Probe quick-change structure and flying probe electrical testing machine

Abstract

This utility model discloses a quick-change probe structure and a flying probe electrical testing machine in the field of flying probe electrical testing technology. It is used for connecting probe arms and probe assemblies. The quick-change structure includes a fixing mechanism and a docking mechanism. The fixing mechanism is used to detachably connect the probe arm and the probe assembly. The docking mechanism includes a circuit board one on the probe arm, a spring pin on the circuit board one, and a circuit board two on the probe assembly for contacting the spring pin. The circuit board has contacts corresponding to the spring pin. This utility model eliminates the need for repeated plugging and unplugging of wiring when replacing the probe assembly. During replacement, the spring pin automatically contacts the contacts, locking the mechanism in place. This ensures contact stability, significantly reduces replacement time, and avoids poor contact caused by frequent plugging and unplugging, thus significantly improving testing efficiency and reliability.

Description

Technical Field

[0001] This utility model relates to the field of flying probe electrical testing machines, specifically to a probe quick-change structure and a flying probe electrical testing machine. Background Technology

[0002] A flying probe electrical tester is a high-precision device used for electrical performance testing of printed circuit boards (PCBs) and electronic components. A flying probe electrical tester typically includes a probe arm, an electrical testing system, probe assemblies, and a control system. The probe arm is connected to the probe assemblies. During the use of a flying probe electrical tester, probe assemblies need to be frequently changed due to different testing requirements. However, most current probe assemblies use pluggable wires to connect to the electrical testing system for signal transmission. This method requires plugging and unplugging the wires each time a probe assembly is changed, which is cumbersome and can easily lead to poor contact. Therefore, we propose a quick-change probe structure and a flying probe electrical tester. Utility Model Content

[0003] The purpose of this invention is to provide a quick-change probe structure and a flying probe electrical tester, which solves the problem that most existing probe components use pluggable wires to connect to the electrical test system to achieve signal transmission. However, this method requires plugging and unplugging the wires every time the probe component is replaced, which is cumbersome and frequent plugging and unplugging can easily lead to poor contact.

[0004] This utility model achieves the above objectives through the following technical solutions:

[0005] A quick-change probe structure is provided for connecting a probe arm and a probe assembly. The quick-change structure includes a fixing mechanism and a docking mechanism. The fixing mechanism is used to detachably connect the probe arm and the probe assembly. The docking mechanism includes a circuit board one disposed on the probe arm, a spring pin disposed on the circuit board one, and a circuit board two disposed on the probe assembly for contacting and connecting with the spring pin. The circuit board is provided with contacts corresponding to the spring pin.

[0006] A further improvement is that the probe arm is provided with a male connector for mounting a circuit board.

[0007] A further improvement is that the fixing mechanism includes a connecting seat on the probe assembly, the connecting seat is sleeved on the outer wall of the probe arm and is detachably fixed by a fixing member, and the outer wall of the probe arm has a plurality of fixing ports that cooperate with the fixing member.

[0008] A further improvement is that the spring pins are provided in several groups, and the several groups of spring pins are inserted together on a support plate.

[0009] A further improvement is that the male connector has an opening on the side opposite to the first circuit board, and the area of ​​the opening is smaller than the area of ​​the first circuit board.

[0010] A further improvement is that the first circuit board and the second circuit board are detachably fixed to the male and probe assemblies by the second fastener.

[0011] A flying probe electrical testing machine includes a probe arm, a probe assembly, and a probe quick-change structure as described above.

[0012] The beneficial effects of this utility model are as follows: When replacing the probe assembly, there is no need to plug and unplug the wiring each time. When replacing the probe assembly, the spring pin and the contact point automatically contact and lock together through the fixing mechanism, which not only ensures the contact stability but also greatly reduces the replacement time. At the same time, it avoids the problem of poor contact caused by frequent plugging and unplugging, and significantly improves the testing efficiency and reliability. Attached Figure Description

[0013] Figure 1 This is a schematic diagram of the probe quick-change structure of this utility model;

[0014] Figure 2 For the present utility model Figure 1 Schematic diagram of a partial structure;

[0015] Figure 3 This is a side view of the male seat structure of this utility model;

[0016] Figure 4 For the present utility model Figure 3 Another perspective structural diagram;

[0017] Figure 5 This is a schematic diagram of the probe assembly structure of this utility model.

[0018] In the diagram: 100, probe arm; 200, probe assembly; 300, fixing mechanism; 301, connector; 302, fixing component one; 400, docking mechanism; 401, male connector; 402, circuit board one; 403, spring pin; 404, carrier plate; 405, through port; 406, fixing component two; 407, circuit board two. Detailed Implementation

[0019] The present application will now be described in further detail with reference to the accompanying drawings. It should be noted that the following specific embodiments are only used to further illustrate the present application and should not be construed as limiting the scope of protection of the present application. Those skilled in the art can make some non-essential improvements and adjustments to the present application based on the above application content.

