Storage flash memory chip testing organization

Abstract

This utility model relates to the technical field of chip testing devices, specifically disclosing a flash memory chip testing mechanism, including: a storage cylinder with symmetrically symmetrically opened sliding grooves on its outer side; and an opening frame assembly symmetrically arranged on the outer side of the storage cylinder. The opening frame assembly is used to drive two protective frames to separate or close. Through the lifting and lowering of the toothed plate, the rotating gear can be driven to rotate, thereby driving the protective frames to open or close. When the suction cup picks up the flash memory chip or needs to be put down, the toothed plate is in a lowered state. During the transportation of the flash memory chip, the electric telescopic rod will rise to a certain position and stop, while the protective frames are in a closed state, thereby preventing the flash memory chip from falling during transportation and providing a good protection effect for the flash memory chip, preventing it from being damaged.

Description

Technical Field

[0001] This utility model relates to the technical field of chip testing devices, specifically to a flash memory chip testing mechanism. Background Technology

[0002] Flash memory chips can reliably store various types of data for a long time, enabling fast data reading and writing. They are widely used in various electronic devices, such as smartphones, tablets, laptops, digital cameras, and solid-state drives, playing an important role in modern information technology.

[0003] To ensure the quality of flash memory chips at the factory, functional tests, performance tests, and reliability tests are conducted on the flash memory chips.

[0004] In existing technologies, when testing chips, a negative pressure suction cup is usually used to pick up the chip and place it in the test socket. However, if the negative pressure of the suction cup is insufficient or leaks, or if wear and tear on the surface of the suction cup is not detected in time after long-term use, or if the robotic arm stops and rotates suddenly, the chip may fall, causing it to be bumped and damaged. Utility Model Content

[0005] The purpose of this invention is to provide a testing mechanism for flash memory chips to solve the problems mentioned in the background art, such as insufficient or leaking suction cup negative pressure, undetected wear on the suction cup surface after long-term use, and chip drop and damage due to sudden stops and turns of the robotic arm.

[0006] To achieve the above objectives, this utility model provides the following technical solution: a flash memory chip testing mechanism, comprising: A storage cylinder is provided, and the outer side of the storage cylinder is symmetrically provided with sliding grooves; An open shelf assembly is symmetrically arranged on the outside of the storage tube, and the open shelf assembly is used to drive the two protective frames to separate or close. The open frame assembly includes a rotating gear, with a connecting rod fixedly installed at both ends of the rotating gear. A receiving frame is fixedly installed on the outer side of the opposite end of the connecting rod, and the receiving frame is fixedly installed at the top of the protective frame. An auxiliary torsion spring is fixedly installed on the outer side of one end of the intermediate connecting rod, and a spring receiving shell is fixedly installed on the other end of the auxiliary torsion spring. The spring receiving shell is fixedly installed on the outer side of the storage cylinder through a connecting plate. The toothed plate is slidably disposed on the inner side of the slide groove, and is meshed on the outer side of the rotating gear. A toothless area is provided on one side of the top of the toothed plate.

[0007] Preferably, the top outer side of the storage cylinder is fixedly provided with two sets of baffles symmetrically arranged on the outer side of the storage cylinder.

[0008] The above technical solution can be connected to the moving mechanism in the testing equipment to drive the picked-up flash memory chip to the testing area. It can also be connected to the end effector of the robotic arm. It is highly practical. The stop block is to prevent the receiving frame from directly colliding with the storage cylinder after it is opened.

[0009] Preferably, a resistance-increasing pad is provided on the outer side of the intermediate connecting rod, a fixed connecting cylinder is fixedly provided on the outer side of the resistance-increasing pad, a fixed connecting plate is fixedly provided on the outer side of the fixed connecting cylinder, and the fixed connecting plate is fixedly provided on the outer side of the receiving fixed cylinder, and the resistance-increasing pad is made of rubber material.

[0010] By adopting the above technical solution, when the middle connecting rod rotates, the resistance of the middle connecting rod rotation will be increased due to the setting of the resistance pad, thus forming an interference fit, which makes the protective frame open slowly.

[0011] Preferably, when the protective frame is in the closed state, the auxiliary torsion spring is in the retracted state, and the intermediate connecting rod is rotatably disposed inside the connecting spring shell.

