A laser diode chip power testing fixture
By designing an adjustable U-shaped frame and pressure plate structure, the problem of the single function of existing fixtures is solved, and stable clamping and position adjustment of chips of different sizes are achieved, improving the practicality and efficiency of laser diode chip testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- WUHAN WISCHIP TECH CO LTD
- Filing Date
- 2025-08-07
- Publication Date
- 2026-08-04
AI Technical Summary
Existing laser diode chip testing fixtures have limited functionality and are difficult to adapt to fixing and adjusting the position of chips of different sizes, resulting in inconvenience in use.
A U-shaped frame and pressure plate structure with adjustable height were designed. Combined with a linear module and a return spring, it can achieve stable clamping and position adjustment of chips of different sizes. The U-shaped frame can be raised and lowered by rotating the screw and the handle, which enhances the flexibility of clamping force and position adjustment.
The fixture's practicality has been improved, making it easy to fix and adjust the position of chips of different sizes, thus enhancing the stability and efficiency of chip testing.
Smart Images
Figure CN224594698U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of chip testing technology, specifically a fixture for testing the power of laser diode chips. Background Technology
[0002] A laser diode, also known as a semiconductor laser, is an electronic device that converts electric current into light energy. During the manufacturing and production process of semiconductor chips used in semiconductor lasers, the produced chips need to undergo power testing. After testing, the chips are then divided according to the markings on the printing paper and the pen, separating the semiconductor chips into independent chips as required.
[0003] Existing testing facilities mostly use fixed clamps for chip fixation, which limits the functionality of these clamps and makes chip positioning inconvenient. Therefore, we propose a clamp for testing the power of laser diode chips. Utility Model Content
[0004] Existing fixtures mostly use fixed clamps for lifting and adjusting to fix the chip, which results in the limitation of the single function of the fixed clamps. This utility model provides a fixture for testing the power of laser diode chips, which can clamp chips of different sizes, facilitates adjustment during use, and improves the practicality of the device, thus solving the problems mentioned in the background art.
[0005] The technical solution of this utility model is implemented as follows: A fixture for testing the power of a laser diode chip includes first through slots symmetrically opened on the top of an operating platform. The first through slots pass through a cavity set at the bottom of the operating platform, and a testing mechanism is slidably connected to one side of the operating platform. Multiple U-shaped frames with upward openings are set in the cavity. First sliding seats are slidably connected in two of the first through slots. The U-shaped frames pass through the first sliding seats and extend to the top of the operating platform. Pressure plates perpendicular to the U-shaped frames are fastened to the two adjacent sides of the U-shaped frames. A second through slot parallel to the first through slot is opened on one side of the top of the operating platform. A second sliding seat is slidably connected in the second through slot, and a screw is threadedly connected in the second sliding seat. The bottom of the screw extends into the cavity. A U-shaped rod is connected between the bottom of the U-shaped frame and the bottom of the screw, and the bottom of the screw and one end of the U-shaped rod are rotatably connected by a rotating seat.
[0006] Optionally, supports are symmetrically connected to the outer wall of the U-shaped frame. The supports are located directly below the first sliding seat, and multiple return springs are fastened between the first sliding seat and the supports.
[0007] Optionally, a handle is coaxially connected to the top of the screw.
[0008] Optionally, the bottom of the operating platform is fixedly mounted on a base.
[0009] Optionally, the testing mechanism includes an L-shaped bracket slidably connected to one side of the operating platform, with the end of the L-shaped bracket extending above the operating platform and a photodetector slidably connected to the bottom of the bracket.
[0010] Optionally, the first linear module is fastened to one side of the top of the operating platform, and the bottom of the L-shaped bracket is slidably connected to the first linear module via the first slider.
[0011] Optionally, a second linear module is tightly attached to the bottom of the L-shaped bracket, and the second linear module is perpendicular to the position of the first linear module. A mounting base is connected to the bottom of the first linear module via a second slider, and the photodetector is connected to the mounting base.
[0012] Optionally, a control box is also included, which contains a controller that connects the first linear module, the second linear module, the photodetector, and the controller.
