A probe structure for rail flaw detection

Abstract

This utility model belongs to the field of probe technology, specifically relating to a probe structure for track flaw detection, including: a probe mounting base housing with at least one mounting groove; at least one probe, with each probe corresponding to a mounting groove; each probe includes a probe housing and at least one probe detection unit; the probe housing has a receiving cavity for accommodating the probe detection unit; the probe detection unit includes a piezoelectric ceramic wafer, a wedge block, and a cable; the first surface of the wedge block forms an angle α with the horizontal plane; the piezoelectric ceramic wafer is mounted on the first surface; and the cable is connected to the piezoelectric ceramic wafer. This utility model uses the angle α to ensure that the refraction angle β is within the range of 45° to 70°; the scanning area is determined by selecting the size of the piezoelectric ceramic wafer; and the ultrasonic frequency is ensured based on the thickness of the piezoelectric ceramic wafer, improving the detection effect and thus improving the detection accuracy in the switch track area.

Description

Technical Field

[0001] This utility model relates to the field of probe technology, and in particular to a probe structure for track flaw detection. Background Technology

[0002] During long-term use, rails inevitably suffer various damages, such as cracks and wear, due to the interaction forces between train wheels and rails and environmental factors. If these damages are not detected and repaired in a timely manner, they can potentially lead to serious accidents such as rail breaks, posing a significant threat to railway transportation order and the safety of people's lives and property. Therefore, rail flaw detection is an indispensable and crucial link in ensuring the safe operation of trains. Currently, ultrasonic testing systems are commonly used on rail flaw detection vehicles to detect rail flaws. Ultrasonic rail flaw detection systems detect rail damage based on the ultrasonic echoes reflected from rail damage. When using ultrasonic probes for rail flaw detection, appropriate structures are used to ensure that the ultrasonic probes correctly transmit and receive ultrasonic waves on the rail.

[0003] However, the surface of the rail in the turnout section may not be as smooth as that of the straight section. There may be unevenness caused by welding points, joints or wear, as well as dirt, rust, etc., which will affect the coupling effect between the ultrasonic probe and the rail surface, and thus affect the accuracy of the test results. Utility Model Content

[0004] The technical problem to be solved by this utility model is: in order to solve the problem of low accuracy of ultrasonic probe detection in the turnout track area in the prior art, this utility model provides a probe structure for track flaw detection to improve detection accuracy.

[0005] The technical solution adopted by this utility model to solve its technical problem is: a probe structure for track flaw detection, comprising: a probe mounting base shell, wherein the probe mounting base shell has at least one mounting groove;

[0006] At least one probe is provided, each probe corresponding to a mounting slot. The probe is installed within the mounting slot. Each probe includes a probe housing and at least one probe detection unit. The probe housing has at least one receiving cavity for accommodating the probe detection unit, with each receiving cavity corresponding to a probe detection unit. Each probe detection unit includes a piezoelectric ceramic wafer, a wedge block, and a cable. The piezoelectric ceramic wafer has a thickness of 1 mm and an area ranging from 150 to 200 mm². 2 An angle α is formed between a first surface of the wedge block and the horizontal plane, the piezoelectric ceramic wafer is mounted on the first surface, and the cable is connected to the piezoelectric ceramic wafer.

[0007] Furthermore, the included angle α ranges from 33° to 46°.

[0008] Furthermore, there are two accommodating cavities and two probe detection units, and the two accommodating cavities are separated by a soundproof baffle.

[0009] Furthermore, the second surface of the wedge block forms an angle with the horizontal plane and the first surface, respectively, and a scattering clutter structure is provided on the second surface.

[0010] Furthermore, the scattering clutter structure is a tooth-shaped structure.

[0011] Furthermore, the probe mounting base housing has a mounting groove, in which a probe is installed, and guide rollers for rolling on a track are provided on both sides of the probe mounting base housing.

[0012] Furthermore, the probe mounting base housing has two mounting slots arranged side by side, and each mounting slot has a probe installed in it. The mounting slot has a stepped protrusion, and the probe housing has a groove that mates with the stepped protrusion.

[0013] Furthermore, the probe mounting base housing has multiple mounting slots, each mounting slot forming an angle with the first direction, and each mounting slot contains a probe.

[0014] Furthermore, a sound-absorbing material structure is provided inside the accommodating cavity, and the sound-absorbing material structure covers the outside of the wedge-shaped block.

[0015] Furthermore, the wedge is an imine wedge.

