Electron microscope sample magnetic cleaning device

Abstract

This invention discloses a magnetic cleaning device for electron microscope samples. The device includes: a movable panel with a detachable clamping component at one end; a driving assembly including a first driving motor for driving the movable panel to slide; and a cleaning assembly including a magnetic suction component disposed in the middle of the movable panel and corresponding to the height of the clamping component. This invention uses the driving assembly to move the movable panel carrying the clamping component, allowing the sample fixed on the clamping component to pass through the cleaning assembly. This simulates the magnetic suction environment during electron microscope operation, pre-treating the sample. This not only removes weakly attached magnetic particles, preventing them from being sucked into the microscope during detection, but also pre-checks the stability of the clamping, thus ensuring a safe and stable electron microscope detection process and effectively preventing contamination.

Description

Technical Field

[0001] This utility model relates to the field of electron microscopy sample pretreatment technology, and in particular to a magnetic electron microscopy sample cleaning device. Background Technology

[0002] Electron microscopes, or electron microscopes for short, are often used for characterizing nanoparticles and metal microstructures due to their high spatial resolution. The magnification principle of an electron microscope involves manipulating an electron beam using an electromagnetic field, often creating a very strong magnetic field around the sample. If the sample is magnetic or easily magnetized, it may be attracted by the magnetic field from the sample stage or grid into the electron microscope. This can range from contaminating the microscope and affecting its performance to blocking the electron beam, rendering the microscope unusable. Because these magnetic particles are often very small and occur within a vacuum system, they are extremely difficult to repair or very expensive to repair. Therefore, many testing institutions refuse to accept magnetic material samples for electron microscope testing.

[0003] In testing institutions that accept magnetic samples, when observing magnetic powder samples using transmission electron microscopy, a double-layer mesh is usually used to clamp the powder sample inside, or to fix or encapsulate the powder in resin before observation with an electron microscope. However, the above methods still have the following problems: 1. The above methods increase the sample thickness, which will affect the electron microscopy observation effect; 2. The membrane of the double-layer mesh is easily damaged, and there is a possibility of powder escaping; 3. The resin embedding time is long and the steps are cumbersome.

[0004] In the existing technology, due to the uncertainties or defects of the above-mentioned processing solutions, the testers cannot determine in advance whether the adhesion of the powder sample after processing will damage the electron microscope, nor can they determine whether the bulk sample is firmly clamped. Therefore, the sample testing still has the possibility of adverse effects on the electron microscope.

[0005] Therefore, existing technologies still need to be improved and developed. Utility Model Content

[0006] To address the problem in existing technologies where, when researchers observe samples using an electron microscope, particles or debris on the sample are easily attracted by magnetism and contaminate the microscope, blocking the optical path of electrons and rendering the microscope unusable, this invention proposes a magnetic cleaning device for electron microscope samples. This device uses an electromagnet to simulate the strong magnetic field inside the electron microscope to pre-treat the electron microscope sample, removing particles that are easily attracted by the magnetic field, thus achieving the purpose of cleaning.

[0007] This utility model is achieved through the following technical solution:

[0008] A magnetic cleaning device for electron microscope samples, wherein the magnetic cleaning device for electron microscope samples comprises:

[0009] A movable panel, one end of which is provided with a detachable clamping component;

[0010] A driving component, the driving component including a first driving motor, the first driving motor being disposed corresponding to the other end of the movable panel, the first driving motor being used to drive the movable panel to slide;

[0011] A cleaning assembly, the cleaning assembly including a magnetic suction assembly, the magnetic suction assembly being disposed in the middle of the movable panel and corresponding to the height of the clamping member.

[0012] The aforementioned magnetic cleaning apparatus for electron microscope samples, wherein the magnetic cleaning apparatus for electron microscope samples comprises:

[0013] A substrate has a groove along a straight line on it. The movable panel is fitted and slidably disposed in the groove. The driving component is fixedly disposed on the substrate at the other end of the movable panel. The cleaning component is fixedly disposed on both sides of the substrate corresponding to the groove.

