A simulated deep-sea high-pressure stress in-situ monitoring device

By setting an optical mirror and a Raman mount on the side of the autoclave, in-situ Raman and in-situ DIC testing under deep-sea high-pressure environment was achieved, solving the problems of high detection cost and low efficiency in the existing technology and improving detection accuracy and efficiency.

CN224581388UActive Publication Date: 2026-07-31NINGBO INST OF MATERIALS TECH & ENG CHINESE ACAD OF SCI +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
NINGBO INST OF MATERIALS TECH & ENG CHINESE ACAD OF SCI
Filing Date
2025-08-29
Publication Date
2026-07-31

AI Technical Summary

Technical Problem

Existing in-situ detection technologies cannot simultaneously meet the requirements of in-situ Raman spectroscopy and in-situ DIC testing under the high pressure environment of the deep sea, resulting in high detection costs and low efficiency.

Method used

A device for simulating in-situ monitoring of high-pressure stress in the deep sea is designed. First and second mounting holes are set on the side of the autoclave body, and first and second optical mirrors are installed in the holes respectively. Combined with Raman mounting body and detection equipment, in-situ Raman and in-situ DIC testing can be realized simultaneously.

Benefits of technology

Without requiring a separate autoclave, it improves detection efficiency, meets the testing requirements of in-situ Raman spectroscopy and in-situ DIC, and enhances detection accuracy and efficiency.

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Abstract

This invention relates to the field of deep-sea high-pressure corrosion detection technology, and provides a device for simulating in-situ monitoring of deep-sea high-pressure stress. A first mounting hole and a second mounting hole are provided on the side of the vessel body. A first optical mirror is sealed at one end of the first mounting hole, and a Raman spectroscopy mount with a second optical mirror is placed in the second mounting hole. Since both the first and second optical mirrors face the test platform, and the second optical mirror extends into the interior of the vessel body, it can approach the sample on the test platform. Therefore, during in-situ DIC testing, an image lens can be inserted into the first mounting hole, and the sample on the test platform can be detected using the first optical mirror. During in-situ Raman testing, a Raman probe can be inserted into the first channel of the Raman mount, and the sample on the test platform can be detected using the second optical mirror. This design, while simultaneously satisfying in-situ Raman and in-situ DIC testing, eliminates the need for a separate high-pressure vessel or other equipment, greatly improving detection efficiency.
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Description

Technical Field

[0001] This utility model belongs to the field of deep-sea high-pressure corrosion detection technology, and in particular relates to an in-situ monitoring device for simulating deep-sea high-pressure stress. Background Technology

[0002] In-situ testing technology is becoming increasingly widely used, but the technology for simulating the high-pressure environment of the deep sea is still in its early stages. Most existing in-situ testing technologies are limited to ambient temperature and pressure or low-pressure environments, presenting technical bottlenecks for in-situ testing under the high pressure of the deep sea. The extreme conditions of the deep-sea environment, such as high pressure, low temperature, and darkness, place extremely high demands on the material selection, structural design, and performance stability of in-situ testing equipment.

[0003] For in-situ detection under high-pressure environments in the deep sea, in-situ Raman spectroscopy and in-situ DIC (Digital Image Correlation) are commonly used. In-situ Raman spectroscopy is an analytical instrument that incorporates an in-situ reaction system, enabling micron-level micro-area detection of samples. In-situ DIC (Digital Image Correlation) is a technology that combines experimental loading environment with optical measurement methods to acquire real-time, dynamic, and non-contact full-field displacement and strain distribution during the deformation of materials or structures under stress.

[0004] However, traditional in-situ detection devices in the deep-sea high-pressure environment cannot meet the requirements for simultaneous in-situ Raman and in-situ DIC testing, requiring a separate high-pressure autoclave, resulting in high testing costs and low testing efficiency. Utility Model Content

[0005] Based on the above background, the purpose of this utility model is to provide an in-situ monitoring device for simulating deep-sea high-pressure stress, which can simultaneously meet the requirements of in-situ Raman and in-situ DIC testing, thereby improving detection efficiency.

