A test support for camera mainboard debugging

By designing a test bracket that includes a base, support plate, sliding column, connecting plate, pressure frame, and electric telescopic rod, the problem of unstable fixation during camera motherboard debugging was solved, achieving stable fixation and automated testing of the motherboard, improving testing accuracy and efficiency, and protecting the integrity of the motherboard.

CN224581565UActive Publication Date: 2026-07-31SHENZHEN LAIMEI VISION ELECTRONIC TECHNOLOGY CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
SHENZHEN LAIMEI VISION ELECTRONIC TECHNOLOGY CO LTD
Filing Date
2025-06-06
Publication Date
2026-07-31

AI Technical Summary

Technical Problem

The camera motherboard is difficult to securely fix during debugging, which may cause displacement during testing and affect the test results.

Method used

A test bracket was designed, comprising a base, a support plate, a sliding column, a connecting plate, a pressure frame, an electric telescopic rod, and a transparent plate. The pressure frame and pressure column are driven by the electric telescopic rod to fix the main board, and dampers and springs are provided for buffer protection. The sliding base and the electric telescopic rod enable automatic pin connection.

Benefits of technology

It achieves stable fixation of the motherboard, avoids displacement, improves testing accuracy, enhances versatility and testing efficiency, reduces the risk of human error, and protects the integrity of the motherboard.

✦ Generated by Eureka AI based on patent content.

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Abstract

This utility model discloses a test bracket for debugging a camera motherboard, including a base, a support plate on the top wall of the base, and opposing sliding columns on the rear side wall of the base. A connecting plate is provided at the top of the sliding column, and a pressure frame is slidably mounted on the sliding column. An electric telescopic rod is provided on the connecting plate, with its movable end slidably passing through the connecting plate and fixed to the pressure frame. A transparent plate is detachably mounted in the middle of the pressure frame, and a pressure column is provided on the bottom wall of the transparent plate. This utility model belongs to the technical field of test brackets, specifically referring to a test bracket for debugging a camera motherboard.
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Description

Technical Field

[0001] This utility model belongs to the field of test bracket technology, specifically referring to a test bracket for debugging camera motherboards. Background Technology

[0002] In the production and manufacturing process of camera motherboards, debugging is a crucial step to ensure stable performance and normal function of the motherboard.

[0003] Currently, when debugging camera motherboards, it is common practice to manually hold the motherboard and connect it to the testing equipment, or to use a simple fixing device to fix the motherboard before testing. However, it is difficult to fix the motherboard securely, and the motherboard may shift during the testing process, affecting the test results. Utility Model Content

[0004] The technical problem this invention aims to solve is that during camera motherboard debugging, it is difficult to securely fix the motherboard, and the motherboard may shift during testing, affecting the test results.

[0005] To achieve the above functions, the technical solution adopted by this utility model is as follows: A test bracket for debugging a camera motherboard includes a base, a support plate on the top wall of the base, and sliding columns arranged opposite to each other on the rear side wall of the base. A connecting plate is provided at the top of the sliding block, and a pressure frame is slidably provided on the sliding block. An electric telescopic rod is provided on the connecting plate, and the movable end of the electric telescopic rod slides through the connecting plate and is fixed on the pressure frame. A transparent plate is detachably provided in the middle of the pressure frame, and a pressure column is provided on the bottom wall of the transparent plate.

[0006] Preferably, the top wall of the base is provided with four sets of pads respectively located at the four corners of the support plate.

[0007] Preferably, the top of the transparent plate is provided with an L-shaped fixing bracket, which is snapped onto the pressure frame and fixed with bolts.

[0008] Preferably, the base has a slide rail on its side wall, the inner side wall of the slide rail has a slide rail, a slide seat is slidably mounted on the slide rail, and an electric telescopic rod is provided between the slide seat and the slide rail. The movable end of the electric telescopic rod slides through the slide rail and is located on the side wall of the slide seat.

