A fool-proof assembly for chip testing grading

Abstract

The utility model relates to chip testing technical field, and disclose a kind of chip testing is prevented stupid component for grading, the chip testing is prevented stupid component for grading, including bottom plate, the top end surface of bottom plate is provided with prevent stupid device.The chip testing is prevented stupid component for grading, definition different test Bin chip respectively uses different color tray material receiving, prevent different Bin product mixes together even if wrong tray is taken, also cannot be loaded or used, from source avoids mixing risk, improves the stability of production line and product consistency, suitable for large quantities of automation or semi-automation production, when color sensor identifies that color is not correct, buzzer alarm, motor stops, until after changing into correct color tray, it can run material receiving, prevent error tray to put into production, avoid mixing risk, confirm tray accurate in place, only then carry out feeding, prevent misplacement feeding, further avoid to cause chip to drop or damage, reduce scrap rate.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, specifically to a foolproof component for chip testing and grading. Background Technology

[0002] During chip testing and sorting, to ensure that products from different test bins can be clearly distinguished and to prevent the risk of mixing during subsequent handling, storage, and assembly, a material receiving management measure with different colored trays has been established. Specifically, based on the test results, chips in each bin must be placed in the corresponding pre-designated colored tray. For example, Bin 1 uses a green tray, and Bin 2 uses an orange tray. Color serves as the most intuitive identification mark. In this way, even in environments with mass production and multi-person collaborative operations, chip categories can be quickly and accurately distinguished, avoiding mixing problems caused by human negligence.

[0003] However, in the actual chip sorting process, under high-intensity and repetitive assembly line work, if the operator needs to take care of multiple testing machines at the same time, the operator is prone to visual and mental fatigue. When frequently picking up and putting down the material tray, the operator may pick up the wrong color due to a momentary lapse in concentration. In view of this, we propose a foolproof component for chip testing and sorting. Utility Model Content

[0004] The purpose of this invention is to provide a foolproof component for chip testing and grading, so as to solve the problems mentioned in the background art.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a foolproof component for chip testing and grading, comprising a base plate, wherein a foolproof device is provided on the top end face of the base plate, the foolproof device comprising:

[0006] A material tray, wherein slots are provided on the side wall of the material tray;

[0007] The frame has a stop block fixedly connected to its top end face;

[0008] A bracket, on which a color sensor is fixedly connected.

[0009] Preferably, a vertical plate is fixedly connected to the top end face of the base plate, a motor is fixedly connected to the side wall of the vertical plate, a lead screw is fixedly connected to the output end of the motor, a slider is drivenly connected to the side wall of the lead screw, and the material tray is inserted into the top end face of the slider.

[0010] Preferably, a crossbar is fixedly connected to the side wall of the vertical plate, and the crossbar is slidably connected to the slider, restricting the slider and the material tray to move only laterally.

[0011] Preferably, the frame is fixedly connected to the top end face of the base plate, the crossbar is fixedly connected to the frame, and the stop block is inserted into the slot.

[0012] Preferably, the bracket is fixedly connected to the side wall of the base plate, and the color sensor is located above the material tray.

[0013] Preferably, a connecting frame is fixedly connected to the top end face of the frame, a through-beam sensor is fixedly connected to the top end face of the connecting frame, and a receiving end is fixedly connected to the top end face of the connecting frame. The receiving end and the through-beam sensor are symmetrically arranged on both sides of the frame.

[0014] Preferably, a robotic arm is fixedly connected to the top end face of the base plate. The robotic arm is located on one side of the material tray and is used to grip the chip and place the chip on the material tray.

[0015] Preferably, the number of the error prevention device and the transmission device is provided in two sets, and the slots in the two sets of error prevention devices are in different positions.

[0016] Compared with the prior art, this utility model provides a foolproof component for chip testing and grading, which has the following advantages:

[0017] 1. This chip testing and grading system uses a foolproof component. By defining different test bins for receiving different colored trays, it prevents different bins from being mixed up. Even if the wrong tray is used, the chip cannot be installed or used, thus avoiding the risk of mixing at the source. This improves the stability of the production line and the consistency of products. It is suitable for large-scale automated or semi-automated production. When the color sensor detects an incorrect color, the buzzer sounds an alarm and the motor stops until the correct color tray is used. This prevents the wrong tray from being used in production and avoids the risk of mixing.

