A selectable controllable test head device for use on Dage-4000

Abstract

This utility model relates to the technical field of selectable controllable test head devices, specifically a selectable controllable test head device applied to the Dage-4000, comprising: a mounting frame, the bottom end of which is fixed with several sets of slide rails, the slide rails having a "C"-shaped plate structure, and one end of a test module being slidably connected between two sets of side plates of the slide rails; the beneficial effect is that by limiting the test modules to be used in the slide rails, during testing, the product only needs to be placed sequentially at the bottom end of the test head that matches the item to be tested, changing the replacement of the original test modules and test heads to the relocation of the test product, thereby realizing the selection and control of the test head. The value of the test product is far lower than that of the test modules and test heads, so there is no need for excessive care. In the continuous testing of multiple samples, the time required for disassembling and assembling test modules and test heads can be saved, making the product testing efficiency higher.

Description

Technical Field

[0001] This utility model relates to the field of selectable controllable test head devices, specifically a selectable controllable test head device applied to Dage-4000. Background Technology

[0002] The Dage-4000 is a semiconductor push-pull force tester, a high-precision, multi-functional mechanical testing device specifically designed to measure the mechanical properties of semiconductor packages, microelectronic components, and interconnects under push (compressive) or pull (tensile) forces. Its core objective is to evaluate the mechanical strength and reliability of critical components such as chips, bonding wires, solder balls, and adhesive layers by simulating actual stress environments, thereby ensuring the quality and lifespan of electronic products.

[0003] However, the test head on the semiconductor push-pull force tester is mounted on the test module. Both the test module and the test head are extremely precise instruments, and the installation and removal of the test module must be handled with great care. When using the semiconductor tester to test the product, multiple different test heads need to be tested in turn. Existing semiconductor push-pull force testers can only install one set of test modules at a time. This means that different test modules need to be replaced during the test, especially when conducting continuous tests on a large batch of samples. The need to constantly replace test modules and test heads severely reduces the testing efficiency. Utility Model Content

[0004] The purpose of this invention is to provide a selectable controllable test head device for use on Dage-4000, so as to solve the problems mentioned in the background art.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a selectable controllable test head device applied to Dage-4000, comprising: a mounting frame, wherein a plurality of slide rails are fixed at the bottom end of the mounting frame, the slide rails are in the form of a "C" shaped plate structure, one end of a test module is slidably connected between two sets of side plates of the slide rails, the other end of the test module is slidably connected between two sets of side plates of another set of slide rails, a test head is fixed at the bottom end of the test module, and a limit rod is movably inserted into the two sets of side plates of the slide rails, the top end of the limit rod abuts against the top end of the test module, and the top end of the test module abuts against the bottom end of the mounting frame.

[0006] Preferably, the two sets of side plates of the slide rail are respectively provided with a first limiting hole and a second limiting hole. One end of the limiting rod is movably inserted into the first limiting hole, and the other end of the limiting rod is movably inserted into the second limiting hole. The limiting rod has a rectangular plate structure. The first limiting hole and the second limiting hole are both rectangular holes, and the first limiting hole and the second limiting hole cooperate with the limiting rod.

[0007] Preferably, a pull block is fixed to one end of the limiting rod inserted into the first limiting hole. The pull block has a rectangular block structure, and the length of the edge of the pull block is greater than that of the first limiting hole.

[0008] Preferably, one end of the limiting rod inserted into the second limiting hole extends out from the side of the second limiting hole away from the first limiting hole. A slot is provided on the side of the end of the limiting rod extending out of the second limiting hole. A locking block is movably inserted into the slot. The locking block has a wedge-shaped block structure. One end of the locking block extends out of the slot, and the side of the end of the locking block extending out of the slot abuts against the outer wall of the side plate of the slide rail. The other set of side surfaces of the end of the locking block extending out of the slot are provided with inclined surfaces.

[0009] Preferably, an air cylinder is fixed in the slot, one end of the air cylinder has a rod hole, a piston rod is movably inserted into the rod hole, the piston rod has a round rod structure, the rod hole matches the piston rod, one end of the piston rod extends out of the rod hole and is fixed in the locking block, and the other end of the piston rod extends into the air cylinder and is fixed with a piston.