[0014] The aforementioned magnetic cleaning device for electron microscopy samples, wherein the magnetic suction component includes:

[0015] First electromagnetic component;

[0016] The second electromagnetic component is arranged mirror images of the first electromagnetic component at a predetermined distance from each other on both sides of the slide groove.

[0017] A second drive motor is provided on the movable panel at the position corresponding to the clamping member, and the second drive motor is used to drive the clamping member to rotate.

[0018] The electron microscope sample magnetic cleaning device is described above, wherein the second electromagnetic component has the same structure as the first electromagnetic component; the first electromagnetic component and the second electromagnetic component are respectively connected to the substrate via a fixed panel;

[0019] The fixed panel is parallel to the slide groove and fixedly connected to the substrate in a direction perpendicular to the substrate. A connecting shaft is provided on one side of the first electromagnetic component. The connecting shaft passes through the fixed panel and is slidably connected to the fixed panel. An adjusting component is provided on the fixed panel. The adjusting component is threadedly connected to the connecting shaft. The adjusting component is used to adjust the relative distance between the first electromagnetic component and the slide groove.

[0020] The aforementioned magnetic cleaning apparatus for electron microscopy samples, wherein the clamping member comprises:

[0021] A connecting rod, which is coaxially threadedly connected to the second drive motor;

[0022] A ring body, which is fixedly mounted on one end of the connecting rod;

[0023] A carrier net is fixedly disposed within the ring body and is used to carry powder samples.

[0024] The electron microscope sample magnetic cleaning device includes a spring sheet on one side of the carrier mesh. The spring sheet is integrally formed with the ring body and abuts against one side of the carrier mesh along a predetermined arc. The spring sheet is used to fix the solid sample.

[0025] In the aforementioned magnetic cleaning device for electron microscope samples, a plurality of locking teeth are continuously arranged on one side of the movable panel, and a drive gear is arranged on the drive shaft of the first drive motor, the drive gear being meshed and rotatably connected with the plurality of locking teeth.

[0026] The electron microscope sample magnetic cleaning device, wherein the driving component includes:

[0027] The mounting panel is perpendicular to the substrate and fixedly mounted on the substrate, and a mounting groove is provided on one side of the mounting panel;

[0028] An adjustment panel is slidably disposed along the mounting groove and is detachably and fixedly connected to the mounting panel. The first drive motor passes through and is fixedly disposed on the mounting panel.

[0029] A protective cover is attached to the adjustment panel, and the drive gear is enclosed within the protective cover.

[0030] The magnetic cleaning device for electron microscope samples, wherein anti-detachment grooves are respectively provided on the moving panel on opposite sides of the slide groove, and the anti-detachment grooves are continuously provided along the length direction of the moving panel;

[0031] A plurality of rollers are evenly arranged in the groove corresponding to the anti-detachment groove. The rollers protrude and are fitted and rotated in the anti-detachment groove.

[0032] The beneficial effects of this utility model are as follows: This utility model drives the moving panel to move the clamping component through the driving component, so that the sample fixed on the clamping component passes through the cleaning component to pre-treat the sample in a way that simulates the magnetic attraction environment during the operation of the electron microscope. This can not only remove weakly attached magnetic particles and prevent them from being sucked into the electron microscope during the detection process, but also pre-detect whether the clamping is stable, thereby ensuring the safety and stability of the electron microscope detection process and effectively avoiding contamination of the electron microscope. Attached Figure Description

[0033] Figure 1 This is a three-dimensional structural schematic diagram of the magnetic cleaning device for electron microscope samples of this utility model;

[0034] Figure 2 This is a structurally disassembled schematic diagram of the moving panel and drive assembly in the magnetic cleaning device for electron microscope samples of this utility model;

[0035] Figure 3 This is a three-dimensional structural diagram of the clamping component in the magnetic cleaning device for electron microscope samples of this utility model.

