A 128-station test handler
By designing a 128-station testing and sorting machine, automated testing and sorting of memory chips were achieved, solving the problem of insufficient automation in existing technologies, improving testing efficiency and reliability, and enhancing production efficiency.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- JIADECHUAN TECH (SHENZHEN) CO LTD
- Filing Date
- 2025-09-03
- Publication Date
- 2026-08-04
AI Technical Summary
Existing memory chip testing and sorting equipment lacks sufficient automation and requires extensive manual intervention, resulting in low testing efficiency, large errors, and poor reliability, which affects product quality and production capacity.
A 128-station test and sorting machine was designed, comprising a test fixture, a storage chamber, a transfer mechanism, and a pushing component, to achieve automated chip loading, testing, and sorting, reducing manual operation.
It improved testing efficiency and reliability, reduced testing errors, ensured the consistency of test results and product quality, and enhanced production efficiency.
Smart Images
Figure CN224586432U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of memory testing technology, specifically a 128-station testing and sorting machine. Background Technology
[0002] Memory modules are core components of modern computers, serving as the hardware foundation for the CPU to address and perform read / write operations via the bus. In the history of personal computers, memory modules initially appeared as expansion modules of the motherboard's main memory. With the rapid iteration of computer hardware and software technology, the demands on memory capacity and speed have become increasingly stringent. Memory modules have now evolved into integrated read / write memory units with multiple chips, and their performance and reliability directly determine the overall system performance. Therefore, comprehensive and precise electrical performance testing and screening of the core components—the memory chips—is crucial during the manufacturing process of memory modules. This is not only a key step in ensuring product quality and meeting specifications, but also a fundamental guarantee for screening out early-failure products and improving the durability and stability of end products, which is of great significance for cost control and maintaining brand reputation.
[0003] However, existing memory chip testing and sorting devices generally suffer from insufficient automation, requiring significant manual intervention in the testing process. Operators must manually load, position, and secure the chips, and even sort and collect them after testing. This manual assistance not only significantly reduces testing efficiency, becoming a bottleneck for increasing production capacity, but also introduces numerous testing error risks due to its inherent instability. For example, manual chip placement may lead to poor contact with the test socket or misalignment, causing signal distortion; frequent manual operations may also cause physical damage to precision test probes or the chips themselves. Furthermore, manual recording and judgment of data are prone to subjective bias or negligence, making it difficult to guarantee the consistency and reliability of test results, ultimately affecting product yield assessment and quality traceability.
[0004] Based on this, a 128-station testing and sorting machine is now provided, which can eliminate the drawbacks of existing devices. Utility Model Content
[0005] The purpose of this invention is to provide a 128-station testing and sorting machine to solve the problems in the background technology.
[0006] To achieve the above objectives, this utility model provides the following technical solution:
[0007] A 128-station testing and sorting machine includes testing fixtures and bins. A plurality of testing fixtures are arranged in an equally spaced array on the upper end of a mounting cabinet. Each testing fixture has a testing motherboard mounted on one side. A plurality of bins are arranged in an equally spaced array on one side of the upper end of the mounting cabinet. The bins are, in sequence, a bin for materials to be tested, a bin for finished materials, a bin for defective materials, a bin for replenishing materials, and a bin for empty trays. Each bin contains a plurality of trays. Each bin contains a pushing component for pushing the trays out. A first transfer mechanism for transferring the trays is located at the upper end of the mounting cabinet and at the bin positions. A second transfer mechanism for transferring and testing memory chips is located at the upper end of the mounting cabinet.
[0008] Based on the above technical solutions, this utility model also provides the following optional technical solutions:
[0009] In one alternative embodiment: each side of the silo body is provided with a feeding port, and each side of the silo body is hinged to a silo door at the feeding port. Each silo door is provided with an opening detection fiber optic cable near the silo body. Each side of the silo door is provided with an installation shaft, and a fixed box is rotatably mounted on the installation shaft. Each fixed box is provided with a torsion spring at the connection between itself and the installation shaft. The fixed box is fixedly mounted on one side of the silo door. Each end of the installation shaft is fixedly provided with a limit buckle. Each silo body is provided with a fixed seat at the position corresponding to the limit buckle. Each silo body is fixedly provided with a detection fiber optic cable at the upper end.
[0010] In one alternative: the pushing assembly includes a sliding plate and a first motor. The sliding plate is slidably provided inside the compartment. The first motor is installed at the bottom of the sliding plate. A lead screw is fixedly provided at the output end of the first motor. A wire tube is fitted on the lead screw. The wire tube is installed inside the mounting cabinet. Guide slide rods are symmetrically provided at the bottom of the sliding plate. Sliding holes are provided at the upper end of the mounting cabinet at the positions corresponding to the guide slide rods.
