An SSD testing device

Abstract

This invention provides an SSD testing device for testing storage disks, including a testing frame, a testing backplate, and guide plates. The testing backplate is detachably connected to the testing frame. The testing frame includes an upper cover assembly, a lower cover, and side plates respectively connected to both ends of the lower cover. The upper cover assembly and the lower cover are arranged opposite to each other, forming a receiving cavity for inserting the storage disk. The guide plates are respectively disposed on the upper cover assembly and the lower cover. The guide plates are provided with a plurality of first guide portions and a plurality of second guide portions, which are spaced apart. This invention solves the technical problem that existing testing devices cannot be compatible with storage disks of different physical sizes.

Description

Technical Field

[0001] This utility model relates to the field of hard disk mounting technology, and more specifically to an SSD testing device. Background Technology

[0002] In the field of solid-state storage device testing, traditional testing equipment suffers from significant physical compatibility limitations. Due to the single, fixed-size guide structure, each guide slot can only accommodate storage disks of a specific shape and size. When testing storage disks of different shapes (such as U.2 and E3.S), independent guide structures and dedicated test frames must be configured for each size. This leads to redundant equipment investment, resulting in idle resources and increased costs. A more prominent problem is that the guide structure forms a rigid connection with the backplane interface; when switching storage disk shapes, operators must replace the entire test platform, making localized modifications impossible to achieve compatibility. This limitation of mechanical design significantly increases test preparation time and restricts the effective utilization of test resources. Utility Model Content

[0003] The purpose of this invention is to overcome the shortcomings of the prior art and provide an SSD testing device, which aims to solve the technical problem that the existing testing devices cannot be compatible with storage disks of different physical sizes.

[0004] To achieve the above objectives, the present invention adopts the following technical solution:

[0005] An SSD testing device for testing storage disks includes a testing frame, a testing backplate, and guide plates. The testing backplate is detachably connected to the testing frame. The testing frame includes an upper cover assembly, a lower cover body, and side plates respectively connected to both ends of the lower cover body. The upper cover assembly and the lower cover body are arranged opposite to each other, and the upper cover assembly, the lower cover body, and the side plates form a receiving cavity for inserting the storage disk. The guide plates are respectively disposed on the upper cover assembly and the lower cover body. The guide plates are provided with a plurality of first guide portions and a plurality of second guide portions, and the first guide portions and the second guide portions are spaced apart.

[0006] In one embodiment, the first guide portion is recessed in the guide plate to form a first guide groove with a bottom wall lower than the upper surface of the guide plate. The width of the first guide groove is equal to the width of the storage disk, and there is a gap between two adjacent first guide grooves.

[0007] In one embodiment, the second guide portion is disposed on the interval segment to form a guide post higher than the upper surface of the guide plate, and a connecting groove is respectively provided on both ends of the storage disk near the upper cover assembly and the lower cover body, the width of the connecting groove being equal to the width of the guide post.

[0008] In one embodiment, the second guide portion is recessed on the interval segment to form a second guide groove with a bottom wall lower than the upper surface of the interval segment. The width of the second guide groove is equal to the width of the storage disk, and the bottom wall of the second guide groove is higher than the bottom wall of the first guide groove.

[0009] In one embodiment, the top cover assembly is detachably connected to the side panel.

[0010] In one embodiment, the upper cover assembly includes an upper cover body and an upper fixing block, the guide plate is disposed on the side of the upper cover body near the lower cover body, and the upper fixing block is disposed at the tail end of the guide plate.

[0011] In one embodiment, the guide plate is disposed on the side of the lower cover near the lower cover, and the test back plate is detachably connected to the tail end of the guide plate.

[0012] In one embodiment, one end of the test backplate is snapped onto the upper fixing block, and the other end of the test backplate is screwed onto the guide plate.

[0013] In one embodiment, the test backplane includes a board body and a disk connector, the disk connector being adapted to the connector of the storage disk.

[0014] In one embodiment, the test backplane has a firmware layer, and a software compatibility system is integrated within the firmware layer.