[0010] Preferably, the piston has a circular plate structure, a sealing ring is fixed on the side wall of the piston, the outer ring of the sealing ring abuts against the inner wall of the gas cylinder, and the gas cylinder is filled with inert gas.

[0011] Compared with the prior art, the beneficial effects of this utility model are:

[0012] This invention proposes a selectable controllable test head device for the Dage-4000 semiconductor push-pull force tester. The top of the mounting bracket is installed in the original position for mounting test modules on the Dage-4000 semiconductor push-pull force tester. Before product testing, the various test modules to be used are sequentially placed into the slide rail. Then, a limiting rod is inserted into the second limiting hole along the first limiting hole, with the top of the limiting rod abutting against the bottom of the test module, thus limiting the various test modules to be used in the slide rail. During testing, the product is simply placed sequentially at the bottom of the test head corresponding to the desired test. The original replacement of test modules and test heads is replaced by repositioning the test product, thereby achieving selective control of the test head. The value of the test product is far lower than that of the test modules and test heads, requiring less care. In continuous testing of multiple samples, the time required for disassembling and assembling test modules and test heads is saved, resulting in higher product testing efficiency. Attached Figure Description

[0013] Figure 1 This is a schematic diagram of the structure of this utility model;

[0014] Figure 2 This is a schematic diagram of the bottom structure of this utility model;

[0015] Figure 3This is a schematic cross-sectional view of the present invention.

[0016] Figure 4 for Figure 3 Enlarged schematic diagram of the structure at point A in the middle;

[0017] Figure 5 This is a schematic diagram of the cross-sectional structure of the card slot;

[0018] Figure 6 for Figure 5 Enlarged schematic diagram of the structure at point B.

[0019] In the diagram: 1. Mounting bracket; 2. Slide rail; 3. Test module; 4. Test head; 5. First limiting hole; 6. Second limiting hole; 7. Limiting rod; 8. Pull block; 9. Slot; 10. Block; 11. Air cylinder; 12. Piston; 13. Piston rod; 14. Sealing ring; 15. Rod hole. Detailed Implementation

[0020] To make the objectives, technical solutions, and advantages of this utility model clear and complete, the embodiments of this utility model will be further described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are only some, not all, embodiments of this utility model, and are merely used to explain the embodiments of this utility model. They are not intended to limit the embodiments of this utility model. All other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.

[0021] Example 1: Please refer to Figures 1-6 This utility model provides a technical solution: a selectable controllable test head device applied to Dage-4000, comprising: a mounting frame 1, wherein a plurality of slide rails 2 are fixed at the bottom end of the mounting frame 1, the slide rails 2 having a "C"-shaped plate structure, one end of a test module 3 is slidably connected between two sets of side plates of the slide rail 2, the other end of the test module 3 is slidably connected between two sets of side plates of another set of slide rails 2, a test head 4 is fixed at the bottom end of the test module 3, and a test head 4 is movably inserted into the two sets of side plates of the slide rail 2. There is a limiting rod 7, the top of which abuts against the top of the test module 3, and the top of the test module 3 abuts against the bottom of the mounting bracket 1. The two sets of side plates of the slide rail 2 are respectively provided with a first limiting hole 5 and a second limiting hole 6. One end of the limiting rod 7 is movably inserted into the first limiting hole 5, and the other end of the limiting rod 7 is movably inserted into the second limiting hole 6. The limiting rod 7 has a rectangular plate structure. The first limiting hole 5 and the second limiting hole 6 are both rectangular holes, and the first limiting hole 5 and the second limiting hole 6 cooperate with the limiting rod 7.

[0022] The top of the mounting bracket 1 is installed on the Dage-4000 semiconductor push-pull force tester in the position originally used to install the test module 3. Before using the Dage-4000 semiconductor push-pull force tester to test the product, each set of test modules 3 to be used is placed into the slide rail 2 in sequence. Then, the limiting rod 7 is inserted into the second limiting hole 6 along the first limiting hole 5. The top of the limiting rod 7 then rests against the bottom of the test module 3, limiting each set of test modules 3 to be used in the slide rail 2. During the test, the product is simply placed at the bottom of the test head 4 that matches the item to be tested. The original replacement of the test module 3 and test head 4 is changed to the relocation of the test product, thereby achieving the selection control of the test head 4. The value of the test product is far lower than that of the test module 3 and test head 4, so there is no need to be overly careful. In the continuous testing of multiple samples, the time required for disassembling and assembling the test module 3 and test head 4 can be saved, making the product testing efficiency higher.

