An electron microscope sample stage for observing sheet-like samples

Abstract

This utility model discloses an electron microscope sample stage for observing sheet-like samples, including a base, a sample latch, an elastic reset component, and a limiting component. The sample latch includes an operating end and a clamping end, which are connected by a connecting rod. The elastic reset component acts as a lever fulcrum and is positioned between the connecting rod and the base. The limiting component is mounted above the connecting rod, with the operating end and clamping end located on opposite sides of the limiting component. When the operating end is pressed, the clamping end lifts under the lever action. After placing the sheet-like sample and releasing the operating end, the clamping end presses the sample firmly under the action of the elastic reset component, keeping the sample fixed during testing. After testing, pressing the operating end down again removes the sample, ensuring that the sample does not break or leave adhesive residue, thus achieving non-destructive testing.

Description

Technical Field

[0001] This utility model belongs to the technical field of sample testing equipment, specifically relating to an electron microscope sample stage for observing sheet-like samples. Background Technology

[0002] In the routine electron microscopy sample preparation process for sheet-like samples, the sample to be tested is usually fixed to the sample stage using conductive tape or conductive silver paste. In actual use, after the test is completed, some samples cannot be removed without damage due to the strong adhesion of the tape or the fragility of the material. Alternatively, adhesive residue may remain on the surface of the conductive tape and conductive silver paste, causing inconvenience for sheet-like samples that require non-destructive testing. Utility Model Content

[0003] The purpose of this invention is to overcome the shortcomings of the prior art and provide an electron microscope sample stage for observing sheet-like samples, which can basically achieve non-destructive testing and solve the problems in the background art mentioned above.

[0004] The technical solution adopted by this utility model to solve its technical problem is: to provide an electron microscope sample stage for observing sheet-like samples, including a base, a sample fastener, an elastic reset component and a limiting component;

[0005] The sample buckle includes an operating end and a clamping end, which are connected by a connecting rod; the elastic reset member serves as a lever fulcrum and is located between the connecting rod and the base; the limiting member is mounted above the connecting rod, and the operating end and the clamping end are located on both sides of the limiting member.

[0006] In a preferred embodiment of the present invention, the two ends of the limiting member are fixedly connected to the base, the middle part forms an arch bridge structure with the base, and the top of the arch is provided with a plane for abutting against the upper surface of the connecting rod.

[0007] In a preferred embodiment of this utility model, the end of the clamping end is bent toward the base to form a support leg.

[0008] In a preferred embodiment of the present invention, at least one of the base and the connecting rod has a countersunk hole on its surface, and the elastic reset member is a spring, with at least one end of the spring embedded in the countersunk hole.

[0009] In a preferred embodiment of this utility model, the connecting rod is parallel to the base surface and abuts against the limiting member under the action of the elastic reset member.

[0010] In a preferred embodiment of the present invention, the operating end is located outside the edge of the base, and the edge of the base forms a second fulcrum that abuts against the operating end or the bottom of the connecting rod.

[0011] In a preferred embodiment of this utility model, the upper surface of the operating end is provided with a protrusion.

[0012] In a preferred embodiment of this utility model, a connecting rod is provided at the center of the lower surface of the base.

[0013] In a preferred embodiment of this utility model, the upper surface of the base is square.

[0014] In a preferred embodiment of this utility model, the base is provided with screw holes, and the two ends of the limiting member are fixedly connected to the base by screws.

[0015] Compared with the prior art, this technical solution has the following advantages:

[0016] This design incorporates sample latches on the base surface and utilizes a lever principle combined with an elastic reset component to enable quick placement and fixation of sheet-like samples on the sample stage base. Furthermore, a limiting component controls the travel distance of the sample latches, ensuring excellent fit for sheet-like samples. Additionally, a countersunk hole restricts part of the elastic reset component's trajectory, more precisely fitting the sample and mitigating the risk of damage due to excessive clamping. When the operating end is pressed, the clamping end lifts under leverage. After placing the sheet-like sample, releasing the operating end allows the elastic reset component to press the sample firmly, keeping it fixed during testing. After testing, pressing the operating end again removes the sample, ensuring it doesn't break or leave adhesive residue, thus achieving non-destructive testing. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 An exploded view of the electron microscope sample stage for an example embodiment;

[0019] Figure 2 This is a structural diagram of the electron microscope sample stage for an embodiment;

[0020] Figure 3 This is a schematic diagram of the initial (clamped) state of the electron microscope sample stage in an embodiment.

[0021] Among them, 1. base; 11. countersunk hole; 12. screw hole; 2. sample buckle; 21. connecting rod; 22. clamping end; 3. limiting component; 31. arch bridge structure; 4. screw; 5. spring; 6. connecting rod. Detailed Implementation

[0022] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.

