A module test fixture for aging test

Abstract

This utility model belongs to the technical field of module testing fixtures, and in particular, a module testing fixture for aging tests. It includes a fixed frame, an aging test circuit board placement rack mounted on the fixed frame, a test circuit board body mounted on the aging test circuit board placement rack, and multiple test chip placement slots located on the side of the fixed frame away from the aging test circuit board placement rack. Chips to be tested are placed in their corresponding test chip placement slots, and multiple parallel connecting cables are sequentially connected in parallel above the test circuit board body. The test interface at one end of each parallel connecting cable is mounted on the bottom of a sliding rod. The sliding rod can be controlled to slide the test interface downwards, allowing it to insert into the chip. This allows the test interface to perform aging tests on the chip, and the sliding rod ensures a tighter contact between the test interface and the chip. Combined with the test chip placement slots, this ensures greater stability of the chip during testing.

Description

Technical Field

[0001] This utility model relates to the field of module testing fixture technology, and in particular to a module testing fixture for aging testing. Background Technology

[0002] Aging testing is an indispensable and crucial step in the manufacturing process of electronic and battery products. Aging testing simulates the operation of products under prolonged, high-load conditions to detect potential performance defects and reliability issues, thereby identifying substandard products and improving overall product quality.

[0003] When in use, the testing machine uses a series method for testing, which limits the number of test products and even makes it impossible to click on the screen under heavy load; each test product is independent and is easy to collide with each other, which reduces the testing efficiency. Therefore, we have proposed a module test fixture for aging testing. Utility Model Content

[0004] The purpose of this invention is to provide a module test fixture for aging testing, which solves the existing problems.

[0005] To achieve the above objectives, the present invention adopts the following technical solution:

[0006] A module test fixture for aging testing includes a fixed frame, an aging test circuit board placement rack, a test circuit board body, and parallel connecting cables. The aging test circuit board placement rack is mounted on the fixed frame; the test circuit board body is mounted on the aging test circuit board placement rack; multiple test chip placement slots are located on the side of the fixed frame away from the aging test circuit board placement rack; multiple parallel connecting cables are electrically connected to the test circuit board body; multiple test interfaces are located on each of the parallel connecting cables; and multiple slide bars are located on the fixed frame, with each test interface located at the end of a corresponding slide bar.

[0007] Preferably, it further includes: multiple mounting brackets disposed on the fixed bracket; and multiple locking blocks disposed at the other end of each of the slide rods.

[0008] Preferably, it further includes: a plurality of locking pins disposed on each of the mounting brackets, each of the locking pins including a locking post and a fixing block; a plurality of springs disposed on the locking post of each of the locking pins, each of the springs being distributed between each of the mounting brackets and the fixing block corresponding to the locking pin.

[0009] Preferably, each of the locking blocks has a locking hole that engages with the locking pin of the limiting pin.

[0010] Preferably, it further includes: a threaded rod disposed on the aging test circuit board placement frame; a knob disposed at the end of the threaded rod away from the aging test circuit board placement frame; and a circuit board clamping plate disposed at the end of the threaded rod away from the knob, the circuit board clamping plate being in contact with the test circuit board body.

[0011] Preferably, it further includes: two guide rods disposed on the aging test circuit board placement rack, the two guide rods being disposed on the side of the circuit board clamping plate near the threaded rod, and the two guide rods being symmetrically distributed on both sides of the threaded rod; and two limiting blocks disposed at the end of each guide rod away from the circuit board clamping plate.

[0012] Preferably, a guide hole is provided on one side of the aging test circuit board placement rack, and the guide rod fits into the guide hole.

[0013] Preferably, an anti-slip rubber pad is fixedly installed on one side of the circuit board clamping plate, and a soft rubber pad is provided inside the aging test circuit board placement rack.

[0014] Compared with the prior art, the beneficial effects of this utility model are as follows:

[0015] (1) A module test fixture for aging test of this utility model places the chip to be tested in the corresponding test chip placement slot, and connects multiple parallel connecting cables in parallel above the test circuit board body in sequence. The test interface at one end of the parallel connecting cable is installed at the bottom of the slide bar. At this time, the slide bar can be controlled to drive the test interface to slide downward and insert the test interface into the chip. The test interface can perform aging test on the chip. The slide bar can drive the test interface to make close contact with the chip. With the test chip placement slot, the chip can be more stable during the test.

