An electronic material detection device

Abstract

The utility model discloses an electronic material detection device relates to electronic material detection field, including device main body, detection mechanism, adjustable material fixed establishment and quick release type fixed component. Among them, detection mechanism sets up in device main body, adjustable material fixed establishment is correspondingly set with detection mechanism, including the mechanism frame of installation in device main body, the transverse guide rail group on installing mechanism frame, set up on the longitudinal guide rail group of transverse guide rail group, the longitudinal slider group of sliding setting on longitudinal guide rail group and the quick release type fixed component on installing longitudinal slider group. Through setting adjustable material fixed establishment, can carry out clamping to the electronic material of different size type, also can carry out clamping to the electronic material of irregular shape, simultaneously, through the configuration different number's component, also can carry out clamping to multiple regular or irregular electronic material, can improve the adaptability of detection device and the flexibility of detection etc.

Description

Technical Field

[0001] This utility model relates to the field of electronic material testing, specifically to an electronic material testing device. Background Technology

[0002] Electronic material testing equipment is used to analyze, test, and evaluate the performance, composition, structure, and reliability of electronic materials. It is widely used in fields such as semiconductors, display devices, and new energy materials, including electrical performance testing equipment, optical performance testing equipment, thermal performance testing equipment, and reliability testing equipment.

[0003] Currently, testing devices for electronic materials, such as those for PCBs, mainly consist of a main body, a testing unit, and a material fixing unit. The testing unit is used to test electronic materials, while the material fixing unit is used to fix the materials to be tested to prevent them from moving during testing, which could affect normal testing and testing results.

[0004] Although there are various existing PCB inspection devices, their material fixing units are usually set up in a one-to-one matching manner. That is, one material fixing unit can usually only fix one type of PCB. When inspecting PCBs of various sizes and types, it is necessary to change different types of material fixing units or directly change the inspection device. This not only results in poor board type adaptability and inspection flexibility, but also increases the inspection and usage costs, which has certain shortcomings. Utility Model Content

[0005] Purpose of the utility model: This utility model aims to address the above-mentioned shortcomings by providing an electronic material testing device to solve the problems existing in the prior art.

[0006] Technical solution: An electronic material testing device, comprising a device body, a testing mechanism, an adjustable material fixing mechanism, and a quick-release fixing component.

[0007] The detection mechanism is located inside the main body of the device and is used to detect electronic materials. The adjustable material fixing mechanism is correspondingly arranged with the detection mechanism and includes a mechanism frame installed inside the main body of the device, a transverse guide rail assembly installed on the mechanism frame, a longitudinal guide rail assembly set on the transverse guide rail assembly, a longitudinal slider assembly slidably set on the longitudinal guide rail assembly, and a quick-release fixing component installed on the longitudinal slider assembly.

[0008] In a further embodiment, the adjustable material fixing mechanism further includes a transverse slider assembly and a transverse locking pin assembly.

[0009] The transverse slider group is slidably connected to the transverse guide rail group and connected to the longitudinal guide rail group. The transverse locking pin group is installed on the longitudinal guide rail group and the transverse slider group and abuts against the inner wall of the transverse guide rail group, and is used to loosen or tighten the longitudinal guide rail group and the transverse guide rail group.

[0010] In a further embodiment, the adjustable material fixing mechanism further includes a longitudinal locking pin assembly mounted on the longitudinal slider assembly and abutting against the inner wall of the longitudinal guide rail assembly, for loosening or tightening the longitudinal slider assembly and the longitudinal guide rail assembly.

[0011] In a further embodiment, the quick-release fixing component includes a first insertion hole, a first insertion block, and a first clamping block.

[0012] The first insertion hole is located on the side wall of the longitudinal slider group, the first insertion block is inserted into the first insertion hole, and the first clamping block is connected to the end of the first insertion block.

[0013] In a further embodiment, the side of the first clamping block away from the first insert block is arranged in an arc shape.

[0014] In a further embodiment, the quick-release fixing component further includes a second insertion hole, a second insertion block, and a second clamping block.

[0015] The second insertion hole is located on the side of the first clamping block away from the first insertion block, the second insertion block is inserted into the second insertion hole, and the second clamping block is connected to the end of the second insertion block.

[0016] In a further embodiment, the side of the second clamping block away from the second insert block is L-shaped.

[0017] Beneficial effects: This utility model discloses an electronic material testing device. By setting an adjustable material fixing mechanism, it can clamp electronic materials such as PCBs of different sizes and types, as well as electronic materials such as PCBs with irregular shapes. At the same time, by configuring different numbers of components, it can also clamp multiple regular or irregular electronic materials such as PCBs. Not only is the whole device easy to assemble and disassemble, but it can also improve the adaptability and flexibility of the testing device and reduce the cost of testing. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the overall structure of this utility model.

[0019] Figure 2 This is a structural schematic diagram of the quick-release fastener of this utility model.

[0020] Figure 3This is a diagram illustrating the effect of the adjustable material fixing mechanism of this utility model clamping a single regular PCB.

[0021] Figure 4 This is a diagram illustrating the effect of the adjustable material fixing mechanism of this utility model clamping a single irregular PCB.