[0006] To achieve the above objectives, the present invention adopts the following technical solution:

[0007] A simulated deep-sea high-pressure stress in-situ monitoring device includes: a high-pressure vessel, comprising a vessel body, a cover, and a testing platform; one end of the vessel body is open, the cover is placed over the opening, and the testing platform is disposed within the vessel body for placing a sample; the side of the vessel body has a first mounting hole and a second mounting hole, the ends of the first mounting hole and the second mounting hole respectively facing the sample on the testing platform; a first optical mirror, covering the end of the first mounting hole facing the testing platform; a Raman mount, one end of which is encapsulated with a second optical mirror, and the Raman mount has a first channel leading to the second optical mirror; the Raman mount passes through the second mounting hole, and the second optical mirror on the Raman mount extends into the interior of the vessel body, the second optical mirror facing the testing platform; and a detection device, comprising a Raman probe and an image lens, the image lens passing through the first mounting hole and the Raman probe passing through the first channel.

[0008] Furthermore, the Raman mount includes a housing and an end cap, the first channel penetrates the housing, the end cap is disposed at one end of the housing, the second optical mirror is disposed between the housing and the end cap, and the end cap has an outlet communicating with the second optical mirror, and the housing passes through the second mounting hole.

[0009] Furthermore, it also includes a first sleeve, which is located at the end of the second mounting hole away from the test platform, and the housing is connected to the first sleeve.

[0010] Furthermore, it also includes an abutment body, which is provided with a second channel. The abutment body passes through the first mounting hole and abuts against the first optical mirror, while the image lens passes through the second channel.

[0011] Furthermore, it also includes a second sleeve, which is located at the end of the first mounting hole away from the test platform, and the abutment body is connected to the second sleeve.

[0012] Furthermore, there are two first mounting holes, which are located on opposite sides of the second mounting hole, and one end of each first mounting hole is sealed with the first optical mirror.

[0013] Furthermore, it also includes a detection stage, a first guide rail, a second guide rail, a first fixed base, and a second fixed base. The first guide rail and the second guide rail are disposed on the detection stage and their length directions intersect. The first fixed base is slidably disposed on the first guide rail, and the second fixed base is slidably disposed on the second guide rail. The image lens is disposed on the first fixed base, and the Raman probe is disposed on the second fixed base.

[0014] Furthermore, the first fixing base includes a fixing plate and an extension plate. The fixing plate is slidably disposed on the first guide rail, and the extension plate is disposed on the fixing plate and extends along the length direction of the first guide rail and toward one side of the second guide rail. The image lens is disposed on the extension plate.

[0015] Furthermore, the extension plate includes a bottom edge and a side edge, the bottom edge is disposed on the fixed plate, the side edge is perpendicularly connected to the bottom edge, and the image lens is disposed on the side edge.

[0016] This utility model has the following beneficial effects:

[0017] (1) A first mounting hole and a second mounting hole are provided on the side of the vessel body. A first optical mirror is sealed at one end of the first mounting hole, and a Raman mount with a second optical mirror is placed in the second mounting hole. Since both the first and second optical mirrors face the test platform, and the second optical mirror extends into the interior of the vessel body and can approach the sample on the test platform, during in-situ DIC testing, the image lens can be inserted into the first mounting hole, and the sample on the test platform can be detected using the first optical mirror. During in-situ Raman testing, the Raman probe can be inserted into the first channel of the Raman mount, and the sample on the test platform can be detected using the second optical mirror. This design, while simultaneously satisfying in-situ Raman and in-situ DIC testing, eliminates the need for separate high-pressure vessel and other equipment, greatly improving testing efficiency.

[0018] (2) The Raman mount is designed as a housing and an end cap. The end cap is set on the housing, so that the second optical mirror is stably fixed between the housing and the end cap. This ensures that the second optical mirror is stably sealed at one end of the second mounting hole, which facilitates in-situ Raman detection of the sample on the test platform and improves the detection accuracy.