[0012] Using the above technical solution, when the two protective frames are closed, the auxiliary torsion spring will gradually contract and store power, which can provide power for the protective frames that are being opened.

[0013] Preferably, the protective frame is L-shaped, and a protective pad is fixedly provided on the top inner side of the protective frame. The protective pad is made of rubber material.

[0014] Using the above technical solution, the closed protective frame facilitates the protection of the storage flash memory chip.

[0015] Preferably, a negative pressure pump is fixedly installed at the top of the storage cylinder, an electric telescopic rod is fixedly installed at the top inner side of the storage cylinder, the toothed plate is symmetrically fixedly installed on the outside of the telescopic end of the electric telescopic rod, a suction cup is fixedly installed at the telescopic end of the electric telescopic rod, the negative pressure pump is connected to the suction cup through a negative pressure air pipe, and the suction cup is used to pick up the storage flash memory chip.

[0016] Using the above technical solution, when picking up the flash memory chip, a negative pressure pump can be used to create negative pressure in the suction cup to hold the flash memory chip, thereby achieving the effect of picking up the flash memory chip. The negative pressure pump can also make the suction cup rise or fall, thereby assisting the suction cup in picking up and putting down the flash memory chip.

[0017] Compared with the prior art, the beneficial effects of this utility model are: the storage flash memory chip testing mechanism: 1. The toothed plate can be raised and lowered to drive the rotating gear, which in turn can open or close the protective frame. When the suction cup picks up the flash memory chip or needs to be lowered, the toothed plate is in a lowered state. When transporting the flash memory chip, the electric telescopic rod will rise to a certain position and stop, while the protective frame is in a closed state, thus preventing the flash memory chip from falling during transportation and providing a good protection effect for the flash memory chip, preventing it from being damaged. Attached Figure Description

[0018] Figure 1 This is a three-dimensional structural diagram of the present invention; Figure 2 This is a schematic diagram showing the disassembled structure of some of the open frame components and the protective frame in this utility model; Figure 3 This is a schematic diagram of the disassembled structure of the open frame component in this utility model; Figure 4 This is a schematic diagram showing the disassembled structure of the storage cylinder and the electric telescopic rod of this utility model.

[0019] In the diagram: 1. Storage cylinder; 101. Connecting plate; 102. Stop block; 103. Slide groove; 2. Opening frame assembly; 201. Coupling gear; 202. Intermediate rod; 203. Auxiliary torsion spring; 204. Connecting plate; 205. Spring housing; 206. Support frame; 207. Fixed cylinder; 208. Resistance pad; 209. Fixed plate; 3. Protective frame; 301. Protective pad; 4. Electric telescopic rod; 401. Toothed plate; 4011. Toothless area; 5. Negative pressure pump; 501. Suction cup; 6. Storage flash memory chip. Detailed Implementation

[0020] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0021] Please see Figure 1-4This utility model provides a technical solution: a flash memory chip testing mechanism, comprising: a storage cylinder 1, with symmetrically symmetrically opened sliding grooves 103 on the outer side of the storage cylinder 1; and an opening frame assembly 2, symmetrically arranged on the outer side of the storage cylinder 1. The opening frame assembly 2 is used to drive two protective frames 3 to separate or close. The opening frame assembly 2 includes a rotating gear 201, with intermediate connecting rods 202 fixedly arranged at both ends of the rotating gear 201. A receiving frame 206 is fixedly arranged on the outer side of the mutually distant end of the intermediate connecting rod 202. The receiving frame 206 is fixedly arranged at the top of the protective frame 3. An auxiliary torsion spring 203 is fixedly installed on the outer side of one end of the rod 202, and a spring receiving shell 205 is fixedly installed on the other end of the auxiliary torsion spring 203. The spring receiving shell 205 is fixedly installed on the outer side of the storage cylinder 1 through the connecting plate 204. The toothed plate 401 is slidably installed on the inner side of the slide groove 103. The toothed plate 401 is meshed on the outer side of the rotating gear 201. A toothless area 4011 is provided on one side of the top of the toothed plate 401. The protective frame 3 is "L" shaped. A protective pad 301 is fixedly installed on the top inner side of the protective frame 3. The protective pad 301 is made of rubber material.

