification circuit includes an amplifier, a fifth resistor, a sixth resistor, and a seventh resistor; wherein, the inverting input terminal of the amplifier is connected to one end of the fifth resistor, and the other end of the fifth resistor is connected to the connection node of the first resistor (11) and the second resistor (12); one end of the sixth resistor is connected to the non-inverting input terminal of the amplifier, and the other end is connected to a ground terminal; one end of the seventh resistor is connected to the inverting input terminal of the amplifier, and the other end is connected to the output terminal of the amplifier; wherein, the fifth resistor and the seventh resistor constitute a feedback network to adjust the amplification factor of the amplifier by the resistance ratio of the fifth resistor and the seventh resistor, and amplify the detected voltage according to the amplification factor.

[0011] In some embodiments, an analog-to-digital converter is further included, which is connected to the output of the amplifier circuit and is used to convert the amplified detection voltage output from the output of the amplifier circuit into a digital signal.

[0012] In some embodiments, a microcontroller is further included, which is connected to the analog-to-digital converter, for converting the digital signal corresponding to the detection voltage into a corresponding pressure value and / or calculating the pressure difference between the pressure value and a reference pressure value, the pressure difference reflecting the pressure change of the component under test.

[0013] In some embodiments, a display is also included, which is connected to the microcontroller, for receiving and displaying the pressure value and / or the pressure difference value.

[0014] In a second aspect, this application provides an electronic device, comprising: a motherboard including a component under test; a pressure detection circuit as described in the first aspect and any embodiment thereof, wherein a second resistor of the pressure detection circuit is disposed on the surface of the component under test, such that the resistance value of the second resistor changes with the pressure deformation of the component under test caused by vibration, thereby obtaining a detection voltage reflecting the vibration change of the component under test; and a housing for accommodating the motherboard and the second resistor of the pressure detection circuit, wherein other components of the pressure detection circuit are disposed outside the housing.

[0015] The pressure detection circuit described above consists of a power supply, a first resistor, a second resistor, and a ground terminal connected in series. The first resistor is a fixed resistor, and the second resistor is a strain gauge resistor. When the second resistor is placed on the surface of the component under test, its resistance changes with the pressure generated by the vibration of the component, causing a corresponding change in the detection voltage between the first and second resistors. By monitoring this voltage change, the pressure change of the component under test due to vibration can be indirectly reflected, ultimately achieving accurate detection of its vibration. Attached Figure Description

[0016] The above and other objects, features, and advantages of exemplary embodiments of this application will become readily understood by reading the following detailed description with reference to the accompanying drawings. In the drawings, several embodiments of this application are illustrated by way of example and not limitation, and the same or corresponding reference numerals denote the same or corresponding parts, wherein:

[0017] Figure 1 A circuit diagram of a pressure detection circuit according to some embodiments of this application is shown;

[0018] Figure 2 A circuit diagram of a pressure detection circuit according to some embodiments of this application is shown;

[0019] Figure 3 The diagram shows a circuit diagram of a pressure detection circuit according to some embodiments of this application.

[0020] 100. Pressure detection circuit; 10. Power supply; 11. First resistor; 12. Second resistor; 13. Grounding terminal; 14. Amplifier circuit; 15. Amplifier; 16. Third resistor; 17. Fourth resistor; 18. Amplifier; 19. Fifth resistor; 20. Sixth resistor; 21. Seventh resistor; 22. Analog-to-digital converter; 23. Microcontroller; 24. Display. Detailed Implementation

[0021] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this application. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0022] It should be understood that the terms "comprising" and "including" used in the specification and claims of this application indicate the presence of the described features, integrals, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components and / or collections thereof.

[0023] It should also be understood that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the application. As used in this specification and claims, the singular forms “a,” “an,” and “the” are intended to include the plural forms unless the context clearly indicates otherwise. It should also be understood that the term “and / or” as used in this specification and claims refers to any combination and all possible combinations of one or more of the associated listed items, and includes such combinations.

[0024] As used in this specification and claims, the term "if" may be interpreted, depending on the context, as "when," "once," "in response to determination," or "in response to detection." Similarly, the phrase "if determined" or "if [described condition or event] is detected" may be interpreted, depending on the context, as "once determined," "in response to determination," "once [described condition or event] is detected," or "in response to detection of [described condition or event]."