[0019] (3) Introducing a contact body allows the first optical mirror to be stably fixed at one end of the first mounting hole, ensuring that the first optical mirror is stably sealed at one end of the first mounting hole, which facilitates in-situ DIC detection of the sample on the test platform and improves detection accuracy.

[0020] (4) Introduce the detection stage, the first guide rail and the second guide rail, and set the first guide rail and the second guide rail to intersect. After the in-situ DIC test is completed, the first fixing seat can be removed so that the image lens can be moved away from the first mounting hole. Then, move the second fixing seat so that the Raman probe is close to the vessel body and insert the Raman probe into the first channel so that the Raman probe approaches the sample through the second optical mirror to meet the requirements of effective and accurate Raman testing. Attached Figure Description

[0021] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0022] Figure 1 This is a schematic diagram of the in-situ monitoring device described in one embodiment;

[0023] Figure 2 This is a schematic diagram of the structure of the autoclave described in one embodiment. Figure 1 ;

[0024] Figure 3 This is a schematic diagram of the structure of the autoclave described in one embodiment. Figure 2 ;

[0025] Figure 4 for Figure 3 A cross-sectional view of the structure along the AA direction;

[0026] Figure 5 This is a schematic diagram of the structure of the autoclave described in one embodiment. Figure 3 ;

[0027] Figure 6 for Figure 5 A cross-sectional view of the structure along the BB direction;

[0028] Figure 7 This is a schematic diagram of the structure of the testing station and testing equipment described in one embodiment. Figure 1 ;

[0029] Figure 8 This is a schematic diagram of the structure of the testing station and testing equipment described in one embodiment. Figure 2 .

[0030] Explanation of icon numbers:

[0031] 10. High-pressure autoclave; 11. Autoclave body; 111. Opening; 112. First mounting hole; 113. Second mounting hole; 12. Cover; 13. Test platform; 14. First sleeve; 15. Second sleeve; 20. First optical mirror; 30. Raman mount; 31. Second optical mirror; 32. First channel; 33. Shell; 34. End cap; 341. Outlet; 40. Abutment; 41. Second channel; 50. Detection stage; 51. First guide rail; 52. Second guide rail; 53. First fixing seat; 531. Fixing plate; 532. Extension plate; 533. Bottom edge; 534. Side edge; 54. Second fixing seat; 60. Image lens; 61. Raman probe; 70. Sample.

[0032] The realization of the purpose, functional features and advantages of this utility model will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0033] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0034] It should be noted that all directional indicators (such as up, down, left, right, front, back, etc.) in this utility model embodiment are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicator will also change accordingly.

[0035] Furthermore, in this utility model, descriptions involving "first," "second," etc., are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. Additionally, the technical solutions of the various embodiments can be combined with each other, but only on the basis of being achievable by those skilled in the art. When the combination of technical solutions is contradictory or impossible to implement, such a combination of technical solutions should be considered non-existent and not within the scope of protection claimed by this utility model.

[0036] In one embodiment, please refer to Figures 1 to 8This application provides a device for simulating in-situ monitoring of high-pressure stress in the deep sea, comprising: a high-pressure vessel 10, including a vessel body 11, a cover 12, and a test platform 13; one end of the vessel body 11 is an opening 111, the cover 12 is placed over the opening 111, and the test platform 13 is disposed inside the vessel body 11 for placing a sample 70; the side of the vessel body 11 is provided with a first mounting hole 112 and a second mounting hole 113, the ends of the first mounting hole 112 and the second mounting hole 113 respectively facing the sample 70 on the test platform 13; and a first optical mirror 20, which covers the first mounting hole 112. 12 faces one end of the test platform 13; Raman mount 30, one end of which is encapsulated with a second optical mirror 31, and the Raman mount 30 has a first channel 32 leading to the second optical mirror 31. The Raman mount 30 passes through the second mounting hole 113, and the second optical mirror 31 on the Raman mount 30 extends into the interior of the vessel body 11, with the second optical mirror 31 facing the test platform 13; detection equipment, including a Raman probe 61 and an image lens 60, the image lens 60 passing through the first mounting hole 112, and the Raman probe 61 passing through the first channel 32.