[0011] In one alternative: the first transfer mechanism includes a second transport component, which is fixedly mounted on the output end of a cylinder. The cylinder is slidably mounted in a guide groove on one side of a guide plate. A transmission belt is provided at the end of the cylinder, and the transmission belt is driven by a second electric motor.
[0012] In one alternative: the second transfer mechanism includes a first transport component, each of the working ends of the first transport component is provided with a suction cup, the first transport component is installed at the bottom of a movable seat, the movable seat is installed at the upper end of a first guide rail, the first guide rail is slidably disposed at the upper end of a second guide rail, and both the movable seat and the first guide rail are driven by a transmission belt.
[0013] In one alternative: a plurality of defective boxes are arranged in an array on one side of the test hopper, and each defective box is fixedly mounted on the upper end of a fixed frame, and a calibration station is provided at the end of the fixed frame.
[0014] In one alternative: the number of test fixtures is 16, and each test fixture is fixedly connected to the mounting cabinet by screws.
[0015] In one alternative: the mounting cabinet is fixedly provided with a top frame, the top frame is provided with several fans, the outer side of the top frame is provided with several side windows, and one end of the top frame is provided with control components and control buttons.
[0016] Compared with the prior art, the beneficial effects of this utility model are as follows:
[0017] This invention, by setting up a first transfer mechanism and a second transfer mechanism, can transfer the material tray and memory chips, so that the memory chips to be tested can be transferred to the testing fixture. After the test is completed, the second transfer mechanism can classify and store the memory chips, which increases the practicality of the testing machine. At the same time, several test fixture arrays are installed on the upper part of the mounting cabinet, so that test fixtures of different specifications can be replaced during testing. By setting up a top frame and side windows, the influence of dust during testing can be reduced. Attached Figure Description
[0018] Figure 1 This is a schematic diagram of the structure of this utility model.
[0019] Figure 2 This is a schematic diagram of the upper structure of the mounting cabinet of this utility model.
[0020] Figure 3 This is a schematic diagram of the cylinder installation of this utility model.
[0021] Figure 4 This is a schematic diagram of the installation of each compartment of this utility model.
[0022] Figure 5 This is a schematic diagram of the storage structure of this utility model.
[0023] Figure 6 This is a schematic diagram of the installation of the second handling component of this utility model.
[0024] Figure 7 This is a schematic diagram of the installation of the calibration station of this utility model.
[0025] Figure 8 This is a schematic diagram of the test motherboard installation for this utility model.
[0026] Figure label annotations: 11 Test fixture, 12 Test main board, 13 Mounting cabinet, 14 Top frame, 15 Side window, 16 Control component, 17 Control button, 18 First handling component, 19 Moving seat, 20 First guide rail, 21 Second guide rail, 22 Test hopper, 23 Finished hopper, 24 Defective hopper, 25 Replenishment hopper, 26 Empty tray hopper, 27 Defective box, 28 Calibration station, 29 Tray, 30 Hopper door, 31 Limit buckle, 32 Opening detection fiber optic cable, 33 Detection fiber optic cable, 34 Guide slide bar, 35 First motor, 36 Lead screw, 37 Second handling component, 38 Cylinder, 39 Second motor, 40 Guide groove plate. Detailed Implementation
[0027] To make the objectives, technical solutions, and advantages of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments.
[0028] In one embodiment, such as Figure 2 , Figure 4 , Figure 6 and Figure 8 As shown, a 128-station testing and sorting machine includes a testing fixture 11 and a bin. Several testing fixtures 11 are arranged in an equally spaced array on the upper end of a mounting cabinet 13. A testing motherboard 12 is mounted on one side of each testing fixture 11. Several bins are arranged in an equally spaced array on one side of the upper end of the mounting cabinet 13. The bins are sequentially designated as a test bin 22, a finished product bin 23, a defective product bin 24, a replenishment bin 25, and an empty bin 26. Several material trays 29 are provided inside each bin. Each bin is equipped with a pushing component for pushing the material trays 29 out. A first transfer mechanism for transferring the material trays 29 is located at the upper end of the mounting cabinet 13 and at the bin position. A second transfer mechanism for transferring and testing memory chips is located at the upper end of the mounting cabinet 13. The first transfer mechanism facilitates the transfer of the material trays 29, enabling continuous testing. The second transfer mechanism facilitates the transfer of memory chips to the testing fixture 11 for testing.
[0029] like Figure 5As shown, each side of the silo body is provided with a feeding port. Each side of the silo body and the feeding port is hinged with a silo door 30. Each silo door 30 is provided with an opening detection fiber optic cable 32 near the silo body. Each side of the silo door 30 is provided with an installation shaft. A fixed box is rotatably mounted on the installation shaft. A torsion spring is provided at the connection between the fixed box and the installation shaft. The fixed box is fixedly mounted on one side of the silo door 30. Each end of the installation shaft is fixedly provided with a limit buckle 31. Each silo body is provided with a fixed seat at the position corresponding to the limit buckle 31. Each silo body is fixedly provided with a detection fiber optic cable 33 at the upper end. In use, when it is necessary to place or remove the material tray 29 into the silo body, rotate the limit buckle 31 to separate the opening detection fiber optic cable 32 from the fixed seat, and then rotate the silo door 30 to place or remove the material tray 29.