[0015] The advantages of this invention compared to existing technologies are as follows: Through innovative mechanical structure design, physical compatibility with two different sized storage disks is achieved. The test frame consists of a standardized receiving cavity formed by an upper cover assembly, a lower cover, and two side plates, providing a unified carrying space for dual-form storage disks. Several first and second guide sections are spaced apart on the guide plate; these fixed-size guide structures precisely adapt to the outlines of the two types of storage disks. The first guide section provides precise guidance for the first type of storage disk, while the second guide section establishes a positioning reference for the other type, eliminating the risk of insertion / removal interference at the physical structure level. The modular connection mechanism between the detachable test backplate and the test frame allows for test form switching simply by replacing the test backplate with the corresponding interface. The pre-installed dual guide sections on the guide plate automatically match the physical position of the test backplate interface, ensuring precise docking of the storage disk pins with the backplate contacts. This synergistic effect of the purely mechanical structure allows the same test frame to adapt to different storage disk forms without modification, effectively avoiding redundant equipment investment.

[0016] The above description is only an overview of the technical solution of this utility model. In order to better understand the technical means of this utility model, it can be implemented according to the contents of the specification. In order to make the above and other objects, features and advantages of this utility model more obvious and easy to understand, the following are preferred embodiments, which are described in detail below. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of the structure of an SSD testing device provided by this utility model;

[0018] Figure 2 A schematic diagram of the planar structure of an SSD testing device provided by this utility model;

[0019] Figure 3 A partial structural schematic diagram of an SSD testing device provided by this utility model;

[0020] Figure 4 A partial structural diagram of an SSD testing device provided by this utility model;

[0021] Figure 5 A connection diagram of an embodiment of the SSD testing device provided by this utility model;

[0022] Figure 6 This is a connection diagram of another embodiment of the SSD testing device provided by this utility model.

[0023] Figure Labels

[0024] 1. Test frame; 11. Top cover assembly; 111. Top cover body; 112. Upper fixing block; 113. Vertical wing plate; 1131. Positioning slot; 12. Lower cover body; 13. Side plate; 2. Test back plate; 21. Plate body; 22. Disk insertion interface; 3. Guide plate; 31. First guide section; 32. Second guide section; 33. Spacing section; 34. Stepped section; 4. Storage disk. Detailed Implementation

[0025] To make the objectives, technical solutions, and advantages of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0026] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present utility model.

[0027] It should be understood that, when used in this specification and the appended claims, the terms "comprising" and "including" indicate the presence of the described features, integrals, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components and / or collections thereof.

[0028] It should also be understood that the terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the scope of the invention. As used in this specification and the appended claims, the singular forms “a,” “an,” and “the” are intended to include the plural forms unless the context clearly indicates otherwise.

[0029] It should also be further understood that the term "and / or" as used in this specification and the appended claims refers to any combination of one or more of the associated listed items and all possible combinations, and includes such combinations.

[0030] See Figures 1 to 6 As shown in the figure, an SSD testing device according to an embodiment of the present invention is used to test a storage disk 4. It includes a testing frame 1, a testing backplate 2, and a guide plate 3. The testing backplate 2 is detachably connected to the testing frame 1. The testing frame 1 includes an upper cover assembly 11, a lower cover body 12, and side plates 13 respectively disposed at both ends of the lower cover body 12. The upper cover assembly 11 and the lower cover body 12 are arranged opposite to each other. The upper cover assembly 11, the lower cover body 12, and the side plates 13 form a receiving cavity for inserting the storage disk 4. The guide plate 3 is respectively disposed on the upper cover assembly 11 and the lower cover body 12. The guide plate 3 is provided with a plurality of first guide portions 31 and a plurality of second guide portions 32, and the first guide portions 31 and the second guide portions 32 are spaced apart.

[0031] Specifically, the SSD testing device in this embodiment mainly consists of a testing frame 1, a testing backplate 2, and guide plates 3 as its core components. The testing frame 1 includes an upper cover assembly 11, a lower cover 12, and side plates 13 precisely positioned at both ends of the lower cover 12. These three components are mechanically assembled to form a standardized cavity for accommodating the storage disk 4. It is understood that the upper cover assembly 11 and the lower cover 12 are arranged in a parallel, opposing layout, with the side plates 13 perpendicularly connecting their edges, together forming a physically fixed insertion and accommodating cavity. The guide plates 3 are integrated into the inner working surfaces of the upper cover assembly 11 and the lower cover 12, respectively. Several first guide portions 31 and second guide portions 32 are provided on their surfaces, and the first guide portions 31 and second guide portions 32 are arranged at spatial intervals to form independent guide paths. The testing backplate 2 forms a modular assembly relationship with the main frame of the testing frame 1 through a detachable connection mechanism, enabling rapid disassembly and replacement.