[0036] exist Figures 1 to 3 In the middle: 100, movable panel; 110, locking tooth; 111, anti-detachment groove; 120, second drive motor; 200, clamping component; 210, connecting rod; 220, ring body; 221, spring piece; 230, carrier net; 300, drive assembly; 310, first drive motor; 311, drive gear; 320, mounting panel; 330, adjustment panel; 340, protective cover; 400, cleaning assembly; 410, magnetic suction assembly; 411, first electromagnetic component; 412, second electromagnetic component; 420, fixing panel; 430, adjustment component; 500, base plate; 510, slide groove; 511, roller. Detailed Implementation

[0037] To make the objectives, technical solutions, and effects of this utility model clearer and more explicit, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this utility model and are not intended to limit this utility model.

[0038] It should be noted that if the embodiments of this utility model involve directional indicators (such as up, down, left, right, front, back, etc.), the directional indicators are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicators will also change accordingly.

[0039] Furthermore, if the embodiments of this utility model involve descriptions such as "first" or "second," these descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, features defined with "first" or "second" may explicitly or implicitly include at least one of those features. Additionally, the technical solutions of the various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. If the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed by this utility model.

[0040] In the existing technology, when researchers use electron microscopes to observe samples, they cannot determine in advance whether the sample is magnetic and the strength of the magnetic field. When the sample has a certain degree of magnetism or is easily magnetized, the particles or debris on the sample are easily attracted by the magnetism and contaminate the electron microscope, causing the electron microscope to be unusable due to the obstruction of the electron light path.

[0041] In view of the above-mentioned problems in the prior art, the present invention provides a magnetic cleaning device for electron microscope samples, such as... Figure 1 and Figure 2 As shown, the magnetic cleaning device for electron microscope samples includes: a movable panel 100, one end of which is provided with a detachable clamping member 200; a drive assembly 300, which includes a first drive motor 310, which is detachably disposed from the other end of the movable panel 100, and the first drive motor 310 is used to drive the movable panel 100 to slide; and a cleaning assembly 400, which includes a magnetic suction assembly 410, which is disposed on one side of the movable panel 100 and corresponds to the height of the clamping member 200.

[0042] This invention uses a driving component 300 to drive a moving panel 100 to move a clamping component 200, so that the sample fixed on the clamping component 200 is pre-treated by a cleaning component 400 in a manner that simulates the magnetic attraction environment during electron microscope operation. This not only removes weakly attached magnetic particles to prevent them from being sucked into the electron microscope during the detection process, but also allows for pre-testing of the clamping stability, thereby ensuring the safety and stability of the electron microscope detection process and effectively preventing contamination of the electron microscope.

[0043] In the above embodiments, such as Figure 1 and Figure 2As shown, the main body of the electron microscope sample magnetic cleaning device of this utility model consists of a movable panel 100, a driving assembly 300, and a cleaning assembly 400. The movable panel 100 is a plate-shaped component driven by the driving assembly 300. A clamping member 200 is provided at one end of the movable panel 100 to fix the sample. When the movable panel 100 is driven by the driving assembly 300, the clamping member 200 carries the sample and moves with the movable panel 100. In a specific configuration, the driving assembly 300 includes a first driving motor 310, which is correspondingly positioned at the other end of the movable panel 100. The first driving motor 310 drives the movable panel 100 to move, thus completing the aforementioned movement process. The cleaning assembly 400 is used to clean the sample. The sample undergoes magnetic cleaning. In this embodiment, the cleaning assembly 400 includes a magnetic suction assembly 410, which is disposed on one side of the movable panel 100 and corresponds to the height of the clamping member 200. When the movable panel 100 is driven to move, the clamping member 200 moves along with it and passes the position of the magnetic suction assembly 410. During the process, the sample corresponds to the magnetic suction assembly 410 at various angles. Magnetic or magnetizable substances contained in the sample are attracted by the magnetic suction assembly 410, thereby attracting magnetic or easily magnetizable particles and debris in the sample to the cleaning assembly 400. After multiple magnetic cleanings, the remaining substances in the sample can be kept stable and will not contaminate the electron microscope when it is inserted into the electron microscope for observation, thus ensuring the safety of the electron microscope.