[0030] like Figure 5 As shown, the pushing assembly includes a sliding plate and a first motor 35. Sliding plates are slidably mounted inside the hopper, and a first motor 35 is installed at the bottom of each sliding plate. A lead screw 36 is fixedly mounted at the output end of the first motor 35, and a wire tube is fitted onto the lead screw 36. The wire tubes are all installed inside the mounting cabinet 13. Guide rods 34 are symmetrically provided at the bottom of each sliding plate. Sliding holes are provided at the upper end of the mounting cabinet 13 corresponding to the positions of the guide rods 34. In use, when it is necessary to push the material tray 29 out of the hopper, the first motor 35 is started. The output end of the first motor 35 drives the lead screw 36 to rotate. The lead screw 36 cooperates with the wire tube, causing the sliding plate to slide inside the hopper. The sliding plate drives the material tray 29 to move. When the material tray 29 moves to the position of the detection fiber optic 33, the output end of the first motor 35 stops rotating.
[0031] like Figure 3 As shown, the first transfer mechanism includes a second transport component 37, which is fixedly mounted on the output end of a cylinder 38. The cylinder 38 is slidably mounted in a guide groove on one side of a guide plate 40. A transmission belt is provided at the end of the cylinder 38, which is driven by a second motor 39. In use, when it is necessary to transfer the material tray 29 inside the replenishment bin 25 to the test bin 22, the second motor 39 drives the second transport component 37 to move via the transmission belt, so that the second transport component 37 moves above the test bin 22. Then, the output end of the cylinder 38 drives the second transport component 37 to move. The second transport component 37 clamps the material tray 29 through its internal cylinder and then transfers the material tray 29. At the same time, the second transport component 37 can transfer the used material tray 29 to the empty tray bin 26 for storage.
[0032] like Figure 3As shown, the second transfer mechanism includes a first transport component 18, each of which has a suction cup at its working end. The first transport component 18 is mounted on the bottom of a movable base 19, which is mounted on the upper end of a first guide rail 20. The first guide rail 20 is slidably disposed on the upper end of a second guide rail 21. Both the movable base 19 and the first guide rail 20 are driven by a transmission belt. In use, when testing a memory chip, the suction cup at the end of the first transport component 18 fixes the memory chip. Then, the movable base 19 drives the first transport component 18 to rise. The movable base 19 slides on the first guide rail 20, and the first guide rail 20 slides on the second guide rail 21, so that the chip to be tested is placed at the corresponding test fixture 11 test position, and the chip end is electrically connected to the test terminal of the test motherboard 12. Then, the memory chip is tested.
[0033] like Figure 6 , 7 As shown, a plurality of defective boxes 27 are arrayed on one side of the test hopper 22. The defective boxes 27 are all fixedly mounted on the upper end of the fixed frame. The end of the fixed frame is provided with a calibration station 28. In use, when the first transport component 18 transfers the memory chip, the first transport component 18 drives the chip to move to the calibration station 28 first. The calibration station 28 performs photoelectric detection on the memory chip. The defective boxes 27 can store defective products.
[0034] like Figure 2 As shown, there are 16 test fixtures 11. All test fixtures 11 are fixedly connected to the mounting cabinet 13 by screws, which makes it easy to replace test fixtures 11 of different specifications during use.
[0035] like Figure 1 As shown, the mounting cabinet 13 is fixedly provided with a top frame 14 at the upper end. The top frame 14 is provided with several fans at the upper end and several side windows 15 on the outer side of the top frame 14. One end of the top frame 14 is provided with a control component 16 and a control button 17. In use, it is convenient to protect the inside of the top frame 14 and reduce the entry of dust. At the same time, the control component 16 and the control button 17 can control the first transport component 18 and the second transport component 37, thereby facilitating the testing of memory chips.
[0036] The above embodiment discloses a 128-station testing and sorting machine. A tray 29 containing memory chips is placed inside a replenishment bin 25 for storage. When the tray 29 needs to be transferred from the replenishment bin 25 to the test bin 22, a second motor 39 drives a second transport component 37 via a transmission belt, moving the second transport component 37 above the test bin 22. Then, the output of a cylinder 38 drives the second transport component 37 to move. The second transport component 37 clamps the tray 29 using an internal cylinder and then transfers the tray 29. Simultaneously, the second transport component 37 can transfer used trays 29 to an empty tray bin 26 for storage. When the tray 29 needs to be pushed out of the bin, a first motor 35 is started. The output of the first motor 35 drives a lead screw 36 to rotate. The lead screw 36, in conjunction with a wire tube, pushes a sliding plate to slide inside the bin. The sliding plate moves the tray 29. When the tray 29 reaches the position of the detection fiber optic 33, the output of the first motor 35 stops rotating.
