Brackets and testing equipment
By designing a bracket with detachable support components and utilizing a first guide structure and a second guide structure, the problem of different types of solid-state drives requiring different brackets was solved, enabling the same bracket to support multiple hard drives and saving costs.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHENZHEN LONGSYS ELECTRONICS CO LTD
- Filing Date
- 2025-09-15
- Publication Date
- 2026-07-31
AI Technical Summary
In existing technologies, a tray can typically only boot one type of solid-state drive (SSD), which means that different types of SSDs require different trays, increasing costs.
Design a bracket that includes a detachable support component with a first guide structure and a second guide structure. By adjusting the installation position of the support component, it can selectively connect and cooperate with different types of solid-state drives, thereby reducing the number of brackets required.
This allows two different types of solid-state drives to be plugged into the same bracket, reducing the number of brackets and saving costs.
Smart Images
Figure CN224581891U_ABST
Abstract
Description
Technical Field
[0001] This application belongs to the field of testing equipment technology, and specifically relates to a bracket and testing equipment. Background Technology
[0002] In testing equipment, the circuit board has multiple connectors. Solid-state drives (SSDs) are inserted into these connectors to electrically connect to the testing equipment, enabling the equipment to perform open-card testing and aging tests on the SSDs. In related technologies, the SSDs are electrically connected to the circuit board connectors via a guide structure in the insertion tray. However, one tray typically guides one type of SSD into the connector; different types of SSDs require different trays, increasing the number of trays and thus raising costs. Utility Model Content
[0003] This application provides a bracket and testing equipment that can be plugged into and used with different types of solid-state drives.
[0004] One embodiment of this application provides a bracket, including a frame and a support member. The support member is detachably connected to the frame. The support member is provided with a first guide structure and a second guide structure. The first guide structure is located on a first side of the support member, and the second guide structure is located on a second side of the support member. The first side and the second side are opposite to each other. The first guide structure is configured to insert and cooperate with a first test piece, and the second guide structure is configured to insert and cooperate with a second test piece.
[0005] In the aforementioned bracket, the support component is detachable, allowing for changes in its installation position. This enables selective alignment of either the first or second guide structure with the connector. When the first guide structure aligns with the connector, it can insert and engage with the first device under test (DUT) to guide its electrical connection to the connector. Conversely, when the second guide structure aligns with the connector, it can insert and engage with the second DUT to guide its electrical connection to the connector. The first and second DUTs can be different types of solid-state drives (SSDs), allowing the same support component to engage with both types of SSDs and guide them into the connector, thus reducing the number of brackets and saving costs.
[0006] In some embodiments, the first guide structure and the second guide structure have different dimensions.
[0007] The support can selectively connect and mate with first and second test pieces of different sizes via a first guide structure or a second guide structure, allowing the same support to connect and mate with test pieces of different sizes, reducing the number of brackets and saving costs.
[0008] In some embodiments, the first guide structure includes a limiting groove having a bottom and two sidewalls. The bottom is configured to support a first test piece, and the two sidewalls abut against opposite sides of the first test piece along a first direction and guide the first test piece to move along a second direction; the second direction is perpendicular to the first direction.
[0009] When the first guide structure is inserted into the first test piece, the first test piece can be inserted between the two side walls along the second direction and moved along the second direction under the guidance of the two side walls to connect with the interface; after the first test piece is inserted into the interface, the bottom of the groove can bear the weight of the first test piece to prevent the first test piece from separating from the interface due to gravity.
[0010] In some embodiments, the second guide structure includes two slides spaced apart along a first direction, each slide having an opening, the two openings facing each other, and the opposite sides of the second test piece being able to pass through the corresponding opening and extend to the corresponding slide, the slides being configured to guide the second test piece to move along a second direction; the second direction is perpendicular to the first direction.
[0011] When the second guide structure is inserted into the test piece, the second test piece can be inserted between the two slides along the second direction. The opposite sides of the second test piece can pass through the corresponding slots and extend into the slides, and move along the second direction under the guidance of the two slides to insert into the interface. After the second test piece is inserted into the interface, the slide can bear the weight of the second test piece to prevent the second test piece from separating from the interface due to gravity.
