Waveguide sheet detection system

Abstract

This utility model discloses a waveguide sheet inspection system, comprising: a projection component for projecting various test images; a waveguide sheet positioning component including a waveguide sheet positioning fixture and a first adjustment mechanism connected to the positioning fixture, the positioning fixture fixing the waveguide sheet and the first adjustment mechanism adjusting the position of the positioning fixture to adjust the position of the waveguide sheet; and a receiving component including a light receiver and a second adjustment mechanism, the light receiver being mounted on the second adjustment mechanism and the second adjustment mechanism adjusting the position of the light receiver. The test images projected by the projection component are received by the light receiver after passing through the waveguide sheet, thus completing the inspection. According to this utility model, multiple performance characteristics of the waveguide sheet can be inspected, improving the flexibility of the waveguide sheet inspection system and increasing the production inspection efficiency of the waveguide sheet.

Description

Technical Field

[0001] This utility model relates to the field of testing instrument technology, and in particular to a waveguide sheet testing system. Background Technology

[0002] Augmented Reality (AR) technology is a technology that integrates virtual information with the real world. Optical waveguides are a key component of AR display technology. They can transmit virtual images to the user's eyes without affecting the user's observation of the real world, thus allowing the user to see the effect of augmented reality.

[0003] In the fabrication process of optical waveguides, it is necessary to test the performance of optical waveguides from multiple dimensions, such as brightness, uniformity, field of view, and eye box. However, in the existing technology, in order to evaluate the performance of optical waveguides in multiple dimensions, multiple testing devices are usually required to test the optical waveguides. Each testing device can only test specific performance of the optical waveguide, resulting in low flexibility of optical waveguide testing equipment. Utility Model Content

[0004] This invention aims to solve at least one of the technical problems existing in the prior art. To this end, this invention provides a waveguide sheet testing system that is highly flexible and capable of testing multiple performance characteristics of waveguide sheets.

[0005] The waveguide sheet inspection system according to this utility model is used for inspecting waveguide sheets, and the waveguide sheet inspection system includes:

[0006] A projection component for emitting various different test images;

[0007] A waveguide plate positioning assembly includes a waveguide plate positioning fixture and a first adjustment mechanism. The first adjustment mechanism is connected to the waveguide plate positioning fixture. The waveguide plate positioning fixture is used to fix the waveguide plate, and the first adjustment mechanism is used to adjust the position of the waveguide plate positioning fixture to adjust the position of the waveguide plate.

[0008] A receiving component, the receiving component including a light receiver and a second adjustment mechanism, the light receiver being disposed on the second adjustment mechanism, the second adjustment mechanism being used to adjust the position of the light receiver;

[0009] The test image emitted by the projection component is received by the optical receiver after passing through the waveguide sheet, thereby completing the detection.

[0010] In some embodiments, the projection assembly includes a light emitter, the light emitter comprising:

[0011] A light source, which is used to emit a light beam;

[0012] A filter for filtering a light beam;

[0013] The chart has various patterns on it, and the light beam forms various different test images after passing through the chart.

[0014] The projection lens receives the test image and then projects the test image out of the projection component.

[0015] The light beam emitted by the light source is filtered by the filter and then directed toward the pattern card. After forming a test image on the pattern card, the light beam is directed toward the projection lens and then exited from the projection assembly to the waveguide plate.

[0016] In some optional embodiments, the light emitter further includes a first rotating disk and a second rotating disk, and multiple filters are provided, wherein...

[0017] The multiple filters are different and are disposed on the first turntable. Rotating the first turntable causes one of the filters to be disposed corresponding to the light source, so as to filter the light beam emitted by the light source.

[0018] The pattern card is placed on the second turntable. Rotating the second turntable causes a pattern on the pattern card to correspond to the filter so as to receive the light beam emitted by the light source and form a test image which is then projected onto the projection lens.

[0019] In some embodiments, the projection assembly further includes a third adjustment mechanism connected to the light emitter and used to adjust the position of the light emitter.

