IV-EL test switching device and integrated IV-EL test machine
By combining semiconductor switching circuits and controllers, the photovoltaic cells can be automatically switched between IV and EL tests, solving the problems of short lifespan and high power consumption of relay switching, thus improving the lifespan of the device and reducing energy loss.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- HANGZHOU MEIJIA INNOVATION TECHNOLOGY CO LTD
- Filing Date
- 2024-12-09
- Publication Date
- 2026-07-31
AI Technical Summary
In current photovoltaic cell testing, relays are used to switch between IV and EL tests, resulting in short switching circuit life and high power consumption.
A semiconductor switching circuit is used to connect the IV test equipment, EL test equipment and the test contacts of the photovoltaic cell. The controller controls the semiconductor switching circuit to realize the automatic switching of the photovoltaic cell between IV test and EL test.
It improves the service life of the switching device, reduces energy loss during the switching process, extends the service life of the device, and reduces power consumption.
Smart Images
Figure CN224583149U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of photovoltaic testing technology, and in particular to an IV-EL testing switching device and an integrated IV-EL testing machine. Background Technology
[0002] In the field of photovoltaic cell testing, common tests include IV testing (current-voltage testing) and EL testing (Electroluminescence Voltage Testing). IV testing requires connecting the photovoltaic cell (PV) to the IV testing equipment, while EL testing requires connecting the photovoltaic cell to the power supply of the EL testing equipment. Since IV testing and EL testing are performed independently, the photovoltaic cell needs to be switched between IV testing equipment and EL testing equipment.
[0003] Current methods for switching between IV and EL testing typically involve using relays in the paths connecting to the IV testing equipment and the EL testing equipment, respectively, to perform the switching connection. However, relay contacts have a limited number of uses, and relays generate significant energy loss during the switching process, resulting in a short lifespan and high power consumption for the switching circuit. Utility Model Content
[0004] This application provides an IV-EL test switching device and an integrated IV-EL test machine to solve the above-mentioned technical problems in the prior art.
[0005] According to a first aspect of this application, an IV-EL test switching device is provided, comprising: a semiconductor switch switching circuit and a controller;
[0006] The first terminal of the semiconductor switch circuit is connected to the IV test equipment, the second terminal is connected to the EL test equipment, the third terminal of the semiconductor switch circuit is connected to the test contact of the photovoltaic cell, and the control terminal of the semiconductor switch circuit is connected to the controller.
[0007] The controller controls the semiconductor switching circuit to connect to the third terminal, either the first terminal or the second terminal, thereby switching between IV testing and EL testing of the photovoltaic cell.
[0008] In some embodiments, the semiconductor switching circuit includes multiple semiconductor switching circuits, the number of which is related to the number of test contacts of the photovoltaic cell; wherein:
[0009] Each of the semiconductor switch circuits has a first terminal connected to a contact of the IV test equipment, a second terminal connected to a contact of the EL test equipment, and a third terminal connected to a test contact of the photovoltaic cell. Each of the semiconductor switch circuits includes at least one control terminal, which is connected to the controller.
[0010] In some embodiments, the semiconductor switching circuit includes two semiconductor switching sub-circuits: a first semiconductor switching sub-circuit connected to the IV test equipment and a second semiconductor switching sub-circuit connected to the EL test equipment;
[0011] The first terminal of the first semiconductor switch sub-circuit serves as the first terminal of the semiconductor switch circuit and is used to connect to a contact of the IV test equipment. The control terminal of the first semiconductor switch sub-circuit is connected to the controller.
[0012] The first terminal of the second semiconductor switch sub-circuit serves as the second terminal of the semiconductor switch circuit and is used to connect to a contact of the EL test equipment; the control terminal of the second semiconductor switch sub-circuit is connected to the controller.
[0013] The junction where the second terminal of the first semiconductor switch sub-circuit connects to the second terminal of the second semiconductor switch sub-circuit serves as the third terminal of the semiconductor switch circuit, used to connect a test contact of the photovoltaic cell.
[0014] In some embodiments, the semiconductor switching sub-circuit includes: a first resistor, a first switching sub-circuit, and a second switching sub-circuit;
[0015] One end of the first resistor is connected to the working voltage, and the other end is connected to the first terminal of the first switch sub-circuit and the control terminal of the second switch sub-circuit.