[0025] The specific embodiments of this application will now be described in detail with reference to the accompanying drawings.

[0026] Figure 1 The diagram shows a circuit schematic of a pressure detection circuit according to some embodiments of this application. For example... Figure 1 As shown, this application proposes a pressure detection circuit 100, including a power supply 10, a first resistor 11, a second resistor 12, and a ground terminal 13 connected in series. The power supply 10 provides the operating voltage for the pressure detection circuit. The first resistor 11 is a fixed resistor, and the second resistor 12 is a strain gauge resistor. Therefore, the first resistor 11 and the second resistor 12 form a voltage divider structure; when the second resistor 12 changes, the voltage across it also changes.

[0027] When the second resistor 12 is placed on the surface of the component under test, its resistance changes with the pressure of the component under test, so that a detection voltage is formed between the first resistor 11 and the second resistor 12. This detection voltage changes with the resistance of the second resistor 12, thereby reflecting the pressure change of the component under test caused by vibration.

[0028] In some embodiments, the component under test is a microelectronic component, such as a capacitor, which may generate frequent periodic movements during its operation, resulting in extremely small vibration amplitudes. This causes the resistance value of the second resistor 12 to change very weakly, which in turn makes the detection voltage amplitude between the first resistor 11 and the second resistor 12 extremely small. This weak signal is easily drowned out by environmental noise, making it difficult to achieve effective identification or accurate measurement.

[0029] Based on this, in some embodiments, the pressure detection circuit 100 further includes an amplifier circuit 14, used to amplify the detection voltage between the first resistor 11 and the second resistor 12, so that the weak detection voltage is amplified to a stable and identifiable amplitude, thereby improving the sensitivity and accuracy of pressure detection and effectively suppressing the interference of environmental noise on the detection results. Furthermore, the input terminal of the amplifier circuit 14 is connected to the connection node of the first resistor 11 and the second resistor 12, and the voltage output from the output terminal is the amplified detection voltage.

[0030] In some embodiments, the pressure detection circuit 100 further includes an analog-to-digital converter 22 for converting the detection voltage into a digital signal.

[0031] Furthermore, in some embodiments, the analog-to-digital converter 22 is connected to the output of the amplifier circuit 14 and is used to convert the amplified detection voltage output from the output of the amplifier circuit 14 into a digital signal.

[0032] In other embodiments, one end of the analog-to-digital converter 22 is connected to the connection node of the first resistor 11 and the second resistor 12 to directly convert the detected voltage into a digital signal. This connection method is suitable for scenarios where the amplitude of the detected voltage itself is relatively large and can be effectively identified without amplification.

[0033] In some embodiments, the analog-to-digital converter 22 may employ an integrated ADC chip (also known as an ADC IC). Such integrated ADC chips typically integrate the core analog-to-digital conversion circuitry with necessary signal conditioning modules (such as reference voltage sources, filter circuits, etc.), offering advantages such as small size, high integration, and simple peripheral circuitry. This simplifies the overall design of the pressure detection circuit 100 while ensuring the stability of the conversion performance.

[0034] It is understandable that the analog-to-digital converter 22 typically also includes a power interface for connecting to the operating voltage, providing power for the operation of its internal functional modules. This power interface can be connected to the operating power supply 10, or to a separate operating power supply. Figure 1 VCC is used to represent this, but this embodiment does not impose any specific limitations on it.

[0035] In some embodiments, the pressure detection circuit 100 further includes a microcontroller 23 connected to an analog-to-digital converter 22, for converting the digital signal corresponding to the detection voltage into a pressure value. This pressure value can serve as a quantitative indicator of the pressure change of the component under test.

[0036] In some embodiments, the microcontroller 23 can convert digital signals into pressure values ​​through the correspondence between digital signals and pressure values. The correspondence between digital signals and pressure values ​​can be established by applying a known standard pressure to the component under test, obtaining the digital signal corresponding to the detection voltage output by the analog-to-digital converter 22 under the applied known standard pressure, and then establishing a mapping data table of "pressure value-digital signal" or fitting a functional relationship between the two. It can be understood that this mapping data table or functional relationship is the correspondence between the digital signals and pressure values ​​mentioned above, and then the data table or functional relationship is pre-stored in the microcontroller 23 to form reference data that can be called for real-time conversion.