[0020] In some embodiments, the waveguide plate positioning assembly further includes an autocollimator for measuring the angle of the waveguide plate.

[0021] In some optional embodiments, the waveguide sheet positioning assembly further includes an area array camera for positioning the contour of the waveguide sheet.

[0022] In some optional embodiments, the waveguide plate positioning assembly further includes a coaxial displacement meter for determining the position of the coupling region on the waveguide plate.

[0023] In some optional embodiments, the first adjustment mechanism includes a six-axis adjustment platform, which includes adjustable structures for the X, Y, Z, Rx, Ry, and Rz axes. The six-axis adjustment platform is used to adjust the position of the waveguide sheet according to the angle of the waveguide sheet measured by the autocollimator, the contour of the waveguide sheet positioned by the area array camera, and the position of the coupling region on the waveguide sheet determined by the coaxial displacement gauge.

[0024] In some alternative embodiments, the light receiver includes a humanoid lens, a spectrometer, and an image sensor. The humanoid lens is used to receive test images emitted from the waveguide and transmit the test images to the spectrometer and the image sensor.

[0025] In some optional embodiments, the waveguide sheet inspection system further includes a support, on which the projection component, the waveguide sheet positioning component, and the receiving component are all mounted.

[0026] According to the waveguide sheet inspection system of this utility model, by setting up a projection component, a waveguide sheet positioning component, and a receiving component, the projection component can emit a variety of different test images, thereby meeting the testing requirements of various performance characteristics. Furthermore, the waveguide sheet positioning component includes a waveguide sheet positioning fixture and a first adjustment mechanism, which allows adjustment of the waveguide sheet position, thus improving the flexibility of waveguide sheet setup. Additionally, the receiving component includes a light receiver and a second adjustment mechanism, allowing the second adjustment mechanism to adjust the position of the light receiver. When different performance characteristics need to be tested, the position of the light receiver can be adjusted to receive the signal of the required test image to complete the corresponding performance test. Through the cooperation of the projection component, the waveguide sheet positioning component, and the receiving component, the waveguide sheet inspection system can test multiple performance characteristics of the waveguide sheet, improving the flexibility of the waveguide sheet inspection system and increasing the production and testing efficiency of the waveguide sheet.

[0027] Additional aspects and advantages of this invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0028] Figure 1 This is a schematic diagram of a waveguide sheet testing system according to an embodiment of the present invention;

[0029] Figure 2 This is a schematic diagram of a light emitter according to an embodiment of the present invention.

[0030] Figure label:

[0031] 1000: Waveguide sheet inspection system; 100: Projection assembly; 110: Light emitter; 111: Light source; 112: Filter; 113: Chart; 114: Projection lens; 120: Third adjustment mechanism; 200: Receiving assembly; 210: Light receiver; 220: Second adjustment mechanism; 300: Waveguide sheet positioning assembly; 310: Waveguide sheet positioning fixture; 320: First adjustment mechanism; 400: Autocollimator; 500: Area array camera; 600: Coaxial displacement meter; 700: Support. Detailed Implementation

[0032] The embodiments of this utility model are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain this utility model, and should not be construed as limiting this utility model.

[0033] The following disclosure provides numerous different embodiments or examples for implementing various structures of the present invention. To simplify the disclosure, specific examples of components and arrangements are described below. These are merely examples and are not intended to limit the scope of the invention. Furthermore, reference numerals and / or letters may be repeated in different examples. Such repetition is for simplification and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed. In addition, examples of various specific processes and materials are provided in this invention; however, those skilled in the art will recognize the applicability of other processes and / or the use of other materials.

