A semiconductor test with a striker

Abstract

The utility model relates to the technical field of semiconductor test, disclose a kind of striker for semiconductor test, including rammer, the outside of rammer is provided with limiting mechanism, the inside sliding connection of rammer has extension rod, the outside of extension rod is provided with clamping mechanism, the clamping mechanism includes base one, the outside fixedly connected with protective housing of base one, the inside movably connected with limiting ring of protective housing, the outside fixedly connected with fixed column of base one, the other end movably connected with fixed clamp of fixed column, the inside fixedly connected with telescopic column one of base one, the outside movably connected with connecting block of telescopic column one. In the utility model, the needle of striker can be replaced, and clamping is realized by clamping mechanism daily, when needle cannot satisfy use demand, reset block drives spring one compression, spring one further drives telescopic column two.

Description

Technical Field

[0001] This utility model relates to the field of semiconductor testing technology, and in particular to a test pin for semiconductor testing. Background Technology

[0002] Semiconductor test probes are core components that ensure the accuracy of semiconductor product quality testing. Their contact resistance stability, tip wear resistance, and signal transmission fidelity are key performance indicators that directly affect the efficiency of semiconductor testing and the reliability of test results. For testing scenarios with high-density pin chips, maintaining the integrity of the tip shape and avoiding signal interference during high-frequency contact has become the core of the design. Through optimization, this component can not only achieve accurate transmission of minute current signals, but also reduce tip wear and deformation after multiple contacts, reduce the test error rate, and ensure the consistency of batch testing. Semiconductor test probes typically consist of a tip functional unit and a signal transmission unit. The tip functional unit is made of high-purity tungsten alloy or rhodium-ruthenium alloy, and is precision-ground to form a tip with a specific radius of curvature, adapting to the contact requirements of different chip pads and ensuring stable contact between the tip and the pad without damaging the chip. The signal transmission unit incorporates a highly conductive silver or gold plating layer, which effectively reduces signal attenuation and interference during transmission, ensuring stable performance of the probe in complex testing environments and meeting the stringent requirements of high precision and high reliability in semiconductor testing. A current semiconductor testing probe lacks a quick-change feature, resulting in significant shortcomings in practicality and economy. In batch testing scenarios, the probe tip is prone to wear and deformation due to high-frequency contact, requiring timely replacement to ensure testing accuracy. However, without a quick-change design, replacement necessitates disassembling the entire probe structure, which is cumbersome and time-consuming, leading to prolonged downtime of the testing equipment and significantly reducing testing efficiency. This makes it difficult to adapt to the high-speed pace of semiconductor production and can also affect the consistency of test results due to debugging errors, adversely impacting the stability and economy of semiconductor product quality testing. Therefore, a new semiconductor testing probe is proposed to address these issues. Utility Model Content

[0003] To overcome the above shortcomings, this utility model provides a semiconductor testing probe, which aims to improve the problem of the inability to quickly replace the probe in the prior art.

[0004] To achieve the above objectives, the present invention adopts the following technical solution: A semiconductor testing probe includes a striking rod, a limiting mechanism being provided on the outside of the striking rod, an extension rod being slidably connected inside the striking rod, and a clamping mechanism being provided on the outside of the extension rod. The clamping mechanism includes a base, a protective shell fixedly connected to the outside of the base, a limiting ring movably connected inside the protective shell, a fixed column fixedly connected to the outside of the base, a fixed clamp movably connected to the other end of the fixed column, a telescopic column fixedly connected inside the base, a connecting block movably connected to the outside of the telescopic column, a connecting plate movably connected to the outside of the connecting block, and a reset component provided on the outside of the base. As a further description of the above technical solution: The limiting mechanism includes a second spring, which is fixedly connected to the outside of the impact rod. A pressing block is fixedly connected to the other end of the second spring, and a limiting post is fixedly connected to the other end of the pressing block. A limiting groove is opened inside the extension rod, and a fixing block is fixedly connected to the outside of the impact rod. As a further description of the above technical solution: The fixed block is internally fixedly connected to a rotating column, and the actuating block is internally rotatably connected to the outside of the rotating column; As a further description of the above technical solution: The reset assembly includes a protective ring, the outer side of which is fixedly connected to the outside of the first base, and the outer side of the protective ring is fixedly connected to the second base. As a further description of the above technical solution: The protective ring has a sliding connection to a reset block, the reset block has a fixed connection to a telescopic column two, and the telescopic column two is sleeved with a spring one. As a further description of the above technical solution: The impact rod is externally fixedly connected to a spring three, and the impact rod is externally slidably connected to a needle tail; As a further description of the above technical solution: The outer part of the spring three is slidably connected to the inside of the needle tail, and the outer part of the limiting ring is slidably connected to the needle tip; As a further description of the above technical solution: The connecting plate is externally movably connected to the outside of the fixing clamp, and the base is externally fixedly connected to the telescopic column.