[0037] The aforementioned in-situ monitoring device for simulating deep-sea high-pressure stress has a first mounting hole 112 and a second mounting hole 113 on the side of the vessel body 11. A first optical mirror 20 is sealed at one end of the first mounting hole 112, and a Raman mount 30 with a second optical mirror 31 is installed in the second mounting hole 113. Since both the first optical mirror 20 and the second optical mirror 31 face the test platform 13, and the second optical mirror 31 extends into the interior of the vessel body 11 and can approach the sample 70 on the test platform 13, during in-situ DIC testing, an image lens 60 can be inserted into the first mounting hole 112, and the sample 70 on the test platform 13 can be detected using the first optical mirror 20. During in-situ Raman testing, a Raman probe 61 can be inserted into the first channel 32 of the Raman mount 30, and the sample 70 on the test platform 13 can be detected using the second optical mirror 31. This design, while simultaneously satisfying in-situ Raman and in-situ DIC testing, eliminates the need for separate high-pressure reactors and other equipment, greatly improving testing efficiency.

[0038] It should be explained that in-situ Raman testing refers to an analytical instrument that incorporates an in-situ reaction system, capable of performing micro-area detection on sample 70 at the micrometer level. Since in-situ Raman testing requires a distance of 1mm to 2mm from the sample 70, one end of the Raman mount 30 with the second optical mirror 31 extends into the vessel body 11, bringing the second optical mirror 31 close to the sample 70 on the test platform 13, thus meeting the requirements of in-situ Raman testing.

[0039] Meanwhile, in-situ Raman spectroscopy and in-situ DIC (Digital Image Correlation) are technical systems that combine experimental loading environments with optical measurement methods to acquire full-field displacement and strain distribution in real time, dynamically, and non-contactly during the deformation of materials or structures under stress. Since the testing principles of in-situ Raman spectroscopy and in-situ DIC are not the focus of this embodiment, they will not be described in detail here.

[0040] Furthermore, the first optical mirror 20 can be fixed in the first mounting hole 112 in various ways, such as, but not limited to, snap-fit ​​and adhesive bonding. Similarly, the Raman mount 30 can also be fixed in the second mounting hole 113 in various ways, such as, but not limited to, snap-fit, threaded connection, and welding. Both the first optical mirror 20 and the second optical mirror 31 can be made of sapphire.

[0041] Further, please refer to Figure 2 and Figure 4 The Raman mount 30 includes a housing 33 and an end cap 34. A first channel 32 passes through the housing 33, and the end cap 34 is located at one end of the housing 33. A second optical mirror 31 is located between the housing 33 and the end cap 34, and the end cap 34 has an outlet 341 communicating with the second optical mirror 31. The housing 33 is inserted into the second mounting hole 113. It can be seen that by designing the Raman mount 30 as a housing 33 and an end cap 34, the end cap 34 is mounted on the housing 33, ensuring that the second optical mirror 31 is stably fixed between the housing 33 and the end cap 34. This guarantees that the second optical mirror 31 is stably sealed at one end of the second mounting hole 113, facilitating in-situ Raman detection of the sample 70 on the test platform 13 and improving detection accuracy.

[0042] It should be explained that the connection between the end cap 34 and the housing 33 can be, but is not limited to, snap-fit, threaded connection, etc.

[0043] In one embodiment, please refer to Figure 4 and Figure 6 It also includes a first sleeve 14, which is located at the end of the second mounting hole 113 away from the test platform 13, and the housing 33 is connected to the first sleeve 14. It can be seen that the first sleeve 14 makes the Raman mount 30 stably fixed in the second mounting hole 113.

[0044] The first sleeve 14 and the vessel body 11 can be an integrated structure, or they can be connected to the vessel body 11 by means of bolts, snap-fit, welding, etc.