[0034] The following is for reference. Figures 1-2 The waveguide sheet inspection system 1000 according to an embodiment of the present invention is used to inspect waveguide sheets. The performance of the waveguide sheet directly affects the display quality of AR display devices. A high-quality waveguide sheet can ensure that the image remains clear and has its original contrast during transmission. The waveguide sheet has an inlet area and an outlet area. External image information can enter the waveguide sheet through the inlet area, and after total internal reflection transmission in the waveguide sheet, it exits the waveguide sheet from the outlet area. The waveguide sheet inspection system 1000 in this embodiment can inspect multiple performance characteristics of the waveguide sheet.

[0035] like Figure 1As shown, the waveguide sheet inspection system 1000 includes a projection component 100, a waveguide sheet positioning component 300, and a receiving component 200. The test image emitted by the projection component 100 passes through the waveguide sheet and is received by the optical receiver 210, thus completing the inspection. The projection component 100 is used to emit multiple different test images; understandably, since the waveguide sheet inspection system 1000 needs to inspect multiple properties of the waveguide sheet, the projection component 100 needs to emit multiple different test images to meet various inspection requirements. Specifically, the projection component 100 can emit multiple different test images; when the performance to be tested is determined, the projection component 100 is adjusted to the desired test image for testing.

[0036] Please continue to refer to Figure 1 Furthermore, the waveguide plate positioning assembly 300 includes a waveguide plate positioning fixture 310 and a first adjustment mechanism 320. The first adjustment mechanism 320 is connected to the waveguide plate positioning fixture 310. The waveguide plate positioning fixture 310 is used to fix the waveguide plate, and the first adjustment mechanism 320 is used to adjust the position of the waveguide plate positioning fixture 310 to adjust the position of the waveguide plate.

[0037] Specifically, the waveguide plate positioning fixture 310 is provided with a movable locking structure. On the one hand, the movable locking structure can fix the waveguide plate by engaging, and after the waveguide plate is fixed, the movable locking structure can be fixed to the waveguide plate positioning fixture 310, so that the waveguide plate is fixed on the waveguide plate positioning fixture 310. On the other hand, the movable locking structure can adapt to different waveguide plate shapes, so that different waveguide plates can be detected by the waveguide plate detection system 1000 of this utility model embodiment.

[0038] Please continue to refer to Figure 1 Furthermore, the first adjustment mechanism 320 is connected to the waveguide plate positioning fixture 310. Therefore, after the waveguide plate is fixed on the waveguide plate positioning fixture 310, the waveguide plate can be moved by adjusting the first adjustment mechanism 320, so that the coupling area of ​​the waveguide plate corresponds to the projection component 100, so that the test image emitted by the projection component 100 can enter the waveguide plate through the coupling area.

[0039] Please continue to refer to Figure 1 Furthermore, the receiving component 200 includes a light receiver 210 and a second adjustment mechanism 220. The light receiver 210 is disposed on the second adjustment mechanism 220, which is used to adjust the position of the light receiver 210. Specifically, the second adjustment mechanism 220 can drive the light receiver 210 to move, so that the light receiver 210 can receive the light emitted from the waveguide coupling region.

[0040] Understandably, since the waveguide testing system 1000 needs to test various performance characteristics of the waveguide, the second adjustment mechanism 220 drives the optical receiver 210 to move, so that the optical receiver 210 can receive the light beams coupled out of the waveguide at different positions, thereby enabling the waveguide testing system 1000 to meet the needs of various performance tests.

[0041] The inventors discovered in their actual research that the waveguide sheet manufacturing process requires testing the performance of the waveguide sheet in multiple dimensions. However, existing waveguide sheet testing equipment can usually only test a specific performance of the optical waveguide, resulting in low flexibility.

