A dual-band axisymmetric probe ring system for near-field testing

Abstract

The utility model belongs to wireless communication test technical field discloses a kind of double-band axis symmetry probe ring system for near-field test, including test room, the inner wall of test room is laid with wave-absorbing layer, inside being equipped with annular assembly;One high-frequency probe and one low-frequency probe are respectively arranged in the annular assembly along front-back direction, to top high-frequency probe as benchmark, in the same horizontal plane, multiple high-frequency probes are evenly arranged along the circumferential direction to left side, and high-frequency test half-ring is formed;To top low-frequency probe as benchmark, in the same horizontal plane, multiple low-frequency probes are evenly arranged along the circumferential direction to left side, and low-frequency test half-ring is formed;The high-frequency test half-ring and low-frequency test half-ring are axially symmetrically distributed.The utility model does not need to worry about the problem of incomplete key data caused by the missing of top area frequency band coverage again, whether high frequency or low frequency test, complete, continuous full-ring data can be obtained, greatly enhance the reliability of test result.

Description

Technical Field

[0001] This utility model relates to the field of wireless communication testing technology, and in particular to a dual-band axisymmetric probe ring system for near-field testing. Background Technology

[0002] In the current technical solution, the probes on the ring assembly are arranged in an alternating pattern of high-frequency and low-frequency probes, uniformly distributed circumferentially to form an alternating arrangement of "high-frequency-low-frequency-high-frequency-low-frequency" to achieve full ring coverage. The device under test is installed on a one-dimensional turntable, and amplitude and phase data acquisition is completed in an omnidirectional 360° range by rotating 180°. However, the alternating high- and low-frequency probe arrangement means that only a single frequency band (high-frequency or low-frequency) probe can be installed in the top area of ​​the ring assembly, resulting in a lack of sampling coverage for the other frequency band in this critical area, leading to incomplete amplitude and phase data acquisition across the entire frequency band. Furthermore, to maintain consistent insertion loss across all links and minimize line loss, high-frequency and low-frequency probes need to be connected to separate switches located near their installation positions, resulting in a mixed connection of both high-frequency and low-frequency probes on the same switch. This connection method triggers the switching switch action whenever any frequency band is tested. Frequent and prolonged switching accelerates the aging of switching components, causing insertion loss and phase shift parameter drift, ultimately affecting the amplitude and phase measurement accuracy of the system. Summary of the Invention

[0003] To overcome the technical defects of the existing technology, this utility model provides a dual-band axisymmetric probe ring system for near-field testing.

[0004] The technical solution adopted in this utility model is as follows: a dual-band axially symmetrical probe ring system for near-field testing, including a test chamber, the inner wall of which is covered with an absorbing layer, and an annular assembly inside; a horizontally arranged translational guide rail is installed at the bottom of the test chamber, the moving end of which is equipped with a turntable, and the rotating end of the turntable is equipped with a vertically upward clamping rod, the top of which is equipped with a fixture for fixing the test piece; driven by the translational guide rail, the fixture can be moved to the test position at the physical phase center of the annular assembly; a high-frequency probe and a low-frequency probe are respectively arranged in the annular assembly along the front-back direction; taking the high-frequency probe at the top as a reference, multiple high-frequency probes are evenly distributed circumferentially to the left side of the same horizontal plane to form a high-frequency test semi-ring; taking the low-frequency probe at the top as a reference, multiple low-frequency probes are evenly distributed circumferentially to the left side of the same horizontal plane to form a low-frequency test semi-ring; the high-frequency test semi-ring and the low-frequency test semi-ring are axially symmetrically distributed.

[0005] Preferably, the annular component is provided with a component support frame on its periphery.

[0006] Preferably, all high-frequency probes in the high-frequency test half-loop are connected to at least one high-frequency switching switch; all low-frequency probes in the low-frequency test half-loop are connected to at least one low-frequency switching switch; the high-frequency switching switch and the low-frequency switching switch are independent of each other.

[0007] Preferably, the annular component is provided with a port corresponding to the translation guide rail.

[0008] Preferably, the turntable is a one-dimensional turntable, which drives the lever and fixture to rotate horizontally.

[0009] Preferably, the number of probes in the high-frequency test half-ring and the low-frequency test half-ring are equal.