[0032] By using a standardized housing to uniformly accommodate storage disks 4 of different sizes, the problem of requiring a separate frame in traditional testing devices is solved. The spaced-apart first guide section 31 and second guide section 32 form physically isolated guide channels, precisely adapting to the outlines of the two different storage disks 4, eliminating the risk of insertion / removal interference caused by size differences. The detachable nature of the test backplate 2 makes it an independent functional module; only the test backplate 2 needs to be replaced to switch interface types, without modifying the guide structure or the main frame, significantly improving the reuse efficiency of test resources.

[0033] During operation, when the first type of storage disk 4 is inserted, the first guide part 31 of the guide plate 3 automatically guides it to move along a preset path until the disk is fully inserted into the receiving cavity and forms stable contact with the interface of the test backplate 2. When the second type of storage disk 4 needs to be tested, the operator first removes the original test backplate 2 and replaces it with a test backplate 2 adapted to the new interface. The second guide part 32 immediately takes effect, guiding the new storage disk 4 to be precisely inserted along a dedicated path. Throughout the process, the receiving cavity provides a unified support reference, and the dual guide parts ensure the physical positional stability of disks of different sizes.

[0034] In one embodiment, the first guide portion 31 is recessed in the guide plate 3 to form a first guide groove with a bottom wall lower than the upper surface of the guide plate 3. The width of the first guide groove is equal to the width of the storage disk 4, and there is a gap 33 between two adjacent first guide grooves.

[0035] Specifically, the first guide section 31 is manifested as a groove structure recessed on the surface of the guide plate 3, forming a first guide groove with a bottom wall significantly lower than the upper surface of the guide plate 3. The width of this guide groove is exactly equal to the physical width of the target storage disk 4, ensuring a zero-clearance fit between the side of the disk and the groove wall. A specific width interval 33 is maintained between two adjacent first guide grooves, and this interval 33 serves as an independent functional area to provide an installation base for the second guide section 32.

[0036] The grooved design achieves precise positioning of the storage disk 4 through three-dimensional spatial constraints: the groove width equals the disk width to eliminate horizontal displacement, the recessed bottom wall provides a vertical bearing reference, and the space reserved by the interval section 33 ensures that the dual guide systems do not interfere with each other. This structure fundamentally avoids offset or shaking during the insertion of the storage disk 4, and is particularly suitable for the stability requirements of high-speed testing scenarios. When the storage disk 4 is inserted, the two edges of the disk body are embedded in the first guide groove, and the groove wall continuously applies lateral constraint force to prevent horizontal displacement. After the bottom surface of the storage disk 4 contacts the bottom wall of the guide groove, it forms vertical support, limiting the sinking range.

[0037] In one embodiment, the second guide portion 32 is disposed on the interval section 33 to form a guide post higher than the upper surface of the guide plate 3. The storage disk 4 is provided with a connecting groove at each end near the upper cover assembly 11 and the lower cover body 12. The width of the connecting groove is equal to the width of the guide post.

[0038] Specifically, the second guide section 32 is a protruding structure provided on the interval section 33, forming a columnar guide body higher than the upper surface of the guide plate 3. The diameter of this guide column is perfectly matched with the width of the pre-set connecting grooves at both ends of the storage disk 4. Rectangular connecting grooves with matching depth are machined on the end faces of the storage disk 4 near the upper cover assembly 11 and the lower cover 12, and the inner cavity width is equal to the outer diameter of the guide column.

[0039] The guide post and the connecting groove form a plug-in mechanical fit, eliminating the horizontal rotational degree of freedom of the storage disk 4 through vertical through-hole constraint. The protruding design achieves physical isolation of the dual guide system within a limited space. The concave structure of the first guide groove and the protruding structure of the second guide part 32 form a complementary height difference, making the insertion and removal paths of the two types of storage disks 4 completely independent.