[0005] This utility model has the following beneficial effects: 1. In this utility model, the needle of the impact pin is replaceable. It is clamped and fixed by the clamping mechanism in daily use. When the needle cannot meet the use requirements, the reset block drives the spring to compress. The spring further drives the telescopic column to compress the base. The base pulls the telescopic column to extend. The telescopic column drives the connecting plate to move. The connecting plate finally acts on the fixing clamp, and the fixing clamp opens or closes to realize the loosening or fixing of the needle. This achieves quick replacement, avoids delaying the operation, and can also ensure the stable installation of the new needle through the precise cooperation of multiple components. At the same time, it reduces the difficulty of operation and adapts to the maintenance needs of multiple scenarios.

[0006] 2. In this utility model, when the length of the striking pin needs to be adjusted, the pressing block compresses the lower spring two and rotates around the rotating column, while simultaneously lifting the limiting column so that the limiting column enters the limiting groove inside the extension rod. At this time, the length of the striking pin can be adjusted according to the requirements. After completion, the limiting column is fixed in position, realizing the adjustment of the striking pin length. This allows the striking pin to adapt to different working environments. Precise component linkage ensures adjustment stability. The operation is simple, without complicated steps, improving the flexibility of striking pin use. Attached Figure Description

[0007] Figure 1 This is a three-dimensional schematic diagram of a semiconductor testing probe proposed in this utility model; Figure 2 This is a schematic diagram of the structure of a clamping mechanism for a semiconductor testing probe proposed in this utility model; Figure 3 This is a schematic diagram of the structure of a fixing clip for a semiconductor testing probe proposed in this utility model; Figure 4 This is a schematic diagram of the structure of the spring three of the semiconductor testing probe proposed in this utility model; Figure 5 for Figure 4 A cross-sectional view at point A in the middle.

[0008] Legend: 1. Striking bar; 2. Extension bar; 3. Clamping mechanism; 31. Base 1; 32. Protective shell; 33. Restricting ring; 34. Fixing post; 35. Fixing clamp; 36. Telescopic post 1; 37. Connecting block; 38. Connecting plate; 4. Reset assembly; 41. Protective ring; 42. Base II; 43. Reset block; 44. Telescopic column II; 45. Spring I; 5. Limiting mechanism; 51. Spring 2; 52. Press block; 53. Rotating column; 54. Fixing block; 55. Limiting column; 56. Limiting groove; 6. Needle tail; 7. Spring three; 8. Needle tip. Detailed Implementation

[0009] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0010] Example: A semiconductor testing probe, reference Figures 1 to 3 The system includes a striker 1, which is the main support structure for the striker and provides a mounting base and motion guide for subsequent components. A limit mechanism 5 is provided on the outside of the striker 1, which provides a stable mounting carrier for the limit mechanism 5. An extension rod 2 is slidably connected inside the striker 1, which provides sliding space and guidance for the extension rod 2. The extension rod 2 can flexibly extend and retract inside the striker 1 according to testing requirements. A clamping mechanism 3 is provided on the outside of the extension rod 2, which provides mounting support for the clamping mechanism 3. The clamping mechanism 3 is used for stable clamping.

[0011] The clamping mechanism 3 includes a base 31, which is the basic load-bearing component of the clamping mechanism 3. A protective shell 32 is fixedly connected to the outside of the base 31. A limiting ring 33 is movably connected inside the protective shell 32. The protective shell 32 provides the limiting ring 33 with a space for movement and guidance. The limiting ring 33 is used to limit the clamped component in the circumferential direction. A fixed post 34 is fixedly connected to the outside of the base 31. A fixed clamp 35 is movably connected to the other end of the fixed post 34. The fixed post 34 provides a movable support point for the fixed clamp 35. The fixed clamp 35 is the core clamping component of the clamping mechanism 3. It can clamp and release the target component through its own movement. A telescopic post 36 is fixedly connected inside the base 31. A connecting block 37 is movably connected to the outside of the telescopic post 36. The telescopic post 36 can drive the connecting block 37 to move synchronously. A connecting plate 38 is movably connected to the outside of the connecting block 37. The connecting plate 38 is movably connected to the outside of the fixed post 34.