[0037] When testing memory chips, the suction cup at the end of the first transport component 18 fixes the memory chip. Then, the moving base 19 drives the first transport component 18 to rise. The moving base 19 slides on the first guide rail 20, and the first guide rail 20 slides on the second guide rail 21. The first transport component 18 drives the chip to the calibration station 28 first. The calibration station 28 performs photoelectric detection on the memory chip. Then, the chip to be tested is placed at the corresponding test fixture 11, and the chip end is electrically connected to the test terminal of the test motherboard 12. Then, the memory chip is tested. After the test is completed, the memory chips can be classified and stored in the hopper 23, the defective hopper 24, and the defective box 27.
[0038] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.
Claims
1. A 128-station testing and sorting machine, comprising testing fixtures (11) and bins, wherein a plurality of the testing fixtures (11) are arranged in an equally spaced array on the upper end of a mounting cabinet (13), and a testing motherboard (12) is mounted on one side of each testing fixture (11), and a plurality of bins are arranged in an equally spaced array on one side of the upper end of the mounting cabinet (13), characterized in that, The plurality of bins are, in sequence, a bin for test material (22), a bin for finished material (23), a bin for defective material (24), a bin for replenishing material (25), and a bin for empty trays (26). Each of the bins is equipped with a plurality of trays (29). Each bin is equipped with a pusher assembly for pushing out the trays (29). The upper end of the mounting cabinet (13) and the bin position are provided with a first transfer mechanism for transferring the trays (29). The upper end of the mounting cabinet (13) is provided with a second transfer mechanism for transferring and testing memory chips.
2. The 128-station testing and sorting machine according to claim 1, characterized in that, Each side of the silo body is provided with a feeding port. Each side of the silo body and the feeding port is hinged with a silo door (30). Each silo door (30) is provided with an opening detection fiber (32) near the silo body. Each side of the silo door (30) is provided with an installation shaft. A fixed box is rotatably provided on the installation shaft. A torsion spring is provided at the connection between the fixed box and the installation shaft. The fixed box is fixedly provided on one side of the silo door (30). Each end of the installation shaft is fixedly provided with a limit buckle (31). Each silo body is provided with a fixed seat at the position corresponding to the limit buckle (31). Each upper end of the silo body is fixedly provided with a detection fiber (33).
3. The 128-station testing and sorting machine according to claim 2, characterized in that, The pushing assembly includes a sliding plate and a first motor (35). The sliding plate is slidably provided inside the compartment. The first motor (35) is installed at the bottom of the sliding plate. The output end of the first motor (35) is fixedly provided with a lead screw (36). A wire tube is provided on the lead screw (36). The wire tube is installed inside the mounting cabinet (13). The bottom of the sliding plate is symmetrically provided with guide slide rods (34). The upper end of the mounting cabinet (13) is provided with sliding holes corresponding to the positions of the guide slide rods (34).
4. A 128-station testing and sorting machine according to claim 3, characterized in that, The first transfer mechanism includes a second transport component (37), which is fixedly mounted on the output end of a cylinder (38). The cylinder (38) is slidably mounted in a guide groove on one side of a guide plate (40). A transmission belt is provided at the end of the cylinder (38), and the transmission belt is driven by a second electric motor (39).
5. A 128-station testing and sorting machine according to claim 4, characterized in that, The second transfer mechanism includes a first transport component (18), the working end of which is provided with a suction cup. The first transport component (18) is installed at the bottom of a movable seat (19), the movable seat (19) is installed at the upper end of a first guide rail (20), the first guide rail (20) is slidably disposed at the upper end of a second guide rail (21), and the movable seat (19) and the first guide rail (20) are both driven by a transmission belt.
6. A 128-station testing and sorting machine according to claim 5, characterized in that, The test hopper (22) has several defective boxes (27) arranged in an array on one side. The defective boxes (27) are all fixed on the upper end of the fixed frame, and the fixed frame has a calibration station (28) at the end.
7. A 128-station testing and sorting machine according to claim 1, characterized in that, The number of test fixtures (11) is 16, and each test fixture (11) is fixedly connected to the mounting cabinet (13) by screws.
8. A 128-station testing and sorting machine according to claim 1, characterized in that, The mounting cabinet (13) is fixedly provided with a top frame (14) at the top end. The top frame (14) is provided with several fans at the top end. The top frame (14) is provided with several side windows (15) on the outside. One end of the top frame (14) is provided with an operating component (16) and a control button (17).