[0040] When the second type of storage disk 4 is inserted, the connecting slots at both ends of the disk body fit into the guide post from top to bottom, and the post body penetrates the slot cavity to form a circumferential constraint. During this process, the sidewall of the guide post continuously provides radial limiting force to prevent the disk body from deflecting under the test vibration environment.

[0041] In one embodiment, the second guide portion 32 is recessed on the interval segment 33 to form a second guide groove with a bottom wall lower than the upper surface of the interval segment 33. The width of the second guide groove is equal to the width of the storage disk 4, and the bottom wall of the second guide groove is higher than the bottom wall of the first guide groove.

[0042] Specifically, in this embodiment, the second guide portion 32 is machined into a recessed groove on the surface of the interval section 33, forming a second guide groove with its bottom wall lower than the upper surface of the interval section 33. In this embodiment, the width of the second guide groove is strictly consistent with the width of the target storage disk 4, and its bottom wall depth is designed as a shallow structure, with its overall height higher than the bottom wall position of the adjacent first guide groove, forming a stepped depth difference. The deep first guide groove supports the thicker storage disk 4, while the shallow second guide groove is adapted to the thinner storage disk 4.

[0043] When the thin storage disk 4 is inserted, the bottom surface of the disk contacts the shallow bottom wall of the second guide groove, and the groove wall provides horizontal constraint. When the thick storage disk 4 is inserted, the thick storage disk 4 is completely submerged in the depth of the first guide groove, and the height of the groove edge precisely limits its vertical displacement. The difference in test height between the two types of storage disks 4 is automatically adapted through the stepped depth, without the need for manual adjustment.

[0044] In one embodiment, the top cover assembly 11 is detachably connected to the side panel 13.

[0045] Specifically, the top cover assembly 11 is detachably connected to the top of the two side plates 13 via a standardized bolt mechanism. Bolt holes are evenly distributed along the upper edge of the side plates 13, and corresponding through-threaded holes are provided on the top cover assembly 11, enabling both rigid fixing and quick disassembly. This modular connection design solves the maintenance challenges of traditional integrated frames. Bolt fixing provides sufficient structural strength, and disassembly directly exposes the operating areas of the guide plate 3 and the test backplate 2, significantly improving device maintenance efficiency to meet the needs of testing scenarios requiring frequent backplate replacements.

[0046] In one embodiment, the upper cover assembly 11 includes an upper cover body 111 and an upper fixing block 112, the guide plate 3 is disposed on the surface of the upper cover body 111 near the lower cover body 12, and the upper fixing block 112 is disposed at the tail end of the guide plate 3.

[0047] Specifically, in this embodiment, the upper cover assembly 11 consists of two main parts: an upper cover body 111 and an upper fixing block 112. The upper cover body 111 is formed by sheet metal stamping to create a rectangular support substrate. The guide plate 3 is vertically fixed to the bottom surface of the upper cover body 111 near the lower cover body 12 by countersunk bolts, with the bolt heads completely recessed below the surface of the guide plate 3. The upper fixing block 112 is fixed to the tail end of the guide plate 3 (i.e., after the storage disk 4 is introduced into the receiving cavity along the guide plate 3, it can be directly connected to the test back plate 2). A rectangular positioning slot 1131 is machined on the vertical wing plate 113 of the upper fixing block 112. The upper cover body 111 provides a rigid support base, the guide plate 3 carries the positioning function of the storage disk 4, and the upper fixing block 112 is dedicated to anchoring the test back plate 2. The external layout of the upper fixing block 112 avoids interference with the working area of ​​the guide plate 3, and the welding process ensures structural stability under extreme vibration. When installing guide plate 3, pass the bolts through the pre-drilled holes in guide plate 3 and screw them into the threaded holes of upper cover assembly 11 to the specified torque value. Disassembly can be performed by reversing the operation to expose the back panel replacement area.

[0048] In one embodiment, the guide plate 3 is disposed on one side of the lower cover 12 near the lower cover 12, and the test back plate 2 is detachably connected to the tail end of the guide plate 3.