[0037] In some embodiments, the resistance of the second resistor 12 changes due to ambient temperature. Therefore, to improve the detection accuracy of pressure changes in the component under test, the microcontroller 23 can first perform temperature compensation on the digital signal corresponding to the detection voltage. This is because the change in the resistance of the second resistor 12 directly causes a shift in the detection voltage, which in turn causes a deviation in the digital signal output by the analog-to-digital converter 22. Since the digital signal is the basis for subsequent pressure value calculation, temperature compensation of the digital signal can eliminate the influence of temperature interference on the signal at the source. After temperature compensation, the digital signal is then converted into the corresponding pressure value.

[0038] In some embodiments, after the microcontroller 23 converts the digital signal corresponding to the detected voltage into a pressure value, it can further calculate the pressure difference between the pressure value and the reference pressure value to intuitively reflect the pressure change of the component under test. In some embodiments, the reference pressure value can be the initial pressure value of the component under test during a specific operating phase. For example, the reference pressure value can be the pressure value when the component under test is not working, or the reference pressure value can be the pressure value at the moment of normal operation or startup of the component under test. This embodiment does not specifically limit this, and those skilled in the art can set it according to actual needs.

[0039] In some embodiments, the microcontroller 23 typically also includes a power interface for connecting to an operating voltage to provide power for its operation. This power interface can be connected to the operating power supply 10 or a separate power source. Figure 1 VCC is used to represent this, but this embodiment does not impose any specific limitations on it.

[0040] In some embodiments, such as Figure 1 As shown, the microcontroller 23 can be an MCU IC (Microcontroller Unit Integrated Circuit). To achieve communication between the microcontroller 23 and the analog-to-digital converter 22, their CS (Chip Select), CLK (Clock), MISO (Master In Slave Out), and MOSI (Master Out Slave In) pins need to be connected accordingly.

[0041] It can be understood that MISO is the data output terminal of analog-to-digital converter 22, used to send data to microcontroller 23; while MOSI is the data output terminal of microcontroller 23, used to send data to analog-to-digital converter 22. In other words, analog-to-digital converter 22 outputs the converted digital signal through its own MISO pin, and microcontroller 23 receives the digital signal through its own MISO pin; if microcontroller 23 needs to send data to analog-to-digital converter 22, it outputs it through its own MOSI pin, and analog-to-digital converter 22 receives it through its own MOSI pin.

[0042] In some embodiments, the pressure detection circuit 100 further includes a display 24 connected to the microcontroller 23, for receiving and displaying the pressure value obtained by the microcontroller 23 from the digital signal corresponding to the detection voltage and / or the pressure difference between the calculated pressure value and a reference pressure value. This allows the user to visually observe the pressure changes of the component under test through the display 24. Specifically, as... Figure 1 As shown, the microcontroller 23 and the display 24 are connected via MIPI (Mobile Industry Processor Interface) pins to enable rapid data (pressure value and / or pressure difference) transmission.

[0043] In some embodiments, the display 24 can display the pressure values ​​and / or pressure difference values ​​received from the microcontroller 23 in a graph format according to time sequence, so as to intuitively show the changes of each pressure value and / or each pressure difference value over time. For example, the display 24 can display the pressure values ​​and / or pressure difference values ​​in a curve graph. The curve is plotted with time as the horizontal axis and pressure value and / or pressure difference as the vertical axis. The received pressure values ​​and / or pressure difference values ​​are connected sequentially in time to form a smooth curve, thereby clearly showing the rising, falling, or stable trend of the pressure values ​​and / or pressure difference values ​​over time. For example, the gradual increase or slight oscillation of the pressure value of the component under test during the working phase, or the sudden rise or fall under abnormal conditions. At the same time, the display 24 can also mark the horizontal reference line corresponding to the baseline pressure value and the upper and lower threshold lines of the pressure difference value in the graph graph. When the curve touches or exceeds the threshold line, it can automatically switch colors (such as red) or flash to intuitively indicate the abnormality. By observing the shape, slope, and relative position of the curve to the reference line, users can quickly grasp the dynamic pattern of pressure changes in the component under test, predict potential problems, and provide a reference for dynamic debugging and troubleshooting of electronic equipment.