[0044] In another possible embodiment of this utility model, in order to make the cooperation between the movable panel 100 and the driving component 300 more stable and smooth, such as Figure 1 and Figure 2 As shown, the above-mentioned magnetic cleaning device for electron microscope samples also includes a substrate 500. A groove 510 is provided on the upper side of the substrate 500 along a straight line. The shape of the groove 510 is adapted to the shape of the movable panel 100, so that the movable panel 100 can be installed in the groove 510 of the substrate 500 in a fitting manner during actual installation. The inside of the groove 510 is smoothly arranged, and the movable panel 100 can slide along the length direction of the groove 510. By providing the groove 510 on the substrate 500, the movement direction of the movable panel 100 can be limited on the one hand, and the relative positional relationship between the drive component 300 and the movable panel 100 can be guaranteed on the other hand, so as to avoid loosening during the movement.

[0045] In this embodiment, as Figure 1As shown, the clamping member 200 for fixing the sample is located on one end of the moving panel 100. In order to reduce the influence of the driving component 300 on the movement of the clamping member 200, in this embodiment, the driving component 300 is fixedly installed on the substrate 500 at the position corresponding to the other end of the moving panel 100. Thus, the moving panel 100 is moved by the driving component 300 through traction and pushing. At the same time, in this embodiment, the cleaning component 400 is fixedly installed on the side of the substrate 500 corresponding to the slide groove 510. The cleaning component 400 is preferably installed in the middle section of the length direction of the substrate 500, so that when the clamping member 200 on the moving panel 100 moves with the moving panel 100, the sample can correspond to the cleaning component 400 at multiple angles, thereby achieving the effect of attracting and testing magnetic particles and debris in the sample.

[0046] In the above embodiments, the magnetic suction component 410 is preferably set using an electromagnet structure. On the one hand, it is convenient to control the variables in the detection process, and on the other hand, it is convenient to control the strength of the magnetism to perform magnetic cleaning for different materials, which can effectively ensure the effect of magnetic cleaning.

[0047] More specifically, such as Figure 1 As shown, in this embodiment, the magnetic suction component 410 is specifically composed of a first electromagnetic component 411 and a second electromagnetic component 412. The first electromagnetic component 411 and the second electromagnetic component 412 have the same structure and are respectively arranged on both sides of the slide groove 510 at a predetermined distance. Thus, when the clamping component 200 passes through, the effect of magnetic cleaning on both sides of the clamping component 200 can be achieved. The first electromagnetic component 411 and the second electromagnetic component 412 are mirror images of the center line of the slide groove 510 and are controlled by the same circuit to ensure that the first electromagnetic component 411 and the second electromagnetic component 412 have the same adsorption effect on the sample. During the process of the clamping component 200 passing through the magnetic suction component 410, the effect of magnetic cleaning on both sides of the clamping component 200 at different angles can be achieved.

[0048] In another possible embodiment of this utility model, such as Figure 1As shown, to enable the first electromagnetic component 411 and the second electromagnetic component 412 to adjust their relative positions so that they can simulate the magnetic field conditions within an electron microscope under different electromagnetic intensities, in this embodiment, the first electromagnetic component 411 and the second electromagnetic component 412 are connected to the substrate 500 via a fixing panel 420. Since the first electromagnetic component 411 and the second electromagnetic component 412 are mirror images of each other, the fixing panels 420 corresponding to the first electromagnetic component 411 and the second electromagnetic component 412 have the same structure and are mirror images of each other. In the following embodiments, only the fixing structure of the first electromagnetic component 411 will be described in detail. Those skilled in the art can refer to the first electromagnetic component 411 to set the second electromagnetic component 412. The fixing panel 420 is parallel to the sliding groove 510 and fixedly connected to the substrate 500 along the direction perpendicular to the substrate 500. A connecting shaft is provided on one side of the first electromagnet, corresponding to... The fixed panel 420 is provided with a connecting hole for mounting a connecting shaft. The connecting shaft passes through the connecting hole to fix the first electromagnet. To facilitate the user's adjustment of the relative position between the first electromagnet and the fixed panel 420, an adjusting member 430 is also provided on the other side of the fixed panel 420 in this embodiment. The adjusting member 430 is specifically a handle structure and is attached with a cover fixedly connected to the fixed panel 420. The handle is rotatably mounted on the cover and is threadedly connected to the connecting shaft. When the user rotates the handle, the relative distance between the first electromagnet 411 and the fixed panel 420 can be adjusted through the threaded engagement. After adjusting the positions of the first electromagnet and the second electromagnet respectively, various magnetic field conditions can be simulated, thereby ensuring that the magnetically cleaned sample is in the same magnetic field condition in the electron microscope, thus avoiding contamination of the electron microscope by magnetic particles and debris in the sample.