[0012] Specifically, the clamping mechanism 3 is based on the base 31, which supports the core. The protective shell 32 fixed to the outside of the base 31 serves both as protection and as a means of movement and guidance for the internal limiting ring 33. The limiting ring 33 can circumferentially limit the clamping components to prevent displacement. The fixed post 34 outside the base 31 is the movable support point of the fixed clamp 35. As the core clamping component, the opening and closing action of the fixed clamp 35 is driven by the telescopic post 36 inside the base 31. When the telescopic post 36 extends or retracts, it drives the connecting block 37 to move synchronously. The connecting block 37 then transmits the power to the fixed post 34 through the connecting plate 38, ultimately realizing the clamping and releasing of the fixed clamp 35 on the target component.

[0013] The fixed column 34 provides an additional movable support point for the connecting plate 38, ensuring the stable movement of the connecting plate 38 during power transmission. The base 1 31 is externally provided with a reset component 4, which provides an installation position for the reset component 4. The limiting mechanism 5 includes a second spring 51, which is externally fixedly connected to the outside of the impact rod 1. The impact rod 1 provides a fixed support point for the second spring 51. The other end of the second spring 51 is fixedly connected to a push block 52. The elastic force of the second spring 51 can directly act on the push block 52, driving the push block 52 to perform a reset movement. The other end of the push block 52 is fixedly connected to a limiting column 55. When the push block 52 moves, it will drive the limiting column 55 to move synchronously. The extension rod 2 has a limiting groove 56 inside, which provides an insertion space for the limiting column 55. Through the cooperation of the limiting column 55 and the limiting groove 56, the impact rod 1 is externally fixedly connected with a fixed block 54, which provides a solid installation base for the fixed block 54.

[0014] Specifically, the fixed column 34 provides additional support for the connecting plate 38, ensuring stable power transmission. A reset assembly 4 is externally mounted on the base 31, providing a mounting position. In the limiting mechanism 5, the impact rod 1 provides fixed support for the second spring 51, and the other end of the second spring 51 is connected to the pressing block 52, whose elasticity drives the pressing block 52 to reset. The pressing block 52 drives the limiting column 55 to move synchronously, and the limiting groove 56 in the extension rod 2 provides insertion space for the limiting column 55; the two work together to achieve limiting. The impact rod 1 also provides a stable mounting base for the fixed block 54, ensuring the coordinated operation of the overall structure.

[0015] Reference Figures 3 to 5 The fixed block 54 has a rotating column 53 fixedly connected inside, providing built-in installation space and fixed support for the rotating column 53. The push block 52 is rotatably connected to the outside of the rotating column 53, and the rotating column 53 provides the rotation axis for the push block 52, allowing the push block 52 to rotate flexibly around the rotating column 53. The reset assembly 4 includes a protective ring 41, which is the external protective structure of the reset assembly 4. The outside of the protective ring 41 is fixedly connected to the outside of the base 1 31. The outside of the protective ring 41 is fixedly connected to the base 2 42, providing a stable installation platform for the base 2 42. The base 2 42 is used to further fix and support the reset assembly 4. The reset block 43 is slidably connected inside the protective ring 41, providing sliding guidance and movement space for the reset block 43.

[0016] Specifically, the fixed block 54 has a built-in rotating column 53 that provides built-in installation space and support. The push block 52 rotates around the rotating column 53 to achieve flexible swinging. In the reset assembly 4, the protective ring 41 is fixed to the base 1 31, which not only provides protection but also provides an installation platform for the base 2 42. The reset block 43 is slidably connected inside the protective ring 41, providing guidance and movement space for it, ensuring the stable sliding of the reset block 43. All structures work together to achieve the limiting and reset functions.

[0017] The reset block 43 is internally fixedly connected to a telescopic column 44, and a spring 45 is sleeved on the outside of the telescopic column 44. The spring 45 can elastically deform with the extension and retraction of the telescopic column 44. The impact rod 1 is externally fixedly connected to a spring 7, and the impact rod 1 provides a fixed support point for the spring 7. The impact rod 1 is externally slidably connected to a needle tail 6, and the impact rod 1 provides sliding space and guidance for the needle tail 6. The spring 7 is externally slidably connected to the inside of the needle tail 6. The limiting ring 33 is externally slidably connected to a needle 8, and the limiting ring 33 provides sliding guidance and radial limit for the needle 8. The connecting plate 38 is externally movably connected to the outside of the fixing clamp 35. The connecting plate 38 can transmit its own movement to the fixing clamp 35. The base 31 is externally fixedly connected to a telescopic column 44, and the base 31 provides external mounting support for the telescopic column 44, so that the telescopic column 44 can provide power to the reset assembly 4 more stably.