[0010] Preferably, the test room is also equipped with walkway panels.

[0011] The beneficial effects of this utility model are as follows: 1. In this utility model, a high-frequency probe and a low-frequency probe are respectively set at the top of the ring assembly along the front-to-back direction, forming a dual-frequency reference for the system; the remaining probes are evenly arranged circumferentially to the left and right sides in the same horizontal plane, with the corresponding top probe as the reference, thus forming two axially symmetrical semi-ring test systems, which are then spliced ​​together to form a complete full-ring test system. During testing, the device under test is first moved to the phase center of the target semi-ring test system (low-frequency or high-frequency) via the bottom slide rail of the turntable, and then rotated 360° by the turntable to complete the acquisition of omnidirectional amplitude and phase data. This layout effectively solves the problem of missing frequency band coverage in the top region.

[0012] 2. This utility model adopts an axially symmetrical layout, which concentrates all probes of a single frequency band within a continuous 180° semi-circle. With the total number of probes remaining unchanged, the angular interval between adjacent probes of the same frequency is reduced to (180° / total number of probes in a single frequency band), thereby improving the sampling accuracy to twice that of the prior art. Attached Figure Description

[0013] One or more embodiments are illustrated by way of example with reference numerals in the accompanying drawings. These illustrations do not constitute a limitation on the embodiments. Elements with the same reference numerals in the drawings are denoted as similar elements. Unless otherwise stated, the figures in the drawings are not to be limited by scale.

[0014] Figure 1 This is a schematic diagram of the overall structure of this utility model; Figure 2 This is a schematic diagram of the ring-shaped component structure of this utility model; Figure 3 This is a distribution diagram of the high-frequency probe and low-frequency probe of this utility model; Figure 4This is a schematic diagram of the installation of the translation guide rail of this utility model.

[0015] Explanation of reference numerals in the attached diagram: 1. Test chamber; 2. Absorbing layer; 3. Ring component; 4. High-frequency probe; 5. Low-frequency probe; 6. Translation guide rail; 7. Turntable; 8. Support pole; 9. Fixture; 10. Component support frame; 11. Through-hole; 12. Walkway plate. Detailed Implementation

[0016] To make the objectives, technical solutions, and advantages of this utility model clearer, the various embodiments of this utility model will be described in detail below with reference to the accompanying drawings. However, those skilled in the art will understand that many technical details have been provided in the various embodiments of this utility model to facilitate a better understanding of this application. However, the technical solutions claimed in the claims of this application can be implemented even without these technical details and with various variations and modifications based on the following embodiments.

[0017] like Figures 1-4 As shown, this embodiment provides a dual-band axially symmetrical probe ring system for near-field testing, including a test chamber 1. The inner wall of the test chamber 1 is covered with an absorbing layer 2. The test chamber 1 and the absorbing layer 2 constitute an electromagnetic anechoic chamber environment, absorbing internal reflected waves to ensure that the test results only include direct radiation from the test piece, without environmental reflection interference. A ring assembly 3 is provided inside the test chamber 1. A horizontally arranged translation rail 6 is installed at the bottom of the test chamber 1. A turntable 7 is mounted on the moving end of the translation rail 6, and a vertically upward-pointing support rod 8 is mounted on the rotating end of the turntable 7. A fixture 9 for fixing the test piece is mounted on the top of the support rod 8. Driven by the translation rail 6, the fixture 9 can be moved to the test position at the physical phase center of the ring assembly 3.

[0018] A high-frequency probe 4 and a low-frequency probe 5 are respectively arranged along the front-to-back direction in the annular component 3. Using the top high-frequency probe 4 as a reference, multiple high-frequency probes 4 are evenly distributed circumferentially to the left side of the same horizontal plane to form a high-frequency test semi-ring; using the top low-frequency probe 5 as a reference, multiple low-frequency probes 5 are evenly distributed circumferentially to the left side of the same horizontal plane to form a low-frequency test semi-ring. The high-frequency and low-frequency test semi-rings are axially symmetrically distributed. At the top of the annular component 3, a high-frequency probe 4 and a low-frequency probe 5 are respectively arranged along the front-to-back direction to form the dual-frequency reference of the system; the remaining probes are evenly distributed circumferentially to the left and right sides of the same horizontal plane, using the corresponding top probe as a reference, thus forming two axially symmetrical semi-ring test systems, which are then spliced ​​together to form a complete full-ring test system. During testing, the device under test is first moved to the phase center of the target semi-ring test system (low-frequency or high-frequency) via the bottom slide rail of the turntable 7, and then rotated 360° by the turntable 7 to complete the acquisition of omnidirectional amplitude and phase data. This layout effectively solves the problem of missing frequency band coverage in the top region. This makes the test results more complete and reliable. Whether it's high-frequency or low-frequency testing, complete and continuous full-loop data can be obtained, greatly enhancing the reliability of the test results and the user's confidence in the final data.

