An imaging mechanism for detecting uneven acid etching on the surface of G5 liquid crystal glass

Abstract

This utility model relates to the field of glass inspection technology, proposing an imaging mechanism for detecting uneven acid etching on the surface of G5 LCD glass. The system mainly consists of a hardware linear CCD, a prism, a high-brightness linear array light source, and a glass product. The high-brightness linear array light source is installed at a high angle, with the light rays incident on the surface of the glass product at an acute angle, enhancing the uniformity and brightness of the reflected light. The prism is placed between the glass product and the hardware linear CCD, and the secondary reflection increases the working distance of the CCD and expands the imaging field of view. The hardware linear CCD captures the faint mottled image after the secondary reflection, and combines it with a deep learning algorithm to identify defects. The glass product is transported to the inspection position by rollers, and the system synchronously triggers the light source and CCD to capture images. A high-precision encoder controls the triggering to ensure clear imaging. This mechanism adopts folded space technology, achieving full coverage inspection of large-format glass within a limited space. It has high inspection efficiency, good accuracy, and strong reliability, providing an efficient online quality inspection solution for LCD glass production.

Description

Technical Field

[0001] This utility model relates to the field of glass inspection technology, specifically to an imaging mechanism for detecting uneven acid etching on the surface of G5 liquid crystal glass. Background Technology

[0002] Liquid crystal display (LCD) glass is a widely used material in the display panel industry. Acid etching technology is extensively used in the production of LCD glass. Acid etching alters the surface appearance and optical and chemical properties of the glass. Uneven etching can lead to substandard glass quality, affecting the reliability of the final LCD panel. Therefore, the mechanism for detecting acid etching defects is a crucial component of production. Current inspection processes rely on manual visual inspection under high-brightness light sources, which suffers from drawbacks such as long inspection times for large products, fatigue under high-brightness light, and the potential for missed defects due to weak defect boundaries.

[0003] This patent utilizes high-precision optical imaging equipment within a limited space to perform line scanning imaging and inspection on large-format G5 LCD glass, enabling online detection of uneven acid etching defects on the product surface. Utility Model Content

[0004] The purpose of this invention is to propose an imaging mechanism for detecting uneven acid etching on the surface of G5 liquid crystal glass, which solves the problems in the existing technology such as long inspection time for large-sized liquid crystal glass, easy fatigue of human visual inspection under high-brightness light source, and easy omission of defect edges due to weak demarcation.

[0005] The technical solution of this utility model is as follows: an imaging mechanism for detecting uneven acid etching on the surface of G5 liquid crystal glass, comprising: a hardware linear CCD, a prism, a high-brightness linear light source, and the glass product to be tested. The high-brightness linear array light source is installed at a high angle, and the high-brightness light emitted by it is incident on the surface of the glass product at a high angle, making the light reflected from the surface of the glass product more uniform and bright. The prism is positioned between the glass product and the hardware linear CCD to perform secondary reflection of the light reflected from the surface of the glass product, thereby increasing the working distance of the hardware linear CCD and expanding the imaging field of view. The hardware linear CCD captures light reflected from the surface of the glass product and then reflected twice by the prism to form a faint cloud-like image on the surface of the glass product, which is used to detect uneven acid etching defects. After the glass product is moved to the designated inspection position by the roller, the high-brightness linear array light source is activated and the hardware linear array CCD is activated simultaneously to capture images. The row triggering of the hardware linear array CCD is controlled by a high-precision encoder to achieve high-definition imaging and detection.

[0006] Preferably, the high-brightness linear array light source is installed at a high angle so that the angle between the incident light and the surface of the glass product is acute, thereby enhancing the uniformity and brightness of the surface reflected light.

[0007] Preferably, the prism compresses the mutual distance between the hardware linear CCD, the glass product, and the high-brightness linear light source through secondary reflection, while expanding the imaging field of the hardware linear CCD to cover large-format glass.

[0008] Preferably, the hardware linear CCD is a high-precision linear CCD, used to capture weak cloud-like reflected light and generate imaging signals.

[0009] Preferably, the glass product is G5 size liquid crystal glass, whose surface may have uneven defects after acid etching treatment.

[0010] Preferably, the scan lines of the high-brightness linear array light source, the glass product, the prism, and the hardware linear array CCD are parallel to each other to ensure the stability of the light reflection path.

[0011] Preferably, the imaging mechanism uses folded space technology to achieve line scanning imaging and detection of large-format glass within a limited space.