[0016] The control terminal of the first switch sub-circuit serves as the control terminal of the corresponding semiconductor switch sub-circuit and is used to connect to the controller; the second terminal of the first switch sub-circuit is grounded.
[0017] The first end of the second switch sub-circuit serves as the first end of the corresponding semiconductor switch sub-circuit and is used to connect to the contacts of the IV test equipment or the EL test equipment. The second end of the second switch sub-circuit serves as the second end of the corresponding semiconductor switch circuit and is used to connect to the test contacts of the photovoltaic cell.
[0018] The controller controls the first switch sub-circuit to be turned on and the second switch sub-circuit to be turned off, so that the test contacts of the photovoltaic cell are disconnected from the contacts of the IV test equipment or EL test equipment; or the controller controls the first switch sub-circuit to be turned off and the second switch sub-circuit to be turned on, so that the test contacts of the photovoltaic cell are connected to the contacts of the IV test equipment or EL test equipment.
[0019] In some embodiments, the first switching sub-circuit includes a second resistor and a transistor;
[0020] The first terminal of the transistor is connected to the first resistor, the second terminal of the transistor is grounded, and the control terminal of the transistor is connected to the controller.
[0021] One end of the second resistor is connected to the control terminal of the transistor, and the other end of the second resistor is grounded.
[0022] In some embodiments, the second switching sub-circuit includes a third resistor, a fourth resistor, and a MOSFET;
[0023] The control terminal of the MOS transistor is connected to the first resistor through the third resistor, the first terminal of the MOS transistor is connected to the contact of the IV test equipment or EL test equipment, and the second terminal of the MOS transistor is connected to the test contact of the photovoltaic cell.
[0024] One end of the fourth resistor is connected to the junction of the MOS transistor and the third resistor, and the other end of the fourth resistor is connected to the second end of the MOS transistor.
[0025] In some embodiments, the second switching sub-circuit further includes a capacitor, one end of which is connected to the junction of the MOS transistor and the third resistor, and the other end of which is connected to the second terminal of the MOS transistor.
[0026] In some embodiments, the semiconductor switching sub-circuit further includes a light-emitting diode, and the first resistor is connected to the control terminal of the second switching sub-circuit through the light-emitting diode.
[0027] In some embodiments, the above-described IV-EL test switching device further includes a power module connected to the semiconductor switching circuit and the controller.
[0028] According to a second aspect of this application, an integrated IV-EL testing machine is provided, comprising an IV testing device, an EL testing device, and the aforementioned IV-EL testing switching device, wherein the IV-EL testing switching device is connected to the IV testing device and the EL testing device.
[0029] In summary, the IV-EL test switching device and IV-EL test integrated machine provided in this application have at least the following beneficial effects:
[0030] By employing a semiconductor switching circuit to connect the controller, the photovoltaic cell's test contacts, the IV testing equipment, and the EL testing equipment, respectively, the controller controls one of the first and second terminals of the semiconductor switching circuit to connect to the third terminal. This allows the photovoltaic cell's test contacts to be electrically connected to the IV testing equipment and disconnected from the EL testing equipment for IV testing, or vice versa. In this way, the photovoltaic cell's connection between IV and EL testing is automatically switched. Moreover, compared to relays, the semiconductor switching circuit has a longer service life and lower energy loss during the switching process, which can improve the lifespan of the IV-EL testing switching device and reduce power consumption. Attached Figure Description
[0031] To more clearly illustrate the technical solutions in the specific embodiments of this application, the accompanying drawings used in the description of the specific embodiments will be briefly introduced below in conjunction with the accompanying drawings. Obviously, the accompanying drawings described below are some embodiments of this application. For those skilled in the art, other drawings or solutions can be obtained based on these drawings without creative effort.
[0032] Figure 1 This is a structural block diagram of an IV-EL test switching device in one embodiment of this application;
[0033] Figure 2 This is a structural block diagram of an IV-EL test switching device in another embodiment of this application;
[0034] Figure 3 This is a circuit diagram of a semiconductor switch sub-circuit in one embodiment of this application;
[0035] Figure 4 This is a structural diagram of a power module in one embodiment of this application. Detailed Implementation
[0036] In the description of this application, it should be understood that the use of terms such as "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential" to indicate orientation or positional relationship, unless otherwise specified, is understood to be based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing this application and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.