[0009] Preferably, the top wall of the base is provided with a groove, a damper is provided in the groove, the bottom wall of the support plate is fixed on the damper, a spring is sleeved on the damper, and the spring is located between the support plate and the bottom wall of the groove.

[0010] The beneficial effects achieved by adopting the above-described structure are as follows:

[0011] 1. By using an electric telescopic rod to move the pressure frame and pressure column downwards, the camera motherboard can be firmly fixed on the support plate, effectively preventing the motherboard from shifting during the test, ensuring the accuracy of the test, and improving the reliability of the test results.

[0012] 2. The transparent plate is detachable. By replacing the transparent plate with different specifications, it can be flexibly adapted to different models and specifications of camera motherboards, meet diverse debugging needs, and improve the versatility and applicability of the test bracket.

[0013] 3. The test pin is installed on the slide. The electric telescopic rod can drive the slide to move, realizing the automatic connection and separation of the pin and the camera motherboard, reducing manual operation, improving testing efficiency, and reducing the risk of human error.

[0014] 4. The support plate is connected to the base via a damper and a spring. When the pressure column presses down, it effectively buffers and protects the camera's mainboard, preventing damage due to excessive pressure and ensuring the integrity and safety of the mainboard. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the overall structure of an embodiment of the present utility model. Figure 1 ;

[0016] Figure 2 This is a schematic diagram of the overall structure of an embodiment of the present utility model. Figure 2 ;

[0017] Figure 3 This is a schematic diagram of the overall structure of an embodiment of the present utility model. Figure 3 ;

[0018] Figure 4 This is a cross-sectional view of an embodiment of the present utility model.

[0019] Among them, 1. base, 2. support plate, 3. sliding column, 4. connecting plate, 5. pressure frame, 6. electric telescopic rod one, 7. transparent plate, 8. pressure column, 9. pad plate, 10. L-shaped fixing frame, 11. slide, 12. slide rail, 13. slide seat, 14. electric telescopic rod two, 15. groove, 16. damper, 17. spring. Detailed Implementation

[0020] The technical solution of this utility model will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this utility model. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.

[0021] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "set," "install," "connect," and "link" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0022] like Figure 1-4 As shown, this utility model proposes a test bracket for debugging a camera motherboard, including a base 1. The top wall of the base 1 is provided with four sets of pads 9 respectively located at the four corners of the support plate 2. The top wall of the base 1 is provided with the support plate 2. The rear side wall of the base 1 is provided with oppositely arranged sliding columns 3. The top of the sliding column is provided with a connecting plate 4. A pressure frame 5 is slidably provided on the sliding column. An electric telescopic rod 6 is provided on the connecting plate 4. The movable end of the electric telescopic rod 6 slides through the connecting plate 4 and is fixed on the pressure frame 5. A transparent plate 7 is detachably provided in the middle of the pressure frame 5. A pressure column 8 is provided on the bottom wall of the transparent plate 7. An L-shaped fixing bracket 10 is provided on the top of the transparent plate 7. The L-shaped fixing bracket 10 is clipped on the pressure frame 5 and fixed with bolts. By removing the bolts, the transparent plate 7 can be replaced according to the selection. The camera motherboard is placed on the support plate 2. The electric telescopic rod 6 extends, which drives the pressure frame 5 and the pressure plate to move down. The pressure column 8 under the pressure plate fixes the camera motherboard on the support plate 2.

[0023] like Figure 3 As shown, the base 1 has a slide 11 on its side wall, a slide rail 12 on its inner side wall, a slide seat 13 slidably mounted on the slide rail 12, and an electric telescopic rod 14 between the slide seat 13 and the slide 11. The movable end of the electric telescopic rod 14 slidably passes through the slide 11 and is located on the side wall of the slide seat 13. By installing a test pin on the slide seat 13 and driving the slide seat 13 to move via the electric telescopic rod 14, the test pin is connected to the camera motherboard for testing.