[0023] Example 2: Based on Example 1, in order to limit the limiting rod 7 in the first limiting hole 5 and the second limiting hole 6, a pull block 8 is fixed to one end of the limiting rod 7 inserted into the first limiting hole 5. The pull block 8 has a rectangular block structure and the edge length of the pull block 8 is greater than that of the first limiting hole 5. One end of the limiting rod 7 inserted into the second limiting hole 6 extends out from the side of the second limiting hole 6 away from the first limiting hole 5. A slot 9 is provided on the side of the end of the limiting rod 7 that extends out of the second limiting hole 6. A locking block 10 is movably inserted into the slot 9. The locking block 10 has a wedge-shaped block structure. One end of the locking block 10 extends out of the slot 9, and the side of the end of the locking block 10 that extends out of the slot 9 abuts against the outer wall of the side plate of the slide rail 2. The other set of side surfaces of the end of the locking block 10 that extends out of the slot 9 are provided with inclined surfaces.

[0024] After the limiting rod 7 is inserted into the first limiting hole 5 until the end of the limiting rod 7 with the slot 9 extends out of the second limiting hole 6, the inclined surface of the locking block 10 slides across the hole wall of the first limiting hole 5, the inner wall of the slide rail 2, and the hole wall of the slot 9 in turn. This keeps the locking block 10 in a state where it is fully pushed into the slot 9. When the end of the limiting rod 7 with the slot 9 extends out of the second limiting hole 6, the end of the locking block 10 automatically extends out of the slot 9 and abuts against the outer wall of one end of the slide rail 2. At this time, the pull block 8 abuts against the outer wall of the other end of the slide rail 2. The pull block 8 and the locking block 10 clamp the slide rail 2 in the middle, thereby limiting the limiting rod 7 in the first limiting hole 5 and the second limiting hole 6.

[0025] Example 3: Based on Example 2, in order to enable one end of the locking block 10 to automatically extend from the locking groove 9, an air cylinder 11 is fixed in the locking groove 9. One end of the air cylinder 11 has a rod hole 15, and a piston rod 13 is movably inserted into the rod hole 15. The piston rod 13 has a round rod structure. The rod hole 15 cooperates with the piston rod 13. One end of the piston rod 13 extends out of the rod hole 15 and is fixed to the locking block 10. The other end of the piston rod 13 extends into the air cylinder 11 and a piston 12 is fixed thereon. The piston 12 has a circular plate structure. A sealing ring 14 is fixed on the side wall of the piston 12. The outer ring of the sealing ring 14 abuts against the inner wall of the air cylinder 11. The air cylinder 11 is filled with inert gas.

[0026] When the locking block 10 is fully pushed into the locking groove 9, the locking block 10 pushes the piston rod 13 into the rod hole 15. The piston rod 13 pushes the piston 12 deeper into the cylinder 11. Under the action of the sealing ring 14, the gap between the inner wall of the cylinder 11 and the piston 12 is blocked, so the inert gas in the cylinder 11 cannot escape to the other side of the piston 12 and can only be compressed. When the end of the limiting rod 7 with the locking groove 9 extends out of the second limiting hole 6, the thrust acting on the locking block 10 disappears, and the inert gas in the cylinder 11 restores its original volume, thereby generating a thrust on the piston 12 and pushing the piston 12 back to its original position. The piston 12 then pushes one end of the locking block 10 out of the locking groove 9 through the piston rod 13.