[0049] Specifically, the lower cover 12 includes a lower cover 12 and a lower fixing block. The lower cover 12 is made of sheet metal of the same specifications as the upper cover 111, forming a symmetrical load-bearing base. It can be understood that the test back plate 2 is fixedly connected to the tail end of the guide plate 3 by bolts, reducing the gap between the test back plate 2 and the guide plate 3, and the storage disk 4 can be quickly connected to the test back plate 2 after passing through the guide plate 3. The lower cover 12 and the upper cover 111 jointly bear the test load, and the two guide plates 3 form a closed-loop positioning system. It can be understood that in this embodiment, the guide plate 3 on the lower cover 12 has a stepped portion 34 on the side near the test back plate 2. The width of the stepped portion 34 is the same as the width of the vertical wing plate 113 of the upper fixing block 112, so that the test back plate 2 is accurately aligned vertically.

[0050] In one embodiment, one end of the test back plate 2 is snapped onto the upper fixing block, and the other end of the test back plate 2 is screwed onto the guide plate 3.

[0051] Specifically, the upper end of the test backplate 2 is sized to match the positioning slot 1131 of the upper fixing block 112, and the lower end is detachably connected to the side of the guide plate 3 near the test backplate 2 via bolts. In this embodiment, the lower end of the test backplate 2 is connected to the stepped portion 34 of the guide plate 3. During installation, the lower end of the test backplate 2 is first bolted to the stepped portion 34 of the guide plate 3 on the lower cover 12. Then, the upper cover 111 is pressed down to lock the positioning slot 1131 of the upper fixing block 112 into place with the upper end of the storage disk 4, forming a three-point mechanical lock. The fixed connection between the positioning slot 1131 of the upper fixing block 112 and the lower bolt restricts the horizontal movement of the test backplate 2 and provides vertical constraint. The size matching design of the positioning groove and the width of the storage disk 4 enables self-guided alignment and simplifies the disassembly and installation steps of the test backplate 2.

[0052] In one embodiment, the test backplane 2 includes a board body 21 and a disk insertion interface 22, the disk insertion interface 22 being adapted to the connector of the storage disk 4.

[0053] Specifically, the test backplane 2 is manufactured as an integral functional module. Different test backplanes 2 are independently developed for different storage disk 4 forms. The disk insertion interface 22 is welded to the board body 21 to ensure the integrity of high-speed signals. The same board body 21 size allows the test backplane 2 to still form spatial coordination with the guide plate 3, the upper cover assembly 11 and the lower cover 12 after replacement, ensuring accurate pin docking of the storage disk 4.

[0054] It is understood that, in this embodiment, U.2 storage disk 4 and E3.S storage disk 4 are preferably selected as the test objects of the test device in this embodiment.

[0055] Further, see Figure 5As shown, the U.2 storage disk 4 adopts a rectangular package with right-angled planes on both sides of the disk body. There is no auxiliary positioning structure. The width of the first guide groove in the guide plate 3 precisely matches the width of the disk body, forming a zero-clearance fit. The bottom wall of the guide groove bears the weight of the storage disk 4 and limits the sinking depth.

[0056] During testing, upon insertion, the two side edges of the U.2 storage disk 4 are embedded into the first guide groove of the guide plate 3. The disk body of the U.2 storage disk 4 slides into the bottom of the receiving cavity along the first guide groove, and its gold fingers fall into the corresponding disk insertion interface 22 of the test back plate 2. The groove wall of the first guide groove continuously applies lateral and vertical constraint forces to eliminate the risk of horizontal and vertical offset. When the disk body of the U.2 storage disk 4 and the interface terminal of the test back plate 2 reach a fully engaged state, the mechanical limit triggers a feedback sound.

[0057] Further, see Figure 6 As shown, the E3.S storage disk 4 adopts a rectangular package, with rectangular connecting slots at both ends of the disk body whose width is smaller than the thickness of the E3.S storage disk 4. The guide post on the guide plate 3 is sized to match the rectangular connecting slot, and the height of the guide post matches the depth of the rectangular connecting slot. The rectangular connecting slot is inserted into the guide post from the end away from the test back plate 2, and the post penetrates the cavity of the rectangular connecting slot to form a circumferential constraint. The tight fit between the side wall of the guide post and the wall of the rectangular connecting slot eliminates the degree of freedom of the E3.S storage disk 4 to sway left and right. The E3.S storage disk 4 continues to slide into the test back plate 2 until the interface of the storage disk 4 is fully coupled with the disk insertion interface 22 of the test back plate 2.