[0012] In some embodiments, the second guide structure further includes a clearance groove disposed between two slides, the clearance groove being configured to avoid the second test piece.
[0013] When the second guide structure is inserted into the second test piece, the support member has a clearance groove to avoid interference between the upper surface of the support member and the lower surface of the second test piece, which would prevent the second test piece from being inserted into the second guide structure.
[0014] In some embodiments, both the first guide structure and the second guide structure are provided with an insertion port. The size of the insertion port gradually decreases along the first direction, which is perpendicular to the insertion direction, as the first test piece is inserted into the first guide structure or the second test piece is inserted into the second guide structure.
[0015] The device drives the test piece (first test piece / second test piece) to its corresponding insertion port, pushing it along the second direction to allow it to connect and mate with the first guide structure / second conductive structure. The two inclined planes have a relatively large time distance between their corresponding insertion ports, reducing the alignment accuracy requirements of the test piece. During the insertion of the test piece into the first guide structure / second conductive structure, the inclined planes contact and continuously guide the test piece along the second direction, ensuring smooth movement of the test piece to the first guide structure / second conductive structure.
[0016] In some embodiments, the support member has a first position or a second position relative to the frame, and the positions of the first guide structure and the second guide structure are opposite when the support member is in the first position and when it is in the second position; when the support member is in the first position, the first guide structure is configured to engage with the first test piece; when the support member is in the second position, the second guide structure is configured to engage with the second test piece.
[0017] By adjusting the installation position of the support relative to the frame, the first guide structure can be selectively engaged with the first test piece (DPT), or the second guide structure can be engaged with the second DPT, so that the support can support two types of DPTs (first DPT / second DPT).
[0018] In some embodiments, the bracket further includes fasteners; the frame body is provided with two or more first connection holes, and the support member is provided with two or more second connection holes. When the support member is in a first position or a second position, at least one first connection hole corresponds to one second connection hole; the fasteners pass through the corresponding first connection holes and second connection holes to connect the support member to the frame body.
[0019] When the first guide structure or the second guide structure corresponds to the plug-in interface, at least one first connecting hole corresponds to one second connecting hole. The first connecting hole and the second connecting hole are connected by fasteners to fix the support to the frame. By removing and installing the fasteners, the position of the support can be adjusted so that the first guide structure or the second guide structure corresponds to the plug-in interface.
[0020] In some embodiments, each support member has a plurality of first guide structures and a plurality of second guide structures on its first and second sides, respectively. The plurality of first guide structures or the plurality of second guide structures are spaced apart along a first direction, and along a third direction, each first guide structure corresponds to one second guide structure; the third direction is perpendicular to the first direction.
[0021] A support can simultaneously guide multiple devices under test (first device under test / second device under test) or multiple devices under test to be inserted into a single connector. In other words, a bracket can guide multiple devices under test to be connected to the circuit board, so that the circuit board can simultaneously test multiple devices under test.
[0022] Embodiments of this application also provide a testing device, including a circuit board and a bracket as described in any of the above embodiments. The bracket is disposed on one side of the circuit board, and the circuit board has an interface. When a first guide structure corresponds to the interface, the first guide structure is configured to be inserted into and cooperate with a first device under test (DUT), and the interface is inserted into the first DUT in the first guide structure. When a second guide structure corresponds to the interface, the second guide structure is configured to be inserted into and cooperate with a second DUT, and the interface is inserted into the second DUT in the second guide structure.
[0023] In the aforementioned testing equipment, by adjusting the installation position of the support relative to the frame, either the first guide structure or the second guide structure can be selectively aligned with the insertion interface. When the first guide structure aligns with the insertion interface, it can insert and mate with the first test piece (DPT), and the DPT within the first guide structure can be inserted into the insertion interface. Conversely, when the second guide structure aligns with the insertion interface, it can insert and mate with the second DPT, and the second DPT within the second guide structure can be inserted into the insertion interface. Therefore, one bracket can support and accommodate two types of DPTs inserted into the insertion interface, reducing the number of brackets and saving costs. Attached Figure Description
[0024] Figure 1 This is a schematic diagram of the structure of the bracket when the support member is in the first position in one embodiment of this application.