[0044] like Figure 2 As shown, in some embodiments, the aforementioned amplification circuit 14 includes an amplifier 15, a third resistor 16, and a fourth resistor 17. The non-inverting input of the amplifier 15 is directly connected to the connection node of the first resistor 11 and the second resistor 12. One end of the third resistor 16 is connected to the inverting input of the amplifier 15, and the other end is connected to the ground terminal 13. One end of the fourth resistor 17 is connected to the inverting input of the amplifier 15, and the other end is connected to the output of the amplifier 15. The output voltage of the amplifier 15 is the amplified detection voltage. Thus, the third resistor 16 and the fourth resistor 17 form a feedback network, allowing the amplification factor of the amplifier 15 to be adjusted by the resistance ratio of the third resistor 16 and the fourth resistor 17, thereby positively amplifying the detection voltage according to the amplification factor.

[0045] Specifically, the amplification factor of amplifier circuit 14 Wherein, Vin is the input voltage at the non-inverting input terminal of amplifier 15, i.e., the detection voltage, Vout is the output voltage of amplifier 15, i.e., the amplified detection voltage, R16 is the third resistor 16, and R17 is the fourth resistor 17.

[0046] like Figure 3As shown, in some embodiments, the aforementioned amplification circuit 14 includes an amplifier 18, a fifth resistor 19, a sixth resistor 20, and a seventh resistor 21. The inverting input of the amplifier 18 is connected to one end of the fifth resistor 19, and the other end of the fifth resistor 19 is connected to the connection node of the first resistor 11 and the second resistor 12. Thus, the detected voltage is connected to the inverting input of the amplifier 18 through the fifth resistor 19. One end of the sixth resistor 20 is connected to the non-inverting input of the amplifier 18, and the other end is connected to the ground terminal 13, providing a ground reference for the non-inverting input. One end of the seventh resistor 21 is connected to the inverting input of the amplifier 18, and the other end is connected to the output of the amplifier 18, forming a feedback loop. Therefore, the amplification factor of the amplifier 15 is adjusted by the resistance ratio of the fifth resistor 19 and the seventh resistor 21, and the detected voltage is amplified in reverse according to the amplification factor.

[0047] Specifically, the amplification factor of amplifier circuit 14 Among them, R19 is the fifth resistor 19, and R21 is the seventh resistor 21.

[0048] After being amplified in reverse by the pressure detection circuit of amplifier circuit 14, the polarity of the detected voltage is reversed. Therefore, the digital signal of the detected voltage obtained after conversion by analog-to-digital converter 22 is also reversed. Before converting the digital signal into a pressure value, microcontroller 23 can correct the reversed digital signal. Specifically, microcontroller 23 can correct the digital signal by multiplying it by -1.

[0049] This application also proposes an electronic device comprising a motherboard, a pressure detection circuit 100 as described in any of the above embodiments, and a housing. The motherboard includes a component under test (DUT). A second resistor 12 of the pressure detection circuit 100 is disposed on the surface of the DUT, such that the resistance of the second resistor 12 changes with the pressure deformation of the DUT caused by vibration, thus obtaining a detection voltage reflecting the vibration change of the DUT. Therefore, the pressure value and / or pressure difference value displayed on the display 24 in the pressure detection circuit 100 reflects the vibration change of the DUT and can be used as a quantitative indicator of the vibration condition of the DUT. It is understood that the stronger the vibration of the DUT, the larger the pressure value and / or pressure difference value displayed on the display 24; conversely, the weaker the vibration of the DUT, the smaller the pressure value and / or pressure difference value displayed on the display 24. The housing is used to house the motherboard and the second resistor of the pressure detection circuit; other circuit structures of the pressure detection circuit are disposed outside the housing.