[0058] In one embodiment, the test backplane 2 is provided with a firmware layer, and a software compatibility system is integrated within the firmware layer.

[0059] Specifically, the test backplane 2 integrates a software compatibility system. In this embodiment, seamless compatibility between U.2 and E3.S dual-form storage disks 4 is preferably achieved through a layered firmware architecture. Its core consists of three subsystems working collaboratively: BIOS, BMC, and CPLD. The CPLD triggers hardware reconfiguration, the BIOS automatically loads protocols, and the MC dynamically adapts policies. Understandably, during system startup, the BIOS module automatically identifies the type of the currently installed test backplane 2 (U.2 or E3.S), dynamically loads the corresponding storage device's initialization protocol and electrical parameter configuration, ensuring that different form factor storage disks 4 complete correct enumeration during the POST phase. The BMC module monitors the storage device's on-premises status, temperature, and power consumption data in real time via the IPMI protocol, implements independent power threshold alarm strategies for the differentiated power consumption curves of U.2 and E3.S, and provides form factor switching records through a remote management interface. The CPLD module, as a hardware abstraction layer, automatically resets the signal routing matrix after detecting a backplane replacement—switching the PCIe Gen5 differential signal channel to the physical interface corresponding to the current backplane, and synchronously adjusting signal timing compensation parameters to match the electrical characteristics of different interfaces, eliminating signal integrity issues. The software compatibility system eliminates the cumbersome process of re-flashing firmware or manually adjusting parameters when switching storage forms on traditional test platforms, enabling plug-and-play compatibility of dual-form storage devices to be achieved simply by replacing the physical backplane within the same test chassis 1.

[0060] The above examples are merely illustrative of the technical content of this utility model to facilitate reader understanding, but do not imply that the implementation of this utility model is limited to these embodiments. Any technical extensions or re-creations made based on this utility model are protected by this utility model. The scope of protection of this utility model is defined by the claims.

Claims

1. An SSD testing device for testing storage disks, characterized in that, The device includes a test frame, a test backplate, and guide plates. The test backplate is detachably connected to the test frame. The test frame includes an upper cover assembly, a lower cover body, and side plates respectively connected to both ends of the lower cover body. The upper cover assembly and the lower cover body are arranged opposite to each other. The upper cover assembly, the lower cover body, and the side plates form a receiving cavity for inserting the storage disk. The guide plates are respectively disposed on the upper cover assembly and the lower cover body. The guide plates are provided with a plurality of first guide portions and a plurality of second guide portions, with the first guide portions and the second guide portions spaced apart.

2. The SSD testing device of claim 1, wherein, The first guide portion is recessed in the guide plate to form a first guide groove with a bottom wall lower than the upper surface of the guide plate. The width of the first guide groove is equal to the width of the storage disk, and there is a gap between two adjacent first guide grooves.

3. The SSD testing device of claim 2, wherein, The second guide portion is disposed on the interval section, forming a guide post higher than the upper surface of the guide plate. The storage disk is provided with a connecting groove at each end near the upper cover assembly and the lower cover body. The width of the connecting groove is equal to the width of the guide post.

4. The SSD test apparatus of claim 2, wherein, The second guide portion is recessed on the interval segment to form a second guide groove with a bottom wall lower than the upper surface of the interval segment. The width of the second guide groove is equal to the width of the storage disk, and the bottom wall of the second guide groove is higher than the bottom wall of the first guide groove.

5. The SSD testing device of claim 1, wherein, The top cover assembly is detachably connected to the side panel.

6. The SSD testing device of claim 1, wherein, The upper cover assembly includes an upper cover body and an upper fixing block. The guide plate is disposed on the side of the upper cover body near the lower cover body, and the upper fixing block is disposed at the tail end of the guide plate.

7. The SSD testing device of claim 6, wherein, The guide plate is located on the side of the lower cover near the lower cover, and the test back plate is detachably connected to the tail end of the guide plate.

8. The SSD testing device of claim 7, wherein, One end of the test backplate is snapped into the upper fixing block, and the other end of the test backplate is screwed into the guide plate.

9. The SSD testing device of claim 1, wherein, The test backplane includes a board body and a disk connector, which is adapted to the connector of the storage disk.

10. The SSD testing device of claim 1, wherein, The test backplane has a firmware layer, which integrates a software compatibility system.

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