[0024] like Figure 4 As shown, the top wall of the base 1 is provided with a groove 15, and a damper 16 is provided in the groove 15. The bottom wall of the support plate 2 is fixed on the damper 16, and a spring 17 is sleeved on the damper 16. The spring 17 is located between the support plate 2 and the bottom wall of the groove 15. When the pressure column 8 is pressed down, it is buffered and protected by the damper 16 and the spring 17.

[0025] In practical use, place the camera motherboard on the support plate 2, and then start the electric telescopic rod 6. The movable end of the electric telescopic rod 6 extends, causing the pressure frame 5 to slide down along the sliding column 3. The pressure column 8 on the bottom wall of the transparent plate 7 in the middle of the pressure frame 5 then descends, firmly fixing the camera motherboard on the support plate 2. If it is necessary to replace the transparent plate 7 with one that is compatible with a different motherboard, the bolts on the L-shaped fixing bracket can be unscrewed, the old transparent plate 7 can be removed, the new transparent plate 7 can be installed, and then it can be fixed with bolts.

[0026] Next, install the required test pins on the slide block 13, and start the electric telescopic rod 14. The movable end of the electric telescopic rod 14 extends, pushing the slide block 13 to move along the slide rail 12, so that the test pins are accurately connected to the corresponding test points on the camera motherboard, thereby performing debugging tests on the camera motherboard. During the test, if the pressure column 8 applies pressure to the motherboard, the damper 16 and spring 17 at the bottom of the support plate 2 can play a buffering role to protect the motherboard from damage. After the test is completed, the electric telescopic rod 14 retracts, causing the slide block 13 to drive the test pins to separate from the motherboard. The electric telescopic rod 6 retracts, and the pressure frame 5 and pressure column 8 move upward, so that the camera motherboard can be removed, completing the entire testing process.

[0027] The present invention and its embodiments have been described above. This description is not restrictive, and the accompanying drawings are only one embodiment of the present invention; the actual structure is not limited thereto. In conclusion, if those skilled in the art are inspired by this description and design similar structures and embodiments without departing from the inventive spirit of the present invention, such designs should fall within the protection scope of the present invention.

Claims

1. A test support for camera main board debugging, characterized in that: Includes a base (1), the top wall of the base (1) is provided with a support plate (2), the rear side wall of the base (1) is provided with oppositely arranged sliding columns (3), the top of the sliding column is provided with a connecting plate (4), a pressure frame (5) is slidably provided on the sliding column, an electric telescopic rod (6) is provided on the connecting plate (4), the movable end of the electric telescopic rod (6) slidably passes through the connecting plate (4) and is fixed on the pressure frame (5), a transparent plate (7) is detachably provided in the middle of the pressure frame (5), and a pressure column (8) is provided on the bottom wall of the transparent plate (7).

2. The test support for camera main board debugging according to claim 1, characterized in that: The top wall of the base (1) is provided with four sets of pads (9) respectively located at the four corners of the support plate (2).

3. The test support for camera main board debugging according to claim 1, characterized in that: The top of the transparent plate (7) is provided with an L-shaped fixing bracket (10), which is snapped onto the pressure frame (5) and fixed with bolts.

4. The test support for camera main board debugging according to claim 1, characterized in that: The base (1) has a slide (11) on its side wall, and a slide rail (12) is provided on the inner side wall of the slide (11). A slide seat (13) is slidably provided on the slide rail (12). An electric telescopic rod (14) is provided between the slide seat (13) and the slide (11). The movable end of the electric telescopic rod (14) slides through the slide (11) and is located on the side wall of the slide seat (13).

5. The test support for camera main board debugging according to claim 1, characterized in that: The top wall of the base (1) is provided with a groove (15), and a damper (16) is provided in the groove (15). The bottom wall of the support plate (2) is fixed on the damper (16), and a spring (17) is sleeved on the damper (16). The spring (17) is located between the support plate (2) and the bottom wall of the groove (15).