[0016] (2) The module test fixture of this utility model for aging test, after positioning, can control the locking pin to slide into the locking groove above the locking block, which can lock the position of the locking block and the sliding rod, so that the test interface can be more stable during the long-term information reading and detection process of the chip. The rotating knob drives the threaded rod to move above the aging test circuit board placement rack through the threaded engagement, so that the threaded rod can drive the circuit board clamping plate to move. The guide rod can guide and limit the circuit board clamping plate, so that the circuit board clamping plate can move stably and clamp and fix the circuit board clamping plate to the test circuit board body, so that the device can be more stable during the aging test. Attached Figure Description

[0017] To more clearly illustrate the technical solutions of the embodiments of this utility model, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a three-dimensional structural diagram of a module test fixture for aging testing proposed in this utility model;

[0019] Figure 2 This is a partial three-dimensional structural diagram of the guide rod and circuit board clamping plate proposed in this utility model.

[0020] Figure 3 This is a partial three-dimensional structural diagram of the main body of the test circuit board proposed in this utility model;

[0021] Figure 4 This is a partial three-dimensional structural diagram of the mounting bracket proposed in this utility model;

[0022] Figure 5 for Figure 4 A schematic diagram of the structure of part A in the diagram;

[0023] Figure 6 for Figure 4 A schematic diagram of part B in the diagram.

[0024] In the diagram: 1. Fixing frame; 2. Aging test circuit board placement rack; 3. Test circuit board body; 4. Test chip placement slot; 5. Parallel connection cable; 6. Test interface; 7. Mounting bracket; 8. Slide bar; 9. Locking block; 10. Locking pin; 11. Spring; 12. Threaded rod; 13. Knob; 14. Guide rod; 15. Limiting block; 16. Circuit board clamping plate. Detailed Implementation

[0025] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present utility model.

[0026] refer to Figure 1-6A module test fixture for aging testing includes a fixture 1, an aging test circuit board placement rack 2, a test circuit board body 3, and a parallel connection cable 5. The device includes an aging test circuit board placement rack 2, mounted on a fixed frame 1; a test circuit board body 3, mounted on the aging test circuit board placement rack 2; multiple test chip placement slots 4, located on the side of the fixed frame 1 away from the aging test circuit board placement rack 2; multiple parallel connecting cables 5, electrically connected to the test circuit board body 3; multiple test interfaces 6, located on each parallel connecting cable 5; and multiple sliding rods 8, located on the fixed frame 1, with each test interface 6 located at the end of a corresponding sliding rod 8. The chip to be tested is placed inside the corresponding test chip placement slot 4, and the multiple parallel connecting cables 5 are sequentially connected in parallel above the test circuit board body 3. The test interface 6 at one end of each parallel connecting cable 5 is installed at the bottom of the sliding rod 8. The sliding rod 8 can then be controlled to slide the test interface 6 downwards, allowing the test interface 6 to be inserted into the chip, enabling the test interface 6 to perform aging tests on the chip. In this embodiment, multiple mounting brackets 7 are fixedly mounted on the top of the fixed frame 1, and a locking block 9 is fixedly mounted on the top of the sliding rod 8.

[0027] In this embodiment, it also includes: multiple locking pins 10, each mounted on a mounting bracket 7, each locking pin 10 including a locking post and a fixing block; multiple springs 11, each mounted on the locking post of each locking pin 10, each spring 11 distributed between each mounting bracket 7 and the fixing block of the corresponding locking pin 10; the slide bar 8 can drive the test interface 6 to make closer contact with the chip, and together with the test chip placement slot 4, it can make the chip more stable during the test. After positioning, it can control the locking pin 10 to slide into the locking slot above the locking block 9, which can lock the position of the locking block 9 and the slide bar 8, and make the test interface 6 more stable during the long-term information reading and detection process.

[0028] In this embodiment, the device further includes: a threaded rod 12, disposed on the aging test circuit board placement rack 2; a knob 13, disposed at the end of the threaded rod 12 away from the aging test circuit board placement rack 2; and a circuit board clamping plate 16, disposed at the end of the threaded rod 12 away from the knob 13, the circuit board clamping plate 16 being in contact with the test circuit board body 3; rotating the knob 13 causes the threaded rod 12 to move above the aging test circuit board placement rack 2 through threaded engagement, allowing the threaded rod 12 to move the circuit board clamping plate 16, and the guide rod 14 to clamp the circuit board. The plate 16 provides guidance and limitation, enabling the circuit board clamping plate 16 to move stably and clamp and fix the test circuit board body 3, thus making the device more stable during the aging test. In this embodiment, two guide rods 14 are set on the aging test circuit board placement rack 2, and the two guide rods 14 are set on the side of the circuit board clamping plate 16 near the threaded rod 12, and the two guide rods 14 are symmetrically distributed on both sides of the threaded rod 12. Two limiting blocks 15 are respectively set at the end of each guide rod 14 away from the circuit board clamping plate 16.

