Test circuit and test device
By switching the connection state through the switching unit in the test circuit, multiple test devices can share the same SIM card, which solves the problem of high SIM card demand in multi-device network registration tests and reduces costs.
Patent Information
- Application Number
- CN202521459376.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-11
- Publication Date
- 2026-07-31
- Estimated Expiration
- 2035-07-11
AI Technical Summary
When conducting network registration tests on multiple testing devices, the demand for SIM cards is high, resulting in higher costs.
By switching the connection state through the switching unit in the test circuit, multiple test devices can share the same SIM card, realizing SIM card switching between devices and improving SIM card utilization.
This reduces the number of SIM cards required when conducting network registration tests with multiple testing devices, thus lowering testing costs.
Smart Images
Figure CN224583325U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of communication technology, specifically to a test circuit and a test device. Background Technology
[0002] With the development of communication technology, more and more cellular projects require network registration testing. Currently, network registration testing typically requires inserting a SIM card into the test equipment. When performing network registration testing on a batch of test equipment in parallel, the demand for SIM cards increases as the number of test equipment increases, resulting in higher costs for network registration testing.
[0003] Therefore, a feasible solution is urgently needed to reduce the number of SIM cards required when multiple test devices are conducting network registration tests. Utility Model Content
[0004] This application provides a test circuit and a test device. Using the test circuit for testing can reduce the number of SIM cards required when multiple test devices are used for network registration testing, thereby reducing the cost of using multiple test devices for network registration testing.
[0005] A first aspect of this application provides a test circuit, the test circuit comprising:
[0006] First SIM card, switch unit;
[0007] The first end of the first SIM card is connected to the first end of the switching unit, the second end of the switching unit is connected to the first end of the first test device, and the third end of the switching unit is connected to the first end of the second test device.
[0008] When the first end of the switch unit is connected to the second end of the switch unit and the first end of the switch unit is disconnected from the third end of the switch unit, the first test device is connected to the first SIM card, and the first test device has the ability to perform network registration test using the first SIM card.
[0009] When the first end of the switch unit is connected to the third end of the switch unit and the first end of the switch unit is disconnected from the second end of the switch unit, the second test device is connected to the first SIM card, and the second test device has the ability to perform network registration tests using the first SIM card.
[0010] Optionally, the test circuit further includes: a control unit;
[0011] The output terminal of the control unit is connected to the input terminal of the switching unit;
[0012] The control unit outputs a first control signal or a second control signal through its output terminal. The first control signal is used to control the first terminal of the switch unit to be connected to the second terminal of the switch unit and the first terminal of the switch unit to be disconnected from the third terminal of the switch unit. The second control signal is used to control the first terminal of the switch unit to be connected to the third terminal of the switch unit and the first terminal of the switch unit to be disconnected from the second terminal of the switch unit.
[0013] Optionally, when the input terminal of the control unit receives the first instruction, the control unit outputs the first control signal through the output terminal of the control unit;
[0014] When the input terminal of the control unit receives the second instruction, the control unit outputs the second control signal through its output terminal.
[0015] Optionally, the test circuit further includes: a second SIM card;
[0016] The first end of the second SIM card is connected to the fourth end of the switching unit;
[0017] When the fourth terminal of the switch unit is connected to the second terminal of the switch unit and the fourth terminal of the switch unit is disconnected from the third terminal of the switch unit, the first test device is connected to the second SIM card, and the first test device has the ability to perform network registration test using the second SIM card;
[0018] When the fourth terminal of the switch unit is connected to the third terminal of the switch unit and the fourth terminal of the switch unit is disconnected from the second terminal of the switch unit, the second test device is connected to the second SIM card, and the second test device has the ability to perform network registration tests using the second SIM card.
[0019] Optionally, the test circuit further includes: a first card slot; the first card slot is used to fix the first SIM card.
[0020] Optionally, the first card slot is adapted to the size of the first SIM card.