[0020] Please see the appendix Figure 1-2A quick-change probe structure is provided for connecting probe arm 100 and probe assembly 200. Probe arm 100 and probe assembly 200 are conventional structures in existing flying probe electrical testing machines. For example, commonly used probe assemblies 200 include two-wire and four-wire types, which will not be described in detail here. The quick-change structure includes a fixing mechanism 300 and a docking mechanism 400. The fixing mechanism 300 is used to detachably connect probe arm 100 and probe assembly 200 so as to realize quick replacement of probe assembly 200.

[0021] The docking mechanism 400 includes a circuit board 402 on the probe arm 100, a spring pin 403 on the circuit board 402, and a circuit board 407 on the probe assembly 200 for contacting and connecting with the spring pin 403. The circuit board 407 has contacts corresponding to the spring pin 403. The circuit board 402 is connected to external equipment (such as the main control unit of a flying probe thermometer) via wires to realize test signal transmission and data interaction. The circuit board 407 is connected to electrical components (such as probes, sensors, etc.) in the probe assembly 200 via wires. Compared with the traditional method, this method eliminates the need for repeated plugging and unplugging of wires when replacing the probe assembly 200. When replacing the probe assembly 200, the spring pin 403 automatically contacts and engages with the contacts to lock the fixing mechanism 300, which ensures contact stability, greatly reduces replacement time, and avoids poor contact caused by frequent plugging and unplugging, significantly improving testing efficiency and reliability.

[0022] Please see the appendix Figure 2-5 Preferably, the probe arm 100 in this embodiment is provided with a male socket 401 for mounting the circuit board 402. The male socket 401 and the probe arm 100 can be detachably connected by a screw-like structure. The male socket 401 is L-shaped and serves as a support and mounting structure.

[0023] Preferably, the fixing mechanism 300 in this embodiment includes a connecting seat 301 disposed on the probe assembly 200. The connecting seat 301 is sleeved on the outer wall of the probe arm 100 and is detachably fixed by a fixing member 302. The outer wall of the probe arm 100 has several sets of fixing ports that cooperate with the fixing member 302. For example, the connecting seat 301 is U-shaped, and the fixing member 302 is, for example, a screw or bolt. This method facilitates the quick replacement of the probe assembly 200. At the same time, multiple sets of fixing ports can be opened and distributed along the length of the probe arm 100 to adjust the stability of the contact between the spring needle 403 and the contact point.

[0024] Preferably, in this embodiment, several sets of spring pins 403 are provided, and several sets of spring pins 403 are inserted together on a support plate 404, such as... Figure 2 As shown, there are eight sets of spring pins 403, and there are also eight sets of contacts on the corresponding circuit board 407. The spring pins 403 and the contacts correspond one-to-one.

[0025] Preferably, in this embodiment, the male connector 401 has a through-hole 405 on the side opposite to the circuit board 402. The area of ​​the through-hole 405 is smaller than the area of ​​the circuit board 402, which facilitates external devices to connect wires to the circuit board 402 through the through-hole 405.

[0026] Preferably, in this embodiment, circuit board 402 and circuit board 407 are detachably fixed to male seat 401 and probe assembly 200 by fastener 406, which is, for example, a bolt or screw.

[0027] A flying probe electrical testing machine includes a probe arm 100, a probe assembly 200, and a probe quick-change structure as described above.

[0028] The embodiments described above are merely examples of several implementations of this utility model, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of this utility model patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this utility model, and these modifications and improvements all fall within the protection scope of this utility model.

Claims

1. A probe quick change structure for connecting a probe arm (100) and a probe assembly (200), characterized in that, The quick-change structure includes a fixing mechanism (300) and a docking mechanism (400). The fixing mechanism (300) is used to detachably connect the probe arm (100) and the probe assembly (200). The docking mechanism (400) includes a first circuit board (402) on the probe arm (100), a spring pin (403) on the first circuit board (402), and a second circuit board (407) on the probe assembly (200) for contacting and connecting with the spring pin (403). The circuit board is provided with a contact point corresponding to the spring pin (403).

2. The probe quick change structure according to claim 1, wherein, The probe arm (100) is provided with a male socket (401) for mounting circuit board one (402).

3. The probe quick change structure according to claim 1, wherein, The fixing mechanism (300) includes a connecting seat (301) disposed on the probe assembly (200). The connecting seat (301) is sleeved on the outer wall of the probe arm (100) and is detachably fixed by a fixing member (302). The outer wall of the probe arm (100) has several sets of fixing ports that cooperate with the fixing member (302).

4. The probe quick change structure according to claim 1, wherein, The spring pins (403) are provided in several groups, and the several groups of spring pins (403) are inserted together on a support plate (404).

5. The probe quick change structure according to claim 2, wherein, The male seat (401) has an opening (405) on the side opposite to the circuit board (402), and the area of ​​the opening (405) is smaller than the area of ​​the circuit board (402).

6. The probe quick change structure according to claim 2, wherein, The circuit board one (402) and circuit board two (407) are respectively detachably fixed to the male seat (401) and the probe assembly (200) by the fastener two (406).

7. A flying probe tester characterized by: It includes a probe arm (100), a probe assembly (200), and a probe quick-change structure as described in any one of claims 1-6.

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