[0037] Furthermore, features specified with "first" or "second" for descriptive purposes only should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Features specified with "first" or "second" may explicitly or implicitly include at least one of the specified features. The description of "multiple" generally means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0038] In this application, unless otherwise explicitly specified and limited, terms such as "installation," "connection," "joining," and "fixing" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can be a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.
[0039] In the description of this specification, the terms "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that the specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.
[0040] In one embodiment of this application, an IV-EL testing switching device is provided, with reference to... Figure 1The IV-EL test switching device includes a semiconductor switch switching circuit 100 and a controller 200. The semiconductor switch switching circuit 100 is a circuit that uses semiconductor switching devices to achieve switch switching.
[0041] The semiconductor switch circuit 100 includes a first terminal, a second terminal, a third terminal, and a control terminal. The first terminal of the semiconductor switch circuit 100 is connected to an IV testing device, specifically to the contacts used to connect the photovoltaic cell (PV) during IV testing. The second terminal of the semiconductor switch circuit 100 is connected to an EL testing device, specifically to the contacts used to connect the photovoltaic cell during EL testing. The third terminal of the semiconductor switch circuit 100 is connected to the test contacts of the photovoltaic cell, which are the electrode points required for IV or EL testing of the photovoltaic cell. The control terminal of the semiconductor switch circuit 100 is connected to a controller 200.
[0042] The number of the first / second terminals of the semiconductor switch circuit 100 is set according to the number of contacts of the IV test equipment / EL test equipment, and the number of the third terminal of the semiconductor switch circuit 100 is set according to the number of test contacts of the photovoltaic cell. For example, Figure 1 The photovoltaic cell shown has four test contacts: IL+, VL+, VL-, and IL-. Test contacts IL+ and IL- are used to apply power, while test contacts VL+ and VL- are used to sample voltage. These four test contacts serve as four reference points. For IV testing, the IV testing equipment contacts need to be connected to these four test contacts. For EL testing, the EL testing equipment needs to be connected to these four test contacts. This is understandable. Figure 1 The test contact shown is just one example. In other embodiments, the number of test contacts may be different, and this application does not limit this.
[0043] The controller 200 controls the semiconductor switch switching circuit 100 to connect to either the first or second terminal and the third terminal. Specifically, the controller 200 controls the first terminal of the semiconductor switch switching circuit 100 to connect to the third terminal. In this case, the IV testing equipment is electrically connected to the test contacts of the photovoltaic cell through the semiconductor switch switching circuit 100 to perform IV testing. Alternatively, the controller 200 controls the second terminal of the semiconductor switch switching circuit 100 to connect to the third terminal. In this case, the EL testing equipment is electrically connected to the test contacts of the photovoltaic cell through the semiconductor switch switching circuit 100 to perform EL testing. In this way, the switching between IV testing and EL testing of the photovoltaic cell is realized.
[0044] The controller 200 can be an MCU (microprocessor). Specifically, the controller 200 can perform switching control by sending level signals to the control terminal of the semiconductor switch circuit 100. For example, the controller 200 sends a first level signal to the control terminal of the semiconductor switch circuit 100 to connect the first terminal and the third terminal of the semiconductor switch circuit 100; the controller 200 sends a second level signal to the control terminal of the semiconductor switch circuit 100 to connect the second terminal and the third terminal of the semiconductor switch circuit 100. Furthermore, the controller 200 can respond to instructions sent by a host computer to send corresponding level signals. For example, when IV testing is required, the user can send an instruction from the host computer to the controller to send a first level signal; when EL testing is required, the user can send an instruction from the host computer to the controller to send a second level signal.
[0045] The aforementioned IV-EL test switching device uses a semiconductor switch switching circuit 100 to connect a controller 200, the test contacts of the photovoltaic cell, the IV test equipment, and the EL test equipment. The controller 200 controls one of the first and second terminals of the semiconductor switch switching circuit 100 to connect to the third terminal, so that the test contacts of the photovoltaic cell are electrically connected to the IV test equipment and disconnected from the EL test equipment for IV testing, or electrically connected to the EL test equipment and disconnected from the IV test equipment for EL testing. In this way, the switching connection of the photovoltaic cell between IV testing and EL testing is automatically realized. Moreover, compared with relays, semiconductor switch switching circuits have a longer service life and less energy loss during the switching process, which can improve the life of the IV-EL test switching device and reduce power consumption.