[0045] In one embodiment, please refer to Figure 6It also includes an abutment body 40, which has a second channel 41 extending through it. The abutment body 40 passes through the first mounting hole 112 and abuts against the first optical mirror 20. The image lens 60 passes through the second channel 41. It can be seen that the introduction of the abutment body 40 ensures that the first optical mirror 20 is stably fixed at one end of the first mounting hole 112, guaranteeing a stable seal at that end. This facilitates in-situ DIC detection of the sample 70 on the test platform 13, improving detection accuracy.

[0046] In one embodiment, please refer to Figure 6 It also includes a second sleeve 15, which is located at the end of the first mounting hole 112 away from the test platform 13, and the abutment body 40 is connected to the second sleeve 15.

[0047] The second sleeve 15 and the vessel body 11 can be an integrated structure, or they can be connected to the vessel body 11 by means of bolts, snap-fit, welding, etc.

[0048] In one embodiment, please refer to Figure 2 There are two first mounting holes 112, which are located on opposite sides of the second mounting hole 113, and one end of each first mounting hole 112 is sealed with a first optical mirror 20. At this time, there are also two image lenses 60, which are configured one-to-one with the first mounting holes 112.

[0049] In one embodiment, please refer to Figure 7 and Figure 8 The system also includes a detection stage 50, a first guide rail 51, a second guide rail 52, a first fixing seat 53, and a second fixing seat 54. The first guide rail 51 and the second guide rail 52 are located on the detection stage 50, and their length directions intersect. The first fixing seat 53 is slidably located on the first guide rail 51, and the second fixing seat 54 is slidably located on the second guide rail 52. The image lens 60 is located on the first fixing seat 53, and the Raman probe 61 is located on the second fixing seat 54. It can be seen that by introducing the detection stage 50, the first guide rail 51, and the second guide rail 52, with the first guide rail 51 and the second guide rail 52 intersecting, after the in-situ DIC test is completed, the first fixing seat 53 can be removed, allowing the image lens 60 to move away from the first mounting hole 112. Then, the second fixing seat 54 is moved, bringing the Raman probe 61 closer to the vessel body 11 and inserting the Raman probe 61 into the first channel 32, so that the Raman probe 61 approaches the sample 70 through the second optical mirror 31, thereby achieving effective and accurate Raman testing.

[0050] It should be explained that the number of first guide rails 51 and second guide rails 52 can be one or more. When there are multiple first guide rails 51 and second guide rails 52, all first guide rails 51 are arranged side by side with gaps, and all second guide rails 52 are arranged side by side with gaps.

[0051] Meanwhile, the first fixed seat 53 and the second fixed seat 54 can be moved manually or automatically, for example, by using a cylinder, hydraulic cylinder, electric cylinder, etc. to drive the first fixed seat 53 or the second fixed seat 54 to move.

[0052] In one embodiment, please refer to Figure 7 and Figure 8 The first fixed base 53 includes a fixed plate 531 and an extension plate 532. The fixed plate 531 is slidably disposed on the first guide rail 51, and the extension plate 532 is disposed on the fixed plate 531 and extends along the length of the first guide rail 51 and toward the side of the second guide rail 52. The image lens 60 is disposed on the extension plate 532.

[0053] In one embodiment, please refer to Figure 7 and Figure 8 The extension plate 532 includes a bottom edge 533 and a side edge 534. The bottom edge 533 is disposed on the fixing plate 531, and the side edge 534 is vertically connected to the bottom edge 533. The image lens 60 is disposed on the side edge 534. It can be seen that the image lens 60 on the side edge 534 is inserted into the first mounting hole 112.

[0054] Among them, the bottom edge 533 and the side edge 534 are integrated structures, for example, the bottom edge 533 and the side edge 534 are formed as one piece by bending process.

[0055] Of course, the above description is not intended to limit the present utility model, and the present utility model is not limited to the examples given above. Any changes, modifications, additions or substitutions made by those skilled in the art within the scope of the present utility model should also fall within the protection scope of the present utility model.