[0029] In this embodiment, a guide hole is provided on one side of the aging test circuit board placement rack 2, and the guide rod 14 fits into the guide hole; in this embodiment, an anti-slip rubber pad is fixedly installed on one side of the circuit board clamping plate 16, and a soft rubber pad is provided inside the aging test circuit board placement rack 2.

[0030] The implementation principle of a module test fixture for aging testing in this embodiment is as follows: The chip to be tested is placed inside the corresponding test chip placement slot 4, and multiple parallel connecting cables 5 are sequentially connected in parallel above the test circuit board body 3. The test interface 6 at one end of each parallel connecting cable 5 is installed at the bottom of a slide bar 8. The slide bar 8 can then be controlled to slide the test interface 6 downwards, allowing it to insert into the chip. This allows the test interface 6 to perform aging testing on the chip. The slide bar 8 ensures a tighter contact between the test interface 6 and the chip, which, combined with the test chip placement slot 4, ensures the chip remains relatively stable during testing. After positioning is complete... The controllable locking pin 10 can slide into the locking groove above the locking block 9 to lock the position of the locking block 9 and the slide bar 8, which can make the test interface 6 more stable during long-term information reading and detection. Rotating the knob 13 drives the threaded rod 12 to move above the aging test circuit board placement rack 2 through threaded engagement, which can drive the circuit board clamping plate 16 to move. The guide rod 14 can guide and limit the circuit board clamping plate 16, which can move the circuit board clamping plate 16 stably and clamp and fix the test circuit board body 3, making the device more stable during aging test.

[0031] In the description of this specification, references to terms such as "an embodiment," "example," "specific example," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0032] The present invention provides a detailed description of a module testing fixture for aging testing. Specific embodiments have been used to illustrate the principles and implementation methods of the present invention. These embodiments are merely illustrative and are intended to aid in understanding the method and core concepts of the present invention. It should be noted that those skilled in the art can make various improvements and modifications to the present invention without departing from its principles, and these improvements and modifications also fall within the scope of protection of the claims of the present invention.

Claims

1. A module test fixture for burn-in testing, comprising: include: Fixture; An aging test circuit board placement rack is mounted on the fixed frame; The main body of the test circuit board is placed on the aging test circuit board placement rack; Multiple test chip placement slots are respectively located on the side of the fixing frame away from the aging test circuit board placement frame; Multiple parallel connecting cables are electrically connected to the main body of the test circuit board; Multiple test interfaces are provided on each of the parallel connection cables; Multiple slide bars are respectively installed on the fixed frame, and each of the test interfaces is located at the end of the corresponding slide bar.

2. The module test fixture for burn-in testing of claim 1, wherein, Also includes: Multiple mounting brackets are mounted on the fixed frame; Multiple locking blocks are located at the other end of each of the slide bars.

3. The module test fixture for burn-in testing of claim 2, wherein, Also includes: Multiple locking pins are disposed on each of the mounting brackets, and each locking pin includes a locking post and a fixing block; Multiple springs are disposed on the locking post of each of the locking pins, and each spring is distributed between each mounting bracket and the fixing block corresponding to the locking pin.

4. The module test fixture for burn-in testing of claim 3, wherein, Each of the locking blocks has a locking hole that engages with the locking pin of the limiting pin.

5. The module test fixture for burn-in testing of claim 1, wherein, Also includes: A threaded rod is mounted on the aging test circuit board holder. A knob is located at the end of the threaded rod away from the aging test circuit board holder; A circuit board clamping plate is disposed at the end of the threaded rod away from the knob, and the circuit board clamping plate is in contact with the test circuit board body.

6. The module test fixture for burn-in testing of claim 5, wherein, Also includes: Two guide rods are provided on the aging test circuit board placement rack. The two guide rods are located on the side of the circuit board clamping plate near the threaded rod, and the two guide rods are symmetrically distributed on both sides of the threaded rod. Two limiting blocks are respectively located at the end of each guide rod away from the circuit board clamping plate.

7. The module test fixture for burn-in testing of claim 6, wherein, The aging test circuit board placement rack has a guide hole on one side, and the guide rod fits into the guide hole.

8. The module test fixture for burn-in testing of claim 5, wherein, An anti-slip rubber pad is fixedly installed on one side of the circuit board clamping plate, and a soft rubber pad is provided inside the aging test circuit board placement rack.

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