[0042] In view of this, the waveguide sheet testing system 1000 according to the present invention, by setting up a projection component 100, a waveguide sheet positioning component 300, and a receiving component 200, allows the projection component 100 to emit various different test images, thereby meeting various performance testing requirements. Furthermore, the waveguide sheet positioning component 300 includes a waveguide sheet positioning fixture 310 and a first adjustment mechanism 320, which allows the position of the waveguide sheet to be adjusted, thereby improving the flexibility of waveguide sheet setup. Additionally, the receiving component 200 includes an optical receiver... The receiver 210 and the second adjustment mechanism 220 allow the second adjustment mechanism 220 to adjust the position of the optical receiver 210. When different performance needs to be tested, the position of the optical receiver 210 can be adjusted to receive the signal of the required test image to complete the corresponding performance test. Through the cooperation of the projection component 100, the waveguide plate positioning component 300 and the receiving component 200, the waveguide plate testing system 1000 can test multiple performances of the waveguide plate, improving the flexibility of the waveguide plate testing system 1000 and improving the production testing efficiency of the waveguide plate.

[0043] Specifically, for example, when testing the waveguide eye box, the projection component 100 can project a completely white test image, and the waveguide positioning component 300 moves the waveguide to align the waveguide with the projection component 100. The completely white test image can enter the waveguide through the coupling area and exit the waveguide through the coupling area. The second adjustment component moves the light receiver 210 up, down, left, and right to obtain the boundary information of the waveguide eye box, thereby completing the test of the waveguide eye box.

[0044] In other embodiments, the image contrast of the waveguide sheet can be detected. For example, the projection component 100 can project a test image of a black and white checkerboard pattern. The waveguide sheet positioning component 300 moves the waveguide sheet so that the waveguide sheet is aligned with the projection component 100. The test image of the black and white checkerboard pattern can enter the waveguide sheet through the coupling area and exit the waveguide sheet through the coupling area. The second adjustment component adjusts the position of the light receiver 210 so that the light receiver 210 receives the test image of the black and white checkerboard pattern coupled out of the waveguide sheet, and obtains the image contrast by analyzing the image.

[0045] It should be noted that the above-described waveguide sheet inspection is only one or two specific examples of the waveguide sheet inspection system 1000. The waveguide sheet inspection system 1000 of this utility model embodiment can also be used to inspect other performance of waveguide sheets, such as inspecting the performance of waveguide sheet imaging in multiple dimensions such as brightness, uniformity, field of view, distortion, light efficiency, color gamut, dispersion, and motion blur.

[0046] Please refer to the above as well. Figure 2 In some embodiments, the projection assembly 100 includes a light emitter 110, which includes a light source 111, a filter 112, a pattern card 113, and a projection lens 114. The light source 111 is used to emit a light beam, and the filter 112 is used to filter the light beam. The pattern card 113 is provided with a variety of different patterns, and the light beam forms a variety of different test images after passing through the pattern card 113. The projection lens 114 receives the test images and then projects the test images out of the projection assembly 100. It can be understood that the light beam emitted by the light source 111 is filtered by the filter 112 and then directed to the pattern card 113. After the test image is formed by the pattern card 113, it is directed to the projection lens 114 and then projected out of the projection assembly 100 to be directed to the waveguide sheet.

[0047] It should be noted that multiple pattern cards 113 can be provided, each pattern card 113 having a different pattern. By providing multiple pattern cards 113 with different patterns, the light beam emitted by the light source 111 can produce different test images after passing through the pattern cards 113 with different patterns, thus meeting the needs of various performance tests on the waveguide sheet. Alternatively, there can be only one pattern card 113, with multiple patterns on it. When the light beam emitted by the light source 111 passes through different patterns on the pattern card 113, different test images can be formed, thus meeting the needs of various performance tests on the waveguide sheet. This embodiment of the present invention does not limit this.

[0048] Therefore, by setting up a variety of different pattern cards 113, the light emitter 110 can emit a variety of different test images to meet the testing of various performance characteristics of the waveguide sheet, thereby further improving the flexibility of the waveguide sheet testing system 1000. Furthermore, the method of forming different test images using different patterns of pattern cards 113 is simple, which can simplify the structure of the waveguide sheet testing system 1000 and reduce the production cost of the waveguide sheet testing system 1000.