[0018] Specifically, the reset block 43 has a built-in telescopic column 44, and a spring 45 sleeved on its exterior deforms with telescopic movement. The base 31 provides fixed support for the telescopic column 44, enhancing the dynamic stability of the reset assembly 4. The strike rod 1 fixes the spring 7, and the needle tail 6, which is externally slidably connected to the strike rod 1, slides within the needle tail 6. The limiting ring 33 guides and radially limits the sliding of the needle 8. The connecting plate 38 transmits the motion to the fixing clamp 35, and all components work together to achieve the functions of reset, guidance, and power transmission.

[0019] The implementation principle of this application embodiment is as follows: During the use of the firing pin, the needle head 8 of the firing pin is replaceable. The needle head 8 is clamped by the clamping mechanism 3. When the needle head 8 is used too many times, it does not achieve the required effect. By pressing the reset block 43, the reset block 43 is attached to one end of the spring 45. Its displacement forces the spring to compress. The other end of the spring 45 presses against the telescopic column 44. The elastic force pushes the telescopic column 44, thereby driving the base 31 to compress. The base 31 is connected to the telescopic column 36, which causes it to stretch. The end of the telescopic column 36 is connected to the connecting plate 38. The connecting plate 38 is fixedly connected to the fixing clamp 35. Under this action, the fixing clamp 35 will open or close to fix or loosen the needle head 8, so as to realize the quick replacement of the needle head 8.

[0020] When the firing pin needs to be extended or shortened, the push block 52 is pressed by external force, which compresses the spring 51, thereby causing the push block 52 to rotate along the rotating column 53. The push block 52 drives the limiting column 55 to rise and enter the limiting groove 56 inside the extension rod 2. When the push block 52 rotates to a specific position, the rising of the limiting column 55 precisely enters the limiting groove 56, ensuring the stability of the limiting column 55. At this time, when it is necessary to extend or shorten, it can be adjusted according to the required length so that the firing pin of different lengths can adapt to different working environments.

[0021] Finally, it should be noted that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Although the present utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A semiconductor testing probe, comprising a striking rod (1), characterized in that: The impact rod (1) is provided with a limiting mechanism (5) on its outside, and an extension rod (2) is slidably connected inside the impact rod (1). The extension rod (2) is provided with a clamping mechanism (3) on its outside. The clamping mechanism (3) includes a base (31), a protective shell (32) is fixedly connected to the outside of the base (31), a limiting ring (33) is movably connected inside the protective shell (32), a fixed column (34) is fixedly connected to the outside of the base (31), a fixed clamp (35) is movably connected to the other end of the fixed column (34), a telescopic column (36) is fixedly connected inside the base (31), a connecting block (37) is movably connected to the outside of the telescopic column (36), a connecting plate (38) is movably connected to the outside of the connecting block (37), and the outside of the connecting plate (38) is movably connected to the outside of the fixed column (34). A reset component (4) is provided on the outside of the base (31).

2. The semiconductor testing probe according to claim 1, characterized in that: The limiting mechanism (5) includes a second spring (51), the outside of which is fixedly connected to the outside of the impact rod (1), and the other end of the second spring (51) is fixedly connected to a pressing block (52). The other end of the pressing block (52) is fixedly connected to a limiting post (55). A limiting groove (56) is opened inside the extension rod (2), and a fixing block (54) is fixedly connected to the outside of the impact rod (1).

3. The semiconductor testing probe according to claim 2, characterized in that: The fixed block (54) is internally fixedly connected to a rotating column (53), and the inside of the pressing block (52) is rotatably connected to the outside of the rotating column (53).

4. The semiconductor testing probe according to claim 1, characterized in that: The reset assembly (4) includes a protective ring (41), the outside of which is fixedly connected to the outside of the base one (31), and the outside of which is fixedly connected to the base two (42).

5. A semiconductor testing probe according to claim 4, characterized in that: The protective ring (41) has a sliding connection to a reset block (43), and the reset block (43) has a fixed connection to a telescopic column (44). The telescopic column (44) is fitted with a spring (45) on its outside.

6. The semiconductor testing probe according to claim 1, characterized in that: The impact rod (1) is externally fixedly connected to a spring three (7), and the impact rod (1) is externally slidably connected to a needle tail (6).

7. A semiconductor testing probe according to claim 6, characterized in that: The outer side of the spring three (7) is slidably connected to the inside of the needle tail (6), and the outer side of the limiting ring (33) is slidably connected to the needle tip (8).

8. A semiconductor testing probe according to claim 1, characterized in that: The connecting plate (38) is externally movably connected to the outside of the fixing clamp (35), and the base one (31) is externally fixedly connected to the telescopic column two (44).

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