[0013] Compared with the prior art, the present invention allows the screw to be rotated and moved up and down within the second sliding seat, thereby adjusting the U-shaped frame and the pressure plate. When the U-shaped frame is pressed down, it exerts a downward pulling force on the reset spring, which further increases the clamping force of the pressure plate on the chip. The U-shaped frame and the pressure plate can be slidably adjusted within the first through slot. When clamping chips of different sizes, the position of the pressure plate can be slidably adjusted, which facilitates adjustment during use and improves the practicality of the device. Attached Figure Description
[0014] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0015] Figure 1 This is a schematic diagram of the structure of this utility model.
[0016] Figure 2 This is a cross-sectional view of the present invention.
[0017] Figure 3 This is a connection diagram of the U-shaped rod and U-shaped frame of this utility model.
[0018] In the diagram: 1. Operating platform; 2. Mounting base; 3. L-shaped bracket; 4. Photodetector; 5. First through slot; 6. Second through slot; 7. First sliding seat; 8. Handle; 9. Pressure plate; 10. Control box; 11. First slider; 12. First linear module; 13. U-shaped frame; 14. Base; 15. Screw; 16. Second sliding seat; 17. Second slider; 18. Second linear module; 19. U-shaped rod; 20. Support; 21. Return spring; 22. Rotating seat; 23. Chamber. Detailed Implementation
[0019] The technical solution of this utility model will be clearly and completely described below with reference to its embodiments. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.
[0020] Reference Figures 1 to 3 This utility model provides a technical solution: a fixture for testing the power of a laser diode chip, including a testing mechanism on one side of an operating platform 1. The testing mechanism includes an L-shaped bracket 3 slidably connected to one side of the operating platform 1, a first linear module 12 fastened to the top side of the operating platform 1, and the bottom of the L-shaped bracket 3 slidably connected to the first linear module 12 via a fixed first slider 11. The end of the L-shaped bracket 3 extends to the top of the operating platform 1.
[0021] The L-shaped bracket 3 has a second linear module 18 tightly attached to it, and the second linear module 18 is perpendicular to the first linear module 12. A mounting base 2 is connected to the bottom of the first linear module 12 via a second slider 17. The photodetector 4 is connected to the mounting base 2, allowing it to move laterally and longitudinally under the action of the second linear module 18 and the first linear module 12. During testing, the chip (… Figure 1 The sensor (indicated by arrow A) is placed on top of the operating platform 1. Driven by the first linear module 12 and the second linear module 18, it can control the photodetector 4 to perform linear sliding adjustment on two axes, thereby enabling the photodetector 4 to perform batch testing of chips. In this solution, the second linear module 18 and the first linear module 12 drive the slider to perform linear movement, which is a conventional technology and will not be described in detail here.
[0022] like Figure 2 , 3As shown, the top of the operating platform 1 has symmetrically opened first through slots 5, which penetrate the cavity 23 at the bottom of the operating platform 1. Multiple U-shaped frames 13 with upward-facing openings are arranged within the cavity 23. First sliding seats 7 are slidably connected to both first through slots 5. In this embodiment, the first sliding seats 7 can be I-shaped and snapped into the first through slots 5. The two wings of the U-shaped frames 13 penetrate the first sliding seats 7 and extend to the top of the operating platform 1. A pressure plate 9 perpendicular to the U-shaped frames 13 is tightly fastened to one of the two adjacent ends of each U-shaped frame 13. Multiple U-shaped frames 139 can slide and adjust within the first through slots 5. The pressure plate 9 can adjust the chip (…) by the lifting and sliding of the U-shaped frames 13. Figure 2 The pressure plate 9 is clamped and fixed (as indicated by arrow A in the diagram). When clamping chips of different sizes, the position of the pressure plate 9 can be slidably adjusted, which facilitates adjustment during use and also improves the practicality of the device.