[0046] In one embodiment, the semiconductor switch circuit 100 includes a plurality of semiconductor switch circuits, the number of which is related to the number of test contacts of the photovoltaic cell. Specifically, the number of semiconductor switch circuits can be equal to the number of test contacts of the photovoltaic cell. For example... Figure 2 As shown, the semiconductor switch switching circuit 100 includes four semiconductor switch circuits, each of which is connected to a test contact of a corresponding photovoltaic cell.
[0047] The semiconductor switch circuit 100 comprises the first terminal of each semiconductor switch circuit, the second terminal of each semiconductor switch circuit, the third terminal of each semiconductor switch circuit, and the control terminal of each semiconductor switch circuit. Specifically, the first terminal of each semiconductor switch circuit is connected to a contact of an IV testing device, the second terminal of each semiconductor switch circuit is connected to a contact of an EL testing device, and the third terminal of each semiconductor switch circuit is connected to a test contact of a photovoltaic cell. Each semiconductor switch circuit includes at least one control terminal, which is connected to a controller. Specifically, the controller 200 controls each semiconductor switch circuit to selectively connect to either the first or second terminal and the third terminal, and all semiconductor switch circuits select the same switching port, for example, all connecting to both the first and third terminals, or all connecting to both the second and third terminals.
[0048] By employing multiple semiconductor switching circuits to connect to different test contacts, each semiconductor switching circuit acts as an isolation unit, used to switch the connection between the test contact and the IV / EL test equipment. The semiconductor switching circuits are isolated from each other, thereby enabling individual switching of each test contact.
[0049] For example Figure 2 As shown, the IV test equipment includes four contacts: IV I+, IV V+, IV V-, and IV I-. The EL test equipment includes four contacts: EL I+, EL V+, EL V-, and EL I-. The first semiconductor switch circuit connects to contact IV I+ at its first end, contact EL I+ at its second end, and test contact IL+ at its third end. The second semiconductor switch circuit connects to contact IV V+ at its first end, contact EL V+ at its second end, and test contact VL+ at its third end. The third semiconductor switch circuit connects to contact IV V- at its first end, contact EL V- at its second end, and test contact VL- at its third end. The fourth semiconductor switch circuit connects to contact IV I- at its first end, contact EL I- at its second end, and test contact IL- at its third end. Thus, each semiconductor switch circuit acts as an isolation unit, used to switch the connection to one test contact. The four semiconductor switch circuits correspond to four different isolation units and do not affect each other. The final test switching is only achieved when all four semiconductor switch circuits are switched to the same IV test equipment or EL test equipment.
[0050] In one embodiment, each semiconductor switch circuit includes two semiconductor switch sub-circuits: a first semiconductor switch sub-circuit connected to an IV testing device and a second semiconductor switch sub-circuit connected to an EL testing device. A first terminal of the first semiconductor switch sub-circuit serves as the first terminal of the semiconductor switch circuit, used to connect to a contact of the IV testing device; a first terminal of the second semiconductor switch sub-circuit serves as the second terminal of the semiconductor switch circuit, used to connect to a contact of the EL testing device; the junction connecting the second terminals of the first and second semiconductor switch sub-circuits serves as the third terminal of the semiconductor switch circuit, used to connect to a test contact of the photovoltaic cell. The control terminals of both the first and second semiconductor switch sub-circuits are connected to the controller 200.
[0051] By employing two semiconductor switching sub-circuits, the first semiconductor switching sub-circuit connects the IV testing equipment and the photovoltaic cell's test contacts, while the second semiconductor switching sub-circuit connects the EL testing equipment and the photovoltaic cell's test contacts. The controller 200 controls the on / off state of these two semiconductor switching sub-circuits, enabling the photovoltaic cell's test contacts to switch between the IV and EL testing equipment. This design is simple and easy to implement. Specifically, the controller 200 controls the first semiconductor switching sub-circuit to be on when it is off, and vice versa.
[0052] by Figure 2 Taking four semiconductor switch circuits as an example, the first semiconductor switch circuit includes a first semiconductor switch sub-circuit 11 and a second semiconductor switch sub-circuit 12, the second semiconductor switch circuit includes a first semiconductor switch sub-circuit 21 and a second semiconductor switch sub-circuit 22, the third semiconductor switch circuit includes a first semiconductor switch sub-circuit 31 and a second semiconductor switch sub-circuit 32, and the fourth semiconductor switch circuit includes a first semiconductor switch sub-circuit 41 and a second semiconductor switch sub-circuit 42.