[0016] Compared with the prior art, the beneficial effects of this utility model are:

[0017] (1) This utility model forms an angle α between the first surface of the wedge block in the probe detection unit and the horizontal plane, and the piezoelectric ceramic wafer is mounted on the first surface. This design ensures that the refraction angle β of the ultrasonic wave emitted by the piezoelectric ceramic wafer on the track is in the range of 45° to 70°. With this design, the area of ​​the piezoelectric ceramic wafer can be determined by selecting the size of the piezoelectric ceramic wafer. Based on the thickness of the piezoelectric ceramic wafer, the ultrasonic frequency is guaranteed to be 2MHz ± 10%, which improves the detection effect and thus improves the detection accuracy in the turnout track area.

[0018] (2) When the present invention is set to two accommodating cavities and two probe detection units, the two accommodating cavities are separated by a sound insulation baffle, which can reduce the interference between ultrasonic signals.

[0019] (3) The present invention provides a clutter scattering structure on the second surface of the wedge block for scattering clutter.

[0020] (4) By covering the outside of the wedge-shaped block with a sound-absorbing material structure, this utility model can absorb excess noise and further improve the detection accuracy.

[0021] (5) The probe mounting base housing and the probe together constitute a probe assembly. The probe assembly can be installed at different positions of the track flaw detection trolley. Through the coordinated cooperation of several probe assemblies and the flaw detection trolley, multiple parts of the track (such as the rail head, rail bottom side and rail bottom) can be scanned at one time. This can replace the existing technology of manually holding a single probe to perform multiple complicated tests on different parts, thereby achieving rapid detection, saving manpower and time, and improving detection efficiency. Attached Figure Description

[0022] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0023] Figure 1 This is a schematic diagram of the probe structure of this utility model.

[0024] Figure 2 for Figure 1 A partial structural diagram of the probe detection unit.

[0025] Figure 3 for Figure 1 A schematic diagram of the internal structure.

[0026] Figure 4 for Figure 1 A schematic diagram of the probe housing structure.

[0027] Figure 5 This is a schematic diagram of the structure of Embodiment 1 of this utility model.

[0028] Figure 6 for Figure 5 A schematic diagram of the probe mounting base housing.

[0029] Figure 7 This is a schematic diagram of the structure of Embodiment 2 of this utility model.

[0030] Figure 8 for Figure 7 A schematic diagram of the probe mounting base housing.

[0031] Figure 9 This is a structural schematic diagram of Embodiment 3 of the present invention.

[0032] Figure 10 for Figure 9 A schematic diagram of the probe mounting base housing.

[0033] In the diagram: 1. Probe mounting housing; 101. Mounting groove; 102. Guide roller; 103. Stepped protrusion; 2. Probe; 201. Probe housing; 201-1. Receptacle; 202. Probe detection unit; 202-1. Piezoelectric ceramic wafer; 202-2. Wedge block; 202-3. Cable; 202-4. First surface; 202-5. Second surface; 202-6. Scattering clutter structure; 202-7. Sound-absorbing material structure; 203. Sound insulation baffle. Detailed Implementation

[0034] The present invention will now be described in further detail with reference to the accompanying drawings. These drawings are simplified schematic diagrams, illustrating only the basic structure of the present invention, and therefore only show the components relevant to the present invention.

[0035] In the description of this utility model, it should be understood that the terms "center," "longitudinal," "transverse," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential," etc., indicating the orientation or positional relationship shown in the accompanying drawings, are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, features defined with "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this utility model, unless otherwise stated, "a plurality of" means two or more.

[0036] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0037] like Figures 1 to 4As shown, this is the probe 2 of the present invention. The probe 2 includes a probe housing 201 and at least one probe detection unit 202. The probe housing has at least one receiving cavity 201-1 for accommodating the probe detection unit 202. The receiving cavities 201-1 correspond one-to-one with the probe detection units 202. The probe detection unit 202 includes a piezoelectric ceramic wafer 202-1, a wedge block 202-2, and a cable 202-3. The piezoelectric ceramic wafer 202-1 has a thickness of 1 mm. This thickness of the piezoelectric ceramic wafer 202-1 ensures an ultrasonic frequency of 2 MHz ± 10%. The area of ​​the piezoelectric ceramic wafer 202-1 ranges from 150 to 200 mm². 2 The first surface 202-4 of the wedge block 202-2 forms an angle α with the horizontal plane. The angle α ranges from 33° to 46°. The angle α ensures that the refraction angle β of the ultrasonic wave emitted by the piezoelectric ceramic chip on the track ranges from 45° to 70°. The refraction angle β refers to the angle between the ultrasonic wave emitted by the piezoelectric ceramic chip and the vertical direction after refraction by the track. The piezoelectric ceramic chip 202-1 is mounted on the first surface 202-4, and the cable 202-3 is connected to the piezoelectric ceramic chip 202-1.

[0038] Specifically, cable 202-3 includes a receiving cable and a transmitting cable, both of which are connected to piezoelectric ceramic wafer 202-1.