[0049] Furthermore, such as Figure 1 As shown, a second drive motor 120 is also provided on the movable panel 100 at the position corresponding to the clamping member 200. The drive shaft of the second drive motor 120 is arranged in the vertical direction and is detachably connected to the clamping member 200. In actual use, when the user turns on the first electromagnetic component 411 and the second electromagnetic component 412, the second drive motor 120 is turned on synchronously when the movable panel 100 is driven by the movable component. The second drive motor 120 rotates by rotating itself, thereby driving the clamping member 200 to rotate. Thus, after the clamping member 200 enters the magnetic field range of the cleaning component 400, the rotation of the clamping member 200 further realizes the correspondence of the sample at various angles in the magnetic field. Another advantage of this setting is that it can make the magnetic substances in the sample accept the attraction of the first electromagnetic component 411 and the second electromagnetic component 412 with different magnetic poles, thereby verifying whether the sample is stable through different magnetic attraction conditions.

[0050] In the above embodiments, the clamping member is provided in various types for fixing powdery samples or solid samples respectively. The drive shaft of the second drive motor 120 is provided with a threaded structure to be adapted and installed with the threaded structure of the clamping member 200. In some embodiments, the existing electron microscope sample fixing structure can also be threaded to be adapted and installed on the drive shaft of the second drive motor 120 to achieve the same magnetic cleaning effect. For example, the handle of the existing double-networked rod can be provided with a threaded structure to hold the powder sample, and then perform magnetic cleaning and electron microscope observation. For another example, the handle of the in-situ TEM bit can be provided with a threaded structure to clamp the block sample, and then perform magnetic cleaning and electron microscope observation.

[0051] In one specific embodiment of this utility model, such as Figure 1 and Figure 3 As shown, this utility model also provides a clamping component to simplify the user's sample fixing operation. Specifically, the clamping component 200 consists of a connecting rod 210, a ring 220, and a carrier net 230. The connecting rod 210 is the component detachably connected to the drive shaft of the second drive motor 120. One end of the connecting rod 210 is provided with a threaded structure adapted to the drive shaft of the second drive motor 120. The ring 220 is fixedly disposed on the other end of the connecting rod 210. The carrier net 230 is fixedly disposed inside the ring 220. In actual installation, the carrier net 230 is a porous metal film with an ultrathin carbon film on the pores. The metal film supports the carbon film, and the carbon film supports ultra-small nanoparticles (i.e., powdered samples). Since the carbon film is relatively thin, it can affect the imaging as much as possible. In some other embodiments, the carrier net 230 can also be made of silicon nitride material.

[0052] In practical use, the powdered sample (nanoscale) can be dispersed in the solution first, and then the solution can be dropped onto the grid 230. After the solution dries, the sample can remain on the grid 230. Alternatively, the grid 230 can be inserted into the solution, and the sample can be scooped up and placed on the grid 230. After the solution dries, the sample can remain on the grid 230. The powdered sample held in the above manner can be fixed on the grid 230 in a flat and scattered state, which facilitates the observation of sample particles in the electron microscope. At the same time, when using the cleaning component 400 to magnetically clean the sample, magnetic or easily magnetized particles and debris can be completely removed, providing a certain safety protection for the subsequent electron microscope observation process.