[0025] Figure 2 yes Figure 1 A schematic diagram of the structure when the support member of the middle bracket is in the second position.
[0026] Figure 3 yes Figure 1 A schematic diagram of the structure after the explosion of the central support frame.
[0027] Figure 4 yes Figure 1 A schematic diagram of the structure of the middle support component.
[0028] Figure 5 yes Figure 2 A schematic diagram of the structure of the middle support component.
[0029] Figure 6 yes Figure 4 A magnified view of a portion of point A in the middle.
[0030] Explanation of main component symbols 100, Bracket; 10, Frame; 11, First Frame; 12, Second Frame; 101, Hollowed-out Section; 102, First Connecting Hole; 20, Support Component; 21, First Guide Structure; 211, Limiting Groove; 2111, Groove Bottom; 2112, Side Wall; 212, 223, Insertion Port; 2121, 2231, Inclined Surface; 22, Second Guide Structure; 221, Slide Groove; 2211, Groove Opening; 222, Clearance Groove; 202, Second Connecting Hole; 30, Fastener; 200, Circuit Board; 2001, Plug-in Interface; 310, First Test Component; 320, Second Test Component; 3201, Adapter Plate; X, First Direction; Y, Second Direction; Z, Third Direction.
[0031] The following detailed description, in conjunction with the accompanying drawings, will further illustrate this application. Detailed Implementation
[0032] The technical solutions of the embodiments of this application will be described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments.
[0033] In the description of the embodiments of this application, the technical terms "first", "second", etc. are used only to distinguish different objects and should not be construed as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features.
[0034] In the description of the embodiments of this application, the term "perpendicular" is used to describe the ideal state between two components. In actual production or use, two components may be in a state that is approximately perpendicular. The term "parallel" is used to describe the ideal state between two components. In actual production or use, two components may be in a state that is approximately parallel.
[0035] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment that is mutually exclusive with other embodiments.
[0036] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
[0037] In testing equipment, the circuit board has multiple connectors. Solid-state drives (SSDs) are inserted into these connectors to electrically connect to the testing equipment, enabling the equipment to perform open-card testing and aging tests on the SSDs. In related technologies, the SSDs are electrically connected to the circuit board connectors via a guide structure in the insertion tray. However, one tray typically guides one type of SSD into the connector; different types of SSDs require different trays, increasing the number of trays and thus raising costs.
[0038] An embodiment of this application provides a bracket, including a frame and a support member. The support member is detachably connected to the frame. The support member is provided with a first guide structure and a second guide structure. The first guide structure is located on a first side of the support member, and the second guide structure is located on a second side of the support member. The first side and the second side are opposite to each other. The first guide structure is configured to be inserted and engaged with a first test piece, or the second guide structure is configured to be inserted and engaged with a second test piece.
[0039] In the aforementioned bracket, the first guide structure and the second guide structure have different dimensions, allowing the support member to be inserted and mated with test pieces of different sizes through the first guide structure or the second guide structure. In this way, the same support member can be inserted and mated with different types of test pieces, that is, one bracket can be inserted and mated with two types of test pieces, reducing the number of brackets and saving costs.
[0040] The embodiments of this application will be further described below with reference to the accompanying drawings. Unless otherwise specified, the various embodiments in this application can be combined with each other.
[0041] Please see Figure 1 and Figure 2 Let the first direction, the second direction, and the third direction be defined as perpendicular to each other. The first direction is the direction parallel to the X direction in the diagram, the second direction is the direction parallel to the Y direction in the diagram, and the third direction is the direction parallel to the Z direction in the diagram.
[0042] For ease of reference to the diagrams, the first direction will be referred to as "first direction X" in the following text, the second direction as "second direction Y" and the third direction as "third direction Z".