[0019] This invention employs an axially symmetrical layout, concentrating all probes for a single frequency band within a continuous 180° semi-circle. With the total number of probes remaining constant, the angular interval between adjacent probes of the same frequency is reduced to (180° / total number of probes in a single frequency band), thereby doubling the sampling accuracy compared to existing technologies. For example, in a 128-probe system, with 64 high-frequency and 64 low-frequency probes, this arrangement achieves a sampling accuracy of 180° / 64 = 2.8125° for a single frequency band, effectively doubling the accuracy compared to existing methods.

[0020] The annular component 3 is provided with a component support frame 10 on its periphery, which is used to rigidly fix the entire annular component 3, effectively suppressing the displacement that may be caused by external vibration and ensuring the stability of the test platform.

[0021] All high-frequency probes 4 in the high-frequency test half-loop are connected to at least one high-frequency switching switch; all low-frequency probes 5 in the low-frequency test half-loop are connected to at least one low-frequency switching switch; the high-frequency switching switch and the low-frequency switching switch are independent of each other. In the axially symmetrical layout adopted in this utility model, the two half-loop test systems, each composed of high-frequency probes 4 and low-frequency probes 5, allow probes of corresponding frequency bands to be connected to the nearest switching switch, and each switch only needs to connect to a probe of a single frequency band (low-frequency or high-frequency). During testing, only the switch corresponding to the target frequency band needs to be switched, avoiding frequent switching operations across frequency bands, thereby significantly reducing the aging risk of switching components and improving the long-term stability and accuracy of the system test; the system is more stable and the maintenance cost is lower: this "on-demand switching" mode makes the system operation more stable and the test data (especially the phase data with extremely high accuracy requirements) has better long-term consistency. At the same time, the slowdown in the aging rate of switching components directly reduces the equipment failure rate and subsequent maintenance costs, bringing users a more worry-free and economical long-term user experience.

[0022] The annular component 3 is provided with a port 11 corresponding to the translation guide rail 6, which facilitates the movement of the fixture 9 to the test position of the physical phase center of the annular component 3 under the drive of the translation guide rail 6.

[0023] The turntable 7 is a one-dimensional turntable, which drives the clamping rod 8 and fixture 9 to rotate horizontally; this achieves complete automation of test piece positioning and rotation. This eliminates human error, ensures consistency of test conditions for each test, and results in highly repeatable test results.

[0024] The high-frequency and low-frequency test half-loops have the same number of probes. This equal number of probes means that during near-field to far-field transformation, the two frequency bands have exactly the same number of sampling points and completely symmetrical sampling positions in space. This provides a highly consistent basis for the data processing algorithm.

[0025] The test room 1 is also equipped with a walkway 12, which provides a safe walking platform for staff to operate, maintain and debug equipment in the dark room. The walkway 1 is also equipped with a wave-absorbing layer.

[0026] Furthermore, any content not described in detail in this specification is existing technology known to those skilled in the art.

[0027] During the working process, the device under test, such as a mobile phone, is mounted and fixed on fixture 9, and all necessary cables such as communication cables and power cables are connected. After preparation is complete, the control system issues a command. The translation guide 6 starts moving smoothly and precisely the fixture 9 carrying the device under test until the phase center of the device under test is completely aligned with the physical phase center of the ring component 3. This position is the "test position".

[0028] Start testing: The device under test (DUT) transmits signals in a specific frequency band or is excited by an external signal source, according to the test requirements. The test can be performed in a single frequency band or alternately in two frequency bands.

[0029] The core process of data acquisition: This process is carried out cyclically, combining turntable rotation and probe switching.