[0049] In some optional embodiments, the light emitter 110 further includes a first turntable and a second turntable. Multiple filters 112 are provided, wherein the multiple filters 112 are different, and the multiple filters 112 are provided on the first turntable. Rotating the first turntable causes one filter 112 to be correspondingly set with the light source 111 to filter the light beam emitted by the light source 111. A pattern card 113 is provided on the second turntable. Rotating the second turntable causes a pattern on the pattern card 113 to correspond with the filter 112 to receive the light beam emitted by the light source 111, and after forming a test image, it is projected onto the projection lens 114.

[0050] Specifically, the multiple filters 112 may include red light filter 112, blue light filter 112, green light filter 112, etc. This utility model embodiment does not limit this, and the specific selection can be made according to actual testing needs.

[0051] Understandably, by rotating the first and second turntables, multiple different filters 112 and multiple different pattern cards 113 can be combined to form multiple different test images to meet the testing of various performance characteristics of the waveguide sheet. Furthermore, using the first and second turntables to combine the patterns on the filters 112 and pattern cards 113 to form different test images is a simple method that can simplify the structure of the waveguide sheet testing system 1000 and reduce the production cost of the waveguide sheet testing system 1000.

[0052] like Figure 1 and Figure 2 As shown, in some optional embodiments, the projection assembly 100 further includes a third adjustment mechanism 120, which is connected to the light emitter 110 and used to adjust the position of the light emitter 110. It should be noted that since the waveguide sheet testing system 1000 needs to meet the requirements of testing multiple performance characteristics of the waveguide sheet, the light emitter 110 may need to be positioned in different locations during the testing process to meet various testing requirements. Therefore, by setting the third adjustment mechanism 120 to adjust the position of the light emitter 110, the flexibility of the emission assembly setting can be improved, further enhancing the flexibility of the waveguide sheet testing system 1000, enabling the waveguide sheet testing system 1000 to meet the requirements of testing multiple performance characteristics of the waveguide sheet.

[0053] like Figure 1 and Figure 2 As shown, in some embodiments, the waveguide plate positioning assembly 300 further includes an autocollimator 400, which is used to measure the angle of the waveguide plate. Understandably, the autocollimator 400 is a core tool for achieving ultra-high precision angle measurement using the principle of optical autocollimation. The autocollimator 400 accurately determines the angle of the waveguide plate by emitting a parallel beam of light and detecting the change in the image position after reflection from the waveguide plate. Therefore, after measuring the angle of the waveguide plate using the autocollimator 400, the angle of the waveguide plate can be adjusted using the first adjustment mechanism 320 so that the test image emitted by the projection assembly 100 can be projected onto the waveguide plate at the optimal incident angle. Furthermore, the autocollimator 400, when measuring the angle of the waveguide plate, features non-contact, high precision, and high sensitivity, thereby improving the detection accuracy of the waveguide plate detection system 1000.

[0054] like Figure 1 and Figure 2 As shown, in some optional embodiments, the waveguide sheet positioning assembly 300 further includes an area array camera 500, which is used to locate the contour of the waveguide sheet. Specifically, the area array camera 500 mainly uses an optical system to project the image of the waveguide sheet onto a two-dimensional sensor to form a digital image, and uses image processing algorithms to accurately extract the pixel sequence representing the product boundary from the image, and converts this pixel information into actual physical coordinates, ultimately analyzing the contour of the waveguide sheet. Thus, after the contour of the waveguide sheet is determined by the area array camera 500, the position of the waveguide sheet can be adjusted using the first adjustment mechanism 320 so that the test image emitted by the projection assembly 100 can be projected into the waveguide sheet. Furthermore, using the area array camera 500 to determine the contour of the waveguide sheet can avoid contact with the waveguide sheet and damage to it, thereby improving the yield of the waveguide sheet manufacturing process.