[0022] In this embodiment, when picking up or putting down the flash memory chip 6, the toothed plate 401 will descend, so that the toothed plate 401 can drive the rotating gear 201 meshing with it to rotate. The rotation of the rotating gear 201 will drive the connecting rod 202 and the receiving frame 206 to rotate together, thereby driving the protective frame 3 to open. The protective frame 3 can only rotate 90 degrees, so that the suction cup 501 can descend to pick up the flash memory chip 6.

[0023] It is important to note that a toothless area 4011 is provided on one side of the top of the toothed plate 401. The toothless area 4011 will not come into contact with the rotating gear 201. Therefore, when the rotating gear 201 is not engaged with the toothed plate 401, the auxiliary torsion spring 203 can automatically open the protective frame 3. When the electric telescopic rod 4 is shortened, that is, after the suction cup 501 picks up the flash memory chip 6, the toothed plate 401 will rise. During the rising distance, the rotating gear 201 will not rotate, so the flash memory chip 6 has enough distance to rise and will not come into contact with the protective frame 3 to cause interference. When the toothed plate 401 engages with the rotating gear 201, the flash memory chip 6 will also reach the specified height. Therefore, the two do not interfere with each other. When the protective frame 3 is closed, it can protect the flash memory chip 6. If the flash memory chip 6 falls, it will only fall on the protective pad 301 and will not fall on the workbench or other places, preventing damage to the flash memory chip 6 and improving the safety during testing.

[0024] It should be noted that when the protective frame 3 is in the closed state, the auxiliary torsion spring 203 is in the retracted state, and the intermediate connecting rod 202 is rotatably set inside the connecting spring shell 205.

[0025] When the two protective frames 3 are closed, the auxiliary torsion spring 203 will gradually contract and store power, which can provide power for the protective frames 3 when they are opening.

[0026] Among them, the top outer side of the storage cylinder 1 is fixedly provided with 101, and two sets of baffles 102 are symmetrically provided on the outer side of the storage cylinder 1.

[0027] 101 can be connected to the moving mechanism in the testing equipment, thereby driving the picked-up flash memory chip 6 to the testing area, or it can be connected to the end effector of the robotic arm, making it highly practical.

[0028] The stop 102 is designed to prevent the receiving frame 206 from directly colliding with the storage cylinder 1 after it is opened. The stop 102 can be made of nylon rubber material, which can provide a good anti-collision effect.

[0029] A resistance-increasing pad 208 is provided on the outer side of the middle connecting rod 202. A fixed connecting cylinder 207 is fixedly provided on the outer side of the resistance-increasing pad 208. A fixed connecting plate 209 is fixedly provided on the outer side of the fixed connecting cylinder 207. The fixed connecting plate 209 is fixedly provided on the outer side of the receiving fixed cylinder 1. The resistance-increasing pad 208 is made of rubber material.

[0030] When the connecting rod 202 rotates, the resistance of the connecting rod 202 will increase due to the setting of the resistance pad 208, thus forming an interference fit. This causes the protective frame 3 to open slowly. This situation occurs when the connecting gear 201 reaches the toothless zone 4011, preventing the protective frame 3 from opening too quickly and impacting the storage cylinder 1.

[0031] When the rotating gear 201 is engaged with the toothed plate 401, the resistance generated by the resistance pad 208 will not affect the rotation of the rotating gear 201, and will not affect the opening and closing of the protective frame 3.

[0032] A negative pressure pump 5 is fixedly installed at the top of the storage cylinder 1, and an electric telescopic rod 4 is fixedly installed at the top of the inner side of the storage cylinder 1. A toothed plate 401 is symmetrically fixed on the outer side of the telescopic end of the electric telescopic rod 4. A suction cup 501 is fixedly installed at the telescopic end of the electric telescopic rod 4. The negative pressure pump 5 is connected to the suction cup 501 through a negative pressure air pipe. The suction cup 501 is used to pick up the storage flash memory chip 6.