[0023] In the description of this utility model, it should be noted that the terms "center", "upper", "lower", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0024] Example

[0025] An electron microscope sample stage for observing sheet-like samples includes a base 1, a sample latch 2, an elastic reset component, and a limiting component 3;

[0026] The sample buckle 2 includes an operating end and a clamping end, which are connected by a connecting rod 21; the elastic reset member serves as a lever fulcrum and is located between the connecting rod 21 and the base 1; the limiting member 3 is mounted above the connecting rod 21, and the operating end and the clamping end are located on both sides of the limiting member 3.

[0027] In this embodiment, the upper surface of the base 1 is square and has two screw holes 12. A countersunk hole 11 is provided between the two screw holes 12. A connecting rod 6 is provided at the center of the lower surface of the base 1. The two ends of the limiting member 3 are fixedly connected to the screw holes 12 on the base 1 by screws 4. An arch bridge structure 31 is formed between the middle part and the base 1, and the top of the arch is provided with a plane for abutting against the upper surface of the connecting rod 21.

[0028] The end of the clamping end is bent towards the base 1 to form a support leg. The lower surface of the connecting rod 21 also has a countersunk hole 11 at a corresponding position in the base 1. The elastic reset element is a spring 5, with both ends of the spring 5 embedded in the countersunk holes 11 of the base 1 and the connecting rod 21, respectively. In the initial / clamped state, the spring 5 is compressed, the support leg contacts the surface of the base 1, and the spring 5 can move flexibly within the height range of the support leg. The spring 5 in the countersunk hole 11 extends and retracts along the direction of the countersunk hole 11. At this time, because the spring 5 and the support leg together support the sample buckle 2, the upper surface of the connecting rod 21 abuts against the plane of the limiting member 3, and the connecting rod 21 is parallel to the surface of the base 1. The operating end is located outside the edge of the base 1, and the edge of the base 1 forms a second fulcrum abutting against the operating end or the bottom of the connecting rod 21. The upper surface of the operating end has a protrusion, which fits against the side wall of the limiting member 3, and the upper surfaces of both are at the same height.

[0029] When the operating end is pressed, spring 5 is further compressed. However, due to the presence of the support legs, spring 5 cannot retract directly downwards. The middle section of spring 5 bends and retracts to form a fulcrum, and the clamping end is lifted under the leverage. Furthermore, when the operating end is pressed down below the surface of base 1, the edge of base 1 forms a second fulcrum. The clamping end is raised to its highest point and abuts against the plane edge of the limiting member 3, which is the limit state. This can control the degree of deformation and the lifting stroke of the clamping end, effectively preventing sample damage due to excessive force when the elastic reset member is instantaneously reset. After placing the sheet sample, releasing the operating end allows the clamping end to return to its initial state under the action of the elastic reset member, pressing the support legs firmly against the sample. This keeps the sample fixed during the test. After the test, pressing down the operating end again removes the sample, ensuring that the sample will not break or leave adhesive residue, thus achieving non-destructive testing.

[0030] The above embodiments are only used to illustrate the technical solutions of this utility model, and are not intended to limit it. Although this utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this utility model.

Claims

1. An electron microscope sample stage for sheet sample observation, characterized by: Includes base, sample buckle, elastic reset component, and limiting component; The sample buckle includes an operating end and a clamping end, which are connected by a connecting rod; the elastic reset member serves as a lever fulcrum and is located between the connecting rod and the base; the limiting member is mounted above the connecting rod, and the operating end and the clamping end are located on both sides of the limiting member.

2. The electron microscope sample stage for sheet sample observation according to claim 1, characterized in that: The two ends of the limiting member are fixedly connected to the base, and the middle part forms an arch bridge structure with the base, and the top of the arch is provided with a plane for abutting against the upper surface of the connecting rod.

3. The electron microscope sample stage for sheet sample observation according to claim 1, characterized in that: The end of the clamping end is bent towards the base to form a support leg.

4. The electron microscope sample stage for sheet sample observation according to claim 3, characterized in that: At least one of the base and the connecting rod has a countersunk hole on its surface, and the elastic reset member is a spring, with at least one end of the spring embedded in the countersunk hole.

5. The electron microscope sample stage for sheet sample observation according to claim 4, characterized in that: The connecting rod is parallel to the base surface and abuts against the limiting member under the action of the elastic reset member.

6. The electron microscope sample stage for sheet sample observation according to claim 5, characterized in that: The operating end is located outside the edge of the base, and the edge of the base forms a second fulcrum that abuts against the operating end or the bottom of the connecting rod.

7. The electron microscope sample stage for sheet sample observation of claim 1, wherein: The upper surface of the operating end is provided with protrusions.

8. The electron microscope sample stage for sheet sample observation of claim 1, wherein: A connecting rod is provided at the center of the lower surface of the base.

9. The electron microscope sample stage for sheet sample observation of claim 1, wherein: The upper surface of the base is square.

10. The electron microscope sample stage for sheet sample observation of claim 2, wherein: The base is provided with screw holes, and the two ends of the limiting member are fixedly connected to the base by screws.

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