[0012] Preferably, the imaging mechanism is applied to online inspection scenarios. Through the high-angle incident light from the high-brightness linear array light source, the secondary reflection from the prism, and the high-precision imaging from the hardware linear array CCD, stable, reliable, and rapid detection of uneven acid etching defects is achieved, with fast detection speed and stable time consumption.

[0013] The present invention adopts the above technical solution and has the following beneficial effects compared with the prior art: The imaging mechanism for detecting uneven acid etching on the surface of G5 LCD glass, as described in this patent, offers the following significant advantages: First, the automated detection scheme, employing a hardware linear CCD array combined with a high-brightness linear light source, significantly improves detection efficiency and enables real-time quality monitoring during the production process. Second, the high-angle incident light source design and prism secondary reflection technology significantly enhance detection accuracy and reliability, enabling accurate identification of various uneven acid etching defects. Third, the innovative optical system design achieves full coverage detection of large-format glass within a limited space, resulting in a more compact equipment structure. Fourth, the intelligent detection system possesses self-learning and adaptive capabilities, enabling it to cope with process changes in different production batches. Fifth, automated detection significantly reduces production costs and manpower requirements while improving the working environment on the production floor. Finally, this technical solution exhibits excellent scalability and compatibility, adapting to the detection needs of LCD glass of different sizes, providing the display panel industry with an efficient and reliable quality control solution. The overall technical solution demonstrates outstanding advantages in terms of detection efficiency, accuracy, reliability, and cost-effectiveness. Attached Figure Description

[0014] The present invention will now be described in further detail with reference to the accompanying drawings and specific embodiments.

[0015] Figure 1 This is a schematic diagram of the overall device of this utility model; In the image: 1. Hardware linear CCD; 2. Prism; 3. High-brightness linear light source; 4. Glass product. Detailed Implementation

[0016] The technical solutions of this utility model will be clearly and completely described below with reference to the embodiments of this utility model. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this utility model.

[0017] For implementation details, please refer to [link / reference]. Figure 1 An imaging mechanism for detecting uneven acid etching on the surface of G5 liquid crystal glass includes: a hardware linear CCD 1, a prism 2, a high-brightness linear light source 3, and the glass product to be tested 4. The high-brightness linear array light source 3 is installed at a high angle, and the high-brightness light emitted by it is incident on the surface of the glass product 4 at a high angle, making the light reflected from the surface of the glass product 4 more uniform and bright. Prism 2 is positioned between glass product 4 and hardware linear array CCD 1 to perform secondary reflection of light reflected from the surface of glass product 4, thereby increasing the working distance of hardware linear array CCD 1 and expanding the imaging field of view. The hardware linear CCD1 captures light reflected from the surface of the glass product 4 and then reflected twice by the prism 2 to form a faint cloud-like image on the surface of the glass product 4, which is used to detect uneven acid etching defects. After the glass product 4 is moved to the designated inspection position by the roller, the high-brightness linear array light source 3 is activated and the hardware linear array CCD 1 is triggered to capture images simultaneously. The row triggering of the hardware linear array CCD 1 is controlled by a high-precision encoder to achieve high-definition imaging and inspection.

[0018] The high-angle installation of the high-brightness linear array light source 3 makes the angle between the incident light and the surface of the glass product 4 acute, thereby enhancing the uniformity and brightness of the surface reflected light.

[0019] Prism 2 compresses the mutual distance between the hardware linear array CCD 1, the glass product 4, and the high-brightness linear array light source 3 through secondary reflection, while expanding the imaging field of the hardware linear array CCD 1 to cover large-format glass.

[0020] The hardware linear CCD1 is a high-precision linear CCD used to capture weak, cloud-like reflected light and generate imaging signals.

[0021] Glass product 4 is a G5 size LCD glass, and its surface may have uneven defects after acid etching treatment.

[0022] The scanning lines of the high-brightness linear array light source 3, glass product 4, prism 2, and hardware linear array CCD 1 are parallel to each other to ensure the stability of the light reflection path.

[0023] The imaging mechanism uses folded space technology to achieve line scanning imaging and detection of large-format glass within a limited space.

[0024] The imaging mechanism is applied in online inspection scenarios. Through the high-brightness linear array light source 3, the high-angle incident light, the secondary reflection of the prism 2, and the high-precision imaging of the hardware linear array CCD 1, it can achieve stable, reliable, and rapid detection of uneven acid etching defects. The detection speed is fast and the time consumption is stable.