[0039] Specifically, there are two accommodating cavities 201-1 and two probe detection units 202. The two accommodating cavities 201-1 are separated by a sound insulation baffle 203, which can reduce interference between ultrasonic signals.

[0040] Specifically, the second surface 202-5 of the wedge block 202-2 forms an angle with the horizontal plane and the first surface 202-4 respectively, and a clutter scattering structure 202-6 is provided on the second surface 202-5 for scattering clutter.

[0041] Specifically, the scattering clutter structure 202-6 is a tooth-shaped structure.

[0042] Specifically, a sound-absorbing material structure 202-7 is provided inside the accommodating cavity. The sound-absorbing material structure 202-7 covers the outside of the wedge-shaped block and can absorb excess noise, further improving the detection accuracy.

[0043] Specifically, the wedge-shaped blocks are made of imide.

[0044] The ultrasonic flaw detection principle of this utility model probe is as follows: the piezoelectric ceramic wafer 202-1 is a piezoelectric ceramic dual wafer, one wafer is used to emit ultrasonic waves, and the other wafer is used to receive ultrasonic waves. When the piezoelectric ceramic dual wafer is subjected to the voltage of the transmitting cable, one wafer will generate ultrasonic waves along a specific direction. After the ultrasonic waves hit the track, part of the ultrasonic waves will be reflected back and received by the other wafer, and the electrical signal will be transmitted to the control terminal through the receiving cable.

[0045] Example 1:

[0046] like Figures 5 to 6 As shown, a probe structure for track flaw detection in this embodiment includes: a probe mounting base housing 1 and the probe 2 mentioned above. The probe mounting base housing 1 has a mounting groove 101, and a probe 2 is installed in the mounting groove 101. Guide rollers 102 for rolling on the track are provided on both sides of the probe mounting base housing 1.

[0047] In this embodiment, the probe mounting housing 1 and the probe 2 form a rail head probe structure and are mounted on a rail flaw detection mobile trolley for flaw detection of the rail head. Specifically, the included angle α of the wedge block 202-2 in this embodiment is 33°, and the refraction angle β of the ultrasonic wave emitted by the probe 2 on the rail is 45°±2°.

[0048] Example 2:

[0049] like Figures 7 to 8 As shown, a probe structure for track flaw detection in this embodiment includes: a probe mounting base housing 1 and the probe 2 mentioned above. The probe mounting base housing 1 has two mounting slots 101, which are arranged side by side. Each mounting slot 101 has a probe 2 installed in it. A stepped protrusion 103 is provided in the mounting slot 101. The probe housing 201 has a groove that cooperates with the stepped protrusion 103.

[0050] In this embodiment, the probe mounting housing 1 and the probe 2 form a trackside probe structure and are mounted on a track flaw detection mobile trolley for flaw detection on the track side. Specifically, the included angle α of the wedge block 202-2 in this embodiment is 33°, and the refraction angle β of the ultrasonic wave emitted by the probe 2 on the track is 45°±2°.

[0051] Example 2:

[0052] like Figures 9 to 10 As shown, a probe structure for track flaw detection in this embodiment includes: a probe mounting base housing 1 and the aforementioned probe 2. The probe mounting base housing 1 has four mounting slots 101, each mounting slot 101 forming an angle with a first direction. A probe 2 is installed in each mounting slot 101. The first direction is the travel direction of the trolley, specifically as follows... Figure 10 The first direction shown is the left-right direction.

[0053] Specifically, the four mounting slots 101 are, from left to right, mounting slot E, mounting slot C, mounting slot D, and mounting slot F. The angle between mounting slot E and the first direction is 0°, the angle between mounting slot C and the first direction is 5°, the angle between mounting slot D and the first direction is 9.5°, and the angle between mounting slot F and the first direction is 8°. Since the structure of the bottom area of ​​the turnout rail is more complex, multiple probes 2 are set to detect the rail in multiple directions, thereby improving the accuracy of the detection results.

[0054] In this embodiment, the probe mounting housing 1 and the probe 2 form a rail bottom probe structure and are mounted on a rail flaw detection mobile trolley for flaw detection of the bottom of the rail. Specifically, the included angle α of the wedge block 202-2 in this embodiment is 46°, and the refraction angle β of the ultrasonic wave emitted by the probe 2 on the rail is 70°±2°.

[0055] Compared with the prior art, the beneficial effects of this utility model are:

[0056] (1) In this utility model, the first surface 202-4 of the wedge block 202-2 in the probe detection unit 202 forms an angle α with the horizontal plane, and the piezoelectric ceramic wafer 202-1 is mounted on the first surface 202-4. This design ensures that the refraction angle β of the ultrasonic wave emitted by the piezoelectric ceramic wafer on the track is in the range of 45° to 70° through the angle α. With this design, the area of ​​the piezoelectric ceramic wafer can be determined by selecting the size of the piezoelectric ceramic wafer. With this design, the thickness of the piezoelectric ceramic wafer can ensure the ultrasonic frequency, improve the detection effect, and thus improve the detection accuracy in the switch track area.