[0033] When picking up the flash memory chip 6, the negative pressure pump 5 can generate negative pressure in the suction cup 501 to hold the flash memory chip 6, thereby achieving the effect of picking up the flash memory chip 6. The negative pressure pump 5 can also make the suction cup 501 rise or fall, thereby assisting the suction cup 501 in picking up and putting down the flash memory chip 6.

[0034] Furthermore, since the toothed plate 401 is connected to the telescopic end of the electric telescopic rod 4, the toothed plate 401 will rise or fall synchronously when the electric telescopic rod 4 extends or shortens.

[0035] Working principle: As the electric telescopic rod 4 extends, the toothed plate 401 descends, driving the coupling gear 201 to rotate. The rotation of the coupling gear 201 causes the receiving frame 206 to rotate as well, which in turn drives the connected protective frame 3 to rotate. The protective frame 3 can only rotate 90 degrees. At this time, the two vertical protective frames 3 become horizontal protective frames 3, that is, the two protective frames 3 are in an open state, which makes it easy for the electric telescopic rod 4 to extend and drive the suction cup 501 to pick up the flash memory chip 6 from the tray, or to place the flash memory chip 6 on the test table. When picking up the flash memory chip 6 or transporting the flash memory chip 6, the protective frame 3 is always in a closed state, thus achieving a good protection effect for the flash memory chip 6 and preventing the chip from being accidentally dropped and damaged.

[0036] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A memory flash chip testing mechanism, characterized by, include: Storage cylinder (1), the outer side of which is symmetrically provided with sliding grooves (103); The open frame assembly (2) is symmetrically arranged on the outside of the storage tube (1). The open frame assembly (2) is used to drive the two protective frames (3) to separate or close. The open frame assembly (2) includes a rotating gear (201), with a connecting rod (202) fixedly installed at both ends of the rotating gear (201), and a support frame (206) fixedly installed on the outer side of the mutually distant end of the connecting rod (202), and the support frame (206) is fixedly installed at the top of the protective frame (3); An auxiliary torsion spring (203) is fixedly installed on the outer side of one end of the middle connecting rod (202), and a spring receiving shell (205) is fixedly installed on the other end of the auxiliary torsion spring (203). The spring receiving shell (205) is fixedly installed on the outer side of the storage cylinder (1) through the connecting plate (204). The toothed plate (401) is slidably disposed on the inner side of the slide groove (103), and the toothed plate (401) is meshed on the outer side of the rotating gear (201). A toothless area (4011) is provided on one side of the top end of the toothed plate (401).

2. The memory flash chip testing mechanism of claim 1, wherein: The top outer side of the storage cylinder (1) is fixedly provided with (101), and two sets of baffles (102) are symmetrically provided on the outer side of the storage cylinder (1).

3. The memory flash chip testing mechanism of claim 1, wherein: A resistance-increasing pad (208) is provided on the outer side of the middle connecting rod (202), a fixed connecting tube (207) is fixedly provided on the outer side of the resistance-increasing pad (208), a fixed connecting plate (209) is fixedly provided on the outer side of the fixed connecting tube (207), and the fixed connecting plate (209) is fixedly provided on the outer side of the receiving fixed tube (1). The resistance-increasing pad (208) is made of rubber material.

4. The memory flash chip testing mechanism of claim 1, wherein: When the protective frame (3) is in the closed state, the auxiliary torsion spring (203) is in the retracted state, and the connecting rod (202) is rotatably disposed on the inner side of the connecting spring shell (205).

5. The memory flash chip testing mechanism of claim 1, wherein: The protective frame (3) is L-shaped, and a protective pad (301) is fixedly provided on the inner top of the protective frame (3). The protective pad (301) is made of rubber material.

6. The memory flash chip testing mechanism of claim 5, wherein: A negative pressure pump (5) is fixedly installed at the top of the storage cylinder (1), and an electric telescopic rod (4) is fixedly installed at the top of the inner side of the storage cylinder (1). The toothed plate (401) is symmetrically fixedly installed on the outside of the telescopic end of the electric telescopic rod (4). A suction cup (501) is fixedly installed at the telescopic end of the electric telescopic rod (4). The negative pressure pump (5) is connected to the suction cup (501) through a negative pressure air pipe. The suction cup (501) is used to pick up the storage flash memory chip (6).

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