[0043] An embodiment of this application provides a testing device (not shown), including a circuit board 200 and a bracket 100. The circuit board 200 is provided with an interface 2001, and the bracket 100 is configured to guide the device under test (DUT) to be inserted into the interface 2001, so that the circuit board 200 is electrically connected to the DUT for card opening test and aging test.
[0044] In some embodiments, the device under test (DUT) includes a first DUT 310 and a second DUT 320. The first DUT 310 and the second DUT 320 can be of the same type or different types. The first DUT 310 and the second DUT 320 can be of the same size or different sizes. In the illustrated embodiment, the DUT is a solid-state drive (SSD), and the first DUT 310 and the second DUT 320 are different models of SSDs, and the sizes of the first DUT 310 and the second DUT 320 are different. Specifically, the width dimension of the first guide structure 21 along the first direction X and the depth dimension along the third direction Z are different.
[0045] Please combine Figure 1 and Figure 2 In some embodiments, the bracket 100 includes a frame 10 and a support member 20. The frame 10 is mounted on the front side of the circuit board 200, and the support member 20 is detachably connected to the front side of the frame 10. The support member 20 is provided with a first guide structure 21 and a second guide structure 22. The first guide structure 21 is provided on a first side of the support member 20, and the second guide structure 22 is provided on a second side of the support member 20. The first side and the second side are arranged vertically and backward along a third direction Z.
[0046] The support member 20 has two mounting positions relative to the frame 10, namely a first position and a second position. When the support member 20 is in the first position, the positions of the first guide structure 21 and the second guide structure 22 are opposite to those when it is in the second position. By adjusting the mounting position of the support member 20, either the first guide structure 21 or the second guide structure 22 can be selectively aligned with the insertion interface 2001.
[0047] Please see Figure 1 When the support member 20 is in the first position relative to the frame 10, the first guide structure 21 located on the first side of the support member 20 faces upward, and the first guide structure 21 corresponds to the insertion interface 2001. At this time, the first guide structure 21 is configured to engage with the first test piece 310 to guide the first test piece 310 into the insertion interface 2001.
[0048] Please see Figure 2 When the support member 20 is in the second position relative to the frame 10, the second guide structure 22 located on the second side of the support member 20 faces upward, and the second guide structure 22 corresponds to the insertion interface 2001. At this time, the second guide structure 22 is configured to engage with the second test piece 320 to guide the second test piece 320 into the insertion interface 2001.
[0049] Therefore, by adjusting the installation position of the support member 20, the same support member 20 can support and cooperate with two types of test devices (first test device 310 and second test device 320) to be inserted into the interface 2001, so that one bracket 100 can support the insertion of two types of test devices into the interface 2001, that is, one bracket 100 can support the insertion and cooperation of different types of solid-state drives and guide the two types of solid-state drives into the interface 2001, thereby reducing the number of brackets 100 and saving costs.
[0050] Please see Figure 3 In some implementations, the frame 10 has a cutout 101. The frame 10 is fixedly installed on the testing equipment. The cutout 101 corresponds to the circuit board 200 and is used to expose the circuit board 200, allowing the first test piece 310 or the second test piece 320 to pass through the cutout 101 and be inserted into the connector 2001 of the circuit board 200. The cutout 101 corresponds to the circuit board 200, enabling the circuit board 200 to position the frame 10 in the correct installation position.
[0051] In some implementations, the outer contour of the circuit board 200 is rectangular, and the cutout portion 101 is a rectangular through hole to fit the circuit board 200.
[0052] In some implementations, the frame 10 includes two first side frames 11 and two second side frames 12. The two first side frames 11 are spaced apart along a first direction X, and the two second side frames 12 are spaced apart along a third direction Z. The two second side frames 12 are fixedly disposed between the two first side frames 11, so that the two first side frames 11 and the two second side frames 12 form a frame 10 with a rectangular through hole. The rectangular through hole corresponds to the circuit board 200, that is, the frame 10 surrounds the outside of the circuit board 200, thereby positioning the installation position of the frame 10 through the circuit board 200.