[0018] 2. The chip testing and grading system uses a foolproof component that confirms the precise positioning of the material tray before feeding, through a set through-beam sensor and receiver. This prevents misaligned feeding, thereby avoiding chip drops, damage, or mixing, and reducing the scrap rate. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the main structure of the present utility model;

[0020] Figure 2 This is a schematic diagram of the material tray structure of this utility model;

[0021] Figure 3 This utility model Figure 2 Schematic diagram of the structure of region A in the middle;

[0022] Figure 4 This utility model Figure 2 Schematic diagram of the structure of region B in the middle.

[0023] In the diagram: 1. Base plate; 2. Vertical plate; 3. Motor; 4. Lead screw; 5. Foolproof device; 501. Material tray; 502. Slot; 503. Frame; 504. Stop block; 505. Bracket; 506. Color sensor; 7. Crossbar; 8. Connecting frame; 9. Through-beam sensor; 10. Receiver; 11. Robotic arm. Detailed Implementation

[0024] like Figures 1-4 As shown, this utility model provides a technical solution: a chip testing and grading anti-foolproof component, including a base plate 1, and an anti-foolproof device 5 is provided on the top end face of the base plate 1. The anti-foolproof device 5 includes a material tray 501, a slot 502, a frame 503, a stop block 504, a bracket 505, and a color sensor 506.

[0025] In one embodiment of this utility model, a vertical plate 2 is fixedly connected to the top end face of the base plate 1, a motor 3 is fixedly connected to the side wall of the vertical plate 2, a lead screw 4 is fixedly connected to the output end of the motor 3, a slider is drivenly connected to the side wall of the lead screw 4, a material tray 501 is inserted into the top end face of the slider, a slot 502 is provided on the side wall of the material tray 501, a crossbar 7 is fixedly connected to the side wall of the vertical plate 2, the crossbar 7 is slidably connected to the slider, and the crossbar 7 restricts the slider and the material tray 501 to move only laterally.

[0026] The frame 503 is fixedly connected to the top end face of the base plate 1. A stop block 504 is fixedly connected to the top end face of the frame 503. The crossbar 7 is fixedly connected to the frame 503. The stop block 504 is inserted into the slot 502. The bracket 505 is fixedly connected to the side wall of the base plate 1. A color sensor 506 is fixedly connected to the side wall of the bracket 505. The color sensor 506 is located above the material tray 501.

[0027] There are two sets of error prevention devices 5 and transmission devices. The slots 502 in the two sets of error prevention devices 5 are in different positions, and the material trays 501 in the two sets of error prevention devices 5 are in different colors. A robotic arm 11 is fixedly connected to the top end face of the base plate 1. The robotic arm 11 is located on one side of the material tray 501. The robotic arm 11 is used to pick up the chip and place the chip on the material tray 501.

[0028] Motor 3 drives lead screw 4 to rotate, causing slider and tray 501 to move laterally. Stop 504 is inserted into slot 502, restricting some pin holes, so that tray 501 can only be used with chips of specific pins. Different test bin chips use different colored trays 501 to receive them, preventing different bin products from being mixed together. Even if the wrong tray 501 is picked up, it cannot be installed or used. By defining that different test bin chips use different colored trays 501 to receive them, the risk of mixing is avoided from the source, improving the stability of the production line and product consistency. It is suitable for mass automated or semi-automated production.

[0029] When the material tray 501 moves laterally, after the material tray 501 moves below the color sensor 506, the color sensor 506 detects the color of the material tray 501 and identifies whether the material tray 501 transported to the receiving position is the color required for the corresponding Bin. When the color sensor 506 identifies that the color is incorrect, the color sensor 506 transmits a signal to the control chip, which then controls the buzzer to sound an alarm and stops the motor 3. The receiving operation can only resume after the correct color material tray 501 is replaced, to prevent the incorrect material tray 501 from being put into production.