Claims

1. A device for simulating in-situ monitoring of high-pressure stress in the deep sea, characterized in that, include: An autoclave (10) includes a vessel body (11), a cover (12), and a testing platform (13). One end of the vessel body (11) is an opening (111), and the cover (12) is placed over the opening (111). The testing platform (13) is located inside the vessel body (11) and is used to place a sample (70). The side of the vessel body (11) is provided with a first mounting hole (112) and a second mounting hole (113). The ends of the first mounting hole (112) and the second mounting hole (113) are respectively facing the sample (70) on the testing platform (13). The first optical mirror (20) covers the end of the first mounting hole (112) facing the test platform (13); A Raman mount (30) is provided with a second optical mirror (31) encapsulated at one end, and a first channel (32) leading to the second optical mirror (31) is provided inside the Raman mount (30). The Raman mount (30) is inserted into the second mounting hole (113), and the second optical mirror (31) on the Raman mount (30) extends into the interior of the vessel body (11). The second optical mirror (31) faces the test platform (13). The detection device includes a Raman probe (61) and an image lens (60), wherein the image lens (60) is inserted into the first mounting hole (112) and the Raman probe (61) is inserted into the first channel (32).

2. The in-situ monitoring device for simulating high pressure stress of deep sea according to claim 1, characterized in that, The Raman mount (30) includes a housing (33) and an end cap (34). The first channel (32) passes through the housing (33). The end cap (34) is located at one end of the housing (33). The second optical mirror (31) is located between the housing (33) and the end cap (34). The end cap (34) has an outlet (341) that communicates with the second optical mirror (31). The housing (33) passes through the second mounting hole (113).

3. The in-situ monitoring device of claim 2, wherein, It also includes a first sleeve (14), which is located at the end of the second mounting hole (113) away from the test platform (13), and the housing (33) is connected to the first sleeve (14).

4. The in-situ monitoring device of claim 1, wherein, It also includes an abutment (40), which is provided with a second channel (41). The abutment (40) passes through the first mounting hole (112) and abuts against the first optical mirror (20). The image lens (60) passes through the second channel (41).

5. The in-situ monitoring device for simulating high pressure stress of deep sea according to claim 4, characterized in that, It also includes a second sleeve (15), which is located at the end of the first mounting hole (112) away from the test platform (13), and the abutment (40) is connected to the second sleeve (15).

6. The in-situ monitoring device of claim 1, wherein, There are two first mounting holes (112), and the two first mounting holes (112) are located on opposite sides of the second mounting hole (113), and one end of each first mounting hole (112) is sealed with the first optical mirror (20).

7. A simulated deep-sea high-pressure stress in-situ monitoring device according to any one of claims 1-6, characterized in that, It also includes a detection stage (50), a first guide rail (51), a second guide rail (52), a first fixing seat (53), and a second fixing seat (54). The first guide rail (51) and the second guide rail (52) are disposed on the detection stage (50) and their length directions intersect. The first fixing seat (53) is slidably disposed on the first guide rail (51), and the second fixing seat (54) is slidably disposed on the second guide rail (52). The image lens (60) is disposed on the first fixing seat (53), and the Raman probe (61) is disposed on the second fixing seat (54).

8. The in-situ monitoring device of claim 7, wherein the device is configured to be attached to a structure to be monitored. The first fixing base (53) includes a fixing plate (531) and an extension plate (532). The fixing plate (531) is slidably disposed on the first guide rail (51). The extension plate (532) is disposed on the fixing plate (531) and extends along the length direction of the first guide rail (51) and toward one side of the second guide rail (52). The image lens (60) is disposed on the extension plate (532).

9. The in-situ monitoring device for simulating high pressure stress of deep sea according to claim 8, characterized in that, The extension plate (532) includes a bottom edge (533) and a side edge (534). The bottom edge (533) is disposed on the fixed plate (531), and the side edge (534) is vertically connected to the bottom edge (533). The image lens (60) is disposed on the side edge (534).