[0021] Optionally, the first card slot includes a flip structure; when the flip structure of the first card slot is in the flip state, the first SIM card can be fixed in the first card slot.
[0022] Optionally, the first card slot includes a pop-out structure; when the pop-out structure of the first card slot is in the pop-out state, the first SIM card can be fixed in the first card slot.
[0023] Optionally, the first end of the first test device includes a first SIM card slot, and the first end of the second test device includes a second SIM card slot;
[0024] The second end of the switch unit includes a first SIM card connector, and the third end of the switch unit includes a second SIM card connector;
[0025] The first SIM card slot is connected to the first SIM card plug, and the second SIM card slot is connected to the second SIM card plug.
[0026] A second aspect of this application provides a testing apparatus, which includes a testing circuit, a first testing device, and a second testing device as described in the first aspect.
[0027] In this embodiment of the application, by switching the connection state of the switch unit, the first SIM card is connected to the first test device or the second test device, so that both the first test device and the second test device can use the first SIM card to perform network registration tests, thereby improving the utilization rate of the first SIM card, reducing the number of SIM cards required when multiple test devices perform network registration tests, and reducing the cost of multiple test devices performing network registration tests. Attached Figure Description
[0028] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0029] Figure 1 A schematic diagram of a test circuit provided in an embodiment of this application;
[0030] Figure 2 This is a schematic diagram of another test circuit provided in an embodiment of this application;
[0031] Figure 3 This is a schematic diagram of another test circuit provided in an embodiment of this application;
[0032] Figure 4 This is a schematic diagram of another test circuit provided in an embodiment of this application;
[0033] Figure 5 This is a flowchart of a test circuit provided in an embodiment of this application. Detailed Implementation
[0034] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.
[0035] The terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or apparatuses.
[0036] In this application, the reference to "embodiment" means that a specific feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a mutually exclusive, independent, or alternative embodiment. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described in this application can be combined with other embodiments.
[0037] It should be understood that network registration testing involves performing stability tests on the SIM card related to network registration, including power-on / off network registration tests, reboot network registration tests, abnormal power-off network registration tests, and airplane mode on / off network registration tests. Typically, network registration tests need to be repeated n times. For example, when performing a power-on / off network registration test, the SIM card is tested using a testing device, and after the test is completed, the device is powered off and then on again, repeating the above steps n times to test the stability of the SIM card during network registration.
[0038] Please see Figure 1 , Figure 1 This is a schematic diagram of a test circuit provided in an embodiment of this application. The test circuit includes a first SIM card 10 and a switching unit 20. The test circuit provided in this embodiment is connected to a first test device 30 and a second test device 40. The first test device 30 includes a first terminal 31, and the second test device 40 includes a first terminal 41. The first SIM card 10 includes a first terminal 11, and the switching unit 20 includes a first terminal 21, a second terminal 22, and a third terminal 23. The first terminal 11 of the first SIM card 10 is connected to the first terminal 21 of the switching unit 20, the second terminal 22 of the switching unit 20 is connected to the first terminal 31 of the first test device 30, and the third terminal 23 of the switching unit 20 is connected to the first terminal 41 of the second test device 40.
[0039] When the first end 21 of the switch unit 20 is connected to the second end 22 of the switch unit 20 and the first end 21 of the switch unit 20 is disconnected from the third end 23 of the switch unit 20, the first test device 30 is connected to the first SIM card 10 and the first test device 30 has the ability to perform network registration test using the first SIM card 10.
[0040] When the first end 21 of the switch unit 20 is connected to the third end 23 of the switch unit 20, and the first end 21 of the switch unit 20 is disconnected from the second end 22 of the switch unit 20, the second test device 40 is connected to the first SIM card 10, and the second test device 40 has the ability to perform network registration tests using the first SIM card 10.
[0041] In this embodiment of the application, by switching the connection state of the switch unit 20, the first SIM card 10 is connected to the first test device 30 or the second test device 40, so that both the first test device 30 and the second test device 40 can use the first SIM card to perform network registration tests, thereby improving the utilization rate of the first SIM card 10, reducing the demand for SIM cards when multiple test devices perform network registration tests, and reducing the cost of multiple test devices performing network registration tests.