[0023] A second through groove 6 parallel to the first through groove 5 is provided on one side of the top of the operating platform 1. A second sliding seat 16 is slidably connected in the second through groove 6. In this embodiment, the second sliding seat 16 can be I-shaped and snapped into the first through groove 5. A screw rod 15 is threaded through the second sliding seat 16. A handle 8 is coaxially connected to the top of the screw rod 15. The bottom of the screw rod 15 extends into the cavity 23. A U-shaped rod 19 is connected between the bottom of the U-shaped frame 13 and the bottom of the screw rod 15. The bottom of the screw rod 15 and one end of the U-shaped rod 19 are rotatably connected through a rotating seat 22. Rotating the screw rod 15 can drive it to slide up and down in the second sliding seat 16, thereby adjusting the height of the U-shaped frame 13 and the pressure plate 9.
[0024] Meanwhile, to further improve the stability of the pressure plate 9 pressing the chip, supports 20 are symmetrically connected to the outer walls of the two wings of the U-shaped frame 13. The supports 20 are located directly below the first sliding seat 7. Multiple return springs 21 are fastened between the first sliding seat 7 and the supports 20. When the U-shaped frame 13 is driven to press down, it can exert a downward pulling force on the return springs 21. Under the action of the pulling force, the clamping force of the pressure plate 9 on the chip is further improved.
[0025] The laser diode chip power testing fixture also includes a control box 10, which houses a controller that connects the first linear module 12, the second linear module 18, and the photodetector 4. To improve the overall stability of the device, a base 14 is securely fastened to the bottom of the operating platform 1.
[0026] The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.
Claims
1. A fixture for testing the power of a laser diode chip, comprising a first through slot (5) symmetrically formed in the top of an operating platform (1), characterized in that, The first through slot (5) is set through the chamber (23) at the bottom of the operating platform (1), and the test mechanism is slidably connected to one side of the operating platform (1); Multiple U-shaped frames (13) with upward openings are provided in the chamber (23). The first sliding seat (7) is slidably connected in the two first through slots (5). The U-shaped frame (13) passes through the first sliding seat (7) and extends to the top of the operating platform (1). The two ends of the U-shaped frame (13) are tightly fitted with pressure plates (9) perpendicular to it. The top side of the operating platform (1) is provided with a second through groove (6) parallel to the first through groove (5). A second sliding seat (16) is slidably connected in the second through groove (6), and a screw (15) is threadedly connected in the second sliding seat (16). The bottom of the screw (15) extends into the chamber (23). A U-shaped rod (19) is connected between the bottom of the U-shaped frame (13) and the bottom of the screw (15), and the bottom of the screw (15) and one end of the U-shaped rod (19) are rotatably connected by a rotating seat (22).
2. The laser diode chip power testing fixture of claim 1, wherein, Supports (20) are symmetrically connected to the outer wall of the U-shaped frame (13). The supports (20) are located directly below the first sliding seat (7). Multiple return springs (21) are fastened between the first sliding seat (7) and the supports (20).
3. The laser diode chip power testing fixture of claim 1, wherein, The top of the screw (15) is coaxially connected to a handle (8).
4. The laser diode chip power testing fixture of claim 1, wherein, The bottom of the operating platform (1) is firmly attached to the base (14).
5. The laser diode chip power testing fixture of any one of claims 1-4, wherein, The testing mechanism includes an L-shaped bracket (3) that is slidably connected to one side of the operating platform (1). The end of the L-shaped bracket (3) extends to the top of the operating platform (1) and a photodetector (4) is slidably connected to the bottom of the bracket (3).
6. The laser diode chip power testing fixture of claim 5, wherein, Secure the first linear module (12) to one side of the top of the operating platform (1), and slide the bottom of the L-shaped bracket (3) to the first linear module (12) via the first slider (11).
7. The laser diode chip power testing fixture of claim 6, wherein, The bottom of the L-shaped bracket (3) is fixed with a second linear module (18), and the second linear module (18) is perpendicular to the position of the first linear module (12). A mounting base (2) is connected to the bottom of the first linear module (12) via a second slider (17), and the photodetector (4) is connected to the mounting base (2).
8. The laser diode chip power testing fixture of claim 7, wherein, It also includes a control box (10), which contains a controller that connects the first linear module (12), the second linear module (18), and the photodetector (4) to the controller.