[0057] (2) When the present invention provides two accommodating cavities 201-1 and two probe detection units 202, the two accommodating cavities 201-1 are separated by a sound insulation baffle 203, which can reduce the interference between ultrasonic signals.

[0058] (3) The present invention provides a clutter scattering structure on the second surface 202-5 of the wedge block 202-2 for scattering clutter.

[0059] (4) By covering the outside of the wedge-shaped block with a sound-absorbing material structure, this utility model can absorb excess noise and further improve the detection accuracy.

[0060] (5) The probe mounting base housing 1 of this utility model can be provided with one, two or more mounting slots 101, and the mounting slots 101 have different settings, which can be flexibly selected according to the actual flaw detection needs, thereby improving the applicability and practicality of the probe structure.

[0061] (6) The probe mounting base housing and the probe together constitute a probe assembly. The probe assembly can be installed at different positions of the track flaw detection trolley. Through the coordinated cooperation of several probe assemblies and the flaw detection trolley, multiple parts of the track (such as the rail head, rail bottom side and rail bottom) can be scanned at one time. This can replace the existing method of manually holding a single probe to perform multiple complicated tests on different parts, thereby achieving rapid detection, saving manpower and time, and improving detection efficiency.

[0062] The above description is based on the preferred embodiments of this utility model. Through the above description, those skilled in the art can make various changes and modifications without departing from the technical concept of this utility model. The technical scope of this utility model is not limited to the contents of the specification, but must be determined by the scope of the claims.

Claims

1. A probe structure for rail flaw detection, characterized by, include: The probe mounting base housing (1) has at least one mounting groove (101) on it; At least one probe (2) is provided, each probe (2) corresponding to a mounting slot (101). The probe (2) is installed in the mounting slot (101). Each probe (2) includes a probe housing (201) and at least one probe detection unit (202). The probe housing has at least one receiving cavity (201-1) for accommodating the probe detection unit (202). The receiving cavity (201-1) is arranged in a one-to-one correspondence with the probe detection unit (202). The probe detection unit (202) includes a piezoelectric ceramic wafer (202-1), a wedge block (202-2), and a cable (202-3). The thickness of the piezoelectric ceramic wafer (202-1) is 1 mm, and the area of ​​the piezoelectric ceramic wafer (202-1) is in the range of 150-200 mm². 2 The first surface (202-4) of the wedge block (202-2) forms an angle α with the horizontal plane, the piezoelectric ceramic wafer (202-1) is mounted on the first surface (202-4), and the cable (202-3) is connected to the piezoelectric ceramic wafer (202-1).

2. A probe structure for rail flaw detection as claimed in claim 1, wherein, The included angle α ranges from 33° to 46°.

3. A probe structure for rail flaw detection as claimed in claim 1, wherein, There are two accommodating cavities (201-1) and two probe detection units (202), and the two accommodating cavities (201-1) are separated by a sound insulation baffle (203).

4. The probe structure for rail flaw detection according to claim 1, wherein The second surface (202-5) of the wedge block (202-2) forms an angle with the horizontal plane and the first surface (202-4), and a scattering clutter structure (202-6) is provided on the second surface (202-5).

5. A probe structure for rail flaw detection as claimed in claim 4, wherein, The scattering clutter structure (202-6) is a tooth-shaped structure.

6. A probe structure for rail flaw detection as claimed in claim 1, wherein, The probe mounting base housing (1) has a mounting groove (101) and a probe (2) is installed in the mounting groove (101). Guide rollers (102) for rolling on the track are provided on both sides of the probe mounting base housing (1).

7. The probe structure for track flaw detection as described in claim 1, characterized in that, The probe mounting base housing (1) has two mounting slots (101) arranged side by side. Each mounting slot (101) has a probe (2) installed in it. The mounting slot (101) has a stepped protrusion (103) and the probe housing (201) has a groove that matches the stepped protrusion (103).

8. The probe structure for track flaw detection as described in claim 1, characterized in that, The probe mounting base housing (1) has a plurality of mounting slots (101), each mounting slot (101) forming an angle with the first direction, and each mounting slot (101) has a probe (2) installed in it.

9. A probe structure for rail flaw detection as claimed in claim 1, wherein, The cavity (201-1) is provided with a sound-absorbing material structure (202-7), which covers the outside of the wedge-shaped block (202-2).

10. A probe structure for rail flaw detection as claimed in claim 1, wherein, The wedge (202-2) is an imine wedge.

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