[0030] a. Initial position: The turntable 7 drives the lever 8 and fixture 9 to rotate to an initial angle, for example, 0 degrees.

[0031] b. Probe sampling: High-frequency testing: When the high-frequency switching switch is triggered, each high-frequency probe 4 on the high-frequency testing half-ring is quickly and sequentially selected according to a preset order. Each probe receives the radiation signal from the device under test when selected and transmits the data to the measuring instrument. In this way, the radiation field strength of the device under test at different spatial orientations in the high-frequency band at the current horizontal angle is collected.

[0032] Low-frequency test: Similarly, when the low-frequency switching switch is triggered, each low-frequency probe 5 on the low-frequency test half-ring is selected in sequence to complete the data acquisition in the low-frequency band.

[0033] Note: High and low frequency band acquisition can be performed sequentially or simultaneously if two independent receiving systems are available.

[0034] c. Rotate to the next angle: After all probes have completed sampling at the current angle, the turntable 7 drives the device under test to rotate by a fixed, very small angle step, such as 1 degree or 2 degrees.

[0035] d. Repeat sampling: At the new horizontal angle, repeat step b and collect data from all probes again by switching the switch.

[0036] e. Cycle complete: The above process continues until the turntable drives the device under test to rotate 360 ​​degrees continuously.

[0037] The computer records the amplitude and phase data acquired at each probe position under each horizontal rotation angle. This data is "near-field" data.

[0038] Because the probe ring is a semi-ring while the device rotates a full circle, through mathematical symmetry and the sampling theorem, complete near-field data can be synthesized across the entire virtual cylindrical surface or, through more complex transformations, onto a sphere. Processing this data yields the test report.

[0039] Those skilled in the art will understand that the above embodiments are specific examples of implementing the present invention, and in practical applications, various changes can be made to them in form and detail without departing from the spirit and scope of the present invention.

Claims

1. A dual-band axially symmetrical probe ring system for near-field testing, comprising a test chamber (1), wherein the inner wall of the test chamber (1) is covered with an absorbing layer (2), and an annular assembly (3) is provided inside; a horizontally arranged translational guide rail (6) is installed at the bottom of the test chamber (1), a turntable (7) is installed at the moving end of the translational guide rail (6), and a vertically upward clamping rod (8) is provided at the rotating end of the turntable (7), and a fixture (9) for fixing the test piece is installed at the top of the clamping rod (8); under the drive of the translational guide rail (6), the fixture (9) can be moved to the test position of the physical phase center of the annular assembly (3); characterized in that: A high-frequency probe (4) and a low-frequency probe (5) are respectively arranged in the front and back directions of the ring assembly (3). Taking the high-frequency probe (4) at the top as a reference, multiple high-frequency probes are evenly arranged in the circumferential direction on the left side of the same horizontal plane to form a high-frequency test half-ring. Taking the low-frequency probe (5) at the top as a reference, multiple low-frequency probes (5) are evenly arranged in the circumferential direction on the left side of the same horizontal plane to form a low-frequency test half-ring. The high-frequency test half-ring and the low-frequency test half-ring are axially symmetrically distributed.

2. The dual-band axisymmetric probe ring system for near-field testing according to claim 1, characterized in that: The annular component (3) is provided with a component support frame (10) on its periphery.

3. A dual-band axisymmetric probe ring system for near-field testing according to claim 1, characterized in that: All high-frequency probes (4) in the high-frequency test half-ring are connected to at least one high-frequency switching switch; all low-frequency probes (5) in the low-frequency test half-ring are connected to at least one low-frequency switching switch; the high-frequency switching switch and the low-frequency switching switch are independent of each other.

4. A dual-band axisymmetric probe ring system for near-field testing according to claim 1, characterized in that: The annular component (3) is provided with a port (11) corresponding to the translation guide rail (6).

5. A dual-band axisymmetric probe ring system for near-field testing according to claim 1, characterized in that: The turntable (7) is a one-dimensional turntable, which drives the rod (8) and fixture (9) to rotate horizontally.

6. A dual-band axisymmetric probe ring system for near-field testing according to claim 1, characterized in that: The number of probes in the high-frequency test half-ring and the low-frequency test half-ring is equal.

7. A dual-band axisymmetric probe ring system for near-field testing according to claim 1, characterized in that: The test room (1) is also equipped with a walkway (12).

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