[0055] like Figure 1 and Figure 2 As shown, in some optional embodiments, the waveguide sheet positioning assembly 300 further includes a coaxial displacement meter 600, which is used to determine the position of the coupling region on the waveguide sheet. The coaxial displacement meter 600 is a precision non-contact displacement sensor that utilizes laser triangulation and employs a coaxial design of the transmitting and receiving optical paths. Understandably, the contour of the waveguide sheet can be located by the area array camera 500, that is, the position information of the waveguide sheet in the X / Y plane can be determined. Combined with the data measured by the coaxial displacement meter 600, the position information of the waveguide sheet in the Z direction can be obtained, thereby determining the position of the coupling region of the waveguide sheet. Therefore, using the coaxial displacement meter 600 to determine the position of the coupling region on the waveguide sheet can avoid contact with the waveguide sheet and thus prevent damage, thereby improving the yield of the waveguide sheet fabrication process.

[0056] like Figure 1 and Figure 2 As shown, in some optional embodiments, the first adjustment mechanism 320 includes a six-axis adjustment platform. This platform includes adjustable structures for the X, Y, Z, Rx, Ry, and Rz axes. The six-axis adjustment platform is used to adjust the position of the waveguide sheet based on the angle of the waveguide sheet measured by the autocollimator 400, the contour of the waveguide sheet positioned by the area array camera 500, and the position of the coupling zone on the waveguide sheet determined by the coaxial displacement meter 600. Thus, by adjusting the position of the waveguide sheet positioning fixture 310 using the six-axis adjustment platform, the position of the waveguide sheet is adjusted so that the test image emitted by the projection component 100 can enter the waveguide sheet from the coupling zone, be transmitted within the waveguide sheet, and exit from the coupling zone. The six-axis adjustment platform offers high flexibility, further enhancing the flexibility of the waveguide sheet testing system 1000, making it suitable for measuring various performance parameters of the waveguide sheet.

[0057] In some optional embodiments, the light receiver 210 includes a humanoid eyepiece, a spectrometer, and an image sensor. The humanoid eyepiece receives the test image emitted from the waveguide sheet and transmits the test image to the spectrometer and image sensor. Thus, the humanoid eyepiece can simulate the entrance pupil of the human eye, making the test results of the waveguide sheet inspection system 1000 closer to human visual perception, thereby further improving the inspection accuracy of the waveguide sheet inspection system 1000. Simultaneously, by incorporating the spectrometer and image sensor, the waveguide sheet inspection system 1000 can simultaneously measure spectral and image information, enabling the inspection of multiple waveguide sheet properties, such as spectral power distribution, brightness, chromaticity, uniformity, color gamut, field of view, and contrast. This further enhances the flexibility of the waveguide sheet inspection system 1000, allowing it to meet the needs of inspecting multiple waveguide sheet properties.

[0058] like Figure 1 and Figure 2 As shown, in some specific embodiments, the second adjustment mechanism 220 may include a robotic arm, with the optical receiver 210 fixed to the robotic arm so that the robotic arm drives the optical receiver 210 to move. It should be noted that since the waveguide sheet inspection system 1000 needs to meet the requirements of testing multiple performance characteristics of the waveguide sheet, the optical receiver 210 may need to be positioned in different locations during the inspection process to meet various testing requirements. Therefore, by placing the optical receiver 210 on the robotic arm, the robotic arm can drive the optical receiver 210 to move, thereby improving the flexibility of the receiving component 200 and further enhancing the flexibility of the waveguide sheet inspection system 1000, enabling the waveguide sheet inspection system 1000 to meet the requirements of testing multiple performance characteristics of the waveguide sheet.

[0059] In some embodiments, the waveguide sheet inspection system 1000 further includes a support 700, on which the projection component 100, the waveguide sheet positioning component 300, and the receiving component 200 are all mounted. Understandably, the support 700 is the core load-bearing structure of the waveguide sheet inspection system 1000. The support 700 can be made of metal or alloy to improve the stability of the waveguide sheet inspection system 1000, prevent external interference from affecting the waveguide sheet inspection system 1000, and thus improve the inspection accuracy of the waveguide sheet inspection system 1000.