[0053] In some implementations, the bracket 100 also includes fasteners 30. The first frame 11 has two or more first connecting holes 102, and the support member 20 has two or more second connecting holes 201. The fasteners 30 pass through the corresponding first connecting holes 102 and second connecting holes 201 to connect the support member 20 to the frame 10.
[0054] Please combine Figures 1 to 3 When the support member 20 is in the first position and the second position, at least one first connecting hole 102 corresponds to one second connecting hole 201. In this way, by removing and installing the fastener 30, the installation position of the support member 20 relative to the frame 10 can be adjusted, so that the support member 20 can be switched between the first position and the second position, thereby selectively making the first guide structure 21 or the second guide structure 22 correspond to the insertion interface 2001.
[0055] In some embodiments, along the first direction X, the two ends of the support member 20 are respectively provided with two or more second connecting holes 201. The two ends of the support member 20 are respectively connected to the frame 10 by fasteners 30, so that the connection between the support member 20 and the frame 10 is firm.
[0056] Please see Figure 1 In some embodiments, the support member 20 has two second connection holes 201 at each end. When the support member 20 is in the first position, each first connection hole 102 corresponds to a second connection hole 201, and the support member 20 can be connected to the frame 10 by four fasteners 30.
[0057] Please see Figure 2 When the support member 20 is in the second position, each end of the support member 20 has a first connecting hole 102 corresponding to a second connecting hole 201. At this time, the support member 20 can be connected to the frame 10 by two fasteners 30.
[0058] In some embodiments, the fastener 30 is a bolt, thread, or screw.
[0059] Please see Figures 3 to 5 In some embodiments, along the third direction Z, each support member 20 has a plurality of first guide structures 21 and a plurality of second guide structures 22 on its first and second sides. The plurality of first guide structures 21 are spaced apart along the first direction X on the first side of the support member 20, and the plurality of second guide structures 22 are spaced apart along the first direction X on the second side of the support member 20. Each first guide structure 21 guides a first test piece 310 to be inserted into the interface 2001 along the second direction Y, and each second guide structure 22 guides a second test piece 320 to be inserted into the interface 2001 along the second direction Y. Along the third direction Z, each first guide structure 21 corresponds to one second guide structure 22.
[0060] In the two installation positions of the support member 20 (first position and second position), the position of the support member 20 in the first direction X remains unchanged; the position of the first connecting hole 102 is located by the second connecting hole 201 to locate the installation position of the support member 20, and the assembly and disassembly of the support member 20 and the frame 10 are convenient and quick.
[0061] Please see Figure 3 In some embodiments, the bracket 100 includes a plurality of support members 20, which are spaced apart along the third direction Z on the frame 10.
[0062] A bracket 100 can guide multiple first test devices 310 or multiple second test devices 320 to be plugged into the circuit board 200, so that the testing equipment can simultaneously test multiple first test devices 310 or multiple second test devices 320.
[0063] Please combine Figure 4 and Figure 6 In some embodiments, the first guide structure 21 includes a limiting groove 211, which has a bottom 2111 and two sidewalls 2112. The bottom 2111 is configured to support a first test piece 310, and the two sidewalls 2112 abut against opposite sides of the first test piece 310 along a first direction X, guiding the first test piece 310 to move along a second direction Y to insert into the connector 2001. When the first test piece 310 is inserted into the connector 2001, the bottom 2111 can support the weight of the first test piece 310 to prevent the first test piece 310 from separating from the connector 2001 or damaging the connector 2001 due to gravity.
[0064] The first guide structure 21 is provided with an insertion port 212, which includes two inclined surfaces 2121. The insertion port 212 is inserted into the first guide structure 21 along the insertion direction (second direction Y) of the first test piece 310. The distance between the two inclined surfaces 2121 along the first direction X gradually decreases. When the support member 20 is in the first position, the two inclined surfaces 2121 in the first guide structure 21 are respectively provided at the end of each side wall 2112 away from the frame 10.