[0053] Furthermore, the aforementioned clamping component provided by this utility model also has the effect of fixing solid samples, such as... Figure 3As shown, a spring sheet 221 is provided on one side of the aforementioned carrier net 230. The spring sheet 221 is made of elastic metal material and is integrally formed with the aforementioned ring body 220. The spring sheet 221 has a plate-like structure and abuts against one side of the carrier net 230 along a predetermined arc. In actual installation, multiple spring sheets 221 can be set to achieve a stable clamping effect. In this embodiment, the elastic clamping effect of the spring sheet 221 can achieve the clamping effect on the solid sample, thereby fixing the solid sample on the carrier net 230. Specifically, in this embodiment, for research objects with thick and large initial materials, it is necessary to first thin the sample before performing transmission electron microscopy characterization to meet the requirement of thickness less than 100 nanometers. Therefore, in the sample processing process, the solid sample can be formed into a thin sheet by mechanical cutting, grinding, polishing, and then ion grinding or direct ion cutting, so that the formed sheet-like solid sample can be fixed and clamped on the carrier net 230 by the spring sheet 221.

[0054] In this embodiment, although the physically processed sample forms a sheet structure, the processing process inevitably results in particles or debris on its surface. Therefore, after the solid sample is fixed on the carrier mesh 230 by the spring sheet 221, the sample is magnetically cleaned by the cleaning assembly 400, which can completely remove magnetic or easily magnetized particles and debris, providing a definite safety protection for the subsequent electron microscope observation process.

[0055] In another possible embodiment of this utility model, in order to achieve a stable fit between the aforementioned movable panel 100 and the drive assembly 300, such as Figure 1 and Figure 2 As shown, in this embodiment, based on the above-mentioned embedding of the movable panel 100 into the slide groove 510 of the substrate 500, a plurality of locking teeth 110 are continuously provided on one side of the movable panel 100. Correspondingly, a drive gear 311 is provided on the drive shaft of the first drive motor 310. The drive gear 311 meshes and rotates with the plurality of locking teeth 110. In actual use, the first drive motor 310 is a stepper motor, and its drive shaft speed, number of rotations, and reversal time can be preset. Through the mutual cooperation of the drive gear 311 and the locking teeth 110, when the drive shaft of the first drive motor 310 rotates, it forms a contact with the movable panel 100. Pushing or pulling the plate 100 allows the movable panel 100 to slide along the slide groove 510, thereby driving the clamping member 200 to move cyclically at the corresponding position of the cleaning component 400. During the process, the first electromagnetic component 411 and the second electromagnetic component 412 form a magnetic attraction effect on the sample, which allows the magnetic or easily magnetized materials on the sample surface to be attracted to the first electromagnetic component 411 and the second electromagnetic component 412. After repeated magnetic cleaning, the remaining magnetic or easily magnetized materials in the sample can be stably fixed on the carrier 230, and there will be no sample escaping or other problems when observing with an electron microscope, thus ensuring the safety of using the electron microscope.

[0056] Furthermore, to prevent the movable panel 100 from separating from the substrate 500 due to uneven force when driven by the first drive motor 310, in this embodiment, anti-detachment grooves 111 are respectively provided on opposite sides of the movable panel 100 corresponding to the slide groove 510. The anti-detachment grooves 111 are continuously provided along the length direction of the movable panel 100 and penetrate through both ends of the movable panel 100. Correspondingly, a plurality of rollers 511 are evenly provided inside the slide groove 510 at positions corresponding to the anti-detachment grooves 111. The plurality of rollers 511 protrude into the interior of the slide groove 510, and the protrusion size is the same as the depth of the anti-detachment groove 111. The dimensions are adapted so that when the movable panel 100 is installed in the slide 510, the roller 511 and the anti-detachment groove 111 can form a fitted and rotating contact structure. In actual use, the cooperation between the anti-detachment groove 111 and the roller 511 restricts the movement direction of the movable panel 100. On the one hand, it ensures that the movable panel 100 can only move along the length of the slide 510. On the other hand, it prevents the movable panel 100 from tipping over. It also reduces the friction force of the movable panel 100 relative to the slide 510 during the sliding process, thereby effectively ensuring the stability and smoothness of the movement of the movable panel 100, and thus ensuring the effect of magnetic cleaning of the sample.