[0027] In actual use, the top of the mounting bracket 1 is installed on the Dage-4000 semiconductor push-pull force tester in the position originally used to install the test module 3. Before using the Dage-4000 semiconductor push-pull force tester to conduct product testing, each set of test modules 3 to be used is placed into the slide rail 2 in sequence. Then, the limiting rod 7 is inserted into the second limiting hole 6 along the first limiting hole 5. After the limiting rod 7 is inserted into the first limiting hole 5, until the end of the limiting rod 7 with the slot 9 protrudes from the second limiting hole 6, the inclined surface of the locking block 10 slides across the hole wall of the first limiting hole 5, the inner wall of the slide rail 2, and the hole wall of the slot 9 in sequence. This ensures that the locking block 10 is always in a state of being fully pushed into the slot 9. When the end of the limiting rod 7 with the slot 9 protrudes from the second limiting hole 6, the end of the locking block 10 automatically exits from the slot. The 9th block extends out and abuts against the outer wall of one end of the slide rail 2. At this time, the pull block 8 abuts against the outer wall of the other end of the slide rail 2. The pull block 8 and the locking block 10 clamp the slide rail 2 in the middle, thereby limiting the limiting rod 7 in the first limiting hole 5 and the second limiting hole 6. The top of the limiting rod 7 abuts against the bottom of the test module 3, limiting each set of test modules 3 to be used in the slide rail 2. When conducting the test, simply place the product in sequence at the bottom of the test head 4 that matches the item to be tested. The original replacement of the test module 3 and test head 4 is changed to the relocation of the test product. The value of the test product is far lower than that of the test module 3 and test head 4, so there is no need to be overly careful. In the continuous testing of a batch of samples, the time required for disassembling and assembling the test module 3 and test head 4 can be saved, making the product testing efficiency higher.

[0028] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A selectable control test head device for use on a Dage-4000, comprising: The mounting frame (1) is characterized in that: a number of slide rails (2) are fixed at the bottom of the mounting frame (1), the slide rails (2) are in the form of a "C" shaped plate structure, one end of the test module (3) is slidably connected between the two sets of side plates of the slide rail (2), the other end of the test module (3) is slidably connected between the two sets of side plates of another set of slide rails (2), the bottom of the test module (3) is fixed with a test head (4), and a limit rod (7) is movably inserted into the two sets of side plates of the slide rail (2), the top end of the limit rod (7) abuts against the top end of the test module (3), and the top end of the test module (3) abuts against the bottom of the mounting frame (1).

2. The selectable controllable test head device for use on Dage-4000 according to claim 1, characterized in that: The slide rail (2) has a first limiting hole (5) and a second limiting hole (6) respectively on its two side plates. One end of the limiting rod (7) is movably inserted into the first limiting hole (5), and the other end of the limiting rod (7) is movably inserted into the second limiting hole (6). The limiting rod (7) has a rectangular plate structure. The first limiting hole (5) and the second limiting hole (6) are both rectangular holes, and the first limiting hole (5) and the second limiting hole (6) cooperate with the limiting rod (7).

3. The selectable controllable test head device applied to Dage-4000 according to claim 2, characterized in that: The end of the limiting rod (7) inserted into the first limiting hole (5) is fixed with a pull block (8). The pull block (8) has a rectangular block structure and the edge length of the pull block (8) is greater than that of the first limiting hole (5).

4. The selectable controllable test head device applied to Dage-4000 according to claim 2, characterized in that: The end of the limiting rod (7) inserted into the second limiting hole (6) extends out from the side of the second limiting hole (6) away from the first limiting hole (5). A slot (9) is provided on the side of the end of the limiting rod (7) that extends out of the second limiting hole (6). A locking block (10) is movably inserted into the slot (9). The locking block (10) has a wedge-shaped block structure. One end of the locking block (10) extends out of the slot (9), and the side of the end of the locking block (10) that extends out of the slot (9) abuts against the outer wall of the side plate of the slide rail (2). The other set of side surfaces of the end of the locking block (10) that extends out of the slot (9) are provided with inclined surfaces.

5. The selectable controllable test head device for use on Dage-4000 according to claim 4, characterized in that: An air cylinder (11) is fixed in the slot (9). One end of the air cylinder (11) has a rod hole (15). A piston rod (13) is movably inserted into the rod hole (15). The piston rod (13) has a round rod structure. The rod hole (15) cooperates with the piston rod (13). When one end of the piston rod (13) extends out of the rod hole (15) and is fixed in the block (10), the other end of the piston rod (13) extends into the air cylinder (11) and is fixed with a piston (12).

6. The selectable controllable test head device for use on Dage-4000 according to claim 5, characterized in that: The piston (12) has a circular plate structure. A sealing ring (14) is fixed on the side wall of the piston (12). The outer ring of the sealing ring (14) abuts against the inner wall of the gas cylinder (11). The gas cylinder (11) is filled with inert gas.

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