[0042] In one possible implementation scenario, the first test device 30 performs a power-on / power-off network registration test, and the second test device performs a restart / power-off network registration test. With the first terminal 21 of the switch unit 20 connected to the second terminal 22 and the first terminal 21 of the switch unit 20 disconnected from the third terminal 23, the first test device 30 uses the first SIM card 10 to perform the network registration test. After the test, the first test device 30 is powered off and then powered on again. At this time, the state of the switch unit 20 is switched so that the first terminal 21 of the switch unit 20 is connected to the third terminal 23 and the first terminal 21 of the switch unit 20 is disconnected from the second terminal 22. The second test device 40 uses the first SIM card 10 to perform the network registration test, and restarts after the test. After repeating the above steps n times, the testing tasks of the first test device 30 and the second test device 40 are completed.
[0043] It should be understood that the embodiments of this application only exemplarily show two test devices, namely the first test device 30 and the second test device 40. This application does not limit the number of test devices, that is, the test circuit can be connected to more than one test device.
[0044] Optionally, the test circuit may also include: a first card slot. The slot is used to insert a first SIM card.
[0045] Alternatively, the first card slot may be sized to match the first SIM card 10, i.e., the first card slot and the first SIM card 10 may fit together with a clearance. For example, if the size of the first card slot is 16*16, the insertable first SIM card 10 should also be 16*16.
[0046] In one possible implementation, the test circuit also includes a flip structure, in which the first SIM card 10 can be inserted into the slot covered by the flip structure when the flip structure is in the flip state.
[0047] In another possible implementation, the test circuit also includes a pop-out structure. With the pop-out structure in the pop-out state, the first SIM card 10 can be inserted into the slot of the pop-out structure.
[0048] Please see Figure 2 , Figure 2 This is a schematic diagram of another test circuit provided in an embodiment of this application. The test circuit includes a first SIM card 10, a switching unit 20, and a control unit 50. The test circuit provided in this embodiment is connected to a first test device 30 and a second test device 40. The first test device 30 includes a first terminal 31, and the second test device 40 includes a first terminal 41. The first SIM card 10 includes a first terminal 11, the switching unit 20 includes a first terminal 21, a second terminal 22, a third terminal 23, and an input terminal 24, and the control unit 50 includes an output terminal 51. The first terminal 11 of the first SIM card 10 is connected to the first terminal 21 of the switching unit 20, the second terminal 22 of the switching unit 20 is connected to the first terminal 31 of the first test device 30, the third terminal 23 of the switching unit 20 is connected to the first terminal 41 of the second test device 40, and the input terminal 24 of the switching unit 20 is connected to the output terminal 51 of the control unit 50.
[0049] The control unit 50 is used to output a first control signal or a second control signal to the switch unit 20. The first control signal is used to control the first terminal 21 of the switch unit 20 to be connected to the second terminal 22 of the switch unit 20 and to disconnect the first terminal 21 of the switch unit 20 from the third terminal 23 of the switch unit 20. The second control signal is used to control the first terminal 21 of the switch unit 20 to be connected to the third terminal 23 of the switch unit 20 and to disconnect the first terminal 21 of the switch unit 20 from the second terminal 22 of the switch unit 20.
[0050] Optionally, the first control signal is a low-level signal, and the second control signal is a high-level signal. When the switching unit 20 receives a low-level signal, the first terminal 21 of the switching unit 20 is connected to the second terminal 22 of the switching unit 20, and the first terminal 21 of the switching unit 20 is disconnected from the third terminal 23 of the switching unit 20. When the switching unit 20 receives a high-level signal, the first terminal 21 of the switching unit 20 is connected to the third terminal 23 of the switching unit 20, and the first terminal 21 of the switching unit 20 is disconnected from the second terminal 22 of the switching unit 20.