[0022] Figure 5 This is a diagram illustrating the effect of the adjustable material fixing mechanism of this utility model clamping multiple regular PCBs.

[0023] The figures are labeled as follows: 1. Main body of the device; 2. Detection mechanism; 3. Adjustable material fixing mechanism; 301. Mechanism frame; 302. Transverse guide rail assembly; 303. Transverse slider assembly; 304. Longitudinal guide rail assembly; 305. Transverse locking pin assembly; 306. Longitudinal slider assembly; 307. Longitudinal locking pin assembly; 4. Quick-release fixing component; 401. First insertion hole; 402. First insertion block; 403. First clamping block; 404. Second insertion hole; 405. Second clamping block. Detailed Implementation

[0024] In the following description, numerous specific details are set forth in order to provide a more thorough understanding of the present invention. However, it will be apparent to those skilled in the art that the present invention can be practiced without one or more of these details. In other instances, certain technical features well-known in the art have not been described in order to avoid confusion with the present invention.

[0025] The applicant argues that existing testing devices for electronic materials such as PCBs typically use a one-to-one matching configuration for material fixing units, which not only results in poor board type compatibility and testing flexibility but also increases testing costs, thus presenting certain limitations and shortcomings.

[0026] Therefore, the applicant proposes an electronic material testing device, such as... Figures 1-5 As shown, it includes the main body of the device 1, the detection mechanism 2, the adjustable material fixing mechanism 3, and the quick-release fixing component 4.

[0027] The testing mechanism 2 is located inside the main body 1 of the device and is used to test electronic materials. The adjustable material fixing mechanism 3 is installed inside the main body 1 of the device and is set in correspondence with the testing mechanism 2.

[0028] In this application, the main body 1 and the detection mechanism 2 can refer to the relevant structures and principles of existing electronic material detection devices. Since most existing detection devices are one-to-one detection devices, that is, one detection device can only detect one type of electronic material, such as PCB detection devices, it is usually necessary to change different detection devices when detecting PCBs of different board types, which is very inconvenient. Therefore, an adjustable material fixing mechanism 3 is set up to facilitate users to use one detection device to detect electronic materials such as PCBs of different types and sizes. The adjustable material fixing mechanism 3 will be described in detail below.

[0029] like Figures 1-5 As shown, the adjustable material fixing mechanism 3 includes a mechanism frame 301, a transverse guide rail assembly 302, a transverse slider assembly 303, a longitudinal guide rail assembly 304, a transverse locking pin assembly 305, a longitudinal slider assembly 306, a longitudinal locking pin assembly 307, and a quick-release fixing component 4.

[0030] The mechanism frame 301 is installed inside the main body 1 of the device. The transverse guide rail group 302 is installed on the mechanism frame 301. The longitudinal guide rail group 304 is set on the transverse guide rail group 302. The longitudinal slider group 306 is slidably set on the longitudinal guide rail group 304. The transverse slider group 303 is slidably connected to the transverse guide rail group 302 and connected to the longitudinal guide rail group 304. The transverse locking pin group 305 is installed on the longitudinal guide rail group 304 and the transverse slider group 303 and abuts against the inner wall of the transverse guide rail group 302. It is used to loosen and tighten the longitudinal guide rail group 304 and the transverse guide rail group 302. The longitudinal locking pin group 307 is installed on the longitudinal slider group 306 and abuts against the inner wall of the longitudinal guide rail group 304. It is used to loosen and tighten the longitudinal slider group 306 and the longitudinal guide rail group 304.

[0031] In this application, the mechanism frame 301 is fixed to the workbench of the device body 1 by bolts. The mechanism frame 301 has multiple mounting slots and bolt holes. The transverse guide rail assembly 302 is embedded in the mounting slots and fixed to the mechanism frame 301 by matching bolts. The transverse guide rail assembly 302 can be a T-slot guide rail, etc. The transverse slider assembly 303 is adapted to the transverse guide rail assembly 302 and is slidably disposed on the transverse guide rail assembly 302. The longitudinal guide rail assembly 304 is disposed on the transverse slider assembly 303 and is fixed and locked by the transverse locking pin assembly 305. The longitudinal slider assembly 306 is adapted to the transverse locking pin assembly 305 and is slidably disposed on the transverse locking pin assembly 305 and is locked by the longitudinal locking pin assembly 307. The quick-release fixing component 4 is installed on the longitudinal slider assembly 306 and is used to clamp electronic materials such as PCBs.

[0032] by Figures 3-4For example, four transverse guide rail groups 302, transverse slider groups 303, longitudinal guide rail groups 304, transverse locking pin groups 305, longitudinal slider groups 306, and longitudinal locking pin groups 307 are respectively provided. Two transverse guide rail groups 302 are installed at the two side edges of the mechanism frame 301, and the other two transverse guide rail groups 302 are installed in the middle of the mechanism frame 301. One transverse slider group 303, one longitudinal guide rail group 304, one transverse locking pin group 305, one longitudinal slider group 306, and one longitudinal locking pin group 307 form a clamping moving part. In use, one transverse locking pin is released. Pin group 305, adjust the corresponding longitudinal guide rail group 304, and by moving the corresponding transverse slider group 303 on the transverse guide rail group 302, the corresponding longitudinal slider group 306 and longitudinal locking pin group 307 can be moved laterally. By releasing the corresponding longitudinal locking pin group 307, the corresponding longitudinal slider group 306 can be moved longitudinally on the corresponding longitudinal guide rail group 304, thereby enabling the corresponding quick-release fixing component 4 to adapt to different types and sizes of electronic materials such as PCBs, and realize the clamping of corresponding electronic materials such as PCBs, including regular and irregular ones.