[0050] It should be noted that the motherboard, also known as the motherboard, is the core circuit carrier of electronic devices, usually a printed circuit board (PCB). Its surface is covered with a large number of copper wires, solder joints, interface slots, and various electronic components, including the component under test. It adopts a multi-layer structure design, commonly with a top layer and a bottom layer. Complex motherboards may even contain more inner layers.

[0051] In some embodiments, the second resistor 12 in the pressure detection circuit 100 is detachably disposed on the surface of the component under test, so that the second resistor 12 can sense the pressure deformation of the component under test caused by vibration, and its resistance value changes accordingly, so that a detection voltage that reflects the vibration change of the component under test is formed between the first resistor 11 and the second resistor 12, thereby obtaining a pressure value and / or pressure difference value that reflects the vibration change of the component under test.

[0052] Furthermore, in some embodiments, a transition connection structure is provided on the surface of the component under test. The second resistor 12 in the pressure detection circuit 100 is fixedly disposed on the surface of the transition connection structure by an adhesive, so as to achieve a tight fit and detachable connection between the second resistor 12 and the component under test. This transition connection structure can be a thin-film stress-strain sensing contact. As mentioned above, the second resistor 12 is a strain gauge resistor. Therefore, when the component under test deforms due to vibration, the deformation will first be transmitted to the thin-film stress-strain sensing contact, and then the contact will transmit the deformation to the second resistor 12, causing it to undergo shape changes such as stretching or compression with the deformation, resulting in a change in its resistance value. Thus, the detection voltage between the second resistor and the first resistor can reflect the pressure deformation of the component under test caused by vibration. In some embodiments, the adhesive can be modeling clay.

[0053] In some embodiments, the second resistor 12 in the pressure detection circuit 100 is disposed on the surface of the component under test on the motherboard. Therefore, the motherboard and the second resistor 12 are encapsulated together by the housing. The leads at both ends of the second resistor 12 can be led out at the housing seam and connected to other circuit structures in the pressure detection circuit 100.

[0054] In some embodiments, the housing is provided with at least one through hole so that the leads at both ends of the second resistor 12 in the pressure detection circuit 100 can pass through the through hole and connect to other circuit structures in the pressure detection circuit 100.

[0055] In some embodiments, the electronic device may be a mobile phone, computer, or other device with audio functionality. The component under test (DUT) may specifically refer to capacitors on the motherboard of such electronic devices, such as electrolytic capacitors and ceramic capacitors.

[0056] When an electronic device is running, the capacitors on its motherboard may frequently charge and discharge due to rapid voltage fluctuations, causing them to vibrate. Because the capacitors are rigidly connected to the motherboard, this vibration is transmitted to the device's casing through the motherboard, brackets, etc., causing the casing to resonate and produce "board vibration noise." This board vibration noise can mix into the normal audio from the speakers, interfering with the device's audio performance.

[0057] By configuring the aforementioned electronic device and employing the pressure detection circuit 100, accurate detection of board vibration noise can be achieved. A second resistor 12, acting as a strain gauge resistor, is placed on the surface of the capacitor (the component under test). When the capacitor vibrates due to charging and discharging, the vibration is sequentially transmitted to the thin-film stress-strain sensing contact and the second resistor 12, causing deformation and a change in resistance. The pressure detection circuit 100 detects this resistance change and converts it into a corresponding voltage change (detection voltage). This voltage change is then converted into a pressure value and / or the pressure difference between this pressure value and a reference pressure value is calculated. The vibration intensity can be inversely calculated using this pressure value and / or pressure difference, ultimately quantifying the board vibration noise characteristics. In other words, this pressure value and / or pressure difference can serve as a quantitative indicator of the intensity of board vibration noise generated by the capacitor, thereby accurately testing the board vibration noise effect of the relevant capacitors in the electronic device.

[0058] In some embodiments, the display can pre-store the correspondence between pressure values ​​and plate vibration intensity. Then, after receiving pressure values ​​and / or pressure differences, the display can convert the pressure values ​​and / or pressure differences into the corresponding plate vibration intensity according to the correspondence and display them, so that the user can intuitively understand the plate vibration sound of the component under test.