[0051] Optionally, the control unit 50 also includes an input terminal 52. When the input terminal 52 of the control unit 50 receives a first instruction, the output terminal 51 of the control unit 50 outputs a first control signal. When the input terminal 52 of the control unit 50 receives a second instruction, the output terminal 51 of the control unit 50 outputs a second control signal.
[0052] In one possible implementation scenario, the test circuit is connected to a computer, and the computer outputs a first instruction or a second instruction to the input terminal 52 of the control unit 50.
[0053] Please see Figure 3 , Figure 3 This is a schematic diagram of another test circuit provided in an embodiment of this application. The test circuit includes a first SIM card 10, a switch unit 20, a control unit 50, and a second SIM card 60. The test circuit provided in this embodiment is connected to a first test device 30 and a second test device 40. The first test device 30 includes a first terminal 31, and the second test device 40 includes a first terminal 41. The first SIM card 10 includes a first terminal 11, the switch unit 20 includes a first terminal 21, a second terminal 22, a third terminal 23, an input terminal 24, and a fourth terminal 25, the control unit 50 includes an output terminal 51, and the second SIM card 60 includes a first terminal 61. The first terminal 11 of the first SIM card 10 is connected to the first terminal 21 of the switch unit 20, the second terminal 22 of the switch unit 20 is connected to the first terminal 31 of the first test device 30, the third terminal 23 of the switch unit 20 is connected to the first terminal 41 of the second test device 40, the input terminal 24 of the switch unit 20 is connected to the output terminal 51 of the control unit 50, and the fourth terminal 25 of the switch unit 20 is connected to the first terminal of the second SIM card 60.
[0054] When the fourth terminal 25 of the switch unit 20 is connected to the second terminal 22 of the switch unit 20, and the fourth terminal 25 of the switch unit 20 is disconnected from the third terminal 23 of the switch unit 20, the first test device 30 is connected to the second SIM card 60, and the first test device 30 has the ability to perform network registration tests using the second SIM card 60.
[0055] When the fourth terminal 25 of the switch unit 20 is connected to the third terminal 23 of the switch unit 20, and the fourth terminal 25 of the switch unit 20 is disconnected from the second terminal 22 of the switch unit 20, the second test device 40 is connected to the second SIM card 60, and the second test device 40 has the ability to perform network registration tests using the second SIM card 60.
[0056] In one possible implementation scenario, the first terminal 21 of the switch unit 20 is connected to the second terminal 22 of the switch unit 20, the fourth terminal 25 of the switch unit 20 is connected to the third terminal 23 of the switch unit 20, the first terminal 21 of the switch unit 20 is disconnected from the third terminal 23 of the switch unit 20, and the fourth terminal 25 of the switch unit 20 is disconnected from the second terminal 22 of the switch unit 20. The first test device 30 uses the first SIM card 10 to perform network registration testing, and the second test device 40 uses the second SIM card 60 to perform network registration testing.
[0057] In another possible implementation scenario, the first terminal 21 of the switch unit 20 is connected to the third terminal 23 of the switch unit 20, the fourth terminal 25 of the switch unit 20 is connected to the second terminal 22 of the switch unit 20, the first terminal 21 of the switch unit 20 is disconnected from the second terminal 22 of the switch unit 20, and the fourth terminal 25 of the switch unit 20 is disconnected from the third terminal 23 of the switch unit 20. The first test device 30 uses the second SIM card 60 to perform network registration testing, and the second test device 40 uses the first SIM card 10 to perform network registration testing.
[0058] It should be understood that the embodiments of this application only exemplarily show two SIM cards, namely the first SIM card 10 and the second SIM card 60. This application does not limit the number of SIM cards, that is, the test circuit may include one or more SIM cards.