[0057] Based on the above embodiments, in another possible embodiment of this utility model, such as Figure 1 and Figure 2 As shown, the aforementioned drive assembly 300 further includes a mounting panel 320, an adjustment panel 330, and a protective cover 340. The mounting panel 320 is disposed perpendicular to the substrate 500 and fixedly disposed on one end of the substrate 500. The mounting panel 320 is disposed parallel to the aforementioned slide groove 510. A mounting groove is provided on one side of the mounting panel 320 corresponding to the slide groove 510. The adjustment panel 330 is slidably mounted in the mounting groove and is detachably and fixedly connected to the mounting panel 320. That is, the user can independently adjust the relative position of the mounting panel 320 and the adjustment panel 330 to perform installation, debugging, disassembly, and other operations.

[0058] In this embodiment, the first drive motor 310 is through and fixedly mounted on the mounting panel 320. The adjustment function of the adjustment panel 330 can adjust the engagement relationship between the first drive motor 310 and the locking teeth 110 on the movable panel 100 to ensure smooth driving process. Correspondingly, a groove structure should be hollowed out on the mounting panel 320 at the position corresponding to the first drive motor 310 to avoid the first drive motor 310.

[0059] In addition, to prevent dust in the air and particles in the sample from contacting the drive gear 311 during use, which could affect the meshing of the drive gear 311 with the retaining teeth 110 on the moving panel 100, a protective cover 340 is used to cover and protect the drive gear 311 in this embodiment. The protective cover 340 is fastened to the adjustment panel 330 to form a fixed connection, which can effectively protect the stability of the engagement between the drive gear 311 and the retaining teeth 110 of the moving panel 100.

[0060] Based on the above embodiments, the actual usage process of the electron microscope sample magnetic cleaning device of this utility model is as follows:

[0061] First, the operator determines the sample processing method according to the sample type to be observed and characterized by electron microscopy, processes the sample into powder or solid flakes and fixes it on the clamp 200, and connects the clamp 200 to the drive shaft of the second drive motor 120 on the moving panel 100.

[0062] Then, the power is turned on, and the first electromagnetic component 411 and the second electromagnetic component 412 activate magnetic attraction. The first drive motor 310 in the drive assembly 300 drives the moving panel 100 to move. During this process, the clamp 200 carrying the sample is driven to rotate by the second drive motor 120 and follows the moving panel 100 through the position between the first electromagnetic component 411 and the second electromagnetic component 412. During this process, the sample passes through the magnetic field at multiple angles, which can remove magnetic or easily magnetized particles from samples that are not firmly fixed. Driven by the first drive motor 310, the moving panel 100 makes cyclical movements. After multiple magnetic cleanings, the sample can finally be confirmed to be stable. At this time, the sample, together with the clamp 200, can be directly placed into the electron microscope for observation. This avoids the sample being sucked into the electron microscope during the detection process and allows for pre-detection of whether the clamp is stable, thereby ensuring the safety and stability of the electron microscope detection process and effectively preventing contamination of the electron microscope.

[0063] In summary, this invention provides a magnetic cleaning device for electron microscope samples. The device includes: a movable panel with a detachable clamping component at one end; a driving assembly including a first driving motor for driving the movable panel to slide; and a cleaning assembly including a magnetic suction component disposed in the middle of the movable panel and corresponding to the height of the clamping component. This invention uses the driving assembly to move the movable panel carrying the clamping component, allowing the sample fixed on the clamping component to pass through the cleaning assembly. This simulates the magnetic suction environment during electron microscope operation, pre-treating the sample. This not only removes weakly attached magnetic particles, preventing them from being sucked into the microscope during detection, but also pre-checks the stability of the clamping, thus ensuring a safe and stable electron microscope detection process and effectively preventing contamination.