[0053] The circuit structures of the first semiconductor switch sub-circuit and the second semiconductor switch sub-circuit can be the same. In one embodiment, refer to... Figure 3 The semiconductor switch sub-circuit includes a first resistor R6, a first switch sub-circuit 111, and a second switch sub-circuit 112.
[0054] The control terminal P of the first switch sub-circuit 111 serves as the control terminal of the corresponding semiconductor switch sub-circuit and is used to connect to the controller 200. The first terminal of the first switch sub-circuit 111 is connected to the operating voltage through the first resistor R6, for example, the operating voltage can be DC+12V. The second terminal of the first switch circuit 111 is grounded. The control terminal of the second switch circuit 112 is connected to the operating voltage through the first resistor R6. The first terminal of the second switch circuit 112 serves as the first terminal of the corresponding semiconductor switch sub-circuit and is used to connect to the contacts of the IV test equipment or EL test equipment. Specifically, the first terminal of the second switch circuit 112 in the first semiconductor switch sub-circuit is connected to the contacts of the IV test equipment, for example... Figure 3 The first terminal of the second switching sub-circuit 112 is connected to contact IV V+; the first terminal of the second switching sub-circuit 112 in the second semiconductor switching sub-circuit is connected to the contact of the EL test equipment. Specifically, the second terminal of the second switching sub-circuit 112 serves as the second terminal of the corresponding semiconductor switching sub-circuit and is used to connect to the test contact of the photovoltaic cell, for example... Figure 3 The second terminal of the second switch sub-circuit 112 is connected to the test contact VL+.
[0055] The operating voltage is used to power the first switching sub-circuit 111 and the second switching sub-circuit 112. Specifically, when the controller 200 controls the first switching sub-circuit 111 to be turned on, the second switching sub-circuit 112 is turned off, thus the first and second terminals of the second switching sub-circuit 112 are not connected, disconnecting the photovoltaic cell's test contacts from the IV or EL testing equipment. When the controller controls the first switching sub-circuit 111 to be turned off, the second switching sub-circuit 112 is turned on, thus connecting the first and second terminals of the second switching sub-circuit 112, connecting the photovoltaic cell's test contacts to the IV or EL testing equipment. Using the circuit structure in this embodiment, simple logic level control is sufficient to achieve the connection and disconnection control of the photovoltaic cell's test contacts.
[0056] Specifically, the controller 200 controls two semiconductor switching sub-circuits within the same semiconductor switching circuit in opposite directions. Figure 2 Taking the first semiconductor switch circuit as an example, when the controller 200 controls the first switch sub-circuit 111 in the first semiconductor switch sub-circuit 11 to be turned on, it controls the first switch sub-circuit 111 in the second semiconductor switch sub-circuit 12 to be turned off, so that the connection between the first semiconductor switch sub-circuit 11 and the IV test equipment is disconnected, while the second semiconductor switch sub-circuit 12 is connected to the EL test equipment, thereby connecting the photovoltaic test contact IL+ to the EL test equipment.
[0057] In one embodiment, reference may continue to be made to... Figure 3The first switching sub-circuit 111 includes a second resistor R1 and a transistor Q0. The first terminal (pin 3) of transistor Q0 is connected to the first resistor R6, the second terminal (pin 2) of transistor Q0 is grounded, and the control terminal (pin 1) of transistor Q0 is connected to the controller 200. One end of the second resistor R1 is connected to the control terminal of transistor Q0, and the other end of the second resistor R1 is grounded. By using a transistor structure to achieve logic level-based on / off control, the structure is simple and easy to implement. It is understood that in other embodiments, transistor Q0 can also be other types of switching devices, such as MOSFETs (Metal-Oxide-Semiconductor Field-Effect Transistors) or IGBTs (Insulated Gate Bipolar Transistors).
[0058] In one embodiment, continue to refer to Figure 3 The second switch sub-circuit 112 includes a third resistor R3, a fourth resistor R8, and a MOSFET Q2.
[0059] The control terminal of MOSFET Q2 is connected to the first resistor R6 via the third resistor R3. The first terminal of MOSFET Q2 is connected to the contact of an IV test device or an EL test device, for example... Figure 2 In the first semiconductor switch sub-circuit of the second semiconductor switch circuit, the first terminal of the second switch sub-circuit 112 is connected to contact IV V+; the second terminal of the MOSFET Q2 is connected to the test contact of the photovoltaic cell, for example... Figure 2 In the first semiconductor switch sub-circuit of the second semiconductor switch circuit, the second terminal of the second switch sub-circuit 112 is connected to the test contact VL+. One end of the fourth resistor R8 is connected to the junction of the MOSFET Q2 and the third resistor R3, and the other end of the fourth resistor R8 is connected to the second terminal of the MOSFET Q2.