[0059] Please see Figure 4 , Figure 4This is a schematic diagram of another test circuit provided in an embodiment of this application. The test circuit includes a first SIM card 10, a switch unit 20, a control unit 50, and a second SIM card 60. The test circuit provided in this embodiment connects a first test device 30, a second test device 40, and a computer 70. The first test device 30 includes a first terminal 31 and a second terminal 32. The second test device 40 includes a first terminal 41 and a second terminal 42. The computer 70 includes a first terminal 71, a second terminal 72, and a third terminal 73. The first terminal 31 of the first test device 30 includes a first SIM card slot, and the first terminal 41 of the second test device 40 includes a second SIM card slot. The first SIM card 10 includes a first terminal 11. The switch unit 20 includes a first terminal 21, a second terminal 22, a third terminal 23, an input terminal 24, and a fourth terminal 25. The second terminal 22 of the switch unit 20 includes a first SIM card plug, and the third terminal 23 of the switch unit 20 includes a second SIM card slot. The control unit 50 includes an output terminal 51 and an input terminal 52. The second SIM card 60 includes a first terminal 61. The first end 11 of the first SIM card 10 is connected to the first end 21 of the switch unit 20. The first SIM card plug of the switch unit 20 is connected to the first SIM card slot of the first test device 30. The second SIM card plug of the switch unit 20 is connected to the second SIM card slot of the second test device 40. The input end 24 of the switch unit 20 is connected to the output end 51 of the control unit 50. The fourth end 25 of the switch unit 20 is connected to the first end of the second SIM card 60. The first end 71 of the computer 70 is connected to the input end 52 of the control unit 50. The second end 72 of the computer 70 is connected to the second end 32 of the first test device 30. The third end 73 of the computer 70 is connected to the second end 42 of the second test device 40.
[0060] The computer 70 sends a first instruction or a second instruction to the control unit 50 through its first terminal 71, thereby changing the connection state of the switching unit 20.
[0061] Computer 70 sends test commands to the second terminal 32 of the first test device 30 through the second terminal 72 of computer 70, and controls the first test device 30 to perform network registration test using the SIM card connected to the first test device 30.
[0062] Computer 70 sends test commands to the second terminal 42 of the second test device 40 through the third terminal 73 of computer 70, and controls the second test device 40 to perform network registration test using the SIM card connected to the second test device 40.
[0063] based on Figure 5 Please refer to the provided test circuit. Figure 5 , Figure 5This is a flowchart of a test circuit provided in an embodiment of this application. When the test circuit is started, the first SIM card 10 is connected to the switch unit 20, the control unit 50 is connected to the computer 70, the first SIM card connector and the second SIM card connector of the switch unit 20 are connected to the first test device 30 and the second test device 40 respectively, and the computer 70 is connected to the first test device 30 and the second test device 40. After completing the above steps, n network registration tests are performed. Specifically, the computer controls the first terminal 21 of the switch unit 20 to connect with the second terminal 22 of the switch unit, and disconnects the first terminal 21 of the switch unit from the third terminal 23 of the switch unit, so that the first test device 30 is connected to the first SIM card 10. The first test device 30 uses the first SIM card 10 to perform the network registration test. After the network registration test of the first test device 30 ends, it enters a stage where it is powered off or de-energized and no SIM card is needed. The first test device 30 then sends the test results of this network registration test to the computer 70. At this time, the computer 70 controls the first terminal 21 of the switch unit 20 to connect with the third terminal 23 of the switch unit 20, and disconnects the first terminal 21 of the switch unit from the second terminal 22 of the switch unit, so that the second test device 40 connects with the first SIM card 10. The second test device 40 uses the first SIM card 10 to perform a network registration test. After the network registration test of the second test device 40 is completed, it enters a stage where it is powered off or de-energized and no SIM card is needed. The second test device 40 sends the test results of this network registration test to the computer 70. After the test of the second test device 40 is completed, the computer 70 counts whether the network registration test has reached the required number of times. If the network registration test has not reached the required number of times, the above network registration test steps are executed again. If the network registration test has reached the required number of times, the computer counts the network registration test results and terminates the execution of the test circuit.