[0030] In addition, a connecting frame 8 is fixedly connected to the top end face of the frame 503, a through-beam sensor 9 is fixedly connected to the top end face of the connecting frame 8, and a receiving end 10 is fixedly connected to the top end face of the connecting frame 8. The receiving end 10 and the through-beam sensor 9 are symmetrically arranged on both sides of the frame 503. Only when the material tray 501 has fully moved into place, and the stop block 504 is fully inserted into the slot 502, is the through-beam sensor 9 and the receiving end 10 blocked by the material tray 501. At this time, the receiving end 10 transmits the signal to the control chip, and the control chip controls the robotic arm 11 to place the chip on the material tray 501 to confirm that the material tray 501 is in place accurately, to prevent misaligned feeding, and thus avoid chip falling, damage or mixing, and to prevent chip damage due to falling or impact, thereby reducing the scrap rate.

[0031] In this invention, during use, the stop block 504 is inserted into the slot 502, restricting part of the pinholes so that the tray 501 can only be used with chips of specific pins. This allows different test bin chips to be received using trays 501 of different colors, preventing different bin products from being mixed together. Even if the wrong tray 501 is used, it cannot be installed or used. When the tray 501 moves horizontally, after it moves below the color sensor 506, the color sensor 506 detects the color of the tray 501 and identifies whether the tray 501 transported to the receiving position is the color required for the corresponding bin. When the color sensor 506 identifies an incorrect color, it transmits a signal to the control chip, which then controls the buzzer to sound an alarm and stops the motor 3 until the correct color tray 501 is used before receiving can resume.

[0032] The present invention has been described in detail above. However, modifications or improvements can be made to it, which will be obvious to those skilled in the art. Therefore, any modifications or improvements that do not depart from the spirit of the present invention are within the protection scope of the present invention.

Claims

1. A foolproof component for chip testing and grading, comprising a base plate (1), characterized in that: The top end face of the base plate (1) is provided with a foolproof device (5), the foolproof device (5) including: A tray (501) has a slot (502) on its side wall; A frame (503) is provided, and a stop (504) is fixedly connected to the top end face of the frame (503); A bracket (505) is provided, and a color sensor (506) is fixedly connected to the side wall of the bracket (505).

2. The error-proof component for chip testing and grading according to claim 1, characterized in that: A vertical plate (2) is fixedly connected to the top end face of the base plate (1), a motor (3) is fixedly connected to the side wall of the vertical plate (2), a lead screw (4) is fixedly connected to the output end of the motor (3), a slider is driven to the side wall of the lead screw (4), and the material tray (501) is inserted into the top end face of the slider.

3. The error-proof component for chip testing and grading according to claim 2, characterized in that: A horizontal bar (7) is fixedly connected to the side wall of the vertical plate (2), and the horizontal bar (7) is slidably connected to the slider.

4. The chip testing and grading error-proofing component according to claim 3, characterized in that: The frame (503) is fixedly connected to the top end face of the base plate (1), the crossbar (7) is fixedly connected to the frame (503), and the stop block (504) is inserted into the slot (502).

5. The error-proof component for chip testing and grading according to claim 1, characterized in that: The bracket (505) is fixedly connected to the side wall of the base plate (1), and the color sensor (506) is located above the tray (501).

6. The error-proof component for chip testing and grading according to claim 1, characterized in that: A connecting frame (8) is fixedly connected to the top end face of the frame (503), a through-beam sensor (9) is fixedly connected to the top end face of the connecting frame (8), and a receiving end (10) is fixedly connected to the top end face of the connecting frame (8). The receiving end (10) and the through-beam sensor (9) are symmetrically arranged on both sides of the frame (503).

7. The error-proof component for chip testing and grading according to claim 1, characterized in that: A robotic arm (11) is fixedly connected to the top end face of the base plate (1), and the robotic arm (11) is located on one side of the material tray (501).

8. The chip testing and grading error-proofing component according to claim 1, characterized in that: The number of the error prevention device (5) and the transmission device is set in two sets, and the slot (502) in the two sets of error prevention devices (5) are in different positions.

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