[0060] The resistors R3 and R8 are set to ensure that the control terminal voltage of MOSFET Q2 meets the operating requirements. Using a MOSFET for on / off control results in a simple and easy-to-implement structure. Compared to relays, MOSFET switches offer stronger controllability, smaller size (saving board space), longer lifespan, and lower power consumption, eliminating concerns about device damage from frequent switching.
[0061] In one embodiment, such as Figure 3 As shown, the second switching sub-circuit also includes a capacitor C9. One end of capacitor C9 is connected to the junction of MOSFET Q2 and the third resistor R3, and the other end of capacitor C9 is connected to the second terminal of MOSFET Q2. By connecting capacitor C9 between the control terminal and the second terminal of MOSFET Q2, the switching speed can be slowed down, and the large current during switching can be reduced by delaying the switching time, so as to prevent damage to the components in the circuit.
[0062] In one embodiment, reference Figure 3The semiconductor switch sub-circuit also includes a light-emitting diode (LED) D19, and the first resistor R6 is connected to the control terminal of the second switch sub-circuit 112 through the LED D19. Specifically, the positive terminal of the LED D19 is connected to the first resistor R6, and the negative terminal of the LED D19 is connected to the third resistor R3.
[0063] The second switch sub-circuit 112 is connected via LED D19. When the first switch sub-circuit 111 is turned off and the second switch sub-circuit 112 is turned on, LED D19 is powered on and emits light. Thus, LED D19 can be used to visually indicate that the second switch sub-circuit 112 is currently in a conducting state.
[0064] In one embodiment, the above-mentioned IV-EL test switching device further includes a power module (not shown), which is connected to the semiconductor switch switching circuit 100 and the controller 200 and is used to supply power to the semiconductor switch switching circuit 100 and the controller 200.
[0065] In one embodiment, the power module includes a transformer, a rectifier and filter circuit, and a voltage regulator connected in sequence. The voltage regulator is connected to a semiconductor switching circuit 100 and a controller 200. The transformer transforms the input AC voltage and outputs it to the rectifier and filter circuit. The rectifier and filter circuit rectifies and outputs a DC voltage to the voltage regulator. The voltage regulator outputs a regulated voltage to the semiconductor switching circuit 100 and the controller 200.
[0066] For example Figure 4 As shown, the transformer transforms the input 220V AC voltage and outputs five 9.5V AC voltages to the rectifier and filter circuit. After rectification and filtering, the rectifier and filter circuit outputs five 13.5V DC voltages to the low dropout linear regulator (LDO). The LDO regulates each DC voltage and outputs five 12V DC voltages. One output (DC12V_1) is connected to the controller 200, and the other four outputs (DC12V_2, DC12V_3, DC12V_4, and DC12V_5) supply the four semiconductor switch circuits connected to the four test contacts, respectively. Specifically, the other four outputs are connected to the first resistor R6 of the two semiconductor switch sub-circuits in the corresponding semiconductor switch circuits to provide 12V DC voltage.
[0067] In addition, this application provides an integrated IV-EL tester, including an IV tester, an EL tester, and the IV-EL test switching device in the above embodiments. The IV-EL test switching device connects the IV tester and the EL tester, and also includes test contacts for connecting photovoltaic cells.
[0068] The technical features described above can be combined arbitrarily. Although not all possible combinations of these technical features are described, any combination of these technical features should be considered to be covered by this specification, provided that such combination does not contain contradictions.
[0069] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.