[0025] Working principle: This patented imaging mechanism for detecting uneven etching on the surface of G5 LCD glass achieves high-efficiency detection based on advanced optical reflection principles and innovative spatial folding technology. Its core working principle is as follows: A high-brightness linear array light source 3 is installed at a specific high angle and emits high-intensity light. This light is incident at an acute angle onto the surface of the glass product 4 to be inspected. This unique light source arrangement significantly enhances the uniformity and brightness of the reflected light from the glass surface, while simultaneously creating a clear optical contrast between the unevenly etched areas and the normal areas. The light reflected from the glass surface then enters the precision prism 2 system for secondary reflection. This key design effectively increases the working distance of the hardware linear array CCD 1 and significantly expands the imaging field of view within a limited space. The system achieves full-area coverage of G5-sized glass. The hardware linear CCD1 precisely captures the faint, cloud-like imaging signal after secondary reflection. An optimized optical system and precise motion control mechanism, including a high-precision encoder-controlled roller transmission system and a synchronous triggering system, ensure clear and stable imaging. The acquired image data is analyzed using professional image processing algorithms and deep learning models, accurately identifying abnormal reflection areas caused by uneven acid etching on the glass surface. This enables rapid and reliable automated inspection. The entire process is completed in an online inspection scenario, with fast and stable inspection speeds. Compared to traditional manual inspection methods, it significantly improves efficiency, accuracy, and reliability.

[0026] The above are merely preferred embodiments of the present utility model and are not intended to limit the present utility model. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model shall be included within the protection scope of the present utility model.

Claims

1. A mechanism for detecting uneven imaging of surface etching of G5 liquid crystal glass, characterized in that, include: Hardware linear array CCD (1), prism (2), high-brightness linear array light source (3) and glass product to be tested (4); The high-brightness linear array light source (3) is installed at a high angle, and the high-brightness light emitted by it is incident on the surface of the glass product (4) at a high angle, making the light reflected from the surface of the glass product (4) more uniform and brighter; The prism (2) is disposed between the glass product (4) and the hardware linear CCD (1) to perform secondary reflection of the light reflected from the surface of the glass product (4) in order to increase the working distance of the hardware linear CCD (1) and expand the imaging field of view. The hardware linear CCD (1) captures light reflected from the surface of the glass product (4) and then reflected twice by the prism (2) to form a faint cloud-like image on the surface of the glass product (4), which is used to detect uneven acid etching defects. After the glass product (4) is driven to the designated inspection position by the roller, the high-brightness linear array light source (3) is triggered to start and the hardware linear array CCD (1) is triggered to capture images synchronously. The row triggering of the hardware linear array CCD (1) is controlled by the high-precision encoder to achieve high-definition imaging and detection. 2.The mechanism for detecting uneven imaging of acid etching on the surface of G5 liquid crystal glass according to claim 1, characterized in that, The high-brightness linear array light source (3) is installed at a high angle so that the angle between the incident light and the surface of the glass product (4) is acute, thereby enhancing the uniformity and brightness of the surface reflected light. 3.The mechanism for detecting uneven imaging of acid etching on the surface of G5 liquid crystal glass according to claim 2, characterized in that, The prism (2) compresses the mutual distance between the hardware linear CCD (1), the glass product (4) and the high-brightness linear light source (3) through secondary reflection, while expanding the imaging field of the hardware linear CCD (1) to cover large-format glass.

4. The imaging mechanism for detecting uneven etching on the surface of G5 liquid crystal glass according to claim 2, characterized in that, The hardware linear CCD (1) is a high-precision linear CCD used to capture weak cloud-like reflected light and generate imaging signals.

5. The imaging mechanism for detecting uneven etching on the surface of G5 liquid crystal glass according to claim 2, characterized in that, The glass product (4) is a G5 size liquid crystal glass, and its surface may have uneven defects after acid etching treatment.

6. The imaging mechanism for detecting uneven acid etching on the surface of G5 liquid crystal glass according to claim 1, characterized in that, The scanning lines of the high-brightness linear array light source (3), the glass product (4), the prism (2), and the hardware linear array CCD (1) are parallel to each other to ensure the stability of the light reflection path.

7. The imaging mechanism for detecting uneven acid etching on the surface of G5 liquid crystal glass according to claim 6, characterized in that, The imaging mechanism utilizes folded space technology to achieve line scanning imaging and detection of large-format glass within a limited space. 8.The mechanism for detecting uneven imaging of acid etching on the surface of G5 liquid crystal glass according to claim 1, characterized in that, The imaging mechanism is applied to online detection scenarios. Through the high-angle incident light from the high-brightness linear array light source (3), the secondary reflection from the prism (2), and the high-precision imaging from the hardware linear array CCD (1), it achieves stable, reliable, and rapid detection of uneven acid etching defects. The detection speed is fast and the time consumption is stable.

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