[0065] When the support member 20 is in the first position, the first guide structure 21 corresponds to the insertion interface 2001. Hold the first test piece 310 and drive the first test piece 310 to correspond to the insertion port 212 of the first guide structure 21. Push the first test piece 310 along the second direction Y so that the first test piece 310 is inserted between the two side walls 2112 and inserted into the insertion interface 2001 under the guidance of the two side walls 2112.
[0066] The two inclined surfaces 2121 have a large time interval between the corresponding insertion ports 212 of the first test piece 310, which can reduce the alignment accuracy requirements of the first test piece 310; during the process of inserting the first test piece 310 into the two side walls 2112, the inclined surfaces 2121 contact and continuously guide the first test piece 310 to move along the second direction Y, so that the first test piece 310 can move smoothly between the two side walls 2112.
[0067] Please combine Figure 5 and Figure 6In some embodiments, the second guide structure 22 includes two grooves 221 spaced apart along a first direction X. Each groove 221 has an opening 2211, and the two openings 2211 are arranged facing each other. The opposite sides of the second test piece 320 can pass through the corresponding opening 2211 and extend into the corresponding groove 221. The groove 221 is configured to guide the second test piece 320 into the connector 2001 along the second direction Y. When the second test piece 320 is inserted into the connector 2001, the groove 221 can bear the weight of the second test piece 320 to prevent the second test piece 320 from separating from the connector 2001 due to gravity or damaging the connector 2001.
[0068] In some embodiments, the second guide structure 22 is also provided with an insertion port 223. The second test piece 320 is inserted into the second guide structure 22 along the insertion direction (second direction Y). The distance between the two inclined surfaces 2231 of the insertion port 223 of the second guide structure 22 gradually decreases along the first direction X. When the support member 20 is in the second position, the two inclined surfaces 2231 in the second guide structure 22 are respectively provided at one end of each slide groove 221 away from the frame 10.
[0069] When the support member 20 is in the second position, the second guide structure 22 corresponds to the insertion interface 2001. Hold the second test piece 320 and drive the second test piece 320 to correspond to the insertion port 223 of the second guide structure 22. Push the second test piece 320 along the second direction Y so that the second test piece 320 is inserted between the two slides 221 and inserted into the insertion interface 2001 under the guidance of the two slides 221.
[0070] The two inclined surfaces 2231 have a large time interval between the corresponding insertion ports 223 of the second test piece 320, which can reduce the alignment accuracy requirements of the second test piece 320; during the process of the second test piece 320 being inserted into the two sliding grooves 221, the inclined surfaces 2231 contact and continuously guide the second test piece 320 to move along the second direction Y, so that the second test piece 320 can move smoothly between the two sliding grooves 221.
[0071] In some embodiments, insertion ports 212 (223) are provided at both ends of the first guide structure 21 and the second guide structure 22 in the second direction Y. In the first guide structure 21 or the second guide structure 22, the insertion ports 212 (223) at both ends are symmetrically arranged.
[0072] In some embodiments, the second guide structure 22 further includes a clearance groove 222, which is disposed between two slide grooves 221 and is configured to avoid the second test piece 320.
[0073] A clearance groove 222 is formed on the support member 20, and the clearance groove 222 is a rectangular groove. When the second test piece 320 is inserted into the interface 2001, the clearance groove 222 on the support member 20 can avoid the second test piece 320, so as to prevent the upper surface of the support member 20 from interfering with the lower surface of the second test piece 320, which would prevent the second test piece 320 from being inserted into the interface 2001.
[0074] Please see Figure 1 In some embodiments, when the first test piece 310 is plugged into the interface 2001, the interface 2001 is inserted into the interface of the first test piece 310, and the bottom of the slot 2111 can directly contact the lower surface of the first test piece 310 without interfering with the connection between the first test piece 310 and the interface 2001.