Claims
1. An IV-EL test switching device, characterized by, include: Semiconductor switching circuits and controllers; The first terminal of the semiconductor switch circuit is connected to the IV test equipment, the second terminal is connected to the EL test equipment, the third terminal of the semiconductor switch circuit is connected to the test contact of the photovoltaic cell, and the control terminal of the semiconductor switch circuit is connected to the controller. The controller controls the semiconductor switching circuit to connect to the third terminal, either the first terminal or the second terminal, thereby switching between IV testing and EL testing of the photovoltaic cell. The semiconductor switch switching circuit includes multiple semiconductor switch circuits, the number of which is related to the number of test contacts of the photovoltaic cell. Each semiconductor switch circuit is equivalent to an isolation unit, used to switch the connection between the test contact and the IV test equipment / EL test equipment. Each semiconductor switch circuit is isolated from each other to achieve individual switching of each test contact. The semiconductor switching circuit includes two semiconductor switching sub-circuits: a first semiconductor switching sub-circuit connected to the IV test equipment and a second semiconductor switching sub-circuit connected to the EL test equipment. The first terminal of the first semiconductor switch sub-circuit serves as the first terminal of the semiconductor switch circuit and is used to connect to a contact of the IV test equipment. The control terminal of the first semiconductor switch sub-circuit is connected to the controller. The first terminal of the second semiconductor switch sub-circuit serves as the second terminal of the semiconductor switch circuit and is used to connect to a contact of the EL test equipment; the control terminal of the second semiconductor switch sub-circuit is connected to the controller. The junction where the second terminal of the first semiconductor switch sub-circuit connects to the second terminal of the second semiconductor switch sub-circuit serves as the third terminal of the semiconductor switch circuit, used to connect a test contact of the photovoltaic cell. The semiconductor switch sub-circuit includes: a first resistor, a first switch sub-circuit, and a second switch sub-circuit; One end of the first resistor is connected to the working voltage, and the other end is connected to the first terminal of the first switch sub-circuit and the control terminal of the second switch sub-circuit. The control terminal of the first switch sub-circuit serves as the control terminal of the corresponding semiconductor switch sub-circuit and is used to connect to the controller; the second terminal of the first switch sub-circuit is grounded. The first end of the second switch sub-circuit serves as the first end of the corresponding semiconductor switch sub-circuit and is used to connect to the contacts of the IV test equipment or the EL test equipment. The second end of the second switch sub-circuit serves as the second end of the corresponding semiconductor switch circuit and is used to connect to the test contacts of the photovoltaic cell. The controller controls the first switch sub-circuit to be turned on and the second switch sub-circuit to be turned off, so that the test contacts of the photovoltaic cell are disconnected from the contacts of the IV test equipment or EL test equipment; or the controller controls the first switch sub-circuit to be turned off and the second switch sub-circuit to be turned on, so that the test contacts of the photovoltaic cell are connected to the contacts of the IV test equipment or EL test equipment.
2. The IV-EL test switch device of claim 1, wherein, Each of the semiconductor switch circuits has a first terminal connected to a contact of the IV test equipment, a second terminal connected to a contact of the EL test equipment, and a third terminal connected to a test contact of the photovoltaic cell. Each of the semiconductor switch circuits includes at least one control terminal, which is connected to the controller.
3. The IV-EL test switch device of claim 1, wherein, The first switching sub-circuit includes a second resistor and a transistor; The first terminal of the transistor is connected to the first resistor, the second terminal of the transistor is grounded, and the control terminal of the transistor is connected to the controller. One end of the second resistor is connected to the control terminal of the transistor, and the other end of the second resistor is grounded.
4. The IV-EL test switch device of claim 1, wherein, The second switching sub-circuit includes a third resistor, a fourth resistor, and a MOSFET; The control terminal of the MOS transistor is connected to the first resistor through the third resistor, the first terminal of the MOS transistor is connected to the contact of the IV test equipment or EL test equipment, and the second terminal of the MOS transistor is connected to the test contact of the photovoltaic cell. One end of the fourth resistor is connected to the junction of the MOS transistor and the third resistor, and the other end of the fourth resistor is connected to the second end of the MOS transistor.
5. The IV-EL test switch device of claim 4, wherein, The second switching sub-circuit also includes a capacitor, one end of which is connected to the junction of the MOS transistor and the third resistor, and the other end of which is connected to the second terminal of the MOS transistor.
6. The IV-EL test switch device of claim 1, wherein, The semiconductor switch sub-circuit also includes a light-emitting diode, and the first resistor is connected to the control terminal of the second switch sub-circuit through the light-emitting diode.
7. The IV-EL test switch device according to any one of claims 1 to 6, characterized in that It also includes a power module, which is connected to the semiconductor switching circuit and the controller.
8. An IV-EL test all-in-one machine, characterized in that, It includes an IV testing device, an EL testing device, and an IV-EL testing switching device as described in any one of claims 1-7, wherein the IV-EL testing switching device is connected to the IV testing device and the EL testing device.