[0033] like Figures 2-5 As shown, the quick-release fixing component 4 is installed on the longitudinal slider assembly 306. The quick-release fixing component 4 includes a first insertion hole 401, a first insertion block 402, a first clamping block 403, a second insertion hole 404, a second insertion block, and a second clamping block 405.

[0034] The first insertion hole 401 is formed on the side wall of the longitudinal slider assembly 306, the first insertion block 402 is inserted into the first insertion hole 401, the first clamping block 403 is connected to the end of the first insertion block 402, the second insertion hole 404 is formed on the side of the first clamping block 403 away from the first insertion block 402, the second insertion block is inserted into the second insertion hole 404, and the second clamping block 405 is connected to the end of the second insertion block.

[0035] In this application, the first insert block 402 and the longitudinal slider group 306, as well as the second insert block and the first clamping block 403, can be magnetically connected by magnetic blocks to improve the stability of the connection. At the same time, the quick-release fixing component 4 is set on the upper part of the longitudinal guide rail group 304. When the quick-release fixing component 4 clamps electronic materials such as PCBs, the upper part of the longitudinal guide rail group 304 can support the edges of electronic materials such as PCBs, thereby improving the stability during testing.

[0036] In addition, the side of the first clamping block 403 away from the first insert block 402 is arc-shaped, and the side of the second clamping block 405 away from the second insert block is L-shaped. This allows for the matching and clamping of electronic materials such as PCBs with square or arc-shaped edges. Furthermore, both the clamping surfaces of the first clamping block 403 and the second clamping block 405 are equipped with pads made of materials such as silicone, which further improves the clamping of electronic materials such as PCBs of different sizes and types. This not only makes the device easy to assemble and disassemble, but also allows a single testing device to clamp electronic materials such as PCBs of various sizes and types, thereby improving the adaptability and flexibility of the testing device and reducing the cost of testing.

[0037] As described above, although the present invention has been shown and described with reference to specific preferred embodiments, it should not be construed as limiting the present invention itself. Various changes in form and detail may be made to the present invention without departing from the spirit and scope of the appended claims.

Claims

1. An electronic material testing device, characterized in that, include: Device body (1); The testing mechanism (2) is located inside the main body (1) of the device and is used to test electronic materials; The adjustable material fixing mechanism (3) is configured in correspondence with the detection mechanism (2), including a mechanism frame (301) installed in the main body (1) of the device, a transverse guide rail group (302) installed on the mechanism frame (301), a longitudinal guide rail group (304) set on the transverse guide rail group (302), a longitudinal slider group (306) slidably set on the longitudinal guide rail group (304), and a quick-release fixing component (4) installed on the longitudinal slider group (306).

2. The electronic material testing device according to claim 1, characterized in that: The adjustable material fixing mechanism (3) also includes a transverse slider group (303) and a transverse locking pin group (305). The transverse slider group (303) is slidably connected to the transverse guide rail group (302) and connected to the longitudinal guide rail group (304); The transverse locking pin assembly (305) is installed on the longitudinal guide rail assembly (304) and the transverse slider assembly (303) and abuts against the inner wall of the transverse guide rail assembly (302) to loosen or tighten the longitudinal guide rail assembly (304) and the transverse guide rail assembly (302).

3. The electronic material testing device according to claim 1, characterized in that: The adjustable material fixing mechanism (3) further includes a longitudinal locking pin group (307) installed on the longitudinal slider group (306) and abutting against the inner wall of the longitudinal guide rail group (304), for loosening or tightening the longitudinal slider group (306) and the longitudinal guide rail group (304).

4. The electronic material testing device according to claim 1, characterized in that: The quick-release fixing component (4) includes a first insertion hole (401), a first insertion block (402), and a first clamping block (403). The first insertion hole (401) is formed on the side wall of the longitudinal slider assembly (306); The first insert (402) is inserted into the first socket (401); The first clamping block (403) is connected to the end of the first insert block (402).

5. The electronic material testing device according to claim 4, characterized in that: The side of the first clamping block (403) away from the first insert block (402) is arc-shaped.

6. The electronic material testing device according to claim 4, characterized in that: The quick-release fixing component (4) also includes a second insertion hole (404), a second insertion block, and a second clamping block (405); The second insertion hole (404) is located on the side of the first clamping block (403) away from the first insertion block (402); The second insert is inserted into the second socket (404); The second clamping block (405) is connected to the end of the second insert block.

7. The electronic material testing device according to claim 6, characterized in that: The side of the second clamping block (405) away from the second insert block is L-shaped.

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