[0075] Please see Figure 2 In some embodiments, in the second device under test 320, the solid-state drive is electrically connected to an adapter plate 3201. The adapter plate 3201 is inserted along the second direction Y between two slides 221 and, guided by the two slides 221, is inserted into the connector 2001, so that the circuit board 200 is electrically connected to the solid-state drive through the adapter plate 3201. When the adapter plate 3201 is inserted into the connector 2001, the connector 2001 is inserted into the interface of the adapter plate 3201, and the bottom of the slide 221 contacts and supports the lower surface of the adapter plate 3201.
[0076] Along the third direction Z, the interface of the adapter plate 3201 protrudes from the upper and lower surfaces of the adapter plate 3201. Therefore, a clearance groove 222 is provided to prevent the lower surface of the interface from interfering with the support member 20.
[0077] Furthermore, those skilled in the art should recognize that the above embodiments are merely illustrative of this application and are not intended to limit this application. Any appropriate changes and variations made to the above embodiments within the essential spirit and scope of this application fall within the scope of this application's disclosure.
Claims
1. A bracket, characterized in that: include: Frame; A support member is detachably connected to the frame. The support member has a first guide structure and a second guide structure. The first guide structure is located on a first side of the support member, and the second guide structure is located on a second side of the support member. The first side and the second side are opposite to each other. The first guide structure is configured to be inserted into a first test piece, or the second guide structure is configured to be inserted into a second test piece.
2. The bracket as described in claim 1, characterized in that: The first guide structure and the second guide structure have different dimensions.
3. The bracket as described in claim 1, characterized in that: The first guide structure includes a limiting groove, the limiting groove having a bottom and two sidewalls, the bottom being configured to support the first test piece, the two sidewalls abutting against opposite sides of the first test piece along a first direction and guiding the first test piece to move along a second direction; the second direction is perpendicular to the first direction.
4. The bracket as described in claim 1, characterized in that: The second guide structure includes two slides spaced apart along a first direction, each slide having an opening, the two openings facing each other, and the opposite sides of the second test piece being able to pass through the corresponding openings and extend into the slides, the slides being configured to guide the second test piece to move along a second direction; the second direction is perpendicular to the first direction.
5. The bracket as described in claim 4, characterized in that: The second guide structure also includes a clearance groove, which is disposed between the two slide grooves and is configured to avoid the second test piece.
6. The bracket as described in any one of claims 1 to 5, characterized in that: Both the first guide structure and the second guide structure are provided with an insertion port. The insertion port includes two inclined surfaces. The insertion direction of the first test piece into the first guide structure or the insertion direction of the second test piece into the second guide structure is such that the distance between the two inclined surfaces gradually decreases along a first direction, which is perpendicular to the insertion direction.
7. The bracket as described in any one of claims 1 to 5, characterized in that: The support member has a first position or a second position relative to the frame, and when the support member is in the first position, the positions of the first guide structure and the second guide structure are opposite to those when the support member is in the second position. When the support is in the first position, the first guide structure is configured to engage with the first test piece; when the support is in the second position, the second guide structure is configured to engage with the second test piece.
8. The bracket as described in claim 7, characterized in that: The bracket also includes fasteners; the frame is provided with two or more first connecting holes, and the support member is provided with two or more second connecting holes. When the support member is located in the first position or the second position, at least one first connecting hole corresponds to one second connecting hole; the fasteners pass through the corresponding first connecting holes and second connecting holes, so that the support member is connected to the frame.
9. The bracket as described in claim 1, characterized in that: Each of the support members has a plurality of first guide structures and a plurality of second guide structures on its first and second sides, respectively. The plurality of first guide structures or the plurality of second guide structures are spaced apart along a first direction. Along a third direction, each first guide structure corresponds to one second guide structure. The third direction is perpendicular to the first direction.
10. A testing device, characterized in that, The device includes a circuit board and a bracket as described in any one of claims 1 to 9, the bracket being disposed on one side of the circuit board, the circuit board having a connector, wherein when the first guide structure corresponds to the connector, the first guide structure is configured to engage with the first device under test (DUT), and the connector engages with the first DUT in the first guide structure; when the second guide structure corresponds to the connector, the second guide structure is configured to engage with the second DUT, and the connector engages with the second DUT in the second guide structure.