[0064] In one possible design, the testing device can correspond to, for example: Figures 1-4 The test apparatus may include any of the test circuits, first test devices, and second test devices shown in the above embodiments. The test apparatus may include components for performing the operations executed by the test circuits in the above embodiments, and each component in the test apparatus respectively implements the operations performed by the test circuits in the above method embodiments.
[0065] In the above embodiments, the descriptions of each embodiment have different focuses. Parts not described in detail in a particular embodiment can be found in the relevant descriptions of other embodiments. It should be understood that the disclosed apparatus can be implemented in other ways based on the embodiments provided in this application. For example, the apparatus embodiments described above are merely illustrative.
[0066] The embodiments of this application have been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this application. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of this application. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this application. Therefore, the content of this specification should not be construed as a limitation of this application.
Claims
1. A test circuit, characterized by The test circuit includes: First SIM card, switch unit; The first end of the first SIM card is connected to the first end of the switching unit, the second end of the switching unit is connected to the first end of the first test device, and the third end of the switching unit is connected to the first end of the second test device. When the first end of the switch unit is connected to the second end of the switch unit and the first end of the switch unit is disconnected from the third end of the switch unit, the first test device is connected to the first SIM card, and the first test device has the ability to perform network registration test using the first SIM card. When the first end of the switch unit is connected to the third end of the switch unit and the first end of the switch unit is disconnected from the second end of the switch unit, the second test device is connected to the first SIM card, and the second test device has the ability to perform network registration tests using the first SIM card.
2. The test circuit of claim 1, wherein, The test circuit also includes: Control unit; The output terminal of the control unit is connected to the input terminal of the switching unit; The control unit outputs a first control signal or a second control signal through its output terminal. The first control signal is used to control the first terminal of the switch unit to be connected to the second terminal of the switch unit and the first terminal of the switch unit to be disconnected from the third terminal of the switch unit. The second control signal is used to control the first terminal of the switch unit to be connected to the third terminal of the switch unit and the first terminal of the switch unit to be disconnected from the second terminal of the switch unit.
3. The test circuit of claim 2, wherein, When the input terminal of the control unit receives the first instruction, the control unit outputs the first control signal through the output terminal of the control unit. When the input terminal of the control unit receives the second instruction, the control unit outputs the second control signal through its output terminal.
4. The test circuit according to any one of claims 1 to 3, characterized in that, The test circuit also includes: Second SIM card; The first end of the second SIM card is connected to the fourth end of the switching unit; When the fourth terminal of the switch unit is connected to the second terminal of the switch unit and the fourth terminal of the switch unit is disconnected from the third terminal of the switch unit, the first test device is connected to the second SIM card, and the first test device has the ability to perform network registration test using the second SIM card; When the fourth terminal of the switch unit is connected to the third terminal of the switch unit and the fourth terminal of the switch unit is disconnected from the second terminal of the switch unit, the second test device is connected to the second SIM card, and the second test device has the ability to perform network registration tests using the second SIM card.
5. The test circuit of claim 1, wherein, The test circuit also includes: a first card slot; The first card slot is used to fix the first SIM card.
6. The test circuit of claim 5, wherein, The first card slot is adapted to the size of the first SIM card.
7. The test circuit of claim 5, wherein, The first card slot includes a flip-top structure; When the flip structure of the first card slot is in the flip state, the first SIM card can be fixed in the first card slot.
8. The test circuit of claim 5, wherein, The first card slot includes a pop-out structure; When the pop-out structure of the first card slot is in the pop-out state, the first SIM card can be fixed in the first card slot.
9. The test circuit of claim 1, wherein, The first end of the first test device includes a first SIM card slot, and the first end of the second test device includes a second SIM card slot; The second end of the switch unit includes a first SIM card connector, and the third end of the switch unit includes a second SIM card connector; The first SIM card slot is connected to the first SIM card plug, and the second SIM card slot is connected to the second SIM card plug.
10. A test device, characterized by The testing apparatus includes a test circuit, a first test device, and a second test device as described in any one of claims 1-9.