[0059] While numerous embodiments of this application have been shown and described herein, it will be apparent to those skilled in the art that such embodiments are provided by way of example only. Many modifications, alterations, and alternatives will arise for those skilled in the art without departing from the spirit and intent of this application. It should be understood that various alternatives to the embodiments of this application described herein may be employed in the practice of this application. The appended claims are intended to define the scope of protection of this application and therefore cover equivalents or alternatives within the scope of these claims.

Claims

1. A pressure detection circuit characterized by comprising: include: A working power supply (10), a first resistor (11), a second resistor (12), and a grounding terminal (13) are connected in series; wherein, the working power supply (10) is used to provide working voltage for the pressure detection circuit, the first resistor (11) is a fixed resistor, and the second resistor (12) is a strain gauge resistor; When the second resistor (12) is placed on the surface of the component under test, its resistance changes with the pressure of the component under test, so that the connection node of the first resistor (11) and the second resistor (12) forms a detection voltage. The detection voltage changes with the resistance of the second resistor (12), thereby reflecting the pressure change of the component under test caused by vibration.

2. The pressure detection circuit according to claim 1, characterized by, It also includes an amplifier circuit (14), whose input is connected to the connection node between the first resistor (11) and the second resistor (12), for amplifying the detection voltage.

3. The pressure detection circuit according to claim 2, characterized in that, The amplifier circuit (14) includes: an amplifier (15), a third resistor (16), and a fourth resistor (17); wherein The amplifier (15) has its non-inverting input terminal connected to the connection node of the first resistor (11) and the second resistor (12); One end of the third resistor (16) is connected to the inverting input terminal of the amplifier (15), and the other end is connected to the ground terminal (13); One end of the fourth resistor (17) is connected to the inverting input terminal of the amplifier (15), and the other end is connected to the output terminal of the amplifier (15). The output voltage of the amplifier (15) is the amplified detection voltage. The third resistor (16) and the fourth resistor (17) form a feedback network to adjust the amplification factor of the amplifier (15) by adjusting the resistance ratio of the third resistor (16) and the fourth resistor (17), thereby amplifying the detected voltage according to the amplification factor.

4. The pressure detection circuit according to claim 2, wherein The amplification circuit (14) includes an amplifier (18), a fifth resistor (19), a sixth resistor (20), and a seventh resistor (21); wherein, The inverting input terminal of the amplifier (18) is connected to one end of the fifth resistor (19), and the other end of the fifth resistor (19) is connected to the connection node of the first resistor (11) and the second resistor (12). One end of the sixth resistor (20) is connected to the non-inverting input terminal of the amplifier (18), and the other end is connected to the ground terminal (13); One end of the seventh resistor (21) is connected to the inverting input terminal of the amplifier (18), and the other end is connected to the output terminal of the amplifier (18); The fifth resistor (19) and the seventh resistor (21) form a feedback network to adjust the amplification factor of the amplifier (18) by adjusting the resistance ratio of the fifth resistor (19) and the seventh resistor (21), thereby amplifying the detection voltage according to the amplification factor.

5. The pressure detection circuit according to claim 2, wherein It also includes an analog-to-digital converter (22), which is connected to the output of the amplifier circuit (14) and is used to convert the amplified detection voltage output from the output of the amplifier circuit (14) into a digital signal.

6. The pressure detection circuit according to claim 5, wherein It also includes a microcontroller (23) connected to the analog-to-digital converter (22) for converting the digital signal corresponding to the detection voltage into a corresponding pressure value and / or calculating the pressure difference between the pressure value and the reference pressure value, wherein the pressure difference reflects the pressure change of the component under test.

7. The pressure detection circuit according to claim 6, wherein It also includes a display (24) connected to the microcontroller (23) for receiving and displaying the pressure value and / or the pressure difference value.

8. An electronic device, comprising: include: Motherboard, the motherboard including the component under test; The pressure detection circuit according to any one of claims 1-7, wherein the second resistor (12) of the pressure detection circuit is disposed on the surface of the component under test, so that the resistance value of the second resistor (12) changes with the pressure deformation of the component under test caused by vibration, thereby obtaining a detection voltage that reflects the vibration change of the component under test; A housing for accommodating the motherboard and the second resistor of the pressure detection circuit, with other components of the pressure detection circuit disposed outside the housing.

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