[0064] It should be understood that the application of this utility model is not limited to the examples above. Those skilled in the art can make improvements or modifications based on the above description, and all such improvements and modifications should fall within the protection scope of the appended claims.

Claims

1. An electron microscope sample magnetic cleaning device, characterized by, The electron microscope sample magnetic cleaning device includes: A movable panel, one end of which is provided with a detachable clamping component; A driving component, the driving component including a first driving motor, the first driving motor being disposed corresponding to the other end of the movable panel, the first driving motor being used to drive the movable panel to slide; A cleaning assembly, the cleaning assembly including a magnetic suction assembly, the magnetic suction assembly being disposed in the middle of the movable panel and corresponding to the height of the clamping member.

2. The magnetic cleaning device for electron microscopy samples according to claim 1, characterized in that The electron microscope sample magnetic cleaning device includes: A substrate has a groove along a straight line on it. The movable panel is fitted and slidably disposed in the groove. The driving component is fixedly disposed on the substrate at the other end of the movable panel. The cleaning component is fixedly disposed on both sides of the substrate corresponding to the groove.

3. The magnetic cleaning device for electron microscopy samples according to claim 2, characterized in that The magnetic attraction component includes: First electromagnetic component; The second electromagnetic component is arranged mirror images of the first electromagnetic component at a predetermined distance from each other on both sides of the slide groove. A second drive motor is provided on the movable panel at the position corresponding to the clamping member, and the second drive motor is used to drive the clamping member to rotate.

4. The magnetic cleaning device for electron microscopy samples according to claim 3, characterized in that The second electromagnetic component has the same structure as the first electromagnetic component; the first electromagnetic component and the second electromagnetic component are respectively connected to the substrate via fixed panels; The fixed panel is parallel to the slide groove and fixedly connected to the substrate in a direction perpendicular to the substrate. A connecting shaft is provided on one side of the first electromagnetic component. The connecting shaft passes through the fixed panel and is slidably connected to the fixed panel. An adjusting component is provided on the fixed panel. The adjusting component is threadedly connected to the connecting shaft. The adjusting component is used to adjust the relative distance between the first electromagnetic component and the slide groove.

5. The magnetic cleaning device for electron microscopy samples according to claim 3, characterized in that The clamping element includes: A connecting rod, which is coaxially threadedly connected to the second drive motor; A ring body, which is fixedly mounted on one end of the connecting rod; A carrier net is fixedly disposed within the ring body and is used to carry powder samples.

6. The magnetic cleaning device for electron microscopy samples according to claim 5, characterized in that A spring sheet is provided on one side of the carrier net. The spring sheet is integrally formed with the ring body. The spring sheet abuts against one side of the carrier net along a predetermined arc. The spring sheet is used to fix the solid sample.

7. The magnetic cleaning device for electron microscopy samples according to claim 2, characterized in that A plurality of locking teeth are continuously provided on one side of the movable panel, and a drive gear is provided on the drive shaft of the first drive motor, the drive gear being meshed and rotatably connected with the plurality of locking teeth.

8. The magnetic cleaning device for electron microscopy samples according to claim 7, characterized in that The driving component includes: The mounting panel is perpendicular to the substrate and fixedly mounted on the substrate, and a mounting groove is provided on one side of the mounting panel; An adjustment panel is slidably disposed along the mounting groove and is detachably and fixedly connected to the mounting panel. The first drive motor passes through and is fixedly disposed on the mounting panel. A protective cover is attached to the adjustment panel, and the drive gear is enclosed within the protective cover.

9. The magnetic cleaning device for electron microscopy samples according to claim 7, characterized in that Anti-detachment grooves are provided on opposite sides of the sliding groove on the movable panel, and the anti-detachment grooves are continuously provided along the length direction of the movable panel. The position corresponding to the anti-off groove in the chute is uniformly provided with a plurality of rollers, and the plurality of rollers are protrudingly arranged, and the plurality of rollers are rotatably arranged in the anti-off groove.

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