[0060] Other configurations and operations of the waveguide sheet inspection system 1000 according to embodiments of the present invention are known to those skilled in the art and will not be described in detail here.

[0061] In the description of this utility model, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this utility model and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model.

[0062] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this utility model, "a plurality of" means two or more, unless otherwise explicitly specified.

[0063] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection, an electrical connection, or a communication connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0064] In this utility model, unless otherwise explicitly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0065] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0066] Although embodiments of the present invention have been shown and described, those skilled in the art will understand that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the claims and their equivalents.

Claims

1. A waveguide sheet inspection system for inspecting waveguide sheets, characterized in that, The waveguide sheet inspection system includes: A projection component for emitting various different test images; A waveguide plate positioning assembly includes a waveguide plate positioning fixture and a first adjustment mechanism. The first adjustment mechanism is connected to the waveguide plate positioning fixture. The waveguide plate positioning fixture is used to fix the waveguide plate, and the first adjustment mechanism is used to adjust the position of the waveguide plate positioning fixture to adjust the position of the waveguide plate. A receiving component, the receiving component including a light receiver and a second adjustment mechanism, the light receiver being disposed on the second adjustment mechanism, the second adjustment mechanism being used to adjust the position of the light receiver; The test image emitted by the projection component is received by the optical receiver after passing through the waveguide sheet, thereby completing the detection.

2. The waveguide sheet detection system of claim 1, wherein, The projection component includes a light emitter, the light emitter comprising: A light source, which is used to emit a light beam; A filter for filtering a light beam; The chart has various patterns on it, and the light beam forms various different test images after passing through the chart. The projection lens receives the test image and then projects the test image out of the projection component. The light beam emitted by the light source is filtered by the filter and then directed toward the pattern card. After forming a test image on the pattern card, the light beam is directed toward the projection lens and then exited from the projection assembly to the waveguide plate.

3. The waveguide sheet detection system of claim 2, wherein, The light emitter further includes a first rotating disk and a second rotating disk, and multiple filters are provided, among which... The multiple filters are different and are disposed on the first turntable. Rotating the first turntable causes one of the filters to be disposed corresponding to the light source, so as to filter the light beam emitted by the light source. The pattern card is placed on the second turntable. Rotating the second turntable causes a pattern on the pattern card to correspond to the filter so as to receive the light beam emitted by the light source and form a test image which is then projected onto the projection lens.

4. The waveguide sheet detection system of claim 3, wherein, The projection assembly also includes a third adjustment mechanism, which is connected to the light emitter and is used to adjust the position of the light emitter.

5. The waveguide sheet detection system of claim 1, wherein, The waveguide plate positioning assembly also includes an autocollimator, which is used to measure the angle of the waveguide plate.

6. The waveguide sheet detection system of claim 5, wherein, The waveguide plate positioning assembly also includes an area array camera, which is used to position the contour of the waveguide plate.

7. The waveguide sheet detection system of claim 6, wherein The waveguide plate positioning assembly also includes a coaxial displacement meter, which is used to determine the position of the coupling region on the waveguide plate.

8. The waveguide sheet detection system of claim 7, wherein, The first adjustment mechanism includes a six-axis adjustment platform, which includes adjustable structures for the X, Y, Z, Rx, Ry, and Rz axes. The six-axis adjustment platform is used to adjust the position of the waveguide sheet according to the angle of the waveguide sheet measured by the autocollimator, the contour of the waveguide sheet positioned by the area array camera, and the position of the coupling region on the waveguide sheet determined by the coaxial displacement gauge.

9. The waveguide sheet detection system of claim 1, wherein, The optical receiver includes a humanoid eyepiece, a spectrometer, and an image sensor. The humanoid eyepiece is used to receive test images emitted from the waveguide sheet and transmit the test images to the spectrometer and the image sensor.

10. The waveguide sheet detection system of any of claims 1-9, wherein, It also includes a bracket, on which the projection component, the waveguide plate positioning component and the receiving component are all mounted.

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