A general-purpose modular instrument probe device

The modularly designed test probe device, using an acrylic fixing plate and detachable probe modules, solves the problem of probe device fixation in existing technologies, improves the versatility and assembly efficiency of the probe modules, reduces costs, and adapts to diverse testing needs.

CN224581600UActive Publication Date: 2026-07-31JIANGXI WODEJIA OPTOELECTRONICS CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
JIANGXI WODEJIA OPTOELECTRONICS CO LTD
Filing Date
2025-07-07
Publication Date
2026-07-31

AI Technical Summary

Technical Problem

The existing test probe devices have a fixed design, which makes them incompatible with different products, resulting in high manufacturing costs, long production cycles, serious material waste, and frequent module replacements when testing requirements change, leading to low efficiency.

Method used

It adopts a modular design, including an acrylic fixing plate, probe module mounting slot, empty probe module, module assembly auxiliary connecting rod and bolt-type locking rod, to realize independent combination and stable fixation of probe modules, support single row or double row expansion, and adapt to different test density requirements.

Benefits of technology

This has improved the versatility and assembly efficiency of the probe module, reduced the cost of making new models, adapted to diverse testing needs, and improved operational efficiency.

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Abstract

This utility model relates to a universal modular testing probe device, comprising an acrylic fixing plate with a probe module mounting slot in the center. Multiple empty probe modules are arranged inside the mounting slot, each with a solder joint on its top. An auxiliary connecting rod for connecting the multiple empty probe modules in series is provided inside the mounting slot. Bolt-type locking rods are inserted into the multiple empty probe modules inside the mounting slot. An independent probe module is located at the bottom of each of the multiple empty probe modules. This universal modular testing probe device achieves high versatility by connecting independent probe modules for different products through the empty probe modules, greatly reducing the cost of manufacturing new models. Different numbers of independent probe modules can be assembled according to requirements to meet diverse testing needs.
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Description

Technical Field

[0001] This utility model relates to the field of testing equipment technology, specifically a general-purpose modular testing probe device. Background Technology

[0002] Existing testing probe devices typically employ a fixed design, with the probe directly embedded in an acrylic module and soldered to external circuitry. This design requires a custom-designed module for each testing machine, making it incompatible with different products. This results in high manufacturing costs and long lead times. Furthermore, when testing requirements change, the entire module must be remounted, leading to material waste and significantly increased costs. Finally, new product testing necessitates frequent module replacements, resulting in low operational efficiency. Therefore, this paper proposes a modular testing probe device to address these issues. Utility Model Content

[0003] To address the shortcomings of existing technologies, this utility model provides a universal modular testing probe device, which features independent probes that can be freely combined, enabling flexible configuration, accelerated assembly, and universal compatibility with multiple products. This solves the problems of fixed and non-universal probe modules in existing technologies.

[0004] To achieve the above objectives, this utility model provides the following technical solution: a general-purpose modular testing probe device, comprising an acrylic fixing plate, wherein a probe module mounting slot is provided in the middle of the acrylic fixing plate, and multiple empty probe modules are arranged inside the mounting slot. Each of the multiple empty probe modules has a circuit soldering point installed on its top. A module assembly auxiliary connecting rod for connecting the multiple empty probe modules together is provided inside the probe module mounting slot. A bolt-type locking rod inserted into the multiple empty probe modules is provided inside the probe module mounting slot. An independent probe module is provided at the bottom of each of the multiple empty probe modules.

[0005] Furthermore, the interior of the plurality of circuit solder joints is electrically connected to one end of an independent probe module inserted inside the plurality of empty probe modules.

[0006] Furthermore, the bolt-type locking rod is tightened by rotating the push module, providing stable fixation.

[0007] Furthermore, the probe module mounting slot supports single-row or double-row expansion to adapt to different test density requirements.

[0008] Furthermore, each of the multiple empty probe modules has a limiting hole and a threaded through hole on its side, through which the module assembly auxiliary connecting rod and the bolt-type locking rod can pass, and the threaded through hole is threadedly connected to the bolt-type locking rod.

[0009] Compared with the prior art, the technical solution of this application has the following beneficial effects:

[0010] 1. This general-purpose modular test probe device connects independent probe modules of different products through empty probe modules, achieving strong versatility and greatly reducing the cost of making new models. Different numbers of independent probe modules can be assembled according to requirements to meet diverse testing needs.

[0011] 2. This general-purpose modular testing probe device connects empty probe modules through module assembly auxiliary connecting rods and bolt-type locking rods, achieving the function of limiting assembly and realizing high assembly efficiency. Attached Figure Description

[0012] Figure 1 This is a schematic diagram of the structure of this utility model;

[0013] Figure 2 This is a front view schematic diagram of the structure of this utility model;

[0014] Figure 3 This is a bottom view of the structure of this utility model;

[0015] Figure 4 This is a right-side view of the structure of this utility model.

[0016] In the diagram: 1. Acrylic fixing plate; 2. Independent probe module; 3. Module assembly auxiliary connecting rod; 4. Bolt-type locking rod; 5. Empty probe module; 6. Probe module mounting slot; 7. Circuit soldering point. Detailed Implementation

[0017] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0018] Please see Figure 1-4This embodiment of a general-purpose modular testing probe device includes an acrylic fixing plate 1 as a base plate, with multiple rows of probe module mounting slots 2 on its surface, supporting single-row or double-row module expansion. A probe module mounting slot 6 is located in the middle of the acrylic fixing plate 1. Each probe is an independent unit with a cable soldering point 3 on its top, allowing for individual installation or replacement. Multiple empty probe modules 5 are installed inside the mounting slot 6 to fill positions where probes are not needed, maintaining structural integrity. Each empty probe module 5 has a wire soldering point 7 installed on its top. A module assembly auxiliary connecting rod 3 is installed inside the probe module mounting slot 6 to connect multiple empty probe modules 5 together. A bolt-type locking rod 4, inserted into the multiple empty probe modules 5, penetrates the mounting slot and is pushed inward by clockwise rotation to ensure stable fixing of each module. An independent probe module 2 is located at the bottom of each of the multiple empty probe modules 5.

[0019] In this embodiment, the interior of multiple line solder joints 7 is electrically connected to one end of an independent probe module 2 inserted inside multiple empty probe modules 5.

[0020] In this embodiment, the bolt-type locking rod 4 is tightened by rotating the push module, providing stable fixation.

[0021] In this embodiment, the probe module mounting slot 2 supports single-row or double-row expansion to adapt to different test density requirements.

[0022] In this embodiment, the sides of the multiple empty probe modules 5 are provided with limiting holes and threaded through holes through which the module assembly auxiliary connecting rod 3 and the bolt-type locking rod 4 can pass, and the threaded through holes are threadedly connected to the bolt-type locking rod 4.

[0023] The working principle of the above embodiments is as follows:

[0024] According to the testing requirements, the assembly process involves inserting an empty probe module 5 into the probe module mounting slot 6 of the acrylic fixing plate 1, then using the module assembly auxiliary connecting rod 3 to connect the modules in series to ensure alignment. At the same time, insert the bolt-type locking rod 4 and rotate it clockwise to push the module inward and tighten it to complete the fixation. Finally, solder the external circuit to the top circuit soldering point 7 of the independent probe module 6 to complete the assembly.

[0025] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0026] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A general-purpose modular testing probe device, comprising an acrylic fixing plate (1), characterized in that: The acrylic fixing plate (1) has a probe module mounting slot (6) in the middle. Multiple empty probe modules (5) are installed inside the mounting slot (6). Each of the multiple empty probe modules (5) has a wire soldering point (7) installed on its top. The probe module mounting slot (6) has a module assembly auxiliary connecting rod (3) for connecting the multiple empty probe modules (5) together. The probe module mounting slot (6) has a bolt-type locking rod (4) inserted into the multiple empty probe modules (5). Each of the multiple empty probe modules (5) has an independent probe module (2) at its bottom.

2. The universal modular testing probe device according to claim 1, characterized in that: The interior of the multiple circuit solder joints (7) is electrically connected to one end of the independent probe module (2) inserted inside the multiple empty probe modules (5).

3. The universal modular testing probe device according to claim 1, characterized in that: The bolt-type locking rod (4) is tightened by rotating the push module, providing stable fixation.

4. The universal modular testing probe device according to claim 1, characterized in that: The probe module mounting slot (6) supports single-row or double-row expansion to adapt to different test density requirements.

5. A general-purpose modular testing probe device according to claim 1, characterized in that: Each of the multiple empty probe modules (5) has a limiting hole and a threaded through hole on its side, through which the module assembly auxiliary connecting rod (3) and the bolt-type locking rod (4) can pass, and the threaded through hole